TWI687791B - Testing method of fan control signal from main board and testing system thereof - Google Patents

Abstract

A testing method of fan control signal from main board includes the following steps. A fan voltage and a PWM signal from a main board are obtained. A PWM duty is calculated according to the PWM signal. When the PWM duty is 100%, a first fan speed is calculated according to a first speed function. When the PWM duty is less than 100% and the fan voltage is greater than a predetermined voltage, a second fan speed is calculated according to a second speed function. When the fan voltage is less than the predetermined voltage, a third fan speed is calculated according to a third speed function. A corresponding first clock signal is transmitted to the main board according to the first, the second or the third fan speed. The first clock signal is determined by the main board if it is in the predetermined range.

Description

Method and system for testing fan control signal of motherboard

The present invention relates to a test method and system, and particularly to a test method and system for a fan control signal of a motherboard.

At present, in the test of the motherboard, multiple sets of physical fans need to be connected to the motherboard to detect whether the fan control signal of the motherboard is abnormal. However, in each test, the operator needs to repeatedly insert and remove the fan, which is quite complicated. In addition, the damage rate of these fans after long-term testing is high, requiring frequent replacement, which increases the cost of testing.

The invention provides a method for testing a fan control signal of a motherboard, which can test the fan control signal of a motherboard without using a physical fan.

The invention provides a test system for a fan control signal of a motherboard, which can be used to replace the physical fan to test the fan control signal of the motherboard.

A test method for a fan control signal of a motherboard includes reading a fan voltage and a pulse width modulation signal sent from a motherboard. A pulse width modulation duty cycle is calculated based on the pulse width modulation signal. Performing a first simulated speed acquisition procedure, including: determining whether the pulse width modulation duty cycle is 100%, wherein when the pulse width modulation duty cycle is 100%, a first fan is calculated according to a first speed formula Speed; when the pulse width modulation duty cycle is not 100%, determine whether the fan voltage is greater than a voltage preset value, when the fan voltage is greater than the voltage preset value, calculate a second fan speed according to a second speed formula ; And when the fan voltage is not greater than the voltage preset value, a third fan speed is obtained. After executing the first simulated speed acquisition procedure, a corresponding first clock signal is output to the motherboard according to the obtained first fan speed, second fan speed or third fan speed. The motherboard determines whether the first clock signal falls within a preset range.

In an embodiment of the present invention, when the first simulated rotation speed acquisition process is executed, it is determined that the motherboard transmits a three-pin signal or a four-pin signal according to the pulse width modulation duty ratio.

In an embodiment of the present invention, the above-mentioned first speed formula is: first fan speed = (fan voltage/12V) x (a maximum speed-a base speed) + base speed.

In an embodiment of the invention, the above-mentioned second speed formula is the second fan speed = (pulse width modulation duty cycle/100) x (a maximum speed-a base speed) + base speed.

In an embodiment of the invention, the rotation speed of the third fan is 0.

In an embodiment of the present invention, after the fan voltage is read, the first simulated speed acquisition procedure or a second simulated speed acquisition procedure can be optionally performed. The second simulated speed acquisition procedure includes: determining whether the fan voltage is greater than In the preset voltage value, when the fan voltage is greater than the preset voltage value, a fourth fan speed is calculated according to the second speed formula; and when the fan voltage is not greater than the preset voltage value, the third fan speed is obtained. After executing the second simulated speed acquisition procedure, according to the obtained third fan speed or fourth fan speed, a corresponding second clock signal is output to the motherboard. The motherboard determines whether the second clock signal falls within the preset range.

