CN102394694A - RSSI (received signal strength indicator) monitoring circuit with high sampling accuracy - Google Patents
RSSI (received signal strength indicator) monitoring circuit with high sampling accuracy Download PDFInfo
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Abstract
The invention discloses an RSSI (received signal strength indicator) monitoring circuit with high sampling accuracy. The one path of existing RSSI monitoring circuit is divided into a high light path and a low light path which are used for aiming at high light up signals and low light up signals so as to carry out RSSI sampling, sampling values are corresponded to calibration values in lookup tables according to a high light lookup table and a low light lookup table, and finally the up light power can be obtained by compassion and processing, so that the sampling accuracy is effectively improved; simultaneously circuit configurations of a high light path and a low light path are different, so that the problem in the prior art that a same monitoring circuit can not simultaneously realize applying environment requirements of up signals with different powers, thus further improving the sampling accuracy; and the sampling accuracy is further improved by high light lookup table and the low light lookup table with determined ranges, hysteresis regions, calibration value intervals being 0.5dbm, and the like, so as to finally achieve high industrial requirements of sampling accuracy being plus and minus1dB.
Description
Technical field
The present invention relates to optical communication field, relate in particular to a kind of RSSI observation circuit of the OLT of raising optical module RSSI sampling precision.
Background technology
GEPON (Gigabit Ethernet Passive Optical Network gigabit ethernet passive optical network) is a kind of fiber optic network of at present tool development prospect, is made up of OLT (Optical Line Terminal optical line terminal), ONT (Optical Network Terminal ONT Optical Network Terminal) and optical distribution network.The mode of operation of GEPON is asynchronous time division multiple access pattern, and in uplink service, the OLT system gives the time slot of a transmission of each user data, sends upstream data by ONT to OLT.Because of the mode of operation of time division multiple access,, form by bursty data one by one so its upstream data is discontinuous.The GEPON system is because the position of each ONT is different, distance is different, the optical link state is different; Therefore the loss in its optical fiber is just different; Because each packet all is to be carrier with the light signal in fiber optic network, thereby each packet luminous power different sizes that causes OLT to receive.This just requires OLT that the uplink burst light signal is carried out the monitoring of luminous power, notes abnormalities and can alarm.OLT equipment can be divided into optical-electric module and two parts of system's host computer, and optical-electric module is accomplished the conversion of photosignal, and the monitoring and the alarm of photoelectric properties are provided simultaneously.Prior art is monitored the luminous power size of the burst upstream data bag that receives and the pilot signal that produces is RSSI (indication of a Received Signal Strength Indication receiving end signal intensity) signal.
OLT equipment can be divided into optical-electric module and two parts of system host, and optical-electric module is accomplished the conversion of photosignal, and the monitoring and the alarm of photoelectric properties are provided simultaneously, comprises the burst luminous power size of utilizing the RSSI judgement to receive.The scope of in the IEEE802.3ah agreement, clearly having stipulated monitor power is controlled at-6dbm to-30dbm perhaps-31dbm.Along with the continuous development of optical module, the performance of itself is constantly being optimized, and client's index is also constantly improving.For example " EPON of China Telecom equipment and technology require V2.1 " increased the regulation of " received optical power of OLT detects " on the basis of V2.0 version: " OLT should support the measurement function from the up average light power of each ONU that it is received, is not inferior to ± 1dB to the certainty of measurement the in-10dbm scope at-30dbm ".For example Huawei requires technical grade EPON OLT optical module in-40 ℃ to 85 ℃ scope again, accomplishes that RSSI monitoring precision is ± 1dB.
