CN113064044A

CN113064044A - Novel APD correction algorithm

Info

Publication number: CN113064044A
Application number: CN202110352121.2A
Authority: CN
Inventors: 翟海峰; 周永华; 付德康; 龚国星
Original assignee: Nantong Zhongrui Communication Technology Co ltd
Current assignee: Nantong Zhongrui Communication Technology Co ltd
Priority date: 2021-03-31
Filing date: 2021-03-31
Publication date: 2021-07-02

Abstract

The invention discloses a novel APD correction algorithm, which comprises the following steps: step one, preparing for use; step two, installing a module to be tested; inserting an optical fiber jumper wire; step four, software APD correction; step five, finishing; stabilizing the temperature of the module through a constant temperature box and providing a normal-low and high-temperature debugging environment, wherein in the third step, a direct-current power supply supplies power to a light source module and a module to be tested, the power input to the module to be tested is controlled through an electrically-adjustable attenuator, a high-frequency signal is provided through a BERT model, error rate data is provided, and in the fourth step, the attenuator is controlled through a PC (personal computer), APD (avalanche photo diode) bias voltage is adjusted, and the BERT error rate is read; the method is safe and reliable, and the correction method is used for reducing the time for searching the bit error rate for many times at high and low temperatures and has high efficiency for directly searching the VBR value; by the correction method, the deviation can be controlled within 0.2V, and the deviation has very small influence on the performance of the APD.

Description

Novel APD correction algorithm

Technical Field

The invention relates to the technical field of APD correction algorithms, in particular to a novel APD correction algorithm.

Background

An avalanche diode is a light receiving device and mainly used for detecting and converting transmitted weak light signals into electric signals, and the working principle of the avalanche diode is that the avalanche photodiode absorbs photons to generate electron-hole pairs, the electron-hole pairs are accelerated under the action of a strong electric field generated by high reverse bias voltage so as to obtain enough energy, and then the electron-hole pairs collide with crystal lattices to form a linkage effect, so that a large number of electron-hole pairs are formed, the avalanche phenomenon is caused, and the current is exponentially increased; therefore, the APD operating condition needs a certain reverse bias voltage to generate a corresponding multiplication effect, and the APD also has a breakdown voltage, when Vapd = VBR, the avalanche gain is infinite, and the avalanche noise becomes very large, which is regarded as APD breakdown, and certainly Vapd < VBR; whether the VBR value or the optimal Vapd value changes along with the change of the temperature, the change trend of the VBR value is similar to that of the Vapd, and only the intercept is greatly different; therefore, it is necessary to invent a new APD correction algorithm at this stage.

Disclosure of Invention

The invention aims to provide a novel APD correction algorithm to solve the problems of time consumption and large error of test correction in the background technology.

In order to achieve the purpose, the invention provides the following technical scheme: a novel APD correction algorithm comprising the steps of: step one, preparing for use; step two, installing a module to be tested; inserting an optical fiber jumper wire; step four, software APD correction; step five, finishing;

in the first step, a PC and a thermostat are opened, control software and a BERT model which are matched with APD correction are opened, equipment is checked, and all the equipment and the software are ensured to be in a normal working state;

in the second step, the tested module of the avalanche photodiode device to be tested and corrected is inserted into the test board, and the stability of insertion is ensured;

in the third step, inserting the optical fiber jumper wire at the output end of the electrically-tuned attenuator into the tested module of the avalanche photodiode device, inserting the input end of the BERT model onto the test board, inserting the output end of the BERT model onto a PC (personal computer), and then switching on a direct-current power supply;

in the fourth step, the APD correction software is clicked, and the APD bias voltage correction is automatically completed by the software;

in the fifth step, after the correction of the three-temperature correction module is completed, the optical fiber jumper wires on the output ends of the tested module of the avalanche photodiode device and the electrically-adjusted attenuator are pulled down, and the finishing work after the test correction is completed.

