CN104485990A - Multi-path fiber core test device and method - Google Patents
Multi-path fiber core test device and method Download PDFInfo
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Abstract
The invention provides a multi-path fiber core test device and method. The device comprises a pulse generator, a light source, a light path switch, a directional coupler, a photoelectric detector, a signal processing device, an MCU (micro control unit) chip and a main clock, wherein the light path switch is provided with a plurality of light transmission ports, each light transmission port is connected with a standby optical fiber, the pulse generator generates electric pulse signals and sends the electric pulse signals to the light source, the light source converts the electric pulse signals into light pulse signals, the light pulse signals are sent to the light path switch through the directional coupler, the light path switch is connected with the standby optical fiber of the corresponding light transmission port, the light pulse signals are transmitted to the standby optical fiber, the fed back light signals are received and are transmitted to the photoelectric detector through the directional coupler, the photoelectric detector converts light signals into electric signals and outputs the electric signals to the signal processing device, the signal processing device generates an illumination intensity-distance performance curve according to the electric signals, and transmits the illumination intensity-distance performance curve to the MCU chip, and the MCU chip compares the performance parameters of the standby optical fibers according to the performance curve and generates a test result.
Description
Technical Field
The invention relates to an optical fiber communication technology in a power system, in particular to a multi-path fiber core testing device and a multi-path fiber core testing method.
Background
Optical fiber communication is a communication method in which an optical fiber is used as a transmission channel and light is used as an information carrier. The optical fiber has the obvious characteristics of high reliability, information confidentiality, excellent mechanical performance, low cost and the like, and becomes an important medium for signal transmission of a power system.
In optical fiber communication, OTDR (optical time domain reflectometer) is widely used to determine transmission attenuation and fault location of optical fiber. OTDR is performed by launching optical pulses into the fiber and then receiving the returned information at the OTDR port. When light pulses are transmitted within an optical fiber, they may be scattered, reflected, or the like due to the nature of the fiber itself, connectors, joints, bends, or the like. Some of the scatter and reflections are returned to the OTDR and useful information is measured by the detector of the OTDR. The reflection distance can be calculated by determining the speed of the light in the glass material from the time it takes to transmit the signal to return the signal, and displaying a graph of the performance of the fiber on the instrument screen.
The OTDR has the advantages of convenience in carrying, accuracy in fiber performance test, accuracy in fault diagnosis position, and the like, but also has some defects. The traditional OTDR only has one optical module, and only one optical fiber can be subjected to light emission and performance test at one time; after the performance parameters of the optical fiber are checked and stored, the next fiber core can be tested continuously. In actual power communication production operation, communication fortune dimension personnel can test the reserve fibre core of ODF of transformer substation's communication computer lab, inspect the fibre core good or bad and get down test data record, and the test to reserve the core consumes time the longest: the OTDR operation is not convenient, the test recording process is repeated, and more than two persons are needed for combined operation. When the number of lines between stations is small, it takes about two hours, and when the number of lines is large, it takes nearly one day. The mechanical fiber core test mode of inserting optical fiber → OTDR test → data recording → pulling optical fiber → inserting the next optical fiber seriously reduces the working efficiency of operation and maintenance personnel, and when repeatedly and continuously plugging an optical fiber, the working personnel easily causes the wrong insertion of the test fiber core and the wrong collision of the service optical fibers carried by the left and the right. Therefore, a new testing scheme for the OTDR multi-path fiber core needs to be proposed to improve the efficiency of the whole testing process and reduce the error caused by manual operation.
Disclosure of Invention
The embodiment of the invention mainly aims to provide a multi-path fiber core testing device and method, which release manpower, reduce labor intensity, improve the efficiency of the whole testing process of an optical fiber to be tested and reduce errors caused by manual operation.