The test system for the fan control signal of the motherboard is suitable for testing a motherboard. The test system for the fan control signal of the motherboard includes a test fixture. The test fixture includes a fixture connector and a processor. The jig connector is suitable for being electrically connected to the motherboard to obtain a fan voltage and a pulse width modulation signal sent from the motherboard. The processor is electrically connected to the jig connector. The processor is adapted to calculate a pulse width modulation duty cycle according to the pulse width modulation signal. The processor is adapted to execute a first simulated speed acquisition procedure. The first simulation speed acquisition procedure includes: judging whether the pulse width modulation duty cycle is 100%, wherein when the pulse width modulation duty cycle is 100%, a first fan speed is calculated according to a first speed formula; when When the duty cycle of the pulse width modulation is not 100%, it is determined whether the fan voltage is greater than a voltage preset value. When the fan voltage is greater than the voltage preset value, a second fan speed is calculated according to a second speed formula; when the fan When the voltage is not greater than the voltage preset value, a third fan speed is obtained. After executing the first simulated speed acquisition procedure, the processor outputs a corresponding first clock signal to the motherboard according to the obtained first fan speed, second fan speed or third fan speed.

In an embodiment of the present invention, the above test fixture further includes a maximum speed setting switch, which is electrically connected to the processor and provides a preset maximum speed to the processor, and the first speed formula is the first fan Speed = (fan voltage / 12V) x (maximum speed-a base speed) + base speed, and the second speed formula is the second fan speed = (pulse width modulation duty cycle / 100) x (maximum speed-base speed ) + Basic speed.

In an embodiment of the present invention, the above-mentioned test fixture further includes a mode setting switch electrically connected to the processor, and the processor selects a first simulated speed acquisition procedure or a second simulated speed according to the mode setting switch Obtaining process, the second simulation speed obtaining process includes determining whether the fan voltage is greater than the voltage preset value, when the fan voltage is greater than the voltage preset value, a fourth fan speed is calculated according to the second speed formula, when the fan voltage is not greater than the voltage pre When setting the value, the third fan speed is obtained. After executing the second simulated speed acquisition procedure, the processor outputs a corresponding second clock signal to the motherboard according to the obtained third fan speed or fourth fan speed.

In an embodiment of the invention, the above test fixture further includes a voltage indicator, electrically connected to the processor, and adapted to indicate a signal according to the fan voltage sent by the motherboard.

In an embodiment of the invention, the above-mentioned test fixture further includes a speed indicator, electrically connected to the processor, and adapted to indicate a signal according to the first clock signal.

Based on the above, the test method and test system of the fan control signal of the motherboard of the present invention utilizes to determine whether the pulse width modulation duty ratio is 100% and whether the fan voltage is greater than the voltage preset value to determine Or use the third speed formula to calculate the fan speed, and output the corresponding clock signal to the motherboard according to the obtained fan speed to simulate the operation of the physical fan. The motherboard will determine whether the received clock signal falls within a preset range. If so, it means that the fan control signal of the motherboard is normal. If not, it means that the fan control signal of the motherboard is abnormal. The method and system for testing the fan control signal of the motherboard of the present invention do not need to connect the physical fan to the motherboard for testing, and the operator does not need to repeatedly plug and unplug multiple physical fan connectors during the process of testing different speed settings. There will also be no problem of fan loss, and test labor and cost can be reduced.

In order to make the above-mentioned features and advantages of the present invention more obvious and understandable, the embodiments are specifically described below in conjunction with the accompanying drawings for detailed description as follows.

When testing the fan control signal of a conventional motherboard, the motherboard will be connected to the physical fan, the motherboard will transmit the fan voltage and pulse width modulation signal to the fan, and the fan will rotate at the corresponding speed. Since the speed of the fan will correspond to a specific clock signal, this clock signal will be fed back to the motherboard. Therefore, the motherboard can determine whether the fan speed is normal based on the received clock signal, and then infer whether the fan control signal transmitted by the motherboard through this connector is normal.

In this embodiment, the system for testing the fan control signal of the motherboard can test whether the fan control signal of the motherboard is normal without connecting the physical fan to the motherboard. The operator does not need to repeatedly plug and unplug the connector of the physical fan during the test. There is no problem of fan loss, which can reduce the test manpower and cost, and can avoid the noise generated when the fan is running. The test system of the fan control signal of the motherboard will be described below.

FIG. 1 is a schematic diagram of a test fixture for a fan control signal of a motherboard according to an embodiment of the invention. FIG. 2 is a schematic diagram of connecting the test fixture of FIG. 1 to a motherboard and a power supply. Please refer to FIGS. 1 and 2. The system for testing the fan control signal of the motherboard in this embodiment is suitable for testing the fan control signal of a motherboard 10 (FIG. 2 ).

