TWI384234B - Motherboard measurement device - Google Patents

Description

Motherboard measuring device for analog central processing unit

The invention relates to a measuring device, in particular to a measuring device capable of simulating a voltage and an operating frequency of a central processing unit on a motherboard.

In a computer device, the motherboard provides a computer-operated hardware platform, and in addition to various peripheral devices, memory, and interface cards, the most important and core components of the motherboard are the central processing unit. When designing and designing the components and layout of the motherboard, the motherboard design and manufacturer must ensure that the central processor is operating properly when it is installed on it. Usually, during the test phase of the correct signal and stability of the motherboard, it is necessary to measure the processor clock (CPU clock) and the processor reset signal provided by the motherboard for the central processor when the central processor is mounted on the motherboard. (CPU reset), the power supply provides a processor socket - a central processor power good (CPU PG), processor core voltage signal (Vcc) ... and other signals are normal. The conventional measurement method must directly install a physical CPU that meets the specifications on the motherboard, and measure the signals of the corresponding contacts of the central processor during the normal power supply operation.

There are several problems with this approach. First, when the motherboard is installed with the central processing unit, the probe of the measuring instrument cannot measure the signal contacts outside the periphery of the central processing unit, and only the periphery of the energy measuring processor is closer to the signal contact (for example, processing) The line segment of the clock signal contact is not able to directly measure the end of the pulse signal, and the measured value and the real value will cause a gap, resulting in inaccurate measurement. Second, in order to measure the socket contacts with the central processor installed, it is usually necessary to scrape the solder mask on the contacts of the motherboard to make the probe of the measuring instrument contact the metal surface of the contact. To get the signal. Third, since the operation of the central processing unit generates high heat and cannot be operated without the fan cooling, the setting of the fan makes measurement difficult. Fourth, for some signal contacts located in the central area of the processor socket, it is still possible to measure through the signal points on the back of the processor socket of the motherboard, but this method still has not measured the energy. Broken signal contacts.

The invention provides a motherboard measuring device for simulating a central processing unit, which is mounted on a processor socket of a motherboard, the processor socket has a plurality of signal contacts, and the motherboard measuring device comprises a circuit A board, a setting unit and a measuring unit. The setting unit is disposed on the circuit board and electrically connected to the signal contact of the processor socket. The measuring unit is disposed on the circuit board and has a measuring point and a contact point. The contact point is electrically connected to a signal contact of the processor socket, and the measuring point and a measuring instrument are electrically connected. Connected to provide the signal contact signal of the processor socket to the measuring instrument.

Please refer to FIG. 1. FIG. 1 is a schematic diagram showing the motherboard slot measuring device 1 of the central processing unit and the processor socket 21 on the motherboard 2. The measuring device 1 is installed in the processor socket 21 of the motherboard 2 to simulate a central processing unit (CPU), so that the motherboard 2 can be successfully powered on and send out signals related to the central processing unit. The measuring device 1 has a circuit board 11 on which a voltage setting unit 12, a frequency setting unit 13 and a plurality of measuring units 14-17 are disposed. For the characteristics of the central processing unit to be simulated, the voltage setting unit 12 has a plurality of adjustment switches 121. When the measurement measuring device 1 is installed in the processor socket 21, the operating voltage of the corresponding central processing unit is simulated; and the frequency setting is performed. The unit 13 has a plurality of adjustment switches 131 to adjust the operating frequency of the corresponding central processing unit when the measurement device 1 is installed in the processor socket 21. The motherboard 2 provides a voltage value corresponding to the central processing unit and a clock signal according to the voltage set by the switch 121 and the frequency set by the switch 131. The voltage value and the clock signal can be obtained by measuring the signal contact 22 in the processor socket 21 by the aforementioned measuring unit.

In addition, in the embodiment of the present invention, the processor slot 21 is a Land Grid Array (LGA), because different processor specifications have different numbers and different deployment modes of the signal contacts 22. The 775-size CPU socket has 775 signal contacts 22 in processor slot 21. Therefore, the measuring device 1 is used to simulate a central processing unit conforming to the Land Grid Array (LGA) 775 specification. However, the technology disclosed in the present invention is not limited to the central processing unit and the motherboard of the foregoing specifications, and the contact positions of the measuring units 14 to 17 and the setting units 12 and 13 in the drawing are also for illustrative purposes only.

