TW201432438A - Fan test fixture - Google Patents
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- TW201432438A TW201432438A TW102101019A TW102101019A TW201432438A TW 201432438 A TW201432438 A TW 201432438A TW 102101019 A TW102101019 A TW 102101019A TW 102101019 A TW102101019 A TW 102101019A TW 201432438 A TW201432438 A TW 201432438A
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04D—NON-POSITIVE-DISPLACEMENT PUMPS
- F04D27/00—Control, e.g. regulation, of pumps, pumping installations or pumping systems specially adapted for elastic fluids
- F04D27/001—Testing thereof; Determination or simulation of flow characteristics; Stall or surge detection, e.g. condition monitoring
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Abstract
Description
本發明涉及一種測試治具，特別涉及一種風扇測試治具。The invention relates to a test fixture, in particular to a fan test fixture.
風扇測試是為了驗證主機板上風扇在工作時，其控制訊號及電壓是否滿足晶片規範及系統設計要求，當主機板溫度發生變化時，風扇能否動態進行調節，即風扇轉速能否變化。主機板透過調節風扇PWM（脈衝寬度調製）訊號，達到改變風扇的轉速，同時，風扇將轉速訊號回饋給主機板，實現閉合的控制過程。從訊號完整性角度考慮，需要驗證風扇所接收的PWM訊號及主機板BMC（基板管理控制器）所接收的轉速訊號。習知測試方案是使用探棒直接在主機板風扇介面處進行檢測。主機板風扇介面包括4個引腳，分別為接地引腳、電源引腳、轉速引腳以及脈衝寬度調製訊號引腳。進行測試時，由於工程師需要保證握緊探棒，才能使探頭良好地接觸風扇與主機板的介面，同時風扇轉速快，所產生的雜訊較大，對工程師產生較大干擾。當進行訊號測試時，探頭的接地線需接觸接地引腳上，而風扇介面的接地引腳與電源引腳之間的間隔較小，這就造成在測試中，探頭地線非常容易同時接觸到接地引腳與電源引腳，進而造成主機板的電源對地短路，燒毀主機板。而且，當進行訊號完整性量測時，通常需要測試PWM訊號在不同工作週期時的訊號品質，而調節的方法通常需要修改暫存器，較為麻煩。The fan test is to verify whether the control signal and voltage of the fan on the motherboard meet the chip specifications and system design requirements. When the temperature of the motherboard changes, whether the fan can be dynamically adjusted, that is, whether the fan speed can be changed. The motherboard adjusts the fan PWM (pulse width modulation) signal to change the speed of the fan. At the same time, the fan feeds back the speed signal to the motherboard to realize the closed control process. From the perspective of signal integrity, it is necessary to verify the PWM signal received by the fan and the speed signal received by the motherboard BMC (Baseboard Management Controller). The conventional test scheme uses a probe to directly detect at the motherboard fan interface. The motherboard fan interface consists of four pins, which are ground pin, power pin, speed pin, and pulse width modulated signal pin. When testing, the engineer needs to ensure that the probe is gripped, so that the probe can well contact the interface between the fan and the motherboard. At the same time, the fan speed is fast, and the generated noise is large, which causes great interference to the engineer. When the signal test is performed, the ground wire of the probe needs to be in contact with the ground pin, and the gap between the ground pin of the fan interface and the power pin is small, which causes the probe ground to be easily accessible at the same time during the test. The ground pin and the power pin cause the power supply of the motherboard to short to the ground and burn the motherboard. Moreover, when performing signal integrity measurement, it is usually necessary to test the signal quality of the PWM signal at different duty cycles, and the adjustment method usually needs to modify the register, which is troublesome.
鑒於此，有必要提供一種可方便探棒接收待測訊號且能夠動態調整脈衝寬度調製訊號工作週期的風扇測試治具。In view of this, it is necessary to provide a fan test fixture that can conveniently receive the signal to be tested and dynamically adjust the duty cycle of the pulse width modulation signal.
