CN111385023A - Optical module debugging device and debugging method - Google Patents
Optical module debugging device and debugging method Download PDFInfo
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- CN111385023A CN111385023A CN202010134289.1A CN202010134289A CN111385023A CN 111385023 A CN111385023 A CN 111385023A CN 202010134289 A CN202010134289 A CN 202010134289A CN 111385023 A CN111385023 A CN 111385023A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
- H04B10/0795—Performance monitoring; Measurement of transmission parameters
- H04B10/07953—Monitoring or measuring OSNR, BER or Q
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/60—Receivers
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Abstract
The invention discloses an optical module debugging device and a debugging method, wherein the method comprises the following steps: establishing a mathematical model, and confirming that the initial value of the reverse voltage Vapd applied to the APD is in a low-voltage area; reducing the error rate range required by the light reaching sensitivity test system under the initial value of Vapd; increasing the voltage by a certain step according to the initial value of Vapd to obtain the corresponding error rate until the error rate is greater than the previous point; performing two-term fitting on the obtained points, wherein the symmetry axis is close to the optimal point, and repeating the steps for one iteration for the high-rate module by using the result of the step S4 as an initial value; the debugging method of the optical module debugging device can accurately find the optimal value of the Vapd. The Vbr-X can be used as an initial value to ensure debugging precision and efficiency, and the initial value can be adjusted twice to be optimized by fitting and iterating to Vapd without being bound by the Vbr-X; by configuring the corresponding steps, the method can meet the debugging production of various speed optical modules using APDs as receiving ends.
Description
Technical Field
The invention specifically relates to the technical field of optical module debugging, in particular to an optical module debugging device and a debugging method.
Background
In the production process of the optical module using the APD as the receiving end, the optimal working point of the APD is set to ensure that the receiving end sensitivity and overload of more optical modules meet the requirement of a customer index. Usually, an optimal operating point of the APD is set to be closely connected with a breakdown voltage Vbr of the APD (Vapd ═ Vbr-X), Vbr-X is used as an initial value in the existing optical module debugging method, a certain voltage step test sensitivity is used, the optimal voltage cannot be accurately positioned, Vbr-X is used as an initial value in the existing optical module debugging method, the voltage test sensitivity is reduced firstly by a certain voltage step to prevent the APD from being damaged, and the voltage test is continuously increased after the test fails. As the sensitivity of APD of each batch of product incoming materials is different, once Vbr-X deviates from an empirical value greatly, and the sensitivity of APD is poor, a defective product is easy to generate and cannot be automatically maintained, and in the traditional application, if Vapd optimally utilizes Vbr-X as an initial value to perform polling test at 0.5V in voltage [ -1,1 ];
in the test, the sensitivity of the Vapd at low voltage is preferentially tested, so that the sensitivity of the high-speed optical module is relatively low as the whole, defective products are easily generated due to small margin of the high-speed optical module, and once a certain batch of Vbr-X is relatively discrete, the yield of production is rapidly reduced.
Due to the fact that the sensitivity of each APD is different, once Vbr-X deviates from an empirical value greatly, and meanwhile, the sensitivity of the APD is poor, defective products are easy to generate, production needs to spend much time for debugging the optimal yield, and production efficiency is low, so that another accurate and efficient debugging method with high universality and good consistency is needed.
Disclosure of Invention
The present invention is directed to overcome the above problems in the conventional technologies, and provides an optical module debugging apparatus and a debugging method.
In order to achieve the technical purpose and achieve the technical effect, the invention is realized by the following technical scheme:
an optical module debugging device adopting APD as a receiving end comprises an optical module component and a sensitivity testing module, wherein the optical module component comprises a microprocessor, a voltage boosting circuit and an APD receiver, the microprocessor sets an APD _ DAC value to pass through the voltage boosting circuit, the voltage boosting circuit outputs Vapd voltage to the APD receiver so as to control APD gain, the sensitivity testing module transmits a total code through a transmitting end, then reduces the number of transmission codes through APD photoelectric conversion to obtain an error rate, observes the error rate of a sensitivity system under each Vapd gain, and establishes a model of Vapd and the error rate to obtain the Vapd value.
