CN106375032A - Terminal test card and terminal test system - Google Patents

Terminal test card and terminal test system Download PDF

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Publication number
CN106375032A
CN106375032A CN201610757683.4A CN201610757683A CN106375032A CN 106375032 A CN106375032 A CN 106375032A CN 201610757683 A CN201610757683 A CN 201610757683A CN 106375032 A CN106375032 A CN 106375032A
Authority
CN
China
Prior art keywords
terminal
card
contact
draw
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610757683.4A
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Chinese (zh)
Inventor
马宁
杨依珍
王中帅
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beijing Xiaomi Mobile Software Co Ltd
Original Assignee
Beijing Xiaomi Mobile Software Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beijing Xiaomi Mobile Software Co Ltd filed Critical Beijing Xiaomi Mobile Software Co Ltd
Priority to CN201610757683.4A priority Critical patent/CN106375032A/en
Publication of CN106375032A publication Critical patent/CN106375032A/en
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/10Monitoring; Testing of transmitters
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70Coupling devices
    • H01R12/71Coupling devices for rigid printing circuits or like structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/46Bases; Cases
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/20Monitoring; Testing of receivers
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04MTELEPHONIC COMMUNICATION
    • H04M1/00Substation equipment, e.g. for use by subscribers
    • H04M1/24Arrangements for testing

Abstract

The invention relates to a terminal test card and a terminal test system. The terminal test card comprises a card slot module and a contact module, wherein the card slot module comprises at least two card slots; the contact module comprises at least two groups of contacts; one group of contacts is in circuit connections with corresponding first contacts for coming into contact with a terminal application card in one card slot of the card slot module; and after the contact module is inserted into a terminal, each group of contacts is in contact with corresponding second contacts for coming into contact with the terminal application card in the terminal. In the terminal test card, only the contact module with the contacts can be inserted into the terminal, and a terminal test can be performed after the terminal application card is inserted into the card slot module of the terminal test card, so that the terminal application card does not need to be placed into the terminal during the test since the card slot module does not need to be inserted into the terminal; the times of plugging the application card into the terminal or pulling the application card out of the terminal are reduced; and the failure rate of poor contact due to plugging and pulling is lowered.

Description

Terminal test card and terminal test system
Technical field
It relates to intelligent terminal's technical field, more particularly, to terminal test card and terminal test system.
Background technology
With the development of intelligent terminal's technology, terminal commonly uses in people's daily life, and the function of terminal is also got over Come more.At present, some terminals have many cards multi-mode function, you can with carry two or multiple subscriber identification cards (sim, Subscriber identification module) or data storage card.Because every card is can to take out from terminal , therefore, terminal domestic demand has the contact portion that corresponding contact can be blocked with every, thus every clamping is entered in terminating circuit, Complete every respective function of card.Typically, include least one set sim card contact in the terminal of many cards multimode, and least one set Data card contact.
During terminal batch generates, need finished product of terminal company is tested, include in terminal in test process Can be with the functional test of the contact of the contact portion of various types of cards.Wherein, test process includes: two kinds of sim cards are put into Carry out in terminal testing for the first time, then, wherein one sim card is extracted terminal, put into another data storage card and carry out the Second test.
Content of the invention
The embodiment of the present disclosure provides terminal test card and terminal test system.Described technical scheme is as follows:
According to the embodiment of the present disclosure in a first aspect, providing a kind of terminal test card, draw-in groove module and contact modules, its In,
Described draw-in groove module includes at least two draw-in grooves;
Described contact modules include at least two groups contacts, wherein, in a draw-in groove of one group of contact and described draw-in groove module Correspondence first contact circuit for being contacted with terminal applies card is connected;
After described contact modules insertion terminal, in described every group of contact and terminal, it is used for the correspondence contacting with terminal applies card Second contact.
It can be seen that, terminal test card includes two modules, and wherein, the contact modules of only contact can be inserted in terminal, and can Can be inserted into corresponding terminal applies card and carry out terminal test in draw-in groove module, so, because draw-in groove module is not required to insert terminal Interior, thus, in test, terminal applies card need not be put in terminal, decrease the number of times of application card plug in terminal, reduce Lead to the fault rate of loose contact due to plug.And, draw-in groove module is outside terminal, its size can not be limited by terminal, Three and above terminal applies card can be inserted simultaneously into, carry out terminal test, select two many cards multimode terminal can be once for three Just complete corresponding terminal test, and without changes terminal application card, by completing corresponding terminal test twice or repeatedly, Save flow process, also further reduce the number of times of application card plug in terminal, reduce terminal volume fault rate.