In order to achieve the above object, an embodiment of the present invention provides a multi-core testing apparatus, including: the device comprises a pulse generator, a light source, a light path switch, a directional coupler, a photoelectric detector, a signal processing device, an MCU chip and a main clock; the optical path switch is provided with a plurality of optical transmission ports, and each optical transmission port is connected with a standby optical fiber; the master clock sends a clock signal to the pulse generator and sends a frequency signal to the signal processing device; the MCU chip sends a periodic emission time signal to the pulse generator and sends a switch switching signal to the light path switch; the pulse generator generates an electric pulse signal according to the clock signal and sends the electric pulse signal to the light source according to the periodic emission time signal; the light source converts the electric pulse signal into an optical pulse signal and sends the optical pulse signal to the directional coupler; the directional coupler outputs the optical pulse signal to the optical path switch; the optical path switch receives the optical pulse signal and the switch switching signal, is connected with the spare optical fiber corresponding to the optical transmission port according to the switch switching signal, then transmits the optical pulse signal to the spare optical fiber corresponding to the optical transmission port, receives a feedback optical signal, and transmits the optical signal to the directional coupler; the directional coupler receives the optical signal and outputs the optical signal to the photodetector; the photoelectric detector converts the optical signal into an electric signal and outputs the electric signal to the signal processing device; the signal processing device receives the frequency signal and the electric signal, converts the electric signal into a digital signal according to the frequency signal, generates a luminous intensity-distance performance curve according to the digital signal, and transmits the luminous intensity-distance performance curve to the MCU chip; and the MCU chip compares the performance parameters of the standby optical fiber of the corresponding optical transmission port according to the luminous intensity-distance performance curve to generate a test result.
In an embodiment, the MCU chip is specifically configured to: obtaining the testing distance error and attenuation value of the spare optical fiber corresponding to the optical transmission port according to the luminous intensity-distance performance curve; judging the size of the test distance error and a standard error value, and judging the size of the attenuation value and a standard attenuation value; when the test distance error is larger than the standard error value and/or the attenuation value is larger than the standard attenuation value, judging the spare optical fiber of the corresponding optical transmission port as a problem optical fiber; otherwise, judging the spare optical fiber of the corresponding optical transmission port as a normal optical fiber; and outputting the judgment result of the spare optical fiber of the corresponding optical transmission port as the test result.
In an embodiment, the apparatus for testing multiple fiber cores further includes: the amplifier is connected between the photoelectric detector and the signal processing device, receives the electric signal output by the photoelectric detector, amplifies the electric signal and transmits the amplified electric signal to the signal processing device.
In an embodiment, the apparatus for testing multiple fiber cores further includes: and the data output device is connected with the MCU chip and receives and outputs the test result.
In an embodiment, the apparatus for testing multiple fiber cores further includes: and the display is connected with the data output device and used for receiving and displaying the luminous intensity-distance performance curve and the test result.
The embodiment of the invention also provides a multi-path fiber core testing method which is applied to the multi-path fiber core testing device and is characterized in that the multi-path fiber core testing method comprises the following steps: the pulse generator generates an electric pulse signal and sends the electric pulse signal to the light source; the light source converts the electric pulse signal into an optical pulse signal and sends the optical pulse signal to the optical path switch through the directional coupler; the optical path switch is connected with a spare optical fiber corresponding to the optical transmission port according to a switch switching signal sent by the MCU chip, transmits the optical pulse signal to the spare optical fiber corresponding to the optical transmission port and receives a feedback optical signal, and then transmits the optical signal to the photoelectric detector through the directional coupler; the photoelectric detector converts the optical signal into an electric signal and outputs the electric signal to the signal processing device; the signal processing device receives the electric signal, generates a luminous intensity-distance performance curve according to the electric signal and transmits the luminous intensity-distance performance curve to the MCU chip; and the MCU chip compares the performance parameters of the standby optical fiber of the corresponding optical transmission port according to the luminous intensity-distance performance curve to generate a test result.
In an embodiment, the comparing, by the MCU chip, the performance parameters of the spare optical fiber corresponding to the optical transmission port according to the luminous intensity-distance performance curve to generate a test result includes: the MCU chip acquires the test distance error and attenuation value of the spare optical fiber corresponding to the optical transmission port according to the luminous intensity-distance performance curve; judging the size of the test distance error and a standard error value, and judging the size of the attenuation value and a standard attenuation value; when the test distance error is larger than the standard error value and/or the attenuation value is larger than the standard attenuation value, judging the spare optical fiber of the corresponding optical transmission port as a problem optical fiber; otherwise, judging the spare optical fiber of the corresponding optical transmission port as a normal optical fiber; and outputting the judgment result of the spare optical fiber of the corresponding optical transmission port as the test result.