Preferably, in the first step, the temperature of the module is stabilized by an incubator, and a normal low and high temperature debugging environment is provided.

Preferably, in the second step, the test board supplies power to the light source and the module to be tested.

Preferably, in the third step, the direct current power supply supplies power to the light source module and the module to be tested, the power input to the module to be tested is controlled through the electrically adjustable attenuator, and the high-frequency signal and the bit error rate data are provided through the BERT model.

Preferably, in the fourth step, the attenuator is controlled by the PC, the APD bias voltage is adjusted, and the BERT bit error rate is read.

Compared with the prior art, the invention has the beneficial effects that: the method is safe and reliable, and the correction method is used for reducing the time for searching the bit error rate for many times at high and low temperatures and has high efficiency for directly searching the VBR value; by the correction method, the deviation can be controlled within 0.2V, and the deviation has very small influence on the performance of the APD.

Drawings

FIG. 1 is a schematic diagram of a temperature-bias experiment of the present invention;

FIG. 2 is a schematic diagram of a calibration system of the present invention;

FIG. 3 is a flow chart of the method of the present invention.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Referring to fig. 1-3, an embodiment of the present invention is shown: a novel APD correction algorithm comprising the steps of: step one, preparing for use; step two, installing a module to be tested; inserting an optical fiber jumper wire; step four, software APD correction; step five, finishing;

in the first step, a PC and a thermostat are opened, control software and a BERT model which are matched with APD correction are opened, equipment is checked, all the equipment and the software are ensured to be in a normal working state, the temperature of a module is stabilized through the thermostat, and a normal-low-high temperature debugging environment is provided;

in the second step, the tested module of the avalanche photodiode device to be tested and corrected is inserted into the test board, the stability of insertion is ensured, and the light source and the tested module are powered through the test board;

in the third step, an optical fiber jumper wire at the output end of the electrically-tuned attenuator is inserted into a module to be tested of the avalanche photodiode device, the input end of the BERT model is inserted into a test board, the output end of the BERT model is inserted into a PC (personal computer), then a direct-current power supply is switched on, the direct-current power supply supplies power to the light source module and the module to be tested, the power of the module to be tested is controlled and input through the electrically-tuned attenuator, a high-frequency signal is provided through the BERT model, and error rate data are provided;

in the fourth step, APD correction software is clicked, APD bias voltage correction is automatically completed through the software, and the attenuator is controlled through the PC, the APD bias voltage is adjusted, and the BERT error rate is read;

Based on the above, the present invention has the advantage that, when the invention is used, the error ratio is small according to the experimental data Δ Vapd ≈ Δ Vapd1 ≈ Δ Vapd2, if the APD DAC is designed to be 8-bit byte, and the maximum voltage of the APD driving chip is 50V, the error can be controlled within 0.2V, and the influence of the error on the performance of the APD is very small, as shown in fig. 1.

It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential attributes thereof. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Claims

1. A novel APD correction algorithm comprising the steps of: step one, preparing for use; step two, installing a module to be tested; inserting an optical fiber jumper wire; step four, software APD correction; and step five, finishing the finishing, which is characterized in that:

2. The novel APD correction algorithm of claim 1, wherein: in the first step, the temperature of the module is stabilized through a constant temperature box, and a normal-low high-temperature debugging environment is provided.

3. The novel APD correction algorithm of claim 1, wherein: in the second step, the test board supplies power to the light source and the module to be tested.

4. The novel APD correction algorithm of claim 1, wherein: and in the third step, the direct current power supply supplies power to the light source module and the module to be tested, the power of the module to be tested is controlled and input through the electrically-adjustable attenuator, and the BERT model provides a high-frequency signal and provides error rate data.

5. The novel APD correction algorithm of claim 1, wherein: in the fourth step, the attenuator is controlled by the PC, the bias voltage of the APD is adjusted, and the BERT bit error rate is read.