CN111367251A - Method and system for testing fan control signal of mainboard - Google Patents

Method and system for testing fan control signal of mainboard Download PDF

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Publication number
CN111367251A
CN111367251A CN201811597502.1A CN201811597502A CN111367251A CN 111367251 A CN111367251 A CN 111367251A CN 201811597502 A CN201811597502 A CN 201811597502A CN 111367251 A CN111367251 A CN 111367251A
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fan
speed
voltage
rotating speed
rotation speed
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Inventor
谢泳龙
孟宪明
孙武雄
廖祝湘
张基霖
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Giga Byte Technology Co Ltd
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Giga Byte Technology Co Ltd
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    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0256Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults injecting test signals and analyzing monitored process response, e.g. injecting the test signal while interrupting the normal operation of the monitored system; superimposing the test signal onto a control signal during normal operation of the monitored system

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  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Control Of Electric Motors In General (AREA)

Abstract

The invention discloses a method and a system for testing a fan control signal of a mainboard. And calculating the pulse width modulation duty ratio according to the pulse width modulation signal. When the duty ratio of the pulse width modulation is 100%, the first fan rotating speed is calculated according to a first rotating speed formula. When the duty ratio of the pulse width modulation is not 100% and the fan voltage is greater than the voltage default value, calculating a second fan rotating speed according to a second rotating speed formula. And when the fan voltage is not greater than the voltage default value, obtaining a third fan rotating speed. And outputting a corresponding first frequency signal to the mainboard according to the obtained first, second or third fan rotating speed. The mainboard judges whether the first frequency signal falls into a preset range. The invention can test the fan control signal of the mainboard without using a physical fan.

Description

Method and system for testing fan control signal of mainboard
Technical Field
The present invention relates to a testing method and system, and more particularly, to a testing method and system for a fan control signal of a motherboard.
Background
Currently, in the testing of the motherboard, a plurality of groups of physical fans are connected to the motherboard to detect whether the fan control signal of the motherboard is abnormal. However, in each test, the operator needs to repeatedly insert and remove the fan, which is very complicated in operation. In addition, these fans have a high failure rate after long-term testing, and need to be replaced frequently, which increases the cost of the test.
Disclosure of Invention
The invention aims to provide a method for testing a fan control signal of a mainboard, which can test the fan control signal of the mainboard without using a physical fan.
The present invention also provides a system for testing a fan control signal of a motherboard, which can be used to replace a physical fan to test the fan control signal of the motherboard.
In order to achieve the above object, the present invention provides a method for testing a fan control signal of a motherboard, which includes reading a fan voltage and a pwm signal sent from a motherboard. A pulse width modulation duty ratio is calculated according to the pulse width modulation signal. Executing a first simulated rotation speed obtaining program, comprising: judging whether the pulse width modulation duty ratio is 100%, wherein when the pulse width modulation duty ratio is 100%, calculating a first fan rotating speed according to a first rotating speed formula; when the pulse width modulation duty ratio is not 100%, judging whether the fan voltage is greater than a voltage default value, and when the fan voltage is greater than the voltage default value, calculating a second fan rotating speed according to a second rotating speed formula; and obtaining a third fan rotating speed when the fan voltage is not greater than the voltage default value. After executing the first simulation rotating speed obtaining program, outputting a corresponding first frequency signal to the mainboard according to the obtained first fan rotating speed, the second fan rotating speed or the third fan rotating speed. The mainboard judges whether the first frequency signal falls into a preset range.
In an embodiment of the invention, when the first simulated rotation speed obtaining procedure is executed, the main board is judged to transmit a three-pin signal or a four-pin signal according to the pulse width modulation duty ratio.
In an embodiment of the invention, the first rotation speed formula is the first fan rotation speed ═ fan voltage/12V x (a maximum rotation speed-a base rotation speed) + the base rotation speed.
In an embodiment of the invention, the second rotation speed formula is the second fan rotation speed ═ (pwm duty ratio/100) x (a maximum rotation speed-a base rotation speed) + the base rotation speed.