In an embodiment, the above optical path switch, according to a switch switching signal sent by the MCU chip, connects to the spare optical fiber corresponding to the optical transmission port, includes: and the optical path switch is respectively and independently connected with the standby optical fiber of each corresponding optical transmission port according to the receiving time sequence of the switch switching signals so as to respectively test each standby optical fiber.
In one embodiment, the pulse generator generates an electrical pulse signal and transmits the electrical pulse signal to the light source, including: the pulse generator receives a clock signal sent by the main clock and receives a periodic emission time signal sent by the MCU chip; the pulse generator generates the electric pulse signal according to the clock signal and sends the electric pulse signal to the light source according to the periodic emission time signal.
In an embodiment, the signal processing apparatus receives the electrical signal, generates a luminous intensity-distance performance curve according to the electrical signal, and transmits the luminous intensity-distance performance curve to the MCU chip, and the signal processing apparatus includes: the signal processing device receives the electric signal and a frequency signal sent by the master clock; the signal processing device converts the electric signal into a digital signal according to the frequency signal, generates the luminous intensity-distance performance curve according to the digital signal, and transmits the luminous intensity-distance performance curve to the MCU chip.
The embodiment of the invention has the advantages that the number of personnel and the instrument operation repeatability required by the test of the standby fiber core can be reduced in the actual production work, the misplugging and the mistaken collision caused in the fiber core plugging and unplugging process are avoided to a certain extent, the labor intensity is reduced, and the operation efficiency is obviously improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without inventive labor.
FIG. 1 is a schematic diagram of a multi-path core testing apparatus 100 according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a spare optical fiber according to an embodiment of the present invention;
FIGS. 3A and 3B are schematic diagrams of performance curves obtained by testing a spare optical fiber according to an embodiment of the present invention;
FIG. 4 is a flow chart of a method of testing multiple cores according to an embodiment of the invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The embodiment of the invention provides a multi-path fiber core testing device and a multi-path fiber core testing method. The present invention will be described in detail below with reference to the accompanying drawings.
The embodiment of the invention provides a multi-path fiber core testing device for testing the performance of a spare optical fiber. As shown in fig. 1, the multi-core testing apparatus 100 includes: the device comprises a pulse generator 1, a light source 2, a directional coupler 3, an optical path switch 4, a photoelectric detector 5, a signal processing device 6, an MCU chip 7 and a main clock 8.
In the beginning stage of the test, the master clock 8 sends a clock signal to the pulse generator 1 and a frequency signal to the signal processing device 6; the MCU chip 7 sends a periodic transmission time signal to the pulse generator 1 and a switch switching signal to the optical switch 3. Wherein, the clock signal is used for making the pulse generator 1 generate an electric pulse signal with a certain frequency; the frequency signal is used for providing an operating frequency for the signal processing device 6, so that the operating frequency of the signal processing device 6 is kept synchronous with the frequency of the electric pulse signal generated by the pulse generator 1; the periodic emission time signal is used for controlling the periodic emission time of the electric pulse signal generated by the pulse generator 1; the switch switching signal is used to control the switching of the optical path switch 4.
After receiving the clock signal and the periodic emission time signal, the pulse generator 1 generates an electrical pulse signal according to the clock signal, and sends the generated electrical pulse signal to the light source 2 according to the periodic emission time signal.
The light source 2 converts the received electric pulse signal into an optical pulse signal, and sends the optical pulse signal to the directional coupler 3. The directional coupler 3 outputs the optical pulse signal to the optical path switch 4.