As shown in FIG. 1, the test system for the fan control signal of the motherboard includes a test fixture 100. The test fixture 100 includes at least one fixture connector 110 and a processor 150 electrically connected to the fixture connector 110. The jig connector 110 is adapted to be electrically connected to the motherboard 10 (FIG. 2) to obtain a fan voltage and a pulse width modulation signal sent from the motherboard 10. In this embodiment, the test fixture 100 includes eight fixture connectors 110, which are electrically connected to the processor 150, and can simulate eight fans. Of course, the number of jig connectors 110 is not limited thereto.

As can be seen in FIG. 2, in this embodiment, the motherboard 10 may have eight connectors that can be connected to the fan. When the fan control signals transmitted by the eight connectors on the motherboard 10 are to be tested, the operation One can insert the connector 16 of each transmission line 17 to the connector on the motherboard 10, and insert the connector 18 of the transmission line 17 to the jig connector 110 of the test jig 100 (FIG. 1), so that the motherboard 10 It is electrically connected to the test fixture 100. In this way, the test fixture 100 can obtain the fan voltage and pulse width modulation signals from the motherboard 10.

The motherboard 10 has a central processing unit 12, an expansion card slot 14 electrically connected to the central processing unit 12, and an electrical connector 15. In this embodiment, the power supply 20 is connected to the electrical connector 15 of the motherboard 10 and the power module 130 of the test fixture 100 to supply power to the motherboard 10 and the test fixture 100.

In this embodiment, the test system for the fan control signal of the motherboard uses the test fixture 100 to simulate the operation of the fan. The processor 150 will calculate the corresponding signal according to the fan voltage and pulse width modulation signal from the motherboard 10 The clock signal is transmitted back to the motherboard 10 for the motherboard 10 to determine whether the fan control signal sent by its connector is normal.

It is worth mentioning that, in this embodiment, the test jig 100 with eight jig connectors 110 can simulate eight virtual fans, and these jig connectors 110 can be connected to multiple on the same motherboard 10 Connector to determine whether the fan control signals on the motherboard 10 are normal. These jig connectors 110 can also be connected to different motherboards 10 to determine whether the fan control signals on different motherboards 10 are normal.

It should be noted that since eight fans can be connected to the motherboard 10, if the test fixture 100 simulates that eight fans start at the same time, the load on the motherboard 10 is large, which may cause the motherboard 10 to shut down. In this embodiment, the test fixture 100 may have a circuit or a switch (not shown) that simulates the batch start of fans, for example, it can control four of the fans to start first, and the other four fans to start later to reduce the motherboard 10 The load. Of course, the form of batch start is not limited to this. In other embodiments, the test fixture 100 may not have a circuit or a switch that simulates batch starting of the fan.

In addition, since the motherboard 10 may be connected to fans with different maximum rotation speeds, in a conventional test, an operator needs to connect the motherboard 10 to fans with different maximum rotation speeds and perform the test. In this embodiment, the test fixture 100 further includes a maximum speed setting switch, which is electrically connected to the processor 150. The operator can adjust the maximum speed setting switch to change the maximum speed of the fan simulated by the test fixture 100. In this way, the operator does not need to test the signals between the motherboard 10 and different fans one by one.

In detail, in this embodiment, the maximum speed setting switch includes switches 142, 144, and 146. The operator can adjust the switches 142, 144, and 146 to set the preset maximum speed by using, for example, Table 1 below. For example, when the operator wants to test a fan with a maximum speed of 2000 rpm, as long as the switches 142, 144, and 146 (for example, the levers 143, 145, and 147) are all turned on, the test fixture 100 is represented. It will be simulated as a fan with a maximum speed of 2000rpm. The processor 150 calculates the corresponding clock signal according to the preset maximum speed.

Table I:

Of course, the form, number, and setting method of the maximum speed setting switch are not limited to this. In addition, in other embodiments, the test fixture 100 may also have more than one set of maximum speed setting switches, and the fans with multiple maximum speeds can be simulated to operate simultaneously.