In an embodiment of the invention, the third fan speed is 0.
In an embodiment of the invention, after the reading of the fan voltage, the first simulated rotation speed obtaining program or a second simulated rotation speed obtaining program is selectively executed, where the second simulated rotation speed obtaining program includes: judging whether the fan voltage is greater than the voltage default value, and calculating a fourth fan rotating speed according to the second rotating speed formula when the fan voltage is greater than the voltage default value; and obtaining a third fan rotating speed when the fan voltage is not greater than the voltage default value. After executing the second simulation rotating speed obtaining program, outputting a corresponding second frequency signal to the mainboard according to the obtained third fan rotating speed or the fourth fan rotating speed. The mainboard judges whether the second frequency signal falls into a preset range.
The invention also provides a test system of the fan control signal of the mainboard, which is suitable for testing the mainboard. The test fixture includes a fixture connector and a processor. The jig connector is suitable for being electrically connected to the mainboard to obtain a fan voltage and a pulse width modulation signal sent from the mainboard. The processor is electrically connected to the jig connector and is suitable for calculating a pulse width modulation duty ratio according to the pulse width modulation signal, wherein the processor is suitable for executing a first simulation rotating speed obtaining program. The first simulated rotation speed obtaining program includes: judging whether the pulse width modulation duty ratio is 100%, wherein when the pulse width modulation duty ratio is 100%, calculating a first fan rotating speed according to a first rotating speed formula; when the pulse width modulation duty ratio is not 100%, judging whether the fan voltage is greater than a voltage default value, and when the fan voltage is greater than the voltage default value, calculating a second fan rotating speed according to a second rotating speed formula; when the fan voltage is not greater than the voltage default value, a third fan rotating speed is obtained. After executing the first simulation rotating speed obtaining program, the processor outputs a corresponding first frequency signal to the mainboard according to the obtained first fan rotating speed, the second fan rotating speed or the third fan rotating speed.
In an embodiment of the invention, the test fixture further includes a maximum rotation speed setting switch electrically connected to the processor for providing a preset maximum rotation speed to the processor, wherein the first rotation speed formula is a first fan rotation speed (fan voltage/12V) x (maximum rotation speed-a basic rotation speed) + the basic rotation speed, and the second rotation speed formula is a second fan rotation speed (pulse width modulation duty ratio/100) x (maximum rotation speed-basic rotation speed) + the basic rotation speed.
In an embodiment of the invention, the test fixture further includes a mode setting switch electrically connected to the processor, the processor selects to execute the first simulation rotation speed obtaining program or the second simulation rotation speed obtaining program according to the mode setting switch, the second simulation rotation speed obtaining program includes determining whether the fan voltage is greater than the voltage default value, when the fan voltage is greater than the voltage default value, calculating a fourth fan rotation speed according to the second rotation speed formula, and when the fan voltage is not greater than the voltage default value, obtaining the third fan rotation speed. After executing the second simulation rotating speed obtaining program, the processor outputs a corresponding second frequency signal to the mainboard according to the obtained third fan rotating speed or the fourth fan rotating speed.
In an embodiment of the invention, the test fixture further includes a voltage indicator electrically connected to the processor and adapted to indicate a signal according to a fan voltage emitted by the motherboard.
In an embodiment of the invention, the test fixture further includes a rotation speed indicator electrically connected to the processor and adapted to indicate a signal according to the first frequency signal.
Based on the above, the method and system for testing the fan control signal of the motherboard of the present invention determine whether the pwm duty cycle is 100% and the fan voltage is greater than the voltage default value, so as to determine whether to calculate the fan speed according to the first, second, or third speed formula, and output the corresponding frequency signal to the motherboard according to the obtained fan speed, thereby simulating the operation of the physical fan. The mainboard judges whether the received frequency signal falls into a preset range, and if so, the fan control signal of the mainboard is normal. If not, the fan control signal of the mainboard is abnormal. The method and the system for testing the fan control signal of the mainboard do not need to connect the physical fan to the mainboard for testing, so that an operator does not need to repeatedly plug and pull the joints of a plurality of physical fans in the process of testing different rotating speed settings, the problem of fan loss is avoided, and the testing labor and the testing cost can be reduced.