The OLT optical module of EPON OLT 1.25Gbps speed can only be accomplished under the technical grade standard ± 2dB now, and this is because the hardware designs of module itself causes, and wants to guarantee low cost, will inevitably can sacrifice to some extent the precision of RSSI monitoring.For reaching ± RSSI of 2dB monitoring precision, the RSSI observation circuit is all as shown in Figure 1 in the prior art.The principle of entire circuit is: after APD (Avalanche Photodiode, avalanche photodide) received the burst uplink optical signal, APD converted this light signal into the current signal that is directly proportional with the power of the uplink optical signal that happens suddenly; After trans-impedance amplifier receives this current signal, convert this current signal into voltage signal and outwards export; Then sampling hold circuit keeps this voltage signal to handle as the RSSI signal; Analog to digital converter among the MCU (Analog-to-Digital Converter is hereinafter to be referred as ADC) is sampled to the RSSI voltage of signals, and converts the aanalogvoltage of this RSSI signal into digital signal, and this digital signal is called as sampled value.How many luminous powers are a sampled value represent actually, in MCU inside through set one with sampled value one to one look-up table confirm.Look-up table is to let the sampling gradually successively from luminous power-6dbm to luminous power-32dbm of whole RSSI observation circuit, obtains according to the corresponding relation of luminous power and the sampled value of emission.Last MCU in register, is read the luminous power value storage that obtains by OLT system host computer, accomplish the testing of luminous power.
Such hardware designs owing to receive the restriction of internal integrated circuit device such as self characters such as amplifier, switch chip, often is difficult to take into account simultaneously the different application environmental requirement of high light upward signal and low light level upward signal.Again because the interference of peripheral circuits etc., it is identical the electric current that APD produces to occur, and the RSSI signal voltage that sampling hold circuit keeps is condition of different but.Experiment finds in the low light level, for example-29dbm ,-30dbm and-31dbm, such situation is especially common.Simultaneously because the fluctuation of luminous power is normal distribution basically, and it is far away more to depart from the basic frequency of normal distribution, and the resultant error of utilizing look-up table to obtain is big more.Having the prior art of being exactly to receive again can not filter out noise and technical grade Influence of Temperature; Cause the RSSI sampling precision also can only accomplish ± 2dB; And then make in the prior art according to luminous power and sampled value one by one the look-up table of the MCU of corresponding naturally formation be to be unit basically with 2dB, can't accomplish ± precision of 1dB.
Summary of the invention
To the problems referred to above, the object of the present invention is to provide a kind of RSSI observation circuit that can sample to the RSSI signal with high accuracy more.
The object of the invention is accomplished through following technical scheme: a kind of RSSI observation circuit of high sampling precision, comprise APD, MCU, register, and also comprise circuit mirror current, high light road, low light level road; Circuit mirror current receives the current signal from APD, and exports the image current signal identical with the APD current signal to the high light road simultaneously respectively with low light level road; Said high light road comprises the high light ADC that high light trans-impedance amplifier, high light sampling hold circuit and MCU provide; The high light trans-impedance amplifier will be the high light voltage signal from the image current conversion of signals of APD and amplify; The high light sampling hold circuit keeps handling to the high light voltage signal; High light ADC converts the high light voltage signal into the high light digital signal, and the MCU high light look-up table that high light digital signal and MCU is inner compares and obtains high light luminous power numerical value; Said low light level road comprises the low light level ADC that low light level trans-impedance amplifier, low light level sampling hold circuit and MCU provide; Low light level trans-impedance amplifier will be low light level voltage signal from the image current conversion of signals of APD and amplify; Low light level sampling hold circuit keeps handling to low light level voltage signal; Low light level ADC converts low light level voltage signal into low light level digital signal, and MCU obtains low light level luminous power numerical value with low light level digital signal and the inner low light level look-up table contrast of MCU; After MCU compares processing to high light luminous power numerical value and low light level luminous power numerical value, deposit the numerical value of luminous power as a result that obtains in register and keep supplying machine-readable the getting in position.
Further, the gain of said high light trans-impedance amplifier stride the resistance be that 200 Europe are to 600 Europe.It is less relatively that resistance is striden in the gain of high light trans-impedance amplifier, can prevent because of the high light current gain excessively, causes high light trans-impedance amplifier output saturated, makes the situation of dropout.
Further again, it is that 800 Europe are to 2000 Europe that resistance is striden in the gain of said low light level trans-impedance amplifier.It is relatively large that resistance is striden in the gain of low light level trans-impedance amplifier, can effectively amplify low light level electric current, thereby make follow-up circuit more accurate to the RSSI signals collecting of the low light level.