In one embodiment, described circuit connects and includes: printed circuit board (PCB) pcb connects, or, wire welding.
It can be seen that, in terminal test card, the connected mode between draw-in groove module and contact modules is flexible, can be applicable to many Plant in scene.
In one embodiment, the Kato consistent size of the size of described contact modules and described terminal, wherein, described card Can be inserted at least two terminal applies cards in support, and can be inserted into the function of completing counterpart terminal application card in described terminal.
It can be seen that, due to size and the Kato consistent size of terminal of contact modules, so, it is easy to the plug of contact modules, And fixing, reduce and bring the bad probability of test because position is mobile.
In one embodiment, every group of contact position in described contact modules and described Kato in described contact modules After inserting corresponding terminal applies card, position consistency on described Kato for the described terminal applies card upper contact.
It can be seen that, after the size of contact modules and the consistent size of Kato, the relative position between contact is also consistent, just In terminal test, terminal test can be enable once just to realize, save resource.
In one embodiment, the size of described draw-in groove module is more than the size of described contact modules.
It can be seen that, draw-in groove module size is more than the size of contact modules, thus being located at outside terminal, its size can not be limited by terminal System, can be inserted simultaneously into three and above terminal applies card, carry out terminal test, select two many cards multimode terminal can one for three Secondary just complete corresponding terminal test, and without changes terminal application card, surveyed by completing corresponding terminal twice or repeatedly Examination, saves flow process, also further reduces the number of times of application card plug in terminal, reduces terminal volume fault rate.
In one embodiment, described terminal applies card includes: subscriber identification card sim or data storage card.
It can be seen that, terminal test card can apply the test of polytype terminal, comprising: one data storage of a sim card The terminal of card, the terminal of two sim cards, the test of terminal of one data storage card of two sim cards etc..
According to the second aspect of the embodiment of the present disclosure, the system of terminal test, it may include: terminal test card, and to be measured The terminal of examination;Wherein,
The contact modules of described terminal test card insert in described terminal, and wherein, described terminal test card includes: draw-in groove mould Block and contact modules, described draw-in groove module includes at least two draw-in grooves, and described contact modules include at least two groups contacts, described tactile One group of contact on point module is touched with the correspondence first being used in a draw-in groove of described draw-in groove module being contacted with terminal applies card Dot circuit connects;
In described terminal for correspondence second contact that contacts with terminal applies card respectively with described contact modules in every Group contact.
It can be seen that, terminal test card includes two modules, and wherein, the contact modules of only contact can be inserted in terminal, and can Can be inserted into corresponding terminal applies card and carry out terminal test in draw-in groove module, so, because draw-in groove module is not required to insert terminal Interior, thus, in test, terminal applies card need not be put in terminal, decrease the number of times of application card plug in terminal, reduce Lead to the fault rate of loose contact due to plug.
In one embodiment, the Kato size one of the size of contact modules of described terminal test card and described terminal Cause, wherein, in described Kato, can be inserted at least two terminal applies cards, and in pluggable described terminal, complete counterpart terminal application The function of card.
It can be seen that, due to size and the Kato consistent size of terminal of contact modules, so, it is easy to the plug of contact modules, And fixing, reduce and bring the bad probability of test because position is mobile.
In one embodiment, every group of contact position in described contact modules in the contact modules of described terminal test card Put and insert after corresponding terminal applies card with described Kato, position one on described Kato for the described terminal applies card upper contact Cause.
It can be seen that, after the size of contact modules and the consistent size of Kato, the relative position between contact is also consistent, just In terminal test, terminal test can be enable once just to realize, save resource.
In one embodiment, the size of the draw-in groove module of described terminal test card is more than the size of described contact modules, Corresponding terminal applies card is inserted in each draw-in groove in described draw-in groove module.
It can be seen that, the size of draw-in groove module is more than the size of contact modules, can be outside terminal, and its size can not be limited by terminal System, can be inserted simultaneously into three and above terminal applies card, carry out terminal test, select two many cards multimode terminal can one for three Secondary just complete corresponding terminal test, and without changes terminal application card, surveyed by completing corresponding terminal twice or repeatedly Examination, saves flow process, also further reduces the number of times of application card plug in terminal, reduces terminal volume fault rate.