In order to make the aforementioned features and advantages of the present invention comprehensible, the present invention is described in detail below with reference to the accompanying drawings and specific examples, but without limiting the present invention thereto.
Drawings
Fig. 1 is a schematic diagram of a testing fixture for fan control signals of a motherboard according to an embodiment of the invention.
Fig. 2 is a schematic diagram illustrating the test fixture of fig. 1 connected to a motherboard and a power supply.
Fig. 3 is a flowchart illustrating a method for testing a fan control signal of a motherboard according to an embodiment of the invention.
Fig. 4 is a flowchart illustrating a first simulated rotation speed obtaining program of the method for testing the fan control signal of the motherboard of fig. 3.
Fig. 5 is a flowchart illustrating a second simulated rotation speed obtaining program of the method for testing the fan control signal of the motherboard of fig. 3.
Wherein, the reference numbers:
10: main machine board
12: central processing unit
14: expansion card slot
15: electric connector
16. 18: joint
17: transmission line
20: power supply
100: test fixture
110: jig connector
120: voltage indicator
122: rotating speed indicator
130: power supply module
140: mode setting switch
141. 143, 145, 147: deflector rod
142. 144, 146: switch with a switch body
150: processor with a memory having a plurality of memory cells
160: reset button
200: method for testing fan control signal of mainboard
202-230: step (ii) of
Detailed Description
When testing the fan control signal of the existing mainboard, the mainboard is connected with the physical fan, the mainboard transmits the fan voltage and the pulse width modulation signal to the fan, and the fan rotates at the corresponding rotating speed. Since the rotation speed of the fan corresponds to a specific frequency signal, the frequency signal is fed back to the motherboard. Therefore, the mainboard can judge whether the rotating speed of the fan is normal or not according to the received frequency signal, and further judge whether the fan control signal transmitted by the mainboard through the connector is normal or not.
In this embodiment, the system for testing the fan control signal of the motherboard can test whether the fan control signal of the motherboard is normal without connecting the physical fan to the motherboard, and during the test, an operator does not need to repeatedly plug and unplug the connector of the physical fan, and there is no problem of fan loss, so that the testing labor and cost can be reduced, and the noise generated during the operation of the fan can be avoided.
Fig. 1 is a schematic diagram of a testing fixture for fan control signals of a motherboard according to an embodiment of the invention. Fig. 2 is a schematic diagram illustrating the test fixture of fig. 1 connected to a motherboard and a power supply. Referring to fig. 1 and fig. 2, the system for testing the fan control signal of the motherboard of the present embodiment is suitable for testing the fan control signal of a motherboard 10 (fig. 2).
As shown in fig. 1, the system for testing a fan control signal of a motherboard includes a testing fixture 100. The test fixture 100 includes at least one fixture connector 110 and a processor 150 electrically connected to the fixture connector 110. The fixture connector 110 is adapted to be electrically connected to the motherboard 10 (fig. 2) to obtain a fan voltage and a pwm signal transmitted from the motherboard 10. In the present embodiment, the test fixture 100 includes eight fixture connectors 110 electrically connected to the processor 150, and can simulate eight fans. Of course, the number of the jig connectors 110 is not limited thereto.
As shown in fig. 2, in the embodiment, the motherboard 10 may have eight connectors for connecting fans, and when testing the fan control signals transmitted by the eight connectors on the motherboard 10, an operator may insert the connector 16 of each transmission line 17 into the connector on the motherboard 10 and insert the connector 18 of the transmission line 17 into the fixture connector 110 (fig. 1) of the testing fixture 100, so that the motherboard 10 is electrically connected to the testing fixture 100. Thus, the test fixture 100 can obtain the fan voltage and the pulse width modulation signal sent by the motherboard 10.