In addition, there are currently two types of fans on the market, one is the old fan, which has 3 transmission pins (3 pins). The other is a new type of fan, which has 4 transmission pins (4 pins), which is currently the main form of fan. Some motherboards 10 only support fans with 4 transmission pins, and some motherboards 10 will support fans with 4 transmission pins and fans with 3 transmission pins.

In order to allow the test fixture 100 to be applied to the above-mentioned motherboard 10, in this embodiment, the test fixture 100 further includes a mode setting switch 140, which is electrically connected to the processor 150. In this embodiment, the lever 141 of the mode setting switch 140 is adjusted to the on position to represent the automatic mode. The processor 150 determines whether the motherboard 10 transmits a three-pin signal or a four-pin signal to the test fixture 100, and Calculate the corresponding clock signal accordingly. When the lever 141 of the mode setting switch 140 is adjusted to the off position, it represents the four-pin mode. The processor 150 directly determines that the motherboard 10 transmits the four-pin signal to the test fixture 100, and calculates the corresponding time accordingly. Pulse signal. Of course, in other embodiments, the test fixture 100 can be directly preset to the automatic mode without the mode setting switch 140.

The following describes how the test system for the fan control signal of the motherboard works. FIG. 3 is a schematic flowchart of a method for testing a fan control signal of a motherboard according to an embodiment of the invention. Please refer to FIG. 3. First, in step 202, when the motherboard 10 transmits the fan control signals to the eight virtual fans to the test fixture 100, the motherboard 10 will divide the time according to the settings on the test fixture 100. The eight virtual fans are activated, that is to say, the motherboard 10 will transmit the fan control signals of the eight virtual fans to the test fixture 100 in batches. For example, the fan control signal is first transmitted to four fixture connectors 110, and then the fan control signal is transmitted to the remaining four fixture connectors 110.

Then, in step 203, the processor 150 reads the information of the maximum speed setting switch to know the maximum speed of the fan currently simulated. And, as in step 205, the processor 150 reads the fan voltage and pulse width modulation signal from the motherboard 10. Then, in step 206, the processor 150 calculates a pulse width modulation duty cycle according to the pulse width modulation signal. Next, in step 206, the processor 150 confirms the setting on the mode setting switch 140 to determine which mode to use to calculate the fan speed.

More specifically, the processor 150 determines whether to execute the automatic mode (automatically determine that the motherboard 10 transmits the three-pin signal or the four-pin signal to the test fixture 100) or the four-pin mode (directly determine the motherboard according to the mode setting switch 140) 10 is to transmit the four-pin signal to the test fixture 100). In this embodiment, if the processor 150 is to calculate the fan speed according to the automatic mode rule, the processor 150 will execute the first simulated speed acquisition procedure. If the processor 150 is to calculate the fan speed according to the four-pin mode rule, the processor 150 will execute a second simulated speed acquisition procedure.

FIG. 4 is a schematic flowchart of a first simulated speed acquisition procedure of the method for testing the fan control signal of the motherboard of FIG. 3. Please refer to FIG. 4. In this embodiment, the first simulated rotation speed acquisition process 210 includes the following steps. First, it is determined whether the duty cycle of the pulse width modulation is 100% (step 211), wherein when the duty cycle of the pulse width modulation is 100%, a first fan speed is calculated according to a first speed formula.

The difference between the three-pin signal and the four-pin signal is that the four-pin signal has one more pin than the three-pin signal to transmit the pulse width modulation signal. In other words, the three-pin signal does not transmit the pulse width modulation signal. When transmitting a three-pin signal, the pulse width modulation signal will be judged to maintain a high logic level (always high). Therefore, the pulse width modulation duty cycle will be calculated as 100%.

In other words, when the duty cycle of the pulse width modulation is 100%, one of them may be the three-pin signal transmitted from the motherboard 10 to the test fixture 100. Another possibility is that the motherboard 10 transmits the four-pin signal to the test fixture 100, and the transmitted pulse width modulation signal is converted into a pulse width modulation duty cycle of 100% (full load).