In addition further, the seek scope of said high light look-up table is to be limited to n dbm on the high light, and n is a real number and greater than low light level lower limit; The seek scope of said low light level look-up table for m dbm to low light level lower limit, m is a real number and less than the high light upper limit.High light look-up table and low light level look-up table each have different seek scopes corresponding to high light road and low light level road different circuits characteristic, can effectively prevent to depart from the main power situation that mistake is big more more and take place, thereby can confirm optical power value more accurately.
Further again, m is more than or equal to n, and m dbm is that hysteresis is interval to n dbm.The interval setting of hysteresis can let two lookup results contrast mutually, makes the luminous power numerical value that obtains after searching more accurate.
Also further, be spaced apart 0.5dbm between the adjacent calibration value of said high light look-up table and low light level look-up table.Every at a distance from calibration value of 0.5dbm setting, can confirm luminous power numerical value more accurately.
Beneficial effect of the present invention is: the present invention is through being divided into high light road and low light level road with original one road RSSI observation circuit; Carry out the RSSI sampling to high light upward signal and low light level upward signal respectively; And come the calibration value in corresponding RSSI sampled value and the look-up table according to high light look-up table and low light level look-up table respectively; Compare processing at last and obtain up luminous power size, can effectively improve sampling precision; The high light road is different with the circuit arrangement on low light level road simultaneously, can effectively avoid the same road of prior art observation circuit can't take into account applied environment requirement under the upward signal of different capacity, thereby further improve sampling precision; Also through confirming the high light look-up table and the low light level look-up table of seek scope respectively, hysteresis is interval, and sampling precision is further improved at the calibration value interval of 0.5dbm etc., finally reaches the high industrial requirements of sampling precision ± 1dB.
Description of drawings
Fig. 1 is a RSSI observation circuit structured flowchart in the prior art;
Fig. 2 is the circuit structure block diagram of specific embodiment of the present invention.
Embodiment
Disclosed all characteristics in this specification, or the step in disclosed all methods or the process except mutually exclusive characteristic and/or the step, all can make up by any way.
Disclosed arbitrary characteristic in this specification (comprising any claim, summary and accompanying drawing) is only if special narration all can be replaced by other equivalences or the alternative features with similar purpose.That is, only if special narration, each characteristic is an example in a series of equivalences or the similar characteristics.The description to alternative features is to being equal to the description of technical characterictic, must not being regarded as the donation to the public in this specification simultaneously.
Term in this specification (comprising any claim, summary and accompanying drawing) like no specified otherwise, all is defined as the peculiar implication in this area if having the peculiar implication of general sense and this area simultaneously.
As shown in Figure 2, be the circuit structure block diagram of the specific embodiment of the invention.APD receives the burst uplink optical signal, and sends the current signal that is directly proportional with the uplink optical signal luminous power; Circuit mirror current receives this current signal, and exports the image current signal identical with the APD current signal to the high light road simultaneously respectively with low light level road.
The high light ADC that said high light route high light trans-impedance amplifier, high light sampling hold circuit and MCU provide forms; The high light trans-impedance amplifier will be the high light voltage signal from the image current conversion of signals of APD and amplify; The high light sampling hold circuit keeps handling to the high light voltage signal; After high light ADC gathers the high light voltage signal in the high light sampling hold circuit; Convert this high light voltage signal that exists with the aanalogvoltage form into exist with the bit stream form high light digital signal, MCU obtains high light luminous power numerical value with high light digital signal and the inner high light look-up table contrast of MCU.
The course of work basically identical on low light level road and high light road; The low light level ADC that said low light level route low light level trans-impedance amplifier, low light level sampling hold circuit and MCU provide forms; Low light level trans-impedance amplifier will be low light level voltage signal from the image current conversion of signals of APD and amplify; Low light level sampling hold circuit keeps handling to low light level voltage signal; Low light level ADC converts low light level voltage signal into low light level digital signal, and MCU obtains low light level luminous power numerical value with low light level digital signal and the inner low light level look-up table contrast of MCU.
After MCU compares processing to high light luminous power numerical value and low light level luminous power numerical value, deposit the numerical value of luminous power as a result that obtains in register and keep supplying machine-readable the getting in position.Here so-called " contrast processing "; Owing to hardware circuit and look-up table itself are not done too many change; So directly high light luminous power numerical value and the addition of low light level luminous power numerical value are got final product divided by 2 again; So can reduce the interference of the noise signal that carries because of IC-components itself, can improve the sampling precision of RSSI effectively.
