CN102820924A - Adjusting and optimizing algorithm for optimum operating bias voltage of avalanche photodiode - Google Patents
Adjusting and optimizing algorithm for optimum operating bias voltage of avalanche photodiode Download PDFInfo
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Abstract
The invention discloses an adjusting and optimizing algorithm for optimum operating bias voltage of an avalanche photodiode. The adjusting and optimizing algorithm includes steps of firstly, determining the optimum input photo power; and secondly, scanning bias voltage of the APD (avalanche photodiode) under the optimum input photo power, and finding out the bias voltage corresponding to the minimum BER (bit error rate), namely the optimum operating bias voltage of the APD. In the adjusting and optimizing algorithm, the optimum bias voltage of different APDs is found in large BER during the optimum bias voltage scanning by automatically adjusting input photo power, the BERs tested near the optimum bias voltage are quite different, accuracy of scanning is guaranteed, and the optimum operating bias voltage of each APD can be found, and the optimum sensitivity can be obtained.
Description
Technical field
The present invention relates to the excellent algorithm of a kind of accent in the optical communication field, particularly a kind of excellent algorithm of accent of avalanche photodide best effort bias voltage.
Background technology
Avalanche photo diode (APD) is that a kind of light of p-n junction type detects diode.The operation principle of avalanche photodide is, applies bigger reverse biased during work, makes it reach the avalanche multiplication state, utilizes the avalanche multiplication effect of charge carrier to amplify photosignal, to improve the sensitivity that detects.Avalanche photodide has its best effort bias voltage, and the best effort bias voltage of different avalanche photodides is different.Usually avalanche photodide is applied its optimal bias during work, so that it reaches higher detection sensitivity.So the best effort bias voltage of finding out avalanche photodide is very necessary.
Because under identical input optical power condition; Different bias voltages can obtain different bit error rate (BER) (as shown in Figure 1); And minimum bit error rate (BER) bias voltage is APD best effort bias voltage, so seek the method for the best effort bias voltage of avalanche photodide at present is, under fixing input optical power; Scan A PD bias voltage; The different APD bias voltages that i.e. input changes utilize error code to produce appearance (HOME BERT) test bit error rate (BER), and the working bias voltage of finding out APD under the minimum bit error rate is the best effort bias voltage of APD.
But; The APD manufacturing process can not be guaranteed the best effort bias voltage at present, and the consistency of the sensitivity and the M factor is even add under the testing time of abundance; If bit error rate (BER) is less, error code produces appearance HOME BERT can not test out a fixing bit error rate (BER) exactly.In addition, as shown in Figure 1, under less bit error rate (BER); When the bias voltage of APD scans near the optimum operating voltage; Because the less and unsteadiness of difference of bit error rate (BER) causes the erroneous judgement of minimum bit error rate, thereby can accurately not find the optimum working bias voltage of APD.
Summary of the invention
The objective of the invention is to overcome the existing deficiency that can't find out the best effort bias voltage of APD accurately in the prior art; A kind of excellent algorithm of accent of avalanche photodide best effort bias voltage is provided, can finds out the best effort bias voltage of APD through this algorithm accurately.
In order to realize the foregoing invention purpose, the invention provides following technical scheme:
A kind of excellent algorithm of accent of avalanche photodide best effort bias voltage, it comprises the steps:
The first step: confirm optimum input optical power;
Second step: under optimum input optical power, scan A PD bias voltage, the bias voltage corresponding until minimum BER is APD best effort bias voltage.
Further, confirm in the said first step that optimum input optical power comprises step:
APD bias voltage initial value Vapd0 and input optical power initial value are set;
Keep bias voltage Vapd0, adjust input optical power automatically, up to bit error rate (BER) BER in standard BER scope.
According to the embodiment of the invention, the standard BER scope of said scan A PD bias voltage is: BER>=5E-04 and BER≤5E-03.
Further, the method for said automatic adjustment input optical power is:
Current input power=initial input luminous power;
Under bias voltage initial value Vapd0 and current input optical power, carry out the BER test, if BER>5E-03, increase input optical power gradually, until BER≤5E-03; If<5E-04 reduces input optical power, until BER>=5E-04 to BER gradually.