The technical scheme that embodiment of the disclosure provides can include following beneficial effect:
In technique scheme, terminal test card includes two modules, and wherein, the contact modules of only contact can be inserted into eventually In end, and corresponding terminal applies card can be can be inserted in draw-in groove module and carry out terminal test, so, because draw-in groove module is not required to In insertion terminal, thus, in test, terminal applies card need not be put in terminal, decrease the plug of application card in terminal time Number, reduces the fault rate leading to loose contact due to plug.
It should be appreciated that above general description and detailed description hereinafter are only exemplary and explanatory, not The disclosure can be limited.
Brief description
Accompanying drawing herein is merged in description and constitutes the part of this specification, shows the enforcement meeting the disclosure Example, and be used for explaining the principle of the disclosure together with description.
Fig. 1 is the structured flowchart of the terminal test card according to an exemplary embodiment.
Fig. 2 is the structured flowchart of the terminal test card according to an exemplary embodiment.
Fig. 3 is the structured flowchart of the terminal test system according to an exemplary embodiment.
Fig. 4 is the structured flowchart of the terminal test card according to an exemplary embodiment.
Specific embodiment
Here will in detail exemplary embodiment be illustrated, its example is illustrated in the accompanying drawings.Explained below is related to During accompanying drawing, unless otherwise indicated, the same numbers in different accompanying drawings represent same or analogous key element.Following exemplary embodiment Described in embodiment do not represent all embodiments consistent with the disclosure.On the contrary, they be only with such as appended The example of the consistent apparatus and method of some aspects being described in detail in claims, the disclosure.
Terminal commonly uses in people's daily life, and the type of terminal also has multiple, for example: the end of single deck tape-recorder single mode End, the terminal of Single-card multi-mode, the terminal of double card bimodulus, the terminal of double card multimode, and the terminal of many cards multimode.Due to terminal Size limitation, the terminal of a lot of double card multimodes can employ three designs selecting two Kato.I.e. terminal is configured with the card that can extract Support, can place two sim cards or a sim card in Kato, a data storage card, so, after Kato inserts terminal, often Zhang Kake contact portion corresponding with terminal, completes every respective function of card.Therefore, at least two groups sim are included in terminal Card contact, and least one set data card contact.When to employing three and selecting the terminal that two Kato designs to carry out production test, Two kinds of sim cards are put into and carries out in terminal testing for the first time, then, wherein one sim card is extracted terminal, puts into another number Carry out second test according to storage card, so, continually extract Kato, plug terminal applies card, be likely to result in loose contact Thus causing test failure.And by testing the waste that will also result in resource twice or repeatedly.
In the technical scheme that the embodiment of the present disclosure provides, terminal test card includes two modules, and wherein, only contact is tactile Point module can be inserted in terminal, and can be inserted into corresponding terminal applies card in draw-in groove module and carry out terminal test, so, by It is not required to insert in terminal in draw-in groove module, thus, in test, terminal applies card need not be put in terminal, decrease in terminal The number of times of application card plug, reduces the fault rate leading to loose contact due to plug.And, draw-in groove module is outside terminal, Its size can not be limited by terminal, can be inserted simultaneously into three and above terminal applies card, carry out terminal test, select two for three Many cards multimode terminal once can just complete corresponding terminal test, and without changes terminal application card, by twice or many Secondary complete corresponding terminal test, save flow process, also further reduce the number of times of the plug of application card in terminal, reduce end End volume fault rate.
Fig. 1 is the structured flowchart of the terminal test card according to an exemplary embodiment.As shown in figure 1, terminal test Card includes: draw-in groove module 110 and contact modules 120, wherein,
Draw-in groove module 110 includes at least two draw-in grooves 111.
Contact modules 120 include at least two groups contacts 121, wherein, a card of one group of contact 121 and draw-in groove module 110 Correspondence first contact circuit being used in groove 111 being contacted with terminal applies card is connected.
After contact modules 120 insertion terminal, every group of contact 121 and the correspondence being used in terminal contacting with terminal applies card the Two contact.