That is to say, in the present embodiment, when the first analog speed acquisition procedure is executed, the duty cycle of the pulse width modulation is used to determine whether the motherboard transmits a three-pin signal or a four-pin signal.

In this embodiment, under the above two conditions, as shown in step 212, the processor 150 calculates the virtual fan speed according to the first speed formula. The first speed formula is the first fan speed = (fan voltage/12V) x (maximum speed-basic speed) + basic speed, where the fan voltage is the voltage that the motherboard 10 passes to the test fixture 100, and the maximum speed is the test fixture The setting value of the maximum speed setting switch on 100, the basic speed may be a preset value, for example, 1000 rpm, but not limited to this.

Next, when the duty cycle of the pulse width modulation is not 100%, it is determined whether the fan voltage is greater than a voltage preset value. In this embodiment, the preset voltage value is, for example, 10V (step 213), but this is not a limitation. Generally speaking, if the fan voltage is 12V as an example, the voltage value may slightly increase or decrease depending on the circuit and other factors. In this embodiment, when the fan voltage is greater than 10V, it can be determined as a normal fan voltage. When the fan voltage is less than 10V, it is determined to be abnormal fan voltage.

In this embodiment, when the fan voltage is greater than the preset voltage value, it means that the fan voltage from the motherboard 10 is still within the normal range. At this time, the processor 150 can calculate a second fan speed according to a second speed formula . In this embodiment, the second speed formula is the second fan speed = (pulse width modulation duty cycle/100) x (maximum speed-base speed) + base speed (step 214).

When the fan voltage is not greater than the voltage preset value, it means that the fan voltage input from the motherboard 10 is not within the normal range, which means abnormality. At this time, the processor 150 obtains a third fan speed. In this embodiment, the third fan speed is 0 (step 215).

Next, please return to FIG. 3, as shown in step 230, the corresponding clock signal is output according to the fan speed. In this embodiment, after executing the first simulated speed acquisition procedure, the processor 150 outputs a corresponding first clock signal to the motherboard according to the obtained first fan speed, second fan speed or third fan speed 10. The motherboard 10 judges whether the first clock signal returned by the test fixture 100 is slightly within a preset range from the received first clock signal. If it is, it means that the first clock signal is normal, and It is concluded that the fan control signal sent by the motherboard 10 is normal. If not, it means that the first clock signal is abnormal, and it can be concluded that the fan control signal sent by the motherboard 10 is abnormal.

On the other hand, if the processor 150 is to calculate the fan speed according to the four-pin mode rule, the processor 150 will execute the second simulated speed acquisition procedure. FIG. 5 is a schematic flowchart of a second simulated rotation speed acquisition procedure of the method for testing the fan control signal of the motherboard of FIG. Please refer to FIG. 5, the second simulated speed obtaining procedure 220 includes the following steps. Determine whether the fan voltage is greater than the voltage preset value. In this embodiment, the voltage preset value is, for example, 10V (step 221), but it is not limited thereto.

When the fan voltage is greater than the voltage preset value, it means that the fan voltage from the motherboard 10 is still within the normal range. At this time, the processor 150 can calculate a fourth fan speed according to the second speed formula. In this embodiment, the second speed formula is the speed of the second fan = (pulse width modulation duty cycle/100) x (maximum speed-basic speed) + basic speed (step 222), where the maximum speed is the test fixture The setting value of the maximum speed setting switch on 100, the basic speed may be a preset value, for example, 1000 rpm, but not limited to this.

When the fan voltage is not greater than the voltage preset value, it means that the fan voltage input from the motherboard 10 is in an abnormal range, and the processor 150 can obtain the third fan speed. In this embodiment, the third fan speed is 0 (step 223).