According to embodiments of the invention; If BER>5E-03; Increase input optical power gradually, be until the concrete operations of BER≤5E-03: current input optical power=current input optical power+luminous power stepping, carry out the BER test under bias voltage initial value Vapd0 and current input optical power; If BER>5E-03, then this operation is carried out in circulation;
If BER is<5E-04; Reduce input optical power gradually; Concrete operations until BER>=5E-04 are: current input optical power=current input optical power-luminous power step-length; Under bias voltage initial value Vapd0 and current input optical power, carry out the BER test, if<5E-04, then this operation is carried out in circulation to BER.
According to the embodiment of the invention, said luminous power stepping is 0.2dbm or 0.5dbm or 1dbm.Be preferably 0.5dbm.
According to the embodiment of the invention, said luminous power step-length is variable, and to depart from 5E-04 far away more along with BER, and luminous power step-length value is big more.
Further, said second the step under optimum input optical power, scan A PD bias voltage, the step of finding out APD best effort bias voltage comprises:
Step a: Vapd1=Vapd0-bias adjustment value is set;
Step b: scan A PD bias voltage, carry out the BER test;
Step c: if BER_Vapd1＜BER_Vapd0 then reduces the APD bias voltage gradually, until finding out the corresponding optimal bias Vopt of minimum BER; If BER_Vapd1＞BER_Vapd0 then increases the APD bias voltage gradually, until finding out the corresponding optimal bias Vopt of minimum BER, wherein, corresponding BER when corresponding BER when BER_Vapd1 representes that bias voltage is Vapd1, BER_Vapd0 represent that bias voltage is Vapd0.
Further, bias adjustment value described in the said step a is 0.2V or 0.4V or 0.6V or 1V.
Further, among the said step c, if BER_Vapd1＜BER_Vapd0; Then reduce the APD bias voltage gradually, until finding out the corresponding optimal bias Vopt of minimum BER, wherein; Reduce the APD bias voltage gradually, be until the method for finding out the corresponding optimal bias Vopt of minimum BER:
Step c101: if BER_Vapd1＜BER_Vapd0 then is provided with Vapd0=Vapd1, the stepping of Vapd1=Vapd0-bias voltage is carried out the BER test, circulation execution in step c101;
Step c102: obtain more excellent Vapd=Vapd1, i.e. the corresponding APD bias voltage of minimum bit error rate;
Step c103: continue scanning less than and at least one bias voltage test point of closing on Vapd, judge whether Vapd is the corresponding APD bias voltage of minimum bit error rate, if then definite Vapd is optimal bias Vopt; If not; Confirm that then the corresponding APD bias voltage of minimum bit error rate measured in this step is optimal bias Vopt; And judge BER_Vopt＞whether set up with reference to BER; Said is the bit error rate (BER) threshold value that different APD all can accurately find out the best effort bias voltage with reference to BER, and said BER_Vopt is bias voltage corresponding BER when being Vopt;
Step c104: if BER_Vopt＞with reference to BER then obtains APD best effort bias voltage and is: Vopt-0.5V; If BER_Vopt≤, then optimum input optical power is adjusted into: optimum input optical power+1dbm with reference to BER; Continue scan A PD bias voltage, until finding out the corresponding bias voltage Vopt ' of minimum BER, then obtaining APD best effort bias voltage be: Vopt '-0.5V.