The optical path switch 4 is provided with a plurality of optical transmission ports, and each optical transmission port is correspondingly connected with a standby optical fiber to be tested. The spare fiber is shown in fig. 2, which shows that 12 spare fibers are tested, wherein the 7 th and 8 th fibers are already occupied and therefore are not tested. It should be noted that the 12 spare optical fibers shown in fig. 2 are only for illustration and are not intended to limit the present invention, and in practical applications, a plurality of spare optical fibers such as 24, 36, or 48 may also be tested. Accordingly, the number of optical transmission ports on the optical path switch 4 can be set according to the number of spare optical fibers.
The optical path switch 4 receives the optical pulse signal transmitted by the directional coupler 3 and the switch switching signal sent by the MCU chip 7. The switch switching signal contains information of the optical transmission port to which the spare optical fiber to be tested is connected. For clarity, this optical transmission port will be referred to as optical transmission port a, and the spare fiber connected to the optical transmission port a will be referred to as spare fiber Ga. The optical path switch 4 connects the spare optical fiber Ga corresponding to the optical transmission port a based on the information of the optical transmission port a included in the switch switching signal, and then transmits the optical pulse signal to the spare optical fiber Ga connected to the optical transmission port a. The optical switch 4 receives the optical signal fed back from the spare fiber Ga and transmits the optical signal to the directional coupler 3.
In practical application, the optical path switch 4 is sequentially and separately connected to the spare optical fibers of each corresponding optical transmission port according to the receiving time sequence of the plurality of switch switching signals, so as to transmit the optical pulse signals to each spare optical fiber, and acquire the optical signals fed back by each spare optical fiber, so as to test each spare optical fiber.
In another embodiment, the optical path switch 4 may also select several spare optical fibers to be sequentially selected and tested according to the switch switching signal, for example, if 1, 2, 3, 5, 6, 9, 10 of 12 spare optical fibers are to be tested, the 1, 2, 3, 5, 6, 9, 10 spare optical fibers may be sequentially connected through the selection switch 4, and the optical pulse signal is transmitted to the spare optical fibers, and the corresponding feedback signal is received, and corresponding data is automatically generated and stored at the same time.
After receiving the optical signal transmitted from the optical path switch 4, the directional coupler 3 outputs the optical signal to the photodetector 5. The photodetector 5 converts the received optical signal into an electrical signal, and outputs the electrical signal to the signal processing device 6 described above.
After receiving the frequency signal and the electrical signal, the signal processing device 6 converts the electrical signal into a digital signal according to the frequency signal, generates a light-emitting intensity-distance performance curve of the spare optical fiber Ga according to performance parameters, such as light-emitting intensity and test distance, of the spare optical fiber Ga included in the digital signal, and transmits the light-emitting intensity-distance performance curve to the MCU chip 7.
The MCU chip 7 compares the performance parameters of the spare optical fiber Ga according to the luminous intensity-distance performance curve sent by the signal processing device 6, and generates a test result. Specifically, the MCU chip 7 obtains performance parameters such as a test distance error and a loss value of the spare optical fiber Ga according to the luminous intensity-distance performance curve, and then determines the size of the test distance error and a standard error value, and determines the size of the loss value and a standard loss value. In practical applications, the standard error value may be set to 2.00 km, and the standard attenuation value may be set to 0.30dB/km, but these two values are used to illustrate the standard error value and the standard attenuation value in the embodiment of the present invention, and are not used to limit the present invention, and different standard error values and standard attenuation values may be set according to different application environments.
When the judgment result of the MCU chip 7 is at least one of that the test distance error is greater than the standard error value and that the attenuation value is greater than the standard attenuation value, judging that the spare optical fiber Ga is a problem optical fiber; otherwise, the spare optical fiber Ga is judged to be a normal optical fiber.
And after the MCU chip 7 finishes judging the spare optical fiber Ga, outputting a judgment result of the spare optical fiber Ga as a test result.
As can be seen from the above description, the multi-path fiber core testing device 100 according to the embodiment of the present invention can reduce the number of personnel and the repeatability of instrument operations required for testing the spare fiber core, and also avoid the mis-insertion and mis-collision during the fiber core plugging process to a certain extent, thereby reducing the labor intensity and significantly improving the operation efficiency.