一種風扇測試治具，用於與一待測主機板上的風扇介面相連，該風扇測試治具包括：A fan test fixture is connected to a fan interface on a motherboard to be tested, and the fan test fixture includes:
一連接器，包括接地引腳、電源引腳、脈衝寬度調製訊號引腳以及速度訊號引腳；a connector including a ground pin, a power pin, a pulse width modulated signal pin, and a speed signal pin;
一電源測試單元，包括第一觸點以及第二觸點，該電源測試單元的第一觸點與連接器的接地引腳相連，該訊號測試單元的第二觸點與連接器的電源引腳相連；a power test unit includes a first contact and a second contact, the first contact of the power test unit is connected to a ground pin of the connector, and the second contact of the signal test unit and a power pin of the connector Connected
一訊號測試單元，包括第三觸點以及第四觸點，該訊號測試單元的第三觸點與第一觸點相連，該訊號測試單元的第四觸點與該連接器的脈衝寬度調製訊號引腳相連；a signal test unit includes a third contact and a fourth contact, wherein the third contact of the signal test unit is connected to the first contact, and the fourth contact of the signal test unit and the pulse width modulation signal of the connector Pin connected;
一微處理器，與該連接器的速度訊號引腳以及訊號測試單元的第四觸點相連；以及a microprocessor coupled to the speed signal pin of the connector and the fourth contact of the signal test unit;
一鍵盤，與該微處理器相連，用於輸入一風扇額定最大轉速及一工作週期預設值，該微處理器還用於根據輸入的額定最大轉速及工作週期預設值計算風扇轉速值並將計算得到的風扇轉速值傳輸至連接器的速度訊號引腳，該待測主機板根據接收的風扇轉速值計算對應的脈衝寬度調製訊號的工作週期，並將計算得到的脈衝寬度調製訊號的工作週期輸出至第四觸點，透過檢測訊號測試單元的第三及第四觸點以得到待測主機板所輸出的脈衝寬度調製訊號的工作週期。a keyboard, connected to the microprocessor, for inputting a rated maximum speed of the fan and a preset value of the working period, the microprocessor is further configured to calculate the fan speed value according to the input rated maximum speed and the preset value of the working period Transmitting the calculated fan speed value to the speed signal pin of the connector, the board to be tested calculates the working period of the corresponding pulse width modulation signal according to the received fan speed value, and works on the calculated pulse width modulation signal The cycle output is output to the fourth contact, and the third and fourth contacts of the signal test unit are detected to obtain a duty cycle of the pulse width modulation signal output by the motherboard to be tested.
透過該風扇測試治具，透過將引腳延伸至觸點可方便將探棒與訊號進行連接且透過微處理器類比輸出風扇轉速訊號至主機板基板管理控制器能夠動態調整脈衝寬度調製訊號工作週期以進行測試。Through the fan test fixture, the probe can be connected to the signal by extending the pin to the contact, and the pulse width modulation signal duty cycle can be dynamically adjusted by the microprocessor analog output fan speed signal to the motherboard management controller. To test.
10．．．風扇測試治具10. . . Fan test fixture
101．．．連接器101. . . Connector
102．．．電源測試單元102. . . Power test unit
103．．．訊號測試單元103. . . Signal test unit
104．．．微處理器104. . . microprocessor
105．．．脈衝寬度調製訊號工作週期顯示器105. . . Pulse width modulated signal duty cycle display
106．．．速度訊號顯示器106. . . Speed signal display
107．．．鍵盤107. . . keyboard
201．．．接地引腳201. . . Ground pin
202．．．電源引腳202. . . Power pin
203．．．速度訊號引腳203. . . Speed signal pin
204．．．脈衝寬度調製訊號引腳204. . . Pulse width modulated signal pin
205-208．．．觸點205-208. . . Contact
圖1為本發明風扇測試治具的較佳實施方式的方框圖。1 is a block diagram of a preferred embodiment of a fan test fixture of the present invention.
請參考圖1，本發明風扇測試治具10的較佳實施方式包括連接器101、電源測試單元102、訊號測試單元103、微處理器104、脈衝寬度調製訊號工作週期顯示器105、速度訊號顯示器106以及鍵盤107。Referring to FIG. 1 , a preferred embodiment of the fan test fixture 10 of the present invention includes a connector 101 , a power test unit 102 , a signal test unit 103 , a microprocessor 104 , a pulse width modulation signal duty cycle display 105 , and a speed signal display 106 . And a keyboard 107.
該連接器101包括接地引腳201、電源引腳202、速度訊號引腳203以及脈衝寬度調製訊號引腳204。該連接器101用於與待測試主機板上的風扇介面相連。The connector 101 includes a ground pin 201, a power pin 202, a speed signal pin 203, and a pulse width modulated signal pin 204. The connector 101 is used to connect to a fan interface on a motherboard to be tested.