The debugging method of the optical module debugging device comprises the following steps:
step S1: establishing a mathematical model for the relationship between Vapd and the error rate, wherein the model formula is as follows: y is ax2+ bx + c, where y is the bit error rate, x is the Vapd voltage value, and a, b, c are floating point numbers;
step S2: confirming that the initial value of the reverse voltage Vapd applied to the APD is in the low-voltage region;
step S3: reducing the error rate range required by the light reaching sensitivity test system under the initial value of Vapd;
step S4: increasing the voltage by a certain step according to the initial value of Vapd to obtain the corresponding error rate until the error rate is greater than the previous point;
step S5: and (4) performing point binomial fitting, namely, enabling the symmetry axis to be close to the optimal point, and repeating the steps S1, S2, S3 and S4 once for the high-rate module by using the result of the step S4 as an initial value.
Further, the initial value of the reverse voltage Vapd is added to the APD to be a typical value provided by a manufacturer, and then whether the APD is in a low-voltage region is judged to prevent the APD device from being damaged.
Further, in the step S3, the error rate range is required to be adjusted according to different module types.
Further, if the module type cannot reach the error rate range, the test rate is modified to reach the error rate range.
Furthermore, the high-voltage area data are added according to the low-voltage area data amount when the point acquisition is stopped under the point acquisition ending condition, and the accuracy of the fitting result is ensured.
The benefit effects of the invention are:
the optical module debugging device has reasonable structural design, the debugging method can accurately find the optimal value of Vapd, not only can ensure the debugging precision and efficiency by using Vbr-X as an initial value, but also can automatically adjust the initial value twice to carry out fitting iteration to the optimal value of Vapd without being bound by the Vbr-X, and the debugging method of the optical module debugging device can meet the debugging production of optical modules with various rates by using APD as a receiving end through configuring corresponding steps.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a working schematic diagram of an optical module according to the present invention;
FIG. 2 is a diagram of a vapd two-fit trajectory of the present invention;
in the drawings, the parts are numbered as follows:
1-optical module component, 101-microprocessor, 102-boosted voltage circuit, 103-APD receiver, 2-sensitivity test module.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1-2, this embodiment is an optical module debugging apparatus using APD as a receiving end, including an optical module assembly 1 and a sensitivity test module 2, where the optical module assembly 1 includes a microprocessor 101, a voltage boosting circuit 102 and an APD receiver 103, the microprocessor 1 sets an APD _ DAC value to pass through the voltage boosting circuit 102, the voltage boosting circuit 102 outputs Vapd voltage to the APD receiver 103 to control APD gain, the sensitivity test module 2 transmits a total code through a transmitting end, and then reduces the number of transmission codes through APD photoelectric conversion to obtain an error rate, observes the error rate of a sensitivity system under each Vapd gain, and establishes a model of Vapd and error rate to obtain a Vapd value.
The embodiment also provides a debugging method of the optical module debugging device, which comprises the following steps:
step S1: establishing a mathematical model for the relationship between Vapd and the error rate, wherein the model formula is as follows:
y＝ax2+ bx + c, where y is the bit error rate, x is the Vapd voltage value, and a, b, c are floating point numbers; vapd is best when the ratio is-b/2 a.
Step S2: confirming that the initial value of the reverse voltage Vapd applied to the APD is in the low-voltage region;
step S3: reducing the error rate range required by the light reaching sensitivity test system under the initial value of Vapd;
step S4: increasing the voltage by a certain step according to the initial value of Vapd to obtain the corresponding error rate until the error rate is greater than the previous point;
step S5: and (4) performing point binomial fitting, namely, enabling the symmetry axis to be close to the optimal point, and repeating the steps S1, S2, S3 and S4 once for the high-rate module by using the result of the step S4 as an initial value.
In this embodiment, the initial value of the reverse voltage Vapd is added to the APD to determine whether the APD is in the low voltage region after the initial value is the typical value provided by the manufacturer, so as to prevent the APD device from being damaged and matched.
In this embodiment, the error rate range is required to be adjusted according to different module types, and if the module type cannot reach the error rate range, the test rate is modified to reach the error rate range.
In this embodiment, the high-pressure area data is added according to the low-pressure area data amount when the point acquisition is finished, so that the accuracy of the fitting result is ensured.