In an embodiment, as shown in fig. 1, the multiple core testing apparatus 100 according to an embodiment of the present invention may further include an amplifier 9, where the amplifier 9 is connected between the photodetector 5 and the signal processing apparatus 6, and the amplifier 9 is configured to receive an electrical signal output by the photodetector 5, amplify the electrical signal, and transmit the amplified electrical signal to the signal processing apparatus 6. Since the signal intensity of the electrical signal output by the photodetector 5 may be weak, the electrical signal is amplified by the amplifier 9, which is more convenient for subsequent processing of the electrical signal.
In practical applications, the multi-core testing apparatus 100 according to the embodiment of the present invention may further include a data output device 10, where the data output device 10 is connected to the MCU chip 7, and is configured to receive and output the test result generated by the MCU chip 7.
Further, the multi-channel fiber core testing device 100 of the embodiment of the present invention further includes a display 11, and the display 11 is connected to the data output device 10, and is configured to receive and display the above-mentioned luminous intensity-distance performance curve and the testing result, so that a tester can more intuitively check and know the state of the multi-channel optical fiber and make adjustments in time.
The following describes the multi-core testing apparatus according to an embodiment of the present invention with reference to a testing example.
Table one below is a statistical table of tests performed on 12 spare fibers as shown in fig. 2, where the 7 th and 8 th fibers are already occupied and therefore no test is performed.
Watch 1
Further, the standard value of the performance parameter to be tested can be specifically selected, as shown in the following table two:
watch two
As can be seen from Table II, in the present test, the standard error value is selected to be 2.00 km, the standard attenuation value is 00.30dB/km, and other test parameters are further set, as shown in Table III below:
watch III
After the parameters of the multi-path fiber core testing device are set, the testing can be started, and the obtained testing results are shown in the following table four:
watch four
As shown in Table IV, the attenuation value obtained by testing the 9 th spare fiber is 0.371dB/km, which is greater than the standard attenuation value by 0.3 dB/km; the test distance is 77.54 km, which is a distance error of 2.46 km, which is greater than the standard error value of 2 km, compared to the set measurement distance of 80 km. Thus, the test results available are: the 1 st to 6 th and 10 th to 12 th spare optical fibers are normal optical fibers, and the 9 th spare optical fiber is a problem optical fiber.
And (4) aiming at the problem optical fiber, the optical fiber can be tested once again and verified, and if the test result has problems, the spare optical fiber can be confirmed to be the problem optical fiber. And (3) cleaning the ODF fiber core of the 9 th spare optical fiber, wiping the fiber core joint, and testing the optical fiber newly, wherein the test results are shown in the following table five:
watch five
As shown in Table V, the attenuation value obtained by the second test of the 9 th spare optical fiber is 0.352dB/km which is greater than the standard attenuation value by 0.3 dB/km; the test distance is 77.82 km, which is a distance error of 2.18 km, which is greater than the standard error value of 2 km, compared to the set measurement distance of 80 km. It can be seen that the 9 th spare fiber is the problem fiber.
Further, the test result can be outputted through the display 11, as shown in fig. 3A and 3B. Fig. 3A is a graph of performance obtained from a test performed on the 1 st spare optical fiber, and fig. 3B is a graph of performance obtained from a secondary test performed on the 9 th spare optical fiber, in which the abscissa is the test distance in km and the ordinate is the luminous intensity in dB.
In practical applications, the multi-fiber core testing method may be applied to the multi-fiber core testing apparatus 100, as shown in fig. 4, and the multi-fiber core testing method according to the embodiment of the present invention includes:
step 101: the pulse generator 1 generates an electric pulse signal and sends the electric pulse signal to the light source 2;
step 102: the light source 2 converts the electric pulse signal into an optical pulse signal, and sends the optical pulse signal to the optical path switch 4 through the directional coupler 3;
step 103: the optical path switch 4 is connected with the spare optical fiber Ga corresponding to the optical transmission port a according to a switch switching signal sent by the MCU chip 7, transmits an optical pulse signal to the spare optical fiber Ga and receives a feedback optical signal, and then transmits the optical signal to the photoelectric detector 5 through the directional coupler 7;
step 104: the photodetector 5 converts the optical signal into an electrical signal and outputs the electrical signal to the signal processing device 6;
step 105: the signal processing device 6 receives the electrical signal, generates a luminous intensity-distance performance curve according to the electrical signal, and transmits the luminous intensity-distance performance curve to the MCU chip 7;
step 106: the MCU chip 7 compares the performance parameters of the spare optical fiber Ga according to the luminous intensity-distance performance curve to generate a test result.