Please refer to FIG. 2 together. FIG. 2 is a schematic view of the back of the measuring device 1. The back side of the measuring device 1 has a plurality of processor contacts 111 respectively corresponding to a plurality of signal contacts 22 on the processor socket 21. The voltage setting unit 12 extends to the back of the circuit board 11 as a plurality of setting contacts 122 corresponding to the plurality of signals of the voltage identification unit (VID) of the processor board 21 in the processor socket 21. The position of the contact 22. When the equivalent measuring device 1 is mounted on the processor socket 21, the setting contact 122 is electrically connected to the signal contact 22 included in the voltage identifying unit to provide the voltage identification code of the central processor to be simulated by the motherboard 2. . The frequency setting unit 13 extends to the back of the circuit board 11 as a plurality of setting contacts 132, the positions of which correspond to the plurality of signals of the processor board 21 to the processor's frequency selection unit (B select pin). The position of the contact 22. When the equivalent measuring device 1 is mounted on the processor socket 21, the setting contact 132 is electrically connected to the signal contact 22 included in the frequency selecting unit to provide the operating frequency of the central processing unit to be simulated by the motherboard 2.

In the embodiment of the present invention, after the motherboard 2 detects the voltage identification code sent by the measuring device 1 and the operating frequency setting, the measuring units 13 to 17 on the measuring device 1 can respectively obtain the motherboard 2 Processor core voltage signal (Vcc), processor reset signal (CPU reset) provided to the central processing unit, processor power supply (CPU PG), and processor socket processor The CPU clock is used to measure and verify that the signals from the motherboard are working properly.

Each measuring unit 14~17 extends to the back of the circuit board 11 as its contact point 142~172, and its position corresponds to the processor core 21, and the processor core voltage signal provided by the motherboard 2 to the central processing unit is connected. Point (Vcc), processor reset signal contact (CPU reset), processor socket power supply ready (CPU power good, CPU PG) and processor slot processor clock signal contact ( The position of the CPU clock), which are included in a plurality of signal contacts 22. The contact points 142 to 172 of the measuring units 14 to 17 and the setting contacts 122 and 132 of the setting units 12 and 13 are included in the plurality of processor contacts 111, and other unused portions of the processor contacts 111 are used. The contact is used as an empty contact, and has only the appearance of the contact on the back of the circuit board 11, and is not electrically connected to the signal contact 22 at the corresponding position.

Each of the measuring units 14 to 17 has measuring points 141 to 171 on the front surface of the circuit board 11 of FIG. 1 . When the equivalent measuring device 1 is installed in the processor slot 21 and the motherboard 2 is in the on state and provides the corresponding processor signal, the probe 31 of the measuring instrument 3 directly contacts the measuring points 141 to 171. Measure the signal of each motherboard. In this way, the measuring device 1 disclosed in the present invention can make the measuring instrument 3 without the need to additionally scrape off the solder mask of the motherboard contact, and is limited to the fan without actually installing the central processing unit. The probe 31 directly measures the value at the end of the clock signal and other signals at the center of the processor to obtain accurate measurement data.

Please refer to FIG. 3, which is a schematic diagram of the signal connection between the measuring device 1 and the processor socket 21. For example, the contact point 142 of the first measuring unit 14 is electrically connected to the contact of the output processor core voltage signal (Vcc) in the processor socket 21, and the probe 31 of the measuring instrument 3 contacts the first quantity. The measuring point 141 of the measuring unit 14 (due to the characteristics of the voltage signal, in the preferred embodiment of the invention, the measuring point 141 is a protruding stitch, which ensures that the probe 31 is firmly contacted to the measuring point 141) for measurement The processor core voltage signal (Vcc) output by the motherboard 2. The contact point 152 of the second measuring unit 15 is electrically connected to the contact of the processor reset signal (CPU reset) in the processor socket 21, and the probe 31 of the measuring instrument 3 contacts the second measuring unit 15 The measuring point 151 is used to measure the processor reset signal (CPU reset) output by the motherboard 2. The contact point 162 of the third measuring unit 16 is electrically connected to the contact of the output power supply ready signal (CPU PG) in the processor socket 21, and the probe 31 of the measuring instrument 3 is in contact with the third amount. The measuring point 161 of the measuring unit 16 measures the power supply ready signal (CPU power good, CPU PG) outputted by the motherboard 2. The contact point 172 of the fourth measuring unit 17 is electrically connected to the contact of the output processor clock signal (CPU clock) in the processor socket 21, and the probe 31 of the measuring instrument 3 contacts the fourth measuring unit 17 The measuring point 171 is used to measure the processor clock signal (CPU clock) output by the motherboard 2.