According to one embodiment of present invention,,, can produce the gain saturation phenomenon of trans-impedance amplifier, cause losing the high light upward signal such as if gain is too big because high light road and low light level road are faced with the different application environments requirement.So-called gain saturation; Be meant that trans-impedance amplifier itself has the limit of gain; If the luminous power of uplink optical signal own is just big, cause the photoelectric current of APD also big, the high light photoelectric current of same multiplication factor then should be arranged with lower-powered photoelectric current in theory; In fact surpassed the limit of trans-impedance amplifier and can't realize that last part high light photoelectric current and more weak high light photoelectric current are converted into the phenomenon of voltage signal of a size.Simultaneously, if gain is too little, low light level upward signal probably is submerged in again among the industrial noise signal of circuit and surrounding environment generation, can't differentiate.The gain resistor of the trans-impedance amplifier of Gu Qiangguanglu is selected the resistance of 200 Europe to 600 Europe, can effectively prevent the gain saturation phenomenon; The gain resistor of the trans-impedance amplifier on low light level road selects 800 Europe to 2000 Europe simultaneously, can effectively amplify low light level signal; Realized taking into account the purpose of different application environmental requirement thus.Low light level gain as for the high light road is little, and the high light on low light level road has problems such as gain saturation, because the high light road does not concern the low light level, high light is indifferent on low light level road, so can not exert an influence.
According to still another embodiment of the invention, the seek scope of said high light look-up table is to be limited to n dbm on the high light, and n is a real number and greater than low light level lower limit; The seek scope of said low light level look-up table for m dbm to low light level lower limit, m is a real number and less than the high light upper limit.M is more than or equal to n, and m dbm is that hysteresis is interval to n dbm.Be spaced apart 0.5dbm between the adjacent calibration value of said high light look-up table and low light level look-up table, calibration value is used for the optical power value that sampling obtains to ADC and calibrates.
By way of example, the optical power monitoring scope of some industrial requirements RSSI observation circuits is-6dbm is to-32dbm, then is limited on the high light-6dbm, be limited under the low light level-32dbm.Artificially setting m then is-16, and n is-18, then the seek scope of high light look-up table be-6dbm is to-18dbm; The seek scope of low light level look-up table is-16dbm is to-32dbm;-16dbm is that hysteresis is interval to-18dbm.Simultaneously the calibration value of look-up table is spaced apart 0.5dbm, promptly on the high light look-up table calibration value be respectively-6dbm ,-6.5dbm.。。。。-17.5dbm ,-18dbm, low light level look-up table and hysteresis interval are by that analogy.
The effect that hysteresis is interval, the one, can make two look-up tables compare the raising precision as same range as, the 2nd, can be used as the result who is determined to end employing high light look-up table still is the foundation of low light level look-up table.The hysteresis interval can be through striding resistance, the APD responsiveness, and the input light intensity waits and calculates.For example 1.25Gbps speed and reception wavelength are in the optical module of 1310nm, APD responsiveness Re >=0.92A/w, it is R1 that resistance is striden in the high light gain; It is R2 that resistance is striden in low light level gain, input range of light intensity-6dbm ~-32dbm, then according to formula 10logmw=dbm; Can calculate-6dbm ~-power that 32dbm is corresponding; Can calculate photoelectric current I=Re*mw*10^-3 according to responsiveness again, circuit mirror current is two-way output, supposes that high light road ratio is X:1; Low light level road is Y:1, again by formula V1=2.5-I/X*R1*10^3; V2=2.5-I/Y*R2*10^3 can obtain the sampled voltage distribution of the low light level to high light, and its part that overlaps is the hysteresis interval.