As can be seen from the above description, the multi-path fiber core testing method according to the embodiment of the present invention transmits the pulse signal output by the pulse generator 1 to the spare optical fiber Ga to be tested, which is correspondingly connected to the optical transmission port a, through the automatic selection of the optical switch 4, and receives the feedback optical signal, so as to test the spare optical fiber Ga according to the optical signal. Therefore, the invention can reduce the number of personnel and the instrument operation repeatability required by the spare fiber core test, avoid the misplugging and the mistaken collision caused in the fiber core plugging and unplugging process to a certain extent, reduce the labor intensity and obviously improve the operation efficiency.
At the beginning of the test, a clock signal can be sent to the pulse generator 1 by the master clock 8, and a frequency signal can be sent to the signal processing device 6; the MCU chip 7 sends a periodic transmission time signal to the pulse generator 1 and a switch switching signal to the optical switch 3.
After receiving the clock signal and the periodic emission time signal, in step 101, the pulse generator 1 generates an electrical pulse signal according to the clock signal, and sends the generated electrical pulse signal to the light source 2 according to the periodic emission time signal.
In step 102, the light source 2 converts the received electrical pulse signal into an optical pulse signal, and sends the optical pulse signal to the directional coupler 3. The directional coupler 3 outputs the optical pulse signal to the optical path switch 4.
The optical path switch 4 is provided with a plurality of optical transmission ports, and each optical transmission port is correspondingly connected with a standby optical fiber to be tested. The optical path switch 4 receives the optical pulse signal transmitted by the directional coupler 3 and the switch switching signal sent by the MCU chip 7. The switch switching signal includes information on the optical transmission port a to which the spare optical fiber Ga to be tested is connected. In step 103, the optical path switch 4 connects the spare optical fiber Ga corresponding to the optical transmission port a based on the information of the optical transmission port a included in the switch switching signal, and then transmits the optical pulse signal to the spare optical fiber Ga connected to the optical transmission port a. The optical switch 4 receives the optical signal fed back from the spare fiber Ga and transmits the optical signal to the directional coupler 3. After receiving the optical signal transmitted from the optical path switch 4, the directional coupler 3 outputs the optical signal to the photodetector 5.
In practical application, the optical path switch 4 is sequentially and separately connected to the spare optical fibers of each corresponding optical transmission port according to the receiving time sequence of the plurality of switch switching signals, so as to transmit the optical pulse signals to each spare optical fiber, and acquire the optical signals fed back by each spare optical fiber, so as to test each spare optical fiber.
In another embodiment, several spare optical fibers may be selected according to the switch switching signal to sequentially select and test, for example, to test 1 st, 2 nd, 3 rd, 5 th, 6 th, 9 th, and 10 th of 12 spare optical fibers, the 1 st, 2 nd, 3 th, 5 th, 6 th, 9 th, and 10 th spare optical fibers may be sequentially connected through the selection switch 4, and the optical pulse signal is transmitted to the spare optical fibers, and the corresponding feedback signal is received, and corresponding data is automatically generated and stored at the same time.
After the directional coupler 3 outputs the optical signal to the photodetector 5, the above step 104 is performed, and the photodetector 5 converts the received optical signal into an electrical signal and outputs the electrical signal to the above signal processing device 6.
In step 105, the signal processing device 6 receives the frequency signal and the electrical signal, generates a light-emitting intensity-distance performance curve of the spare optical fiber Ga according to performance parameters, such as the light-emitting intensity and the test distance, of the spare optical fiber Ga included in the digital signal, and transmits the light-emitting intensity-distance performance curve to the MCU chip 7. Specifically, the signal processing device 6 converts the electrical signal into a digital signal according to the frequency signal sent by the master clock 8 to ensure that the processing frequency of the signal processing device 6 is kept synchronous with the frequency of the electrical pulse signal generated by the pulse generator 1.