In this embodiment, since the lever 141 of the mode setting switch 140 is adjusted to the off position, the processor 150 will calculate the fan speed according to the four-pin mode rule. At this time, the processor 150 already knows the motherboard 10 The test fixture 100 is judged as a fan with 4 transmission pins. Therefore, the processor 150 does not need to distinguish whether the motherboard 10 transmits a three-pin signal or a four-pin signal. Therefore, when the processor 150 executes the second simulated rotation speed acquisition program, step 211 is omitted. In this embodiment, step 222 of FIG. 5 is the same as step 214 of FIG. 4, and step 223 of FIG. 5 is the same as step 215 of FIG. 4, but it is not limited thereto.

Then, after executing the second simulated rotation speed acquisition program, the processor 150 outputs a corresponding second clock signal to the motherboard 10 according to the obtained third fan rotation speed or fourth fan rotation speed. Similarly, the motherboard 10 uses the received second clock signal to determine whether the second clock signal returned by the test fixture 100 is slightly within a preset range. If it is, it means that the second clock signal is normal , And it can be concluded that the fan control signal sent by the motherboard 10 is normal. If not, the fan control signal sent by the motherboard 10 is abnormal.

Please return to FIG. 2. In this embodiment, the test fixture 100 further includes a voltage indicator 120 electrically connected to the processor 150. The voltage indicator 120 is adapted to indicate a signal according to the fan voltage sent by the motherboard 10. In other words, the operator can obtain the fan voltage information transmitted from the motherboard 10 from the voltage indicator 120 on the test fixture 100. For example, in this embodiment, the voltage indicator 120 may be a light emitting diode, which may be brighter as the fan voltage sent by the motherboard 10 is higher, so that the operator can judge that the motherboard 10 is fed. Is the fan voltage normal? Of course, in other embodiments, the voltage indicator 120 may also be a screen or a digital meter, which indicates the signal by displaying the value of the fan voltage. Alternatively, the voltage indicator 120 can also be presented by sound, and by emitting different sounds or frequencies, the operator can determine whether the fan voltage sent by the motherboard 10 is normal.

In addition, in this embodiment, the test fixture 100 further includes a rotation speed indicator 122, and the rotation speed indicator 122 is electrically connected to the processor 150. The speed indicator 122 is adapted to indicate a signal according to the first clock signal. In other words, the operator can obtain the information of the clock signal that the test jig 100 is to return to the motherboard 10 from the speed indicator 122 on the test jig 100. For example, in this embodiment, the speed indicator 122 may be a light-emitting diode of another color, which may flash faster as the clock signal of the test fixture 100 is returned to the motherboard 10. It is for the operator to determine whether the clock signal to be returned by the test fixture 100 to the motherboard 10 is within the normal range. Of course, in other embodiments, the speed indicator 122 may also be a screen or a digital watch, which indicates the signal by displaying the value of the clock signal. Alternatively, the rotation speed indicator 122 can also be presented by sound, and by emitting different sounds or frequencies, the operator can determine whether the clock signal to be returned by the test fixture 100 to the motherboard 10 is normal.

In this embodiment, each fixture connector 110 is provided with a corresponding voltage indicator 120 and speed indicator 122, which can facilitate the operator to determine whether the fan control signal transmitted through the fixture connector 110 is normal. In other words, in this embodiment, the test fixture 100 may include eight voltage indicators 120 and eight rotation speed indicators 122, which are respectively disposed beside the eight fixture connectors 110. Of course, the number and position of the voltage indicator 120 and the speed indicator 122 are not limited thereto.

It should be noted that, in general, when there is a problem with the fan control signal of the motherboard 10, if the motherboard 10 is connected to a physical fan, it is difficult to determine whether there is a problem with the fan voltage or pulse width modulation, which is not easy Debug. In this embodiment, the operator can determine whether the fan voltage is normal by the voltage indicator 120, and whether the clock signal is normal by the speed indicator 122, to infer whether the pulse width modulation is normal, and it is easier to debug. In addition, in this embodiment, the test fixture 100 further includes a restart button 160 to facilitate the operator to restart the test fixture 100.