Further, among the said step c, if BER_Vapd1＞BER_Vapd0; Then increase the APD bias voltage gradually, until finding out the corresponding optimal bias Vopt of minimum BER, wherein; Increase the APD bias voltage gradually, be until the method for finding out the corresponding optimal bias Vopt of minimum BER:
Step c201: if BER_Vapd1＞BER_Vapd0 then is provided with Vapd0=Vapd1, the stepping of Vapd1=Vapd0+ bias voltage is carried out the BER test, circulation execution in step c201;
Step c202: obtain more excellent Vapd=Vapd1, i.e. the corresponding APD bias voltage of minimum bit error rate;
Step c203: continue scanning greater than and at least one bias voltage test point of closing on Vapd, judge whether Vapd is the corresponding APD bias voltage of minimum bit error rate, if then definite Vapd is optimal bias Vopt; If not, confirm that then the corresponding APD bias voltage of minimum bit error rate measured in this step is optimal bias Vopt, and judge that BER_Vopt＞whether set up with reference to BER, said BER_Vopt are the BER of bias voltage correspondence when being Vopt;
Step c204: judge BER_Vopt＞whether set up, if BER_Vopt＞with reference to BER then obtains APD best effort bias voltage and is: Vopt-0.5V with reference to BER; If BER_Vopt≤, then optimum input optical power is adjusted into: optimum input optical power+1dbm with reference to BER; Continue scan A PD bias voltage, until finding out the corresponding bias voltage Vopt ' of minimum BER, then obtaining APD best effort bias voltage be: Vopt '-0.5V.
Through step c101-c104 among the step c or step c201-c204, confirm optimum input optical power, the optimum input optical power accuracy that obtains is high, and debugging speed is fast.
Further, said bias voltage stepping is 0.1V or 0.2V or 0.4V or 0.6V.Be preferably 0.2V.
Further, said is 5E-06 with reference to BER.
Compared with prior art, beneficial effect of the present invention:
1, the excellent algorithm of accent of avalanche photodide best effort bias voltage of the present invention; Through automatic adjustment input optical power; Make that different APD all are the optimal bias that under big bit error rate (BER), find in the optimal bias scanning process; Near the bit error rate (BER) of optimal bias, testing differs the accuracy of having guaranteed scanning more greatly, thereby finds out every APD best effort bias voltage accurately, obtains optimum sensitivity.
2, APD best effort bias point can change with the variation of ambient temperature; Need penalty coefficient that different temperature points is calibrated in the practical application; If can accurately not find the APD bias voltage at certain temperature spot, the calibration parameter that calculates according to this point so just can accurately not compensate, and causes some temperature spot APD sensitivity to descend; The meeting that compensating error is serious causes in the long-term use of APD, decreased performance even permanent damage.The present invention transfers excellent algorithm can draw APD best effort bias voltage accurately, has avoided the generation of this type of situation, improves the APD performance.
Description of drawings:
Fig. 1 is in the present algorithm, under the identical input optical power condition, APD bias voltage and bit error rate (BER) concern sketch map.
Fig. 2 is different input optical powers, APD bias voltage and bit error rate (BER) concern sketch map.
Fig. 3 is the workflow diagram of the excellent algorithm of accent of avalanche photodide best effort bias voltage of the present invention.
Fig. 4 is a workflow diagram of confirming optimum input optical power in the inventive method.
Fig. 5 is in the inventive method, and under optimum input optical power, scan A PD bias voltage is to find out the workflow diagram of APD best effort bias voltage.
Embodiment
Below in conjunction with Test Example and embodiment the present invention is made further detailed description.But should this be interpreted as that the scope of the above-mentioned theme of the present invention only limits to following embodiment, allly all belong to scope of the present invention based on the technology that content of the present invention realized.
With reference to figure 1, the method for seeking the best effort bias voltage of avalanche photodide at present is, under fixing input optical power, and scan A PD bias voltage, the working bias voltage of finding out APD under the minimum bit error rate is the best effort bias voltage of APD.But, under less bit error rate (BER), when the bias voltage of APD scans near the optimum operating voltage, because the less and unsteadiness of difference of bit error rate (BER) causes the erroneous judgement of minimum bit error rate, thereby can accurately not find APD best effort bias voltage.Therefore; Even if in APD bias voltage scanning process, can both test the bit error rate (BER) that differs greatly to scan than small step footpath 0.1V; Just can avoid test error; Can find the minimum bit error rate accurately, scan A PD bias voltage under big bit error rate (BER) can be found out APD best effort bias voltage accurately.