In the above step 106, the MCU chip 7 compares the performance parameters of the spare optical fiber Ga according to the luminous intensity-distance performance curve sent by the signal processing device 6, and generates a test result. Specifically, the MCU chip 7 obtains performance parameters such as a test distance error and a loss value of the spare optical fiber Ga according to the luminous intensity-distance performance curve. Then, the magnitude of the test distance error and a standard error value are judged, and the magnitude of the attenuation value and a standard attenuation value are judged. In practical applications, the standard error value may be set to 2.00 km, and the standard attenuation value may be set to 0.30dB/km, but these two values are used to illustrate the standard error value and the standard attenuation value in the embodiment of the present invention, and are not used to limit the present invention, and different standard error values and standard attenuation values may be set according to different application environments.
When the judgment result of the MCU chip 7 is at least one of that the test distance error is greater than the standard error value and that the attenuation value is greater than the standard attenuation value, judging that the spare optical fiber Ga is a problem optical fiber; otherwise, the spare optical fiber Ga is judged to be a normal optical fiber.
And after the MCU chip 7 finishes judging the spare optical fiber Ga, outputting a judgment result of the spare optical fiber Ga as a test result.
In conclusion, the multi-path fiber core testing method provided by the embodiment of the invention can reduce the number of personnel and the instrument operation repeatability required by the standby fiber core testing in the actual production work, also avoids the misplugging and the mistaken collision caused in the fiber core plugging and unplugging process to a certain extent, reduces the labor intensity and obviously improves the operation efficiency.
It will be understood by those skilled in the art that all or part of the steps in the method for implementing the above embodiments may be implemented by relevant hardware instructed by a program, and the program may be stored in a computer readable storage medium, such as ROM/RAM, magnetic disk, optical disk, etc.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are only exemplary embodiments of the present invention, and are not intended to limit the scope of the present invention, and any modifications, equivalent substitutions, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (10)
1. A multi-core testing device, comprising: the device comprises a pulse generator, a light source, a light path switch, a directional coupler, a photoelectric detector, a signal processing device, an MCU chip and a main clock; the optical path switch is provided with a plurality of optical transmission ports, and each optical transmission port is connected with a standby optical fiber; wherein,
the master clock sends a clock signal to the pulse generator and sends a frequency signal to the signal processing device;
the MCU chip sends a periodic emission time signal to the pulse generator and sends a switch switching signal to the light path switch;
the pulse generator generates an electric pulse signal according to the clock signal and sends the electric pulse signal to the light source according to the periodic emission time signal;
the light source converts the electric pulse signal into an optical pulse signal and sends the optical pulse signal to the directional coupler;
the directional coupler outputs the optical pulse signal to the optical path switch;
the optical path switch receives the optical pulse signal and the switch switching signal, is connected with the spare optical fiber corresponding to the optical transmission port according to the switch switching signal, then transmits the optical pulse signal to the spare optical fiber corresponding to the optical transmission port, receives a feedback optical signal, and transmits the optical signal to the directional coupler;
the directional coupler receives the optical signal and outputs the optical signal to the photodetector;
the photoelectric detector converts the optical signal into an electric signal and outputs the electric signal to the signal processing device;
the signal processing device receives the frequency signal and the electric signal, converts the electric signal into a digital signal according to the frequency signal, generates a luminous intensity-distance performance curve according to the digital signal, and transmits the luminous intensity-distance performance curve to the MCU chip;
and the MCU chip compares the performance parameters of the standby optical fiber of the corresponding optical transmission port according to the luminous intensity-distance performance curve to generate a test result.