It can be seen that, terminal test card includes two modules, and wherein, the contact modules of only contact can be inserted in terminal, and can Can be inserted into corresponding terminal applies card and carry out terminal test in draw-in groove module, so, because draw-in groove module is not required to insert terminal Interior, thus, in test, terminal applies card need not be put in terminal, decrease the number of times of application card plug in terminal, reduce Lead to the fault rate of loose contact due to plug.And, draw-in groove module is outside terminal, its size can not be limited by terminal, Three and above terminal applies card can be inserted simultaneously into, carry out terminal test, select two many cards multimode terminal can be once for three Just complete corresponding terminal test, and without changes terminal application card, by completing corresponding terminal test twice or repeatedly, Save flow process, also further reduce the number of times of application card plug in terminal, reduce terminal volume fault rate.
As shown in figure 1, the contact modules 120 in dashed region are located at same with the draw-in groove module 110 in solid line region In printed circuit board (PCB), so, the connection between contact modules 120 and draw-in groove module 110 can be connected by printed circuit board (PCB) pcb.
Certainly, between contact modules 120 and draw-in groove module 110 can be detached two pieces of modules,
Fig. 2 is the structured flowchart of the terminal test card according to an exemplary embodiment.As shown in Fig. 2 terminal test Card includes: draw-in groove module 110 and contact modules 120, wherein,
Draw-in groove module 110 includes at least two draw-in grooves 111.
Contact modules 120 include at least two groups contacts 121, wherein, a card of one group of contact 121 and draw-in groove module 110 Correspondence first contact being used in groove 111 contacting with terminal applies card carries out circuit connection by wire welding.
After contact modules 120 insertion terminal, every group of contact 121 and the correspondence being used in terminal contacting with terminal applies card the Two contact.
As shown in Fig. 2 by wire by a draw-in groove of one group of contact on contact modules 120 121 and draw-in groove module 110 Correspondence first contact circuit being used in 111 being contacted with terminal applies card is connected.
Therefore, in the embodiment of the present disclosure, the circuit between draw-in groove module 110 and contact modules 120 connects and includes: printing electricity Road plate pcb connects, or, wire welding.So, in terminal test card, the connected mode between draw-in groove module and contact modules is spirit Live, can be applicable in several scenes.
At present, a lot of terminals all adopt the design of Kato, can be inserted at least two terminal applies cards in Kato, then will Kato inserts the function of can completing counterpart terminal application card in terminal.In the embodiment of the present disclosure, terminal applies card includes: user Identification card sim or data storage card.Thus, terminal test card can apply the test of polytype terminal, comprising: to one The terminal of one data storage card of sim card, the terminal of two sim cards, terminal of one data storage card of two sim cards etc. Test.
Here, the size of contact modules 120 may be typically less than or is equal to the Kato size of terminal.
In the disclosure one embodiment, the size of contact modules 120 can be with the Kato consistent size of terminal, wherein, in Kato The function of counterpart terminal application card is completed in pluggable at least two terminal applies cards, and pluggable terminal.
So, due to consistent size, it is easy to the plug of contact modules, and fixing, reduce because position is mobile and bring survey Try bad probability.
And after the consistent size of the size of contact modules 120 and Kato, also need for the position between contact to be also configured as one Cause, that is, in the embodiment of the present disclosure, every group of contact position in contact modules and the Kato corresponding terminal of insertion in contact modules After application card, position consistency on Kato for the terminal applies card upper contact.So, the contact modules in terminal test card are inserted Behind the position of Kato insertion in terminal, in contact modules every group of contact can at once be used in terminal contacting with terminal applies card Corresponding second contact, need not be adjusted, be easy to terminal test, terminal test can be enable once just to realize, save Resource.
Certainly, contact modules 120 be smaller in size than terminal Kato size when, only need to design contact modules 120 every group Contact can be with correspondence second contact for contacting with terminal applies card in terminal.
Typically, because draw-in groove module 110 can be inserted into two or multiple terminal applies cards, therefore, the size of draw-in groove module 110 Size more than contact modules 120.And can be located at outside terminal, its size can not be limited by terminal, can be inserted simultaneously into three and with On terminal applies card, carry out terminal test, once can just complete corresponding terminal for the three many cards multimode terminals selecting two Test, and without changes terminal application card, by completing corresponding terminal test twice or repeatedly, save flow process, also enter one Step decreases the number of times of application card plug in terminal, reduces terminal volume fault rate.
According to above-mentioned terminal test card, the terminal producing can be tested, form terminal test system.