One specific application of this embodiment is: a mathematical model is adopted to confirm that the initial value of the reverse voltage Vapd applied to the APD is in a low-voltage area; reducing the error rate range required by the light reaching sensitivity test system under the initial value of Vapd; increasing the voltage by a certain step according to the initial value of Vapd to obtain the corresponding error rate until the error rate is greater than the previous point; and (3) performing point binomial fitting, namely, enabling the symmetry axis to be close to an optimal point, repeating the steps S1, S2, S3 and S4 once for the high-speed module by using the result of the step S4 as an initial value, setting the APD _ DAC value by the microprocessor, outputting Vapd voltage to control APD gain through the booster circuit, transmitting a total code by the sensitivity test system through a transmitting end, restoring the number of the transmission codes through APD photoelectric conversion to obtain an error rate, observing the error rate of the sensitivity system under each Vapd gain, and establishing a model of Vapd and the error rate to obtain the Vapd value.
The optical module debugging device in the embodiment has reasonable structural design, the debugging method can accurately find the optimal value of Vapd, not only can ensure the debugging precision and efficiency by using Vbr-X as an initial value, but also can adjust the initial value twice to perform fitting iteration to the optimal value of Vapd without being bound by the Vbr-X, and the debugging method of the optical module debugging device can meet the debugging production of various speed optical modules using APD as a receiving end by configuring corresponding steps.
In the description herein, references to the description of "one embodiment," "an example," "a specific example" or the like are intended to mean that a particular feature, structure, material, or the like described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
The preferred embodiments of the invention disclosed above are intended to be illustrative only. The preferred embodiments are not intended to be exhaustive or to limit the invention to the precise embodiments disclosed. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and the practical application, to thereby enable others skilled in the art to best utilize the invention. The invention is limited only by the claims and their full scope and equivalents.
Claims (7)
1. An optical module debugging device using APD as receiving end is characterized in that: the device comprises an optical module component (1) and a sensitivity test module (2), wherein the optical module component (1) comprises a microprocessor (101), a boost voltage circuit (102) and an APD receiver (103), the microprocessor (1) sets an APD _ DAC value to pass through the boost circuit (102), the boost circuit (102) outputs Vapd voltage to the APD receiver (103) so as to control APD gain, the sensitivity test module (2) transmits a total code through a transmitting end, obtains an error rate through APD photoelectric conversion reduction transmission code number, observes the error rate of a sensitivity system under each Vapd gain, and establishes a model of the Vapd and the error rate to obtain the Vapd value.
2. A debugging method for an optical module debugging apparatus according to claim 1, comprising the steps of:
step S1: establishing a mathematical model for the relationship between Vapd and the error rate, wherein the model formula is as follows: y is ax2+ bx + c, where y is the bit error rate, x is the Vapd voltage value, and a, b, c are floating point numbers;
step S2: confirming that the initial value of the reverse voltage Vapd applied to the APD is in the low-voltage region;
step S3: reducing the error rate range required by the light reaching sensitivity test system under the initial value of Vapd;
step S4: increasing the voltage by a certain step according to the initial value of Vapd to obtain the corresponding error rate until the error rate is greater than the previous point;
step S5: and (4) performing two-term fitting on the acquired points, wherein the symmetry axis Vapd is-b/2 a, namely the point is close to the optimal point, and repeating the steps S1, S2, S3 and S4 once for the high-rate module by using the result of the step S4 as an initial value.
3. A debugging method for an optical module debugging apparatus according to claim 2, characterized in that: vapd ═ b/2 a.
4. A debugging method for an optical module debugging apparatus according to claim 2, characterized in that: in step S2, the initial value of the reverse voltage Vapd is added to the APD to determine whether the APD is in the low voltage region, so as to prevent the APD device from being damaged.
5. A debugging method for an optical module debugging apparatus according to claim 2, characterized in that: in step S3, the error rate range is required to be adjusted according to different module types.
6. A debugging method for an optical module debugging apparatus according to claim 2, characterized in that: in step S3, if the module type cannot reach the ber range, the test rate is modified to reach the ber range.
7. A debugging method for an optical module debugging apparatus according to claim 2, characterized in that: in step S4, the point-taking end condition adds the high-pressure area data according to the low-pressure area data amount at the time of stopping, so as to ensure the accuracy of the fitting result.
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| CN202010134289.1A CN111385023A (en) | 2020-03-02 | 2020-03-02 | Optical module debugging device and debugging method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN115833941A (en) * | 2023-01-10 | 2023-03-21 | 中天通信技术有限公司 | DWDM optical module APD debugging method, electronic equipment and computer readable storage medium |
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