The motherboard 10 has a central processing unit 12, an expansion card slot 14 electrically connected to the central processing unit 12, and an electrical connector 15. In the embodiment, the power supply 20 is connected to the electrical connector 15 of the motherboard 10 and the power module 130 of the test fixture 100 to supply power to the motherboard 10 and the test fixture 100.
In this embodiment, the testing system of the fan control signal of the motherboard simulates the operation of the fan through the testing fixture 100, and the processor 150 calculates a corresponding frequency signal according to the fan voltage and the pwm signal transmitted from the motherboard 10, and transmits the frequency signal back to the motherboard 10, so that the motherboard 10 can determine whether the fan control signal transmitted by the connector is normal.
It should be noted that, in the embodiment, the test fixture 100 having eight fixture connectors 110 can simulate eight virtual fans, and the fixture connectors 110 can be connected to a plurality of connectors on the same motherboard 10 to determine whether a plurality of fan control signals on the motherboard 10 are normal. The jig connectors 110 may also be connected to different motherboards 10 to determine whether the fan control signals on different motherboards 10 are normal.
It should be noted that, since eight fans can be connected to the motherboard 10, if the test fixture 100 simulates that the eight fans are started simultaneously, the load on the motherboard 10 is large, which may cause the motherboard 10 to stop operating (shutdown). In the present embodiment, the test fixture 100 may have a circuit or a switch (not shown) for simulating the batch start of the fans, for example, four of the fans can be controlled to start first, and the other four fans can be controlled to start later, so as to reduce the load of the motherboard 10. Of course, the form of batch start is not so limited. In other embodiments, the test fixture 100 may not have a circuit or switch for simulating the batch start of the fan.
In addition, since the main board 10 may be connected to fans with different maximum rotation speeds, in the conventional test, an operator needs to connect the main board 10 to the fans with different maximum rotation speeds respectively and perform the test. In the present embodiment, the test fixture 100 further includes a maximum rotation speed setting switch electrically connected to the processor 150. The operator can adjust the maximum rotation setting switch to change the maximum rotation of the fan simulated by the test fixture 100. Thus, the operator does not need to test the signals between the motherboard 10 and different fans one by one.
In detail, in the embodiment, the maximum rotation speed setting switch includes the switches 142, 144, 146, and the operator can adjust the switches 142, 144, 146 to set the preset maximum rotation speed, for example, by using the following table one. For example, when the operator wants to test the fan with the maximum rotation speed of 2000rpm, the test fixture 100 simulates the fan with the maximum rotation speed of 2000rpm by turning all the switches 142, 144, 146 (such as the levers 143, 145, 147) to on (on). The processor 150 calculates the corresponding frequency signal according to the preset maximum rotation speed.
Table one:
Figure BDA0001921684480000061
Figure BDA0001921684480000071
of course, the type and number of the maximum rotation speed setting switches and the manner of setting the maximum rotation speed are not limited thereto. In addition, in other embodiments, the test fixture 100 may also have more than one set of maximum rotation speed setting switches, so as to simulate the simultaneous operation of fans with various maximum rotation speeds.
In addition, the fans on the market are divided into two types, one is old fan, which has 3 transmission pins (3 pins). The other is a new fan with 4 transmission pins (4pin), which is the current main fan type. Some of the motherboards 10 only support fans with 4 transmission pins, and some of the motherboards 10 support fans with 4 transmission pins and fans with 3 transmission pins.
In order to make the testing fixture 100 applicable to the motherboard 10 of the above-mentioned type, in the present embodiment, the testing fixture 100 further includes a mode setting switch 140 electrically connected to the processor 150. In the present embodiment, the position of the toggle lever 141 of the mode setting switch 140 adjusted to on (on) represents the automatic mode, and the processor 150 determines whether the motherboard 10 transmits a three-pin signal or a four-pin signal to the test fixture 100, and calculates the corresponding frequency signal accordingly. When the switch lever 141 of the mode setting switch 140 is adjusted to the off position, which represents the four-pin mode, the processor 150 directly determines that the motherboard 10 transmits the four-pin signal to the test fixture 100, and calculates the corresponding frequency signal accordingly. Of course, in other embodiments, the test fixture 100 may be directly preset to the automatic mode without the mode setting switch 140.