Fig. 3 is the structured flowchart of the terminal test system according to an exemplary embodiment.As shown in figure 3, terminal is surveyed Test system includes: terminal test card 100, and terminal 200 to be tested.Wherein,
In the contact modules 120 insertion terminal of terminal test card 100, wherein, terminal test card 100 includes: draw-in groove module 110 and contact modules 120, draw-in groove module 110 includes at least two draw-in grooves 111, and contact modules 120 include at least two groups contacts 121, it is used for and terminal applies clamping on contact modules 120 group contact 121 and a draw-in groove 111 of draw-in groove module 110 Tactile correspondence first contact circuit connects;
In terminal 200 for correspondence second contact that contacts with terminal applies card respectively with contact modules 120 in every group Contact 121 contacts.
It can be seen that, terminal test card includes two modules, and wherein, the contact modules of only contact can be inserted in terminal, and can Can be inserted into corresponding terminal applies card and carry out terminal test in draw-in groove module, so, because draw-in groove module is not required to insert terminal Interior, thus, in test, terminal applies card need not be put in terminal, decrease the number of times of application card plug in terminal, reduce Lead to the fault rate of loose contact due to plug.
In one embodiment of the disclosure, the size of contact modules 120 of terminal test card 100 and the Kato of terminal 200 Consistent size, wherein, can be inserted at least two terminal applies cards in Kato, and completes counterpart terminal application card in pluggable terminal Function.
It can be seen that, due to size and the Kato consistent size of terminal of contact modules, so, it is easy to the plug of contact modules, And fixing, reduce and bring the bad probability of test because position is mobile.
In one embodiment of the disclosure, in the contact modules 120 of terminal test card 100, every group of contact 121 is in contact mould Position in block 120 is inserted after corresponding terminal applies card with Kato, position consistency on Kato for the terminal applies card upper contact.
It can be seen that, after the size of contact modules and the consistent size of Kato, the relative position between contact is also consistent, just In terminal test, terminal test can be enable once just to realize, save resource.
In one embodiment of the disclosure, the size of the draw-in groove module 110 of terminal test card 100 is more than the chi of contact modules Very little, insert corresponding terminal applies card in each draw-in groove 111 in draw-in groove module 110.
It can be seen that, the size of draw-in groove module is more than the size of contact modules, can be outside terminal, and its size can not be limited by terminal System, can be inserted simultaneously into three and above terminal applies card, carry out terminal test, select two many cards multimode terminal can one for three Secondary just complete corresponding terminal test, and without changes terminal application card, surveyed by completing corresponding terminal twice or repeatedly Examination, saves flow process, also further reduces the number of times of application card plug in terminal, reduces terminal volume fault rate.
Certainly, application is included with the terminal applies card in terminal test system: subscriber identification card sim or data storage Card.So, terminal test card can be to inclusion: the terminal of one data storage card of a sim card, the terminal of two sim cards, and two Open terminal of one data storage card of sim card etc. to be tested.
Taking can select, to employing three, the terminal test card that the terminal of two modes tested as a example it is described below.
Fig. 4 is the structure chart of the terminal test card according to an exemplary embodiment.As shown in figure 4, terminal test card For a pcb card, comprising: draw-in groove module 110 and contact modules 120.
Wherein, draw-in groove module 110 includes three draw-in grooves 111, and wherein, two draw-in grooves 111 can insert sim card, a draw-in groove 111 can insert data storage card.
Corresponding contact modules 120 include three groups of contacts 121, wherein, one group of contact 121 and draw-in groove 111 be used for Correspondence the first contact pcb circuit of sim card contact connects, and another group of contact 121 is also used for and sim clamping with a draw-in groove 111 Tactile correspondence the first contact pcb circuit connects, and last group contact 121 is used for contacting with data storage card with a draw-in groove 111 Correspondence the first contact pcb circuit connect.
After contact modules 120 insertion terminal, every group of contact 121 and the correspondence being used in terminal contacting with terminal applies card the Two contact.
Certainly, the terminal applies card during the disclosure is implemented is respectively two sim cards and a data storage card.
Two Kato is selected to design because terminal to be tested uses three, so, in the present embodiment, contact modules 120 Size and terminal Kato consistent size, wherein, Kato can be inserted into two terminal applies cards, is two sim cards respectively, or One sim card one data cards.