The search procedure of MCU is following in the present embodiment: when uplink optical signal was imported, through the processing of preorder circuit, high light ADC can generate high light optical power value a, and low light level ADC can generate low light level optical power value b.MCU acquiescence at first with the n value of a and high light look-up table promptly-18dbm compares, < 18dbm then directly deposits b in register, the flow process end as if this a.If this a >-18dbm, then MCU with the m value of this a and low light level look-up table be again-16dbm compares, see whether in the hysteresis interval; If-16dbm >=a=-18dbm, then let a, that b looks for nearest calibration value to do respectively in the hysteresis interval is poor, get again and the minimum optical power value of the absolute value of the difference of calibration value optical power value as a result of; Such as if a=-16.28dbm, b=-17.1dbm, then a with-16.5dbm is the most approaching; Absolute value is 0.22dbm, b with-17dbm is the most approaching, absolute value is 0.1dbm; Comprehensively get off, the absolute value of the difference of b and calibration value is minimum, and then MCU deposits b in register.At last, if a >-16dbm, then MCU directly deposits a in register, and flow process finishes.
The look-up table that so is provided with cooperates high light road and low light level road, can effectively improve the sampling precision of RSSI, makes it to reach ± the high industrial requirements of 1dB.
Claims (6)
1. the RSSI observation circuit of a high sampling precision comprises APD, MCU, register, it is characterized in that:
Also comprise circuit mirror current, high light road, low light level road;
Circuit mirror current receives the current signal from APD, and exports the image current signal identical with the APD current signal to the high light road simultaneously respectively with low light level road;
Said high light road comprises the high light ADC that high light trans-impedance amplifier, high light sampling hold circuit and MCU provide; The high light trans-impedance amplifier will be the high light voltage signal from the image current conversion of signals of APD and amplify; The high light sampling hold circuit keeps handling to the high light voltage signal; High light ADC converts the high light voltage signal into the high light digital signal, and the MCU high light look-up table that high light digital signal and MCU is inner compares and obtains high light luminous power numerical value;
Said low light level road comprises the low light level ADC that low light level trans-impedance amplifier, low light level sampling hold circuit and MCU provide; Low light level trans-impedance amplifier will be low light level voltage signal from the image current conversion of signals of APD and amplify; Low light level sampling hold circuit keeps handling to low light level voltage signal; Low light level ADC converts low light level voltage signal into low light level digital signal, and MCU obtains low light level luminous power numerical value with low light level digital signal and the inner low light level look-up table contrast of MCU;
After MCU compares processing to high light luminous power numerical value and low light level luminous power numerical value, deposit the numerical value of luminous power as a result that obtains in register and keep supplying machine-readable the getting in position.
2. according to the RSSI observation circuit of the said high sampling precision of claim 1, it is characterized in that:
It is that 200 Europe are to 600 Europe that resistance is striden in the gain of said high light trans-impedance amplifier.
3. according to the RSSI observation circuit of the said high sampling precision of claim 1, it is characterized in that:
It is that 800 Europe are to 2000 Europe that resistance is striden in the gain of said low light level trans-impedance amplifier.
4. according to the RSSI observation circuit of the said high sampling precision of claim 1, it is characterized in that:
The seek scope of said high light look-up table is to be limited to n dbm on the high light, and n is a real number and more than or equal to low light level lower limit;
The seek scope of said low light level look-up table for m dbm to low light level lower limit, m is a real number and smaller or equal to the high light upper limit.
5. according to the RSSI observation circuit of the said high sampling precision of claim 4, it is characterized in that:
M is more than or equal to n, and m dbm is that hysteresis is interval to n dbm.
6. according to the RSSI observation circuit of the said high sampling precision of claim 4, it is characterized in that:
Be spaced apart 0.5dbm between the adjacent calibration value of said high light look-up table and low light level look-up table.
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| CN106936398A (en) * | 2017-02-27 | 2017-07-07 | 烽火通信科技股份有限公司 | A kind of RSSI circuits for trans-impedance amplifier |
| CN108880671A (en) * | 2018-06-20 | 2018-11-23 | 深圳市飞思卓科技有限公司 | The signal loss detection circuit and device of four-way optical module |
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| CN112511221A (en) * | 2020-10-30 | 2021-03-16 | 武汉联特科技股份有限公司 | Method and equipment for improving receiving and reporting monitoring power range of optical module |
| CN112290996A (en) * | 2020-11-05 | 2021-01-29 | 四川天邑康和通信股份有限公司 | Optical attenuator compensation method applied to PON component automatic test system |
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Application publication date: 20120328 |