The test fixture 100 of this embodiment is designed as a fan simulator, which can simulate a physical fan from receiving the fan voltage and pulse width modulation (PWM) information transmitted from the motherboard 10 to outputting a clock signal (Clock) corresponding to the speed To replace the physical fan used in the computer motherboard 10 or Netcom motherboard 10 fan test. The physical fan will have problems of noise and easy damage during operation, and the test fixture 100 only has electrical signals and will not have the noise and damage of the physical fan in the operation of the organization. Therefore, using the test fixture 100 of this embodiment to test the fan control signal of the motherboard can reduce test time and cost.

In this embodiment, the test fixture 100 can simulate a three-pin (Pin) fan and a four-pin fan, and can support different forms of the motherboard 10. In addition, the test fixture 100 can simulate multiple sets of fan signals, and the test fixture 100 can set various speed modes by the maximum speed setting switch, which can simplify the test. In addition, compared to the energy consumption of the physical fan, the test fixture 100 of this embodiment has a current draw of about 0.8A and an operating power of about 9.6W when the fan voltage is 12V, which is quite energy-saving.

In summary, the test method and test system of the fan control signal of the motherboard of the present invention utilizes the determination of whether the pulse width modulation duty cycle is 100% and the fan voltage is greater than the voltage preset value to determine The second or third speed formula is used to calculate the fan speed, and the corresponding clock signal is output to the motherboard according to the obtained fan speed to simulate the operation of the physical fan. The motherboard will determine whether the received clock signal falls within a preset range. If so, it means that the fan control signal of the motherboard is normal. If not, it means that the fan control signal of the motherboard is abnormal. The method and system for testing the fan control signal of the motherboard of the present invention do not need to connect the physical fan to the motherboard for testing, and the operator does not need to repeatedly plug and unplug multiple physical fan connectors during the process of testing different speed settings. There is no problem of fan loss and noise, and it can reduce the test manpower and cost and improve the comfort of the test environment.

Although the present invention has been disclosed as above with examples, it is not intended to limit the present invention. Any person with ordinary knowledge in the technical field can make some changes and modifications without departing from the spirit and scope of the present invention. The scope of protection of the present invention shall be subject to the scope defined in the appended patent application.

10: motherboard

12: CPU

14: expansion card slot

15: Electric connector

16, 18: connector

17: Transmission line

20: Power supply

100: test fixture

110: Fixture connector

120: voltage indicator

122: speed indicator

130: power module

140: Mode setting switch

141, 143, 145, 147: lever

142, 144, 146: switch

150: processor

160: restart button

200: Test method of the fan control signal of the motherboard

202~230: steps

FIG. 1 is a schematic diagram of a test fixture for a fan control signal of a motherboard according to an embodiment of the invention. FIG. 2 is a schematic diagram of connecting the test fixture of FIG. 1 to a motherboard and a power supply. FIG. 3 is a schematic flowchart of a method for testing a fan control signal of a motherboard according to an embodiment of the invention. FIG. 4 is a schematic flowchart of a first simulated speed acquisition procedure of the method for testing the fan control signal of the motherboard of FIG. 3. FIG. 5 is a schematic flowchart of a second simulated rotation speed acquisition procedure of the test method of the fan control signal of the motherboard of FIG. 3.

10: motherboard

12: CPU

14: expansion card slot

15: Electric connector

16, 18: connector

17: Transmission line

20: Power supply

100: test fixture

120: voltage indicator

122: speed indicator

130: power module

140: Mode setting switch

142, 144, 146: Maximum speed setting switch

150: processor

160: restart button

Claims (8)

