CN219322399U

CN219322399U - Optical module emission integrated test system and device

Info

Publication number: CN219322399U
Application number: CN202320058392.1U
Authority: CN
Inventors: 王苗庆; 徐华良; 陈志超; 俞国平
Original assignee: Shaoxing Zktel Equipment Co ltd
Current assignee: Shaoxing Zktel Equipment Co ltd
Priority date: 2023-01-09
Filing date: 2023-01-09
Publication date: 2023-07-07
Anticipated expiration: 2033-01-09

Abstract

The utility model relates to an optical module emission integrated test system and device, comprising a first optical splitter, a second optical splitter, an optical attenuator, an amplifier, a CDR detection circuit, an amplitude test circuit, an optical power detector I, an optical power detector II and a controller; the output end of the first optical splitter is respectively connected with the optical input ends of the optical attenuator and the optical power detector II, the optical output end of the optical attenuator is connected with the input end of the second optical splitter, the electric input end of the optical attenuator is connected with the output end of the amplifier, the controller is electrically connected with the amplifier in a bidirectional way, the output end of the second optical splitter is respectively connected with the CDR detection circuit, the amplitude test circuit and the optical input end of the optical power detector I, and the input end of the controller is respectively connected with the CDR detection circuit, the amplitude test circuit, the optical power detector I and the electric output end of the optical power detector II, and the advantages are that: the capability of all-in-one performance test during optical module test emission is solved, the test efficiency is improved, and the cost is reduced.

Description

Optical module emission integrated test system and device

Technical Field

The utility model relates to the technical field of optics, in particular to an optical module emission integrated test system and an optical module emission integrated test device.

Background

Eye diagram and extinction ratio are important test indexes of optical module performance, and eye diagram analysis and extinction ratio test need to use an oscilloscope (eye diagram instrument), for example, in patent CN111934758B, an automatic test method and device for optical module emission optical power and eye diagram are disclosed, and the device needs to use an oscilloscope during test. However, the existing oscilloscopes are monopolized by some enterprises in the united states such as de-tech, tek, and ani, and the cost is very high, and if the optical module test adopts a multi-channel parallel test mode, multiple oscilloscopes need to be used at the same time, so that the test cost is further increased.

In patent CN110057546a, a low-cost simple optical eye extinction ratio measuring method and system are disclosed, the extinction ratio is tested by testing the optical power and the optical modulation amplitude, but the system has the following drawbacks: 1. eye diagram analysis of the emitted light cannot be performed; 2. the wavelength of light cannot be tested.

Based on this, the present application is hereby proposed.

Disclosure of Invention

One of the purposes of the present utility model is to provide an integrated test system for transmitting an optical module, which is used for testing the extinction ratio, the optical power, the wavelength of emitted light and the analysis of the eye pattern of emitted light of the optical module.

In order to achieve the above object, the technical scheme of the present utility model is as follows:

an optical module emission integrated test system comprises a first optical splitter, a second optical splitter, an optical attenuator, an amplifier, a CDR detection circuit, an amplitude test circuit, an optical power detector I, an optical power detector II and a controller;

the input end of the first optical splitter is used for receiving light emitted by the optical module, the output end of the first optical splitter is connected with the optical input ends of the optical attenuator and the optical power detector II respectively, the optical output end of the optical attenuator is connected with the input end of the second optical splitter, the electric input end of the optical attenuator is electrically connected with the output end of the amplifier, the controller is electrically connected with the amplifier in a bidirectional way, the output end of the second optical splitter is connected with the CDR detection circuit, the amplitude test circuit and the optical input end of the optical power detector I respectively, and the input end of the controller is electrically connected with the CDR detection circuit, the amplitude test circuit, the optical power detector I and the electric output end of the optical power detector II respectively.

Further, the first optical splitter is a 1×2 optical splitter.

Further, the second optical splitter is a 1×3 optical splitter.

Further, the amplitude testing circuit comprises a photoelectric converter and an amplitude chip, wherein the optical input end of the photoelectric converter is connected with the output end of the second optical divider, the electric output end of the photoelectric converter is electrically connected with the input end of the amplitude chip, and the output end of the amplitude chip is electrically connected with the input end of the controller.

Further, the optical switch comprises a wavelength division multiplexer, a 1 XN path optical switch and an optical switch control board, wherein the input end of the wavelength division multiplexer is connected with the output end of the first optical branching device, the output end of the wavelength division multiplexer is connected with the optical input end of the 1 XN path optical switch, the optical output end of the 1 XN path optical switch is connected with the optical input end of the second optical power detector, and the optical switch control board is respectively and bidirectionally electrically connected with the 1 XN path optical switch and the controller.

Further, the 1×n optical switches are 1×8 optical switches.

The second object of the utility model is to provide an optical module emission integrated test device, which comprises a case, wherein the optical module emission integrated test system is arranged in the case.

The utility model has the advantages that:

1. the method solves the problem of the capability of integrated test of each performance during the test and emission of the optical module, including extinction ratio test, optical power size test, emitted light wavelength test and emitted light eye pattern analysis, and simultaneously, the controller reads the analog value of the amplitude chip and converts the analog value into digital value so as to judge the extinction ratio, thereby realizing that the computer control test equipment adjusts the extinction ratio parameter of the tested optical module to a proper range;

2. the system can realize parallel testing of a plurality of channels, and simultaneously test, and can reduce cost, improve efficiency and reduce occupation of production line space by matching with multi-thread software.

Drawings

Fig. 1 is a schematic block diagram of an optical module emission integrated test system in an embodiment.