The measuring device disclosed by the invention uses the setting unit to set the voltage and operating frequency of the simulated central processing unit. When installed in the processor socket on the motherboard, the central processing unit can be simulated, and the main board is powered and operated according to the set voltage. And the working frequency, the corresponding signal is output. The measuring device has a plurality of measuring units, so that the measuring instrument directly measures the core voltage signal, the processor reset signal, the power supply ready signal, the processor clock signal or the processor clock signal provided by the motherboard through the measuring unit. Other signals to be measured make the measurement of the motherboard signal more convenient and accurate.

The above are only the preferred embodiments of the present invention, and all changes and modifications made to the scope of the present invention should be within the scope of the present invention.

1. . . Measuring device

2. . . motherboard

3. . . Measuring instrument

11. . . Circuit board

12. . . Voltage setting unit

13. . . Frequency setting unit

14. . . First measuring unit

15. . . Second measuring unit

16. . . Third measuring unit

17. . . Fourth measuring unit

twenty one. . . Processor socket

twenty two. . . Signal contact

31. . . Probe

111. . . Processor contact

121, 131. . . Adjustment switch

122, 132. . . Set contact

141, 151, 161, 171. . . Measuring point

142, 152, 162, 172. . . Contact point

1 is a schematic diagram of a motherboard measuring device of a central processing unit of the present invention and a processor socket on a motherboard.

Figure 2 is a schematic view of the back side of the measuring device of Figure 1.

Figure 3 is a schematic diagram of the signal connection between the measuring device and the processor socket.

1. . . Measuring device

2. . . motherboard

3. . . Measuring instrument

11. . . Circuit board

12. . . Voltage setting unit

13. . . Frequency setting unit

14. . . First measuring unit

15. . . Second measuring unit

16. . . Third measuring unit

17. . . Fourth measuring unit

twenty one. . . Processor socket

twenty two. . . Signal contact

31. . . Measuring head

121, 131. . . Adjustment switch

141, 151, 161, 171. . . Measuring point

Claims (9)

A motherboard measuring device for simulating a central processing unit, configured to be installed in a processor socket of a motherboard, the processor socket having a plurality of signal contacts, the motherboard measuring device comprising: a circuit board a setting unit disposed on the circuit board and electrically connected to the signal contact of the processor socket for setting a voltage and an operating frequency of the analog central processing unit; and a measuring unit disposed at the The circuit board has a measuring point and a contact point, and the contact point is electrically connected to a signal contact of the processor socket, and the measuring point is electrically connected to a measuring instrument to provide the processor plug The signal contact signal of the slot is given to the measuring instrument. The motherboard measuring device of claim 1, wherein the setting unit has a plurality of adjusting switches, and a plurality of signal contacts included in a voltage identification unit (VID) of the processor socket Connection, used to provide a voltage identification code for the motherboard. The motherboard measurement device of claim 1, wherein the setting unit has a plurality of adjustment switches electrically connected to a plurality of signal contacts included in a frequency selection unit (B select pin) of the processor socket. Used to provide a frequency selection signal for the motherboard. The motherboard measurement device of claim 1, wherein the processor socket of the motherboard is a central processor socket conforming to a Land Grid Array (LGA) 775 specification, the number of the motherboard The circuit board of the measuring device has a plurality of processor contacts corresponding to and contacting a plurality of signal contacts of the central processing unit slot. The motherboard measuring device of claim 4, wherein the setting unit has a plurality of setting contacts electrically connected to the signal contacts of the central processing unit slot, the plurality of processor contacts including the plurality of The contact point and the contact point of the measuring unit are set. The motherboard measuring device of claim 1, wherein the contact point of the measuring unit is electrically connected to a processor core voltage signal contact (Vcc) of the processor socket. The motherboard measuring device of claim 1, wherein the contact point of the measuring unit is electrically connected to a processor reset signal (CPU reset) of the processor socket. The motherboard measuring device of claim 1, wherein the contact point of the measuring unit is electrically connected to a power supply (CPU power good, CPU PG) of the processor socket. The motherboard measuring device of claim 1, wherein the contact point of the measuring unit is electrically connected to a processor clock signal of the processor socket.