該電源測試單元102包括第一觸點205以及第二觸點206，該第一觸點205與連接器101的接地引腳201相連，該第二觸點206與連接器101的電源引腳202相連。The power test unit 102 includes a first contact 205 and a second contact 206 connected to the ground pin 201 of the connector 101, the second contact 206 and the power pin 202 of the connector 101. Connected.
該訊號測試單元103包括第三觸點207以及第四觸點208，該第三觸點207與第一觸點205相連。由於第一觸點205與該連接器101的接地引腳201相連，即使得該第三觸點207也與連接器101的接地引腳201電連接。該第四觸點208與該脈衝寬度調製訊號引腳204相連。The signal test unit 103 includes a third contact 207 and a fourth contact 208 that is coupled to the first contact 205. Since the first contact 205 is connected to the ground pin 201 of the connector 101, the third contact 207 is also electrically connected to the ground pin 201 of the connector 101. The fourth contact 208 is coupled to the pulse width modulated signal pin 204.
該微處理器104與該速度訊號引腳203及脈衝寬度調製訊號引腳204均相連。該微處理器104還與該脈衝寬度調製訊號工作週期顯示器105以及速度訊號顯示器106相連。The microprocessor 104 is coupled to both the speed signal pin 203 and the pulse width modulated signal pin 204. The microprocessor 104 is also coupled to the pulse width modulated signal duty cycle display 105 and the speed signal display 106.
該鍵盤107與該微處理器104相連。The keyboard 107 is coupled to the microprocessor 104.
本實施方式中，測試時，將該連接器101與待測試主機板上的風扇介面相連。此時，風扇介面的接地引腳及電源引腳則分別與連接器101的接地引腳201及電源引腳202相連，進而使得電源測試單元102的第一觸點205及第二觸點206分別與待測試主機板上的風扇介面的接地引腳及電源引腳相連。又由於第一觸點205與第二觸點206之間的間距較大，如此即可避免了人工將兩探針分別與待測試主機板上的風扇介面的接地引腳及電源引腳接觸時由於誤操作而造成主機板電源短路狀況。In this embodiment, the connector 101 is connected to the fan interface on the motherboard to be tested during testing. At this time, the ground pin and the power pin of the fan interface are respectively connected to the ground pin 201 and the power pin 202 of the connector 101, so that the first contact 205 and the second contact 206 of the power test unit 102 respectively Connect to the ground pin and power pin of the fan interface on the motherboard to be tested. Moreover, since the distance between the first contact 205 and the second contact 206 is large, the manual contact between the two probes and the ground pin and the power pin of the fan interface on the motherboard to be tested can be avoided. The motherboard power supply is short-circuited due to misoperation.
本實施方式中，測量脈衝寬度調製訊號完整性時，可預先透過該鍵盤107向微處理器104輸入程式以設定待測試風扇的額定最大轉速F(max)以及工作週期預設值P，其中工作週期預設值與額定最大轉速之間的公式為：工作週期預設值P=F(fact)/F(max)，公式中F(fact)為風扇實際轉速值，F(max)為風扇額定最大轉速值。該微處理器104可透過輸入的額定最大轉速以及工作週期預設值計算風扇實際轉速值，並將計算得到的風扇轉速值輸出至該速度訊號引腳203，其中該計算得到的風扇轉速值可被視為是類比的速度訊號。In the embodiment, when the pulse width modulation signal integrity is measured, a program may be input to the microprocessor 104 through the keyboard 107 to set the rated maximum speed F(max) of the fan to be tested and the preset period P of the duty cycle, wherein the operation is performed. The formula between the cycle preset value and the rated maximum speed is: the preset value of the duty cycle P=F(fact)/F(max), where F(fact) is the actual fan speed value and F(max) is the fan rating. Maximum speed value. The microprocessor 104 can calculate the actual fan speed value through the input rated maximum speed and the preset value of the duty cycle, and output the calculated fan speed value to the speed signal pin 203, wherein the calculated fan speed value can be It is considered an analogous speed signal.