2. The multi-channel fiber core testing device of claim 1, wherein the MCU chip is specifically configured to:
obtaining the testing distance error and attenuation value of the spare optical fiber corresponding to the optical transmission port according to the luminous intensity-distance performance curve;
judging the size of the test distance error and a standard error value, and judging the size of the attenuation value and a standard attenuation value;
when the test distance error is larger than the standard error value and/or the attenuation value is larger than the standard attenuation value, judging the spare optical fiber of the corresponding optical transmission port as a problem optical fiber; otherwise, judging the spare optical fiber of the corresponding optical transmission port as a normal optical fiber;
and outputting the judgment result of the spare optical fiber of the corresponding optical transmission port as the test result.
3. The multi-core testing apparatus of claim 2, further comprising: the amplifier is connected between the photoelectric detector and the signal processing device, receives the electric signal output by the photoelectric detector, amplifies the electric signal and transmits the amplified electric signal to the signal processing device.
4. The multiple core testing apparatus of claim 3, wherein said multiple core testing apparatus further comprises: and the data output device is connected with the MCU chip and receives and outputs the test result.
5. The multiple core testing apparatus of claim 4, wherein said multiple core testing apparatus further comprises: and the display is connected with the data output device and used for receiving and displaying the luminous intensity-distance performance curve and the test result.
6. A multi-core testing method applied to the multi-core testing apparatus of claim 1, wherein the multi-core testing method comprises:
the pulse generator generates an electric pulse signal and sends the electric pulse signal to the light source;
the light source converts the electric pulse signal into an optical pulse signal and sends the optical pulse signal to the optical path switch through the directional coupler;
the optical path switch is connected with a spare optical fiber corresponding to the optical transmission port according to a switch switching signal sent by the MCU chip, transmits the optical pulse signal to the spare optical fiber corresponding to the optical transmission port and receives a feedback optical signal, and then transmits the optical signal to the photoelectric detector through the directional coupler;
the photoelectric detector converts the optical signal into an electric signal and outputs the electric signal to the signal processing device;
the signal processing device receives the electric signal, generates a luminous intensity-distance performance curve according to the electric signal and transmits the luminous intensity-distance performance curve to the MCU chip;
and the MCU chip compares the performance parameters of the standby optical fiber of the corresponding optical transmission port according to the luminous intensity-distance performance curve to generate a test result.
7. The method according to claim 6, wherein the comparing, by the MCU chip, the performance parameters of the spare optical fiber corresponding to the optical transmission port according to the luminous intensity-distance performance curve to generate a test result comprises:
the MCU chip acquires the test distance error and attenuation value of the spare optical fiber corresponding to the optical transmission port according to the luminous intensity-distance performance curve;
judging the size of the test distance error and a standard error value, and judging the size of the attenuation value and a standard attenuation value;
when the test distance error is larger than the standard error value and/or the attenuation value is larger than the standard attenuation value, judging the spare optical fiber of the corresponding optical transmission port as a problem optical fiber; otherwise, judging the spare optical fiber of the corresponding optical transmission port as a normal optical fiber;
and outputting the judgment result of the spare optical fiber of the corresponding optical transmission port as the test result.
8. The method according to claim 7, wherein the optical switch connects the spare optical fiber corresponding to the optical transmission port according to a switch switching signal sent by the MCU chip, and the method comprises:
and the optical path switch is respectively and independently connected with the standby optical fiber of each corresponding optical transmission port according to the receiving time sequence of the switch switching signals so as to respectively test each standby optical fiber.
9. The multiple core testing method of claim 8 wherein said pulse generator generates an electrical pulse signal and sends said electrical pulse signal to said light source, comprising:
the pulse generator receives a clock signal sent by the main clock and receives a periodic emission time signal sent by the MCU chip;
the pulse generator generates the electric pulse signal according to the clock signal and sends the electric pulse signal to the light source according to the periodic emission time signal.
10. The method according to claim 9, wherein the signal processing device receives the electrical signal, generates a luminous intensity-distance performance curve according to the electrical signal, and transmits the luminous intensity-distance performance curve to the MCU chip, and the method comprises:
the signal processing device receives the electric signal and a frequency signal sent by the master clock;
the signal processing device converts the electric signal into a digital signal according to the frequency signal, generates the luminous intensity-distance performance curve according to the digital signal, and transmits the luminous intensity-distance performance curve to the MCU chip.
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