With reference to figure 2, different input optical powers, APD bias voltage and bit error rate (BER) concern sketch map.Same APD, under the different input optical powers, the APD bias voltage is different with the relation curve that bit error rate (BER) BER constitutes.As can be seen from Figure 2, BER is when 5E-06 is following, and the difference of the bit error rate (BER) that APD best effort bias voltage annex is tested is very little, is easy to cause the erroneous judgement of minimum bit error rate, thereby can accurately not find out the optimum working bias voltage of APD.BER is when 5E-06 is above, and the difference of the bit error rate (BER) that APD best effort bias voltage annex is tested is bigger, so can find out APD best effort bias voltage very accurately.
Through discovering; Satisfying BER>under the condition of 5E-06; The difference of the bit error rate (BER) of the best effort bias voltage annex of different APD is bigger; Different APD all can accurately find out the best effort bias voltage, define bit error rate (BER) threshold value that different APD all can accurately find out the best effort bias voltage for reference to BER, and promptly 5E-06 is with reference to BER.In addition; Best effort bias voltage between each APD has huge difference; If guarantee BER＞5E-06, the optimum input optical power of different APD is different, therefore in scanning process; Transfer in the survey in actual production, fixing input optical power can't be guaranteed all scan bias voltage under the reference bits error rate of every APD.
Guarantee that if desired the BER that scans is greater than 5E-06, because different ROSA have different responsivenesses and different best effort bias voltages, so initial APD bias voltage setting is particularly important, input optical power can not be too little simultaneously, need adjust to an optimum value.Through discovering; Beginning scan A PD bias voltage in BER>=5E-04 and BER≤5E-03 scope; Can guarantee BER>5E-06, and obtain optimum APD bias voltage, so this scope of definition is the standard BER scope of scan A PD bias voltage; If in standard BER scope, then defining this input optical power is the optimum input optical power of scan A PD bias voltage at the BER that records under a certain input optical power.
For example; As can be seen from Figure 2, satisfying BER under the condition more than the 5E-06, when input optical power be-during 31dbm; The corresponding BER of the optimum working bias voltage of APD is starkly lower than near the corresponding BER of the bias voltage of the optimum working bias voltage of APD; When so input optical power is set for-31dbm, can be easy to, find out very accurately the optimum working bias voltage of APD, this-31dbm is called optimum input optical power.
The core concept of the excellent algorithm of accent of avalanche photodide best effort bias voltage of the present invention is exactly; Confirm earlier optimum input optical power, scan A PD bias voltage under optimum input optical power again is not if minimum BER satisfies BER＞5E-06; Calibrate input optical power again; Amplify near the BER of APD best effort bias voltage, can find out APD best effort bias voltage accurately, eliminate BER test erroneous judgement.
With reference to figure 3, Fig. 4, Fig. 5, the excellent algorithm of accent of avalanche photodide best effort bias voltage of the present invention may further comprise the steps:
S100: confirm optimum input optical power;
S200: under optimum input optical power, scan A PD bias voltage is found out the corresponding bias voltage of minimum BER and is APD best effort bias voltage.
Wherein, the step of definite optimum input optical power comprises among the step S100:
S101: the initial value Vapd0 of APD bias voltage and the initial value Power0 of input optical power are set.
The initial value of APD bias voltage and the initial value of input optical power are configurable, are provided with according to the product specification book explanation of different APD producer.
S102: carry out the BER test.
S103: adjust input optical power automatically, make input optical power reach optimum input optical power, that is, under optimum input optical power, the BER of test gained is in BER>=5E-04 and BER≤5E-03 scope.
Automatically the method for adjustment input optical power is:
If BER>5E-03, then increase input optical power gradually, until BER≤5E-03; If<5E-04 then reduces input optical power, until BER>=5E-04 to BER gradually.For example:
If BER>5E-03, step S102 is returned in then Power0=Power0+ luminous power stepping, follows and encircles the BER test, until BER≤5E-03; If BER 5E-04, and then Power0=Power0+ luminous power step-length is returned step S102, and the BER test is carried out in circulation, until BER>=5E-04; When BER>=5E-04 and BER≤5E-03, stop to adjust input optical power, the input optical power of this moment is optimum input optical power.