Detailed Description

The present utility model is described in further detail below with reference to examples.

The embodiment provides an optical module emission integrated test system, as shown in fig. 1, including a first optical splitter, a second optical splitter, an optical attenuator, an amplifier, a CDR detection circuit, a photoelectric converter VPD BOSA, an amplitude chip, an optical power detector one, an optical power detector two, an MCU controller, a CWDM wavelength division multiplexer, a 1×n optical switch and an optical switch control board, where in this embodiment, the first optical splitter is a 1×2 optical splitter, the second optical splitter is a 1×3 optical splitter, and the 1×n optical switch selects a 1×8 optical switch.

The input end of the first optical splitter is used for receiving light emitted by the optical module to be tested, and the output end of the first optical splitter is connected with the optical input end of the optical attenuator and the input end of the CWDM wavelength division multiplexer through optical fibers respectively. The optical output end of the optical attenuator is connected with the input end of the second optical splitter through an optical fiber, the electric input end of the optical attenuator is electrically connected with the output end of the amplifier, and the MCU controller is in bidirectional electric connection with the amplifier. The output end of the second optical divider is respectively connected with the CDR detection circuit, the photoelectric converter and the optical input end of the first optical power detector through optical fibers, and the electric output end of the photoelectric converter is electrically connected with the input end of the amplitude chip. The input end of the MCU controller is electrically connected with the CDR detection circuit, the amplitude chip, the first optical power detector and the second optical power detector respectively. The output end of the wavelength division multiplexer is connected with the optical input end of the 1 XN optical switch through optical fibers, the optical output end of the 1 XN optical switch is connected with the optical input end of the second optical power detector through optical fibers, and the optical switch control board is respectively and electrically connected with the 1 XN optical switch and the MCU controller in a bidirectional mode.

The working principle of the test system is as follows:

s1, a tested optical module works and emits light, the light emitted by the optical module passes through a first optical divider, 50% of light enters an optical attenuator, 50% of light enters a CWDM wavelength division multiplexer, and the input light enters a second optical divider after being attenuated by the optical attenuator;

s2, a part of light is input to the first optical power detector by the second optical splitter, the second optical splitter is used for detecting the optical power of the optical module to be detected, and the optical power is transmitted to the MCU controller; it should be noted that, after the optical module to be tested is replaced, the MCU controller detects that the input optical power is inconsistent (the optical power of different optical modules is inconsistent), and the MCU controller can adjust the fixed attenuation value of the optical attenuator through the amplifier to make the optical attenuation value conform to the current performance of the optical module to be tested;

the second optical splitter inputs a part of light to the CDR detection circuit, and the CDR detection circuit recovers clock data of the light signal and sends the clock data to the MCU for rapidly analyzing the performance of an emitted light eye pattern;

the second optical divider inputs a part of light to the photoelectric converter, the photoelectric converter performs photoelectric conversion on the input light, the amplitude chip reads the electric amplitude of the electric signal output by the photoelectric converter, the MCU controller reads the analog value output by the amplitude chip and converts the analog value into digital value so as to judge the extinction ratio, and the computer control test equipment can be realized to adjust the extinction ratio parameter of the tested optical module to a proper range;

and S3, after the first optical splitter outputs 50% of light to the CWDM wavelength division multiplexer, the MCU controller controls the optical switch control board to switch the 1 XN paths of optical switches, the optical power detector II reads the size of N paths of light (the light output by the optical module to be detected is light compounded with various wavelengths), and the MCU controller reads the data of the largest path of light to distinguish the emission wavelength of the optical module.

The embodiment also provides an optical module emission integrated test device, which comprises a case, wherein the optical module emission integrated test system is arranged in the case, and the shape of the case and the positions of all interfaces on the case can be designed according to actual requirements.

The above embodiments are only for illustrating the concept of the present utility model and not for limiting the protection of the claims of the present utility model, and all the insubstantial modifications of the present utility model using the concept shall fall within the protection scope of the present utility model.

Claims

1. The optical module emission integrated test system is characterized by comprising a first optical splitter, a second optical splitter, an optical attenuator, an amplifier, a CDR detection circuit, an amplitude test circuit, an optical power detector I, an optical power detector II and a controller;

2. An optical module launch integrated test system as recited in claim 1 wherein said first optical splitter is a 1 x 2 optical splitter.

3. An optical module launch integrated test system as recited in claim 1 wherein said second optical splitter is a 1 x 3 optical splitter.

4. The optical module emission integrated test system of claim 1, wherein the amplitude test circuit comprises an optical-to-electrical converter and an amplitude chip, the optical input of the optical-to-electrical converter is connected to the output of the second optical splitter, the electrical output of the optical-to-electrical converter is electrically connected to the input of the amplitude chip, and the output of the amplitude chip is electrically connected to the input of the controller.

5. The optical module emission integrated test system as claimed in claim 1, comprising a wavelength division multiplexer, a 1×n optical switch and an optical switch control board, wherein the input end of the wavelength division multiplexer is connected with the output end of the first optical splitter, the output end of the wavelength division multiplexer is connected with the optical input end of the 1×n optical switch, the optical output end of the 1×n optical switch is connected with the optical input end of the second optical power detector, and the optical switch control board is respectively connected with the 1×n optical switch and the controller in a bidirectional electrical manner.

6. The optical module transmission integrated test system of claim 5, wherein said 1 x N optical switch is a 1 x 8 optical switch.

7. An optical module emission integrated test device, which is characterized by comprising a case, wherein the optical module emission integrated test system as claimed in any one of claims 1 to 6 is arranged in the case.