根據主機板上風扇介面的連接關係可知，風扇介面的速度訊號引腳連接主機板上的基板管理控制器，即微處理器104輸出的風扇轉速值會被主機板上的基板管理控制器所接收。該主機板基板管理控制器接收該風扇轉速值之後依據公式：工作週期P=F(fact)/F(max)計算出脈衝寬度調製訊號的工作週期，並透過脈衝寬度調製訊號引腳204輸出至該第四觸點208。此時，測試者使用示波器探針量測第三觸點207以及第四觸點208即可得到脈衝寬度調製訊號的工作週期，透過比較檢測得到的工作週期與工作週期預設值即可測量訊號的完整性。According to the connection relationship of the fan interface on the motherboard, the speed signal pin of the fan interface is connected to the baseboard management controller on the motherboard, that is, the fan speed value output by the microprocessor 104 is received by the baseboard management controller on the motherboard. . After receiving the fan speed value, the motherboard substrate management controller calculates a duty cycle of the pulse width modulation signal according to a formula: a duty cycle P=F(fact)/F(max), and outputs the pulse width modulation signal pin 204 to the pulse width modulation signal pin 204. The fourth contact 208. At this time, the tester uses the oscilloscope probe to measure the third contact 207 and the fourth contact 208 to obtain the duty cycle of the pulse width modulated signal, and the signal can be measured by comparing the detected duty cycle and the preset duty cycle value. Integrity.
同時，該脈衝寬度調製訊號的工作週期還被輸出至脈衝寬度調製訊號工作週期顯示器105，該脈衝寬度調製訊號工作週期顯示器105用於顯示脈衝寬度調製訊號的工作週期。且，該脈衝寬度調製訊號工作週期顯示器105還用於顯示透過鍵盤107輸入的工作週期預設值。該速度訊號顯示器106用於顯示該微處理器104輸出的風扇轉速值。At the same time, the duty cycle of the pulse width modulated signal is also output to the pulse width modulated signal duty cycle display 105, which is used to display the duty cycle of the pulse width modulated signal. Moreover, the pulse width modulated signal duty cycle display 105 is further configured to display a duty cycle preset value input through the keyboard 107. The speed signal display 106 is used to display the fan speed value output by the microprocessor 104.
透過該風扇測試治具10，測試訊號完整性時不僅可以避免由於誤操作而導致將示波器的兩探針相接觸，還可實現動態調整脈衝寬度調製訊號的工作週期。Through the fan test fixture 10, when the signal integrity is tested, not only the two probes of the oscilloscope can be contacted due to misoperation, but also the duty cycle of dynamically adjusting the pulse width modulation signal can be realized.
綜上所述，本發明符合發明專利要件，爰依法提出專利申請。惟，以上所述者僅為本發明之較佳實施例，舉凡熟悉本案技藝之人士，在爰依本發明精神所作之等效修飾或變化，皆應涵蓋於以下之申請專利範圍內。In summary, the present invention complies with the requirements of the invention patent and submits a patent application according to law. The above description is only the preferred embodiment of the present invention, and equivalent modifications or variations made by those skilled in the art will be included in the following claims.
10．．．風扇測試治具10. . . Fan test fixture
101．．．連接器101. . . Connector
102．．．電源測試單元102. . . Power test unit
103．．．訊號測試單元103. . . Signal test unit
104．．．微處理器104. . . microprocessor
105．．．脈衝寬度調製訊號工作週期顯示器105. . . Pulse width modulated signal duty cycle display
106．．．速度訊號顯示器106. . . Speed signal display
107．．．鍵盤107. . . keyboard
201．．．接地引腳201. . . Ground pin
202．．．電源引腳202. . . Power pin
203．．．速度訊號引腳203. . . Speed signal pin
204．．．脈衝寬度調製訊號引腳204. . . Pulse width modulated signal pin
205-208．．．觸點205-208. . . Contact
Claims (3)
一連接器，包括接地引腳、電源引腳、脈衝寬度調製訊號引腳以及速度訊號引腳；
一電源測試單元，包括第一觸點以及第二觸點，該電源測試單元的第一觸點與連接器的接地引腳相連，該訊號測試單元的第二觸點與連接器的電源引腳相連；
一訊號測試單元，包括第三觸點以及第四觸點，該訊號測試單元的第三觸點與第一觸點相連，該訊號測試單元的第四觸點與該連接器的脈衝寬度調製訊號引腳相連；
一微處理器，與該連接器的速度訊號引腳以及訊號測試單元的第四觸點相連；以及
一鍵盤，與該微處理器相連，用於輸入一風扇額定最大轉速及一工作週期預設值，該微處理器還用於根據輸入的額定最大轉速及工作週期預設值計算風扇轉速值並將計算得到的風扇轉速值傳輸至連接器的速度訊號引腳，該待測主機板根據接收的風扇轉速值計算對應的脈衝寬度調製訊號的工作週期，並將計算得到的脈衝寬度調製訊號的工作週期輸出至第四觸點，透過檢測訊號測試單元的第三及第四觸點以得到待測主機板所輸出的脈衝寬度調製訊號的工作週期。A fan test fixture is connected to a fan interface on a motherboard to be tested, and the fan test fixture includes:
a connector including a ground pin, a power pin, a pulse width modulated signal pin, and a speed signal pin;
a power test unit includes a first contact and a second contact, the first contact of the power test unit is connected to a ground pin of the connector, and the second contact of the signal test unit and a power pin of the connector Connected