Said luminous power stepping can be 0.2dbm, 0.5dbm, 1dbm, getting the luminous power stepping in the present embodiment is 0.5dbm, input optical power is with the adjustment of the step frequency of 0.5dbm, every adjustment once, BER approximately changes an one magnitude.
<during 5E-04, said luminous power step-length is variable luminous power step-length, and BER is more little, and promptly to depart from 5E-04 far away more for BER, and luminous power step-length value is big more, can improve test speed like this, the input optical power when finding BER>=5E-04 within a short period of time as BER.For example, the luminous power step-length can take following mode to change:
Choose input optical power according to aforesaid way successively, BER test is carried out in circulation, the input optical power when finding BER >=5E-04.
Wherein, among the step S200 under optimum input optical power, scan A PD bias voltage, find out APD best effort bias voltage and comprise step:
S201: scan A PD bias voltage, APD bias voltage Vapd1=Vapd0-bias adjustment value is set, carry out the BER test then, if BER_Vapd1＜BER_Vapd0 then gets into step S202; If BER_Vapd1＞BER_Vapd0 then gets into step S203.Wherein, said bias adjustment value can be chosen 0.4V usually for 0.2V or 0.4V or 0.6V or 1V.
With reference to figure 2, BER_Vapd1＜BER_Vapd0 explains BER along with the APD bias voltage reduces and reduces, so reduce the APD bias voltage gradually, subtracts so that certain bias voltage stepping is tired like Vapd0, constantly scans, and can find out the corresponding more excellent bias voltage Vapd of minimum BER.
S202:Vapd0 is with directly tired subtracting of step of 0.2V, like Vapd0-0.2V, and Vapd0-0.4V; Vapd0-0.6V, Vapd0-0.8V is until finding more excellent bias voltage Vapd; Promptly under optimum input optical power, Vapd is corresponding to minimum bit error rate BER_Vapd, wherein; Corresponding BER when corresponding BER when BER_Vapd1 representes that bias voltage is Vapd1, BER_Vapd0 represent that bias voltage is Vapd0;
Because when test is that discrete sampling is carried out in stepping with 0.2V, so in order to obtain optimal bias more accurately, whether checking Vapd is APD optimal bias Vopt; Improve the test accuracy of APD optimal bias, finding the Vapd continued to scan several APD bias voltage test points, like Vapd-0.1V; Vapd-0.2V, Vapd-0.3V, Vapd-0.4V; Vapd-0.6V finally confirms optimal bias Vopt.For example, be respectively Vapd-0.1V at bias voltage, Vapd-0.2V, Vapd-0.3V, Vapd-0.4V, during Vapd-0.6V, BER is all greater than BER_Vapd, Vopt=Vapd then, promptly Vapd is the APD optimal bias; When if bias voltage is Vapd-0.1V or Vapd-0.2V or Vapd-0.3V or Vapd-0.4V or Vapd-0.6V; Any BER is wherein arranged less than BER_Vapd; Confirm that then optimal bias Vopt is Vapd-0.1V or Vapd-0.2V or Vapd-0.3V or Vapd-0.4V or Vapd-0.6V, gets into step S204.
With reference to figure 2, BER_Vapd1>BER_Vapd0, explain that BER reduces along with the APD bias voltage and increases; Be BER along with the APD bias voltage increases and reduces,, add up with certain bias voltage stepping like Vapd0 so increase the APD bias voltage gradually; Constantly scan, can find out the corresponding more excellent bias voltage Vapd of minimum BER.
S203:Vapd1 adds up with the stepping of 0.2V, like Vapd1+0.2V, and Vapd1+0.4V, Vapd1+0.6V, until finding more excellent Vapd, that is, under optimum input optical power, Vapd is corresponding to minimum bit error rate BER_Vapd.Same, finding the Vapd continued to scan several APD bias voltage test points, like Vapd+0.1V, Vapd+0.2V, Vapd+0.3V, Vapd+0.4V, Vapd+0.6V finally confirms optimal bias Vopt, gets into step S205.