And, position in contact modules 120 of every group of contact 121 and Kato insert corresponding end in contact modules 120 After the application card of end, position consistency on Kato for the terminal applies card upper contact.So, the size of the size of contact modules and Kato After consistent, the relative position between contact is also consistent, is easy to terminal test, and terminal test can be enable once just real Existing, save resource.
Certainly, in terminal test card, draw-in groove module 110 can insert two sim cards respectively, a data storage card, therefore, The size of draw-in groove module 110 is more than the size of contact modules 120.And, draw-in groove module is located at outside terminal, can be inserted simultaneously into three Terminal applies card, carry out terminal test, once can just complete corresponding terminal for the three many cards multimode terminals selecting two and survey Examination, and without changes terminal application card, by completing corresponding terminal test twice or repeatedly, save flow process, also further Decrease the number of times of application card plug in terminal, reduce terminal volume fault rate.
Those skilled in the art, after considering description and putting into practice disclosure disclosed herein, will readily occur to its of the disclosure Its embodiment.The application is intended to any modification, purposes or the adaptations of the disclosure, these modifications, purposes or Person's adaptations are followed the general principle of the disclosure and are included the undocumented common knowledge in the art of the disclosure Or conventional techniques.Description and embodiments be considered only as exemplary, the true scope of the disclosure and spirit by following Claim is pointed out.
It should be appreciated that the disclosure is not limited to be described above and precision architecture illustrated in the accompanying drawings, and And various modifications and changes can carried out without departing from the scope.The scope of the present disclosure only to be limited by appended claim.

Claims (10)

1. a kind of terminal test card is it is characterised in that include: draw-in groove module and contact modules, wherein,
Described draw-in groove module includes at least two draw-in grooves;
Described contact modules include at least two groups contacts, wherein, are used in one group of contact and a draw-in groove of described draw-in groove module Correspondence first contact circuit being contacted with terminal applies card is connected;
After described contact modules insertion terminal, in described every group of contact and terminal, it is used for the correspondence second contacting with terminal applies card Contact.
2. terminal test card as claimed in claim 1 is it is characterised in that described circuit connects inclusion: printed circuit board (PCB) pcb is even Connect, or, wire welding.
3. terminal test card as claimed in claim 1 is it is characterised in that the card of the size of described contact modules and described terminal Support consistent size, wherein, can be inserted at least two terminal applies cards in described Kato, and completes to correspond in pluggable described terminal The function of terminal applies card.
4. terminal test card as claimed in claim 3 is it is characterised in that every group of contact is in described contact in described contact modules Position in module is inserted after corresponding terminal applies card with described Kato, and described terminal applies card upper contact is on described Kato Position consistency.
5. terminal test card as claimed in claim 1 is it is characterised in that the size of described draw-in groove module is more than described contact mould The size of block.
6. any terminal test card as described in claim 1-4 is it is characterised in that described terminal applies card includes: Yong Hushen Part identification card sim or data storage card.
7. a kind of system of terminal test is it is characterised in that include: terminal test card, and terminal to be tested;Wherein,
The contact modules of described terminal test card insert in described terminal, and wherein, described terminal test card includes: draw-in groove module and Contact modules, described draw-in groove module includes at least two draw-in grooves, and described contact modules include at least two groups contacts, described contact mould One group of contact on block is electric with correspondence first contact being used in a draw-in groove of described draw-in groove module contacting with terminal applies card Road connects;
In described terminal, correspondence second contact for being contacted with terminal applies card is touched with every group in described contact modules respectively Point contact.
8. system as claimed in claim 7 it is characterised in that
The size of contact modules of described terminal test card and the Kato consistent size of described terminal, wherein, can in described Kato At least two terminal applies cards of insertion, and can be inserted into the function of completing counterpart terminal application card in described terminal.
9. system as claimed in claim 8 it is characterised in that
In the contact modules of described terminal test card every group of contact position in described contact modules and described Kato insert right After the terminal applies card answered, position consistency on described Kato for the described terminal applies card upper contact.
10. any system as described in claim 7-9 it is characterised in that
The size of the draw-in groove module of described terminal test card is more than the size of described contact modules, each card in described draw-in groove module Corresponding terminal applies card is inserted in groove.
CN201610757683.4A 2016-08-29 2016-08-29 Terminal test card and terminal test system Pending CN106375032A (en)

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CN112769998A (en) * 2020-12-28 2021-05-07 东莞华贝电子科技有限公司 Plug-in electronic card adapter plate and test tool

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Application publication date: 20170201