a signal test unit includes a third contact and a fourth contact, wherein the third contact of the signal test unit is connected to the first contact, and the fourth contact of the signal test unit and the pulse width modulation signal of the connector Pin connected;
a microprocessor coupled to the speed signal pin of the connector and the fourth contact of the signal test unit; and a keyboard coupled to the microprocessor for inputting a fan rated maximum speed and a duty cycle preset The microprocessor is further configured to calculate a fan speed value according to the input rated maximum speed and the preset period of the duty cycle, and transmit the calculated fan speed value to the speed signal pin of the connector, and the motherboard to be tested is received according to the value. The fan speed value calculates a duty cycle of the corresponding pulse width modulation signal, and outputs the calculated duty cycle of the pulse width modulation signal to the fourth contact, and passes through the third and fourth contacts of the detection signal test unit to obtain The duty cycle of the pulse width modulated signal output by the motherboard is measured.
The fan test fixture of claim 2, further comprising a speed signal display, wherein the speed signal display is connected to the microprocessor for displaying a fan speed value output by the microprocessor.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210578416.2A CN103899558A (en) | 2012-12-27 | 2012-12-27 | Fan testing fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW201432438A true TW201432438A (en) | 2014-08-16 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW102101019A TW201432438A (en) | 2012-12-27 | 2013-01-11 | Fan test fixture |
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| Country | Link |
|---|---|
| US (1) | US20140188424A1 (en) |
| CN (1) | CN103899558A (en) |
| TW (1) | TW201432438A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI679532B (en) * | 2018-10-05 | 2019-12-11 | 緯穎科技服務股份有限公司 | Monitoring system and method |
| TWI687791B (en) * | 2018-12-26 | 2020-03-11 | 技嘉科技股份有限公司 | Testing method of fan control signal from main board and testing system thereof |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI586897B (en) * | 2016-07-11 | 2017-06-11 | 奇鋐科技股份有限公司 | Fan detecting system and method |
| CN107588029B (en) * | 2017-09-04 | 2019-03-05 | 郑州云海信息技术有限公司 | A kind of multi-platform fan test method of automation |
| CN109026810B (en) * | 2018-09-25 | 2024-04-16 | 长虹美菱股份有限公司 | Fan test fixture |
| CN111090018B (en) * | 2019-12-27 | 2022-05-17 | 苏州浪潮智能科技有限公司 | Testing arrangement of server fan board |
| CN112924852A (en) * | 2021-02-21 | 2021-06-08 | 深圳市微特精密科技股份有限公司 | Fan simulation test method and fan simulation test card |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7098617B1 (en) * | 2005-02-16 | 2006-08-29 | Texas Instruments Incorporated | Advanced programmable closed loop fan control method |
| CN101452414A (en) * | 2007-12-06 | 2009-06-10 | 鸿富锦精密工业（深圳）有限公司 | Mainboard fan interface test system and method |
| CN102817824A (en) * | 2011-06-08 | 2012-12-12 | 鸿富锦精密工业（深圳）有限公司 | Fan testing method and system |
-
2012
- 2012-12-27 CN CN201210578416.2A patent/CN103899558A/en active Pending
-
2013
- 2013-01-11 TW TW102101019A patent/TW201432438A/en unknown
- 2013-08-22 US US13/972,956 patent/US20140188424A1/en not_active Abandoned
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI679532B (en) * | 2018-10-05 | 2019-12-11 | 緯穎科技服務股份有限公司 | Monitoring system and method |
| TWI687791B (en) * | 2018-12-26 | 2020-03-11 | 技嘉科技股份有限公司 | Testing method of fan control signal from main board and testing system thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103899558A (en) | 2014-07-02 |
| US20140188424A1 (en) | 2014-07-03 |
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