Said bias voltage stepping can be 0.1V, 0.2V, and 0.4V, 0.6V, the bias voltage stepping is more little, and the precision of test gained is also high more, but the speed of test is lower.When the bias voltage stepping was 0.2V, measuring accuracy was very high, and the bias voltage stepping of 0.2V is tired to be subtracted or add up so choose, and improves test speed.
S204: judge whether BER_Vopt＞5E-06 sets up,,, get into step S206, corresponding BER when wherein BER_Vopt representes that bias voltage is Vopt if be false if BER_Vopt＞5E-06 gets into S210.
S205: judge whether BER_Vopt＞5E-06 sets up,,, get into step S207, corresponding BER when wherein BER_Vopt representes that bias voltage is Vopt if be false if BER_Vopt＞5E-06 gets into S210.
S206: optimum input optical power is adjusted into: optimum input optical power+1dbm gets into step S208.
Through discovering, with reference to figure 2, on the basis of the optimum input optical power of in step S100, confirming, add 1dbm, revised input optical power can accurately be found out the optimum input optical power of APD best effort bias voltage.
S207: optimum input optical power is adjusted into: optimum input optical power+1dbm gets into step S209.
S208: continue scan A PD bias voltage, only need near a small amount of bias voltage test point a spot of several Vopt of scanning this moment, like Vopt+0.4V, and Vopt+0.2V, Vopt, Vopt-0.2V, Vopt-0.4V, Vopt-0.6V is to improve test speed.Find out in the above-mentioned bias voltage test point, the bias voltage that minimum BER is corresponding promptly, with obtaining the optimal bias Vopt ' that optimal bias is revised as this step gained among the step S202, gets into step S211.
Because behind step S202, S204, found out Vopt, only need this moment near a small amount of bias voltage test point the scanning Vopt can obtain optimal bias accurately, thus only need near a small amount of bias voltage test point the scanning Vopt this moment, through test speed.
S209: continue scan A PD bias voltage, a spot of several bias voltage test points get final product near only needing this moment to scan Vopt, like Vopt+0.4V, and Vopt+0.2V; Vopt, Vopt-0.2V, Vopt-0.4V; Vopt-0.6V finds out in the above-mentioned bias voltage test point, the bias voltage that minimum BER is corresponding; That is,, get into step S211 with obtaining the optimal bias Vopt ' that optimal bias is revised as this step gained among the step S203.
S210: obtaining APD best effort bias voltage is Vopt-0.5V.
It should be stressed that optimal bias described in this specification is not an APD best effort bias voltage, APD best effort bias voltage is on the basis of optimal bias, to deduct 0.5V, i.e. APD best effort bias voltage=optimal bias-0.5V.Consider that ROSA uses after the long-distance optical fiber transmission and LOS judges; And the deviation of optimum sensitivity and the M factor=10 in the ROSA actual production; Confirm APD best effort bias voltage=optimal bias-0.5V; Further improve the accuracy of APD best effort bias voltage, under this APD best effort bias voltage, the APD performance is better.
S211: obtaining APD best effort bias voltage is Vopt '-0.5V.
The excellent algorithm of accent of avalanche photodide best effort bias voltage of the present invention; Through automatic adjustment input optical power; Make that different APD all are the optimal bias that under big bit error rate (BER), find in the optimal bias scanning process; Near the bit error rate (BER) of optimal bias, testing differs the accuracy of having guaranteed scanning more greatly, thereby finds out every APD best effort bias voltage accurately, obtains optimum sensitivity.
Disclosed arbitrary characteristic in this specification (comprising any accessory claim, summary and accompanying drawing) is only if special narration all can be replaced by other equivalences or the alternative features with similar purpose.That is, only if special narration, each characteristic is an example in a series of equivalences or the similar characteristics.
The present invention is not limited to aforesaid embodiment.The present invention expands to any new feature or any new combination that discloses in this manual, and the arbitrary new method that discloses or step or any new combination of process.