A test method for a fan control signal of a motherboard includes: reading a fan voltage and a pulse width modulation signal sent from a motherboard; calculating a pulse width modulation duty cycle according to the pulse width modulation signal Executing a first simulated speed acquisition procedure, including: judging whether the pulse width modulation duty cycle is 100%, wherein when the pulse width modulation duty cycle is 100%, according to a first speed formula to calculate a The first fan speed, the first speed formula is the first fan speed = (the fan voltage/12V) x (a maximum speed-a base speed) + the base speed; when the pulse width modulation duty cycle is not At 100%, it is determined whether the fan voltage is greater than a voltage preset value. When the fan voltage is greater than the voltage preset value, a second fan speed is calculated according to a second speed formula, the second speed formula is the first Two fan speed = (the pulse width modulation duty cycle/100) x (the maximum speed-the base speed) + the base speed; and when the fan voltage is not greater than the voltage preset value, a third fan is obtained Rotation speed; after executing the first simulated rotation speed acquisition procedure, according to the obtained first fan rotation speed, the second fan rotation speed or the third fan rotation speed, output a corresponding first clock signal to the motherboard; and The motherboard determines whether the first clock signal falls within a preset range. The method for testing the fan control signal of the motherboard as described in item 1 of the patent scope, wherein when the first analog speed acquisition procedure is executed, the duty cycle of the pulse width modulation is used to determine that the motherboard passes a three-pin Signal or a four-pin signal. The method for testing the fan control signal of the motherboard as described in item 1 of the patent scope, wherein the third fan speed is 0. The method for testing the fan control signal of the motherboard as described in item 1 of the patent application scope, wherein after reading the fan voltage, a processor can selectively execute the first simulated speed acquisition procedure according to a mode setting switch or A second simulated speed acquisition procedure, the second simulated speed acquisition procedure includes: determining whether the fan voltage is greater than the voltage preset value, and when the fan voltage is greater than the voltage preset value, calculating a according to the second speed formula The fourth fan speed; and when the fan voltage is not greater than the voltage preset value, the third fan speed is obtained; after performing the second simulated speed acquisition procedure, according to the obtained third fan speed or the fourth The speed of the fan outputs a corresponding second clock signal to the motherboard; and the motherboard determines whether the second clock signal falls within the preset range. A test system for a fan control signal of a motherboard is suitable for testing a motherboard. The test system for a fan control signal of the motherboard includes: a test fixture, including: A jig connector suitable for being electrically connected to the motherboard to obtain a fan voltage and a pulse width modulation signal sent from the motherboard; a processor electrically connected to the jig connector, The processor is adapted to calculate a pulse width modulation duty cycle according to the pulse width modulation signal, wherein the processor is adapted to execute a first simulated speed acquisition procedure, the first simulated speed acquisition procedure includes: determining the pulse Whether the width modulation duty cycle is 100%, where when the pulse width modulation duty cycle is 100%, a first fan speed is calculated according to a first speed formula, when the pulse width modulation duty cycle is not When it is 100%, it is judged whether the fan voltage is greater than a voltage preset value, when the fan voltage is greater than the voltage preset value, a second fan speed is calculated according to a second speed formula, when the fan voltage is not greater than the When the voltage is preset, a third fan speed is obtained; and a maximum speed setting switch is electrically connected to the processor to provide a preset maximum speed to the processor, the first speed formula is the first A fan speed = (the fan voltage/12V) x (the maximum speed-a base speed) + the base speed, and the second speed formula is the second fan speed = (the pulse width modulation duty cycle/100 ) x (the maximum speed-the base speed) + the base speed, after executing the first simulated speed acquisition program, the processor according to the obtained first fan speed, the second fan speed or the third fan Speed, output a corresponding first clock signal to the motherboard. The test system for the fan control signal of the motherboard as described in item 5 of the patent scope, the test fixture further includes: a mode setting switch, electrically connected to the processor, and the processor selects according to the mode setting switch To execute the first simulated speed obtaining procedure or a second simulated speed obtaining procedure, the second simulated speed obtaining procedure includes determining whether the fan voltage is greater than the voltage preset value, and when the fan voltage is greater than the voltage preset value, A fourth fan speed is calculated according to the second speed formula. When the fan voltage is not greater than the voltage preset value, the third fan speed is obtained. After executing the second simulated speed acquisition procedure, the processor The obtained third fan speed or the fourth fan speed outputs a corresponding second clock signal to the motherboard. The test system for the fan control signal of the motherboard as described in item 5 of the patent application scope, the test fixture further includes: a voltage indicator, electrically connected to the processor, and adapted to be based on the The fan voltage indicates a signal. The test system for the fan control signal of the motherboard as described in item 5 of the patent scope, the test fixture further includes: a speed indicator, electrically connected to the processor, suitable for indicating according to the first clock signal There is a signal.

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