Claims (9)
1. the excellent algorithm of accent of an avalanche photodide best effort bias voltage is characterized in that, this transfers excellent algorithm to comprise the steps:
The first step: confirm optimum input optical power;
Second step: under optimum input optical power, scan A PD bias voltage, the bias voltage corresponding up to minimum BER is APD best effort bias voltage.
2. the excellent algorithm of accent of avalanche photodide best effort bias voltage as claimed in claim 1 is characterized in that, confirms in the said first step that optimum input optical power comprises step:
APD bias voltage initial value Vapd0 and input optical power initial value are set;
Keep bias voltage Vapd0, adjust input optical power automatically, up to bit error rate (BER) BER in standard BER scope.
3. the excellent algorithm of accent of avalanche photodide best effort bias voltage as claimed in claim 2 is characterized in that said standard BER scope is: BER>=5E-04 and BER≤5E-03.
4. the excellent algorithm of accent of avalanche photodide best effort bias voltage as claimed in claim 2 is characterized in that the method for said automatic adjustment input optical power is:
Current input power=initial input luminous power;
Under bias voltage initial value Vapd0 and current input optical power, carry out the BER test, if BER>5E-03, then increase input optical power gradually, until BER≤5E-03; If<5E-04 reduces input optical power, until BER>=5E-04 to BER gradually.
5. the excellent algorithm of accent of avalanche photodide best effort bias voltage as claimed in claim 4; It is characterized in that, if BER 5E-03, increase input optical power gradually; Concrete operations until BER≤5E-03 are: current input optical power=current input optical power+luminous power stepping; Under bias voltage initial value Vapd0 and current input optical power, carry out the BER test, if BER>5E-03, then this operation is carried out in circulation;
If BER is<5E-04; Reduce input optical power gradually; Concrete operations until BER>=5E-04 are: current input optical power=current input optical power-luminous power step-length; Under bias voltage initial value Vapd0 and current input optical power, carry out the BER test, if<5E-04, then this operation is carried out in circulation to BER.
6. the excellent algorithm of accent of avalanche photodide best effort bias voltage as claimed in claim 5 is characterized in that, said luminous power stepping is 0.2dbm or 0.5dbm or 1dbm.
7. the excellent algorithm of accent of avalanche photodide best effort bias voltage as claimed in claim 5 is characterized in that said luminous power step-length is variable, and to depart from 5E-04 far away more along with BER, and luminous power step-length value is big more.
8. the excellent algorithm of accent of avalanche photodide best effort bias voltage as claimed in claim 1 is characterized in that, said second the step under optimum input optical power, scan A PD bias voltage, the step of finding out APD best effort bias voltage comprises:
Step a: Vapd1=Vapd0-bias adjustment value is set;
Step b: scan A PD bias voltage, carry out the BER test;
Step c: if BER_Vapd1＜BER_Vapd0 then reduces the APD bias voltage gradually, until finding out the corresponding optimal bias Vopt of minimum BER; If BER_Vapd1＞BER_Vapd0 then increases the APD bias voltage gradually, until finding out the corresponding optimal bias Vopt of minimum BER, wherein, corresponding BER when corresponding BER when BER_Vapd1 representes that bias voltage is Vapd1, BER_Vapd0 represent that bias voltage is Vapd0.
9. the excellent algorithm of accent of avalanche photodide best effort bias voltage as claimed in claim 8 is characterized in that, bias adjustment value described in the said step a is 0.2V or 0.4V or 0.6V or 1V.
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105049202A (en) * | 2015-08-19 | 2015-11-11 | 安徽问天量子科技股份有限公司 | Method and device for dynamically adjusting defector drift in quantum key distribution system |
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| CN111385023A (en) * | 2020-03-02 | 2020-07-07 | 成都优博创通信技术股份有限公司 | Optical module debugging device and debugging method |
| CN113064044A (en) * | 2021-03-31 | 2021-07-02 | 南通中瑞通信科技有限公司 | Novel APD correction algorithm |
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