How the test system for the fan control signal of the motherboard operates will be described below. Fig. 3 is a flowchart illustrating a method for testing a fan control signal of a motherboard according to an embodiment of the invention. Referring to fig. 3, in step 202, when the motherboard 10 transmits the fan control signals to the eight virtual fans to the test fixture 100, the motherboard 10 starts the eight virtual fans in a time-sharing manner according to the settings on the test fixture 100, that is, the motherboard 10 transmits the fan control signals of the eight virtual fans to the test fixture 100 in batches. For example, the fan control signal is first transmitted to four of the jig connectors 110, and then the fan control signal is transmitted to the remaining four jig connectors 110.
Next, in step 203, the processor 150 reads the information of the maximum rotation speed setting switch to obtain the maximum rotation speed of the currently simulated fan. And, in step 205, the processor 150 reads the fan voltage and the pwm signal transmitted by the motherboard 10. Next, in step 206, the processor 150 calculates a pwm duty cycle according to the pwm signal. In step 206, the processor 150 confirms the setting on the mode setting switch 140 to determine which mode is to be used to calculate the fan speed.
More specifically, the processor 150 determines whether to execute an auto mode (automatically determining whether the motherboard 10 transmits a three-pin signal or a four-pin signal to the test fixture 100) or a four-pin mode (directly determining whether the motherboard 10 transmits a four-pin signal to the test fixture 100) according to the mode setting switch 140. In the present embodiment, if the processor 150 wants to calculate the fan speed according to the auto mode rule, the processor 150 executes a first simulated speed obtaining procedure. If the processor 150 wants to calculate the fan speed according to the four-pin mode rule, the processor 150 executes a second simulation speed obtaining procedure.
Fig. 4 is a flowchart illustrating a first simulated rotation speed obtaining program of the method for testing the fan control signal of the motherboard of fig. 3. Referring to fig. 4, in the present embodiment, the first simulated rotation speed obtaining program 210 includes the following steps. First, whether the pwm duty cycle is 100% is determined (step 211), wherein a first fan speed is calculated according to a first speed formula when the pwm duty cycle is 100%.
The difference between the three-pin signal and the four-pin signal is that the four-pin signal has one more pin for transmitting the pwm signal than the three-pin signal. That is, the three-pin signal does not carry a pwm signal. When transmitting the three-pin signal, the pwm signal is determined to be maintained at a high logic level (always high), and thus the pwm duty cycle is calculated to be 100%.
In other words, when the pwm duty ratio is 100%, one of the signals may be the three-pin signal transmitted from the motherboard 10 to the test fixture 100. Alternatively, the motherboard 10 transmits a four-pin signal to the test fixture 100, and the transmitted pwm signal is converted to a pwm duty cycle of 100% (full).
That is, in the present embodiment, when the first simulated rotation speed obtaining procedure is executed, it is determined that the motherboard transmits a three-pin signal or a four-pin signal according to the pwm duty cycle.
In the present embodiment, under the above two conditions, the processor 150 calculates the virtual fan speed according to the first speed formula as shown in step 212. The first rotation speed formula is the first fan rotation speed ═ x (fan voltage/12V) (max-base rotation speed) + base rotation speed, where the fan voltage is the voltage transmitted to the test fixture 100 by the motherboard 10, the max rotation speed is the set value of the max rotation speed setting switch on the test fixture 100, and the base rotation speed may be a default value, such as 1000rpm, but is not limited thereto.
Then, when the duty ratio of the pulse width modulation is not 100%, whether the fan voltage is larger than a voltage default value is judged. In this embodiment, the default voltage is, for example, 10V (step 213), but not limited thereto. Generally, the fan voltage is 12V for example, since the voltage may slightly increase or decrease depending on the circuit and other factors. In the present embodiment, when the fan voltage is greater than 10V, it can be determined as the normal fan voltage. When the fan voltage is less than 10V, it is determined as an abnormal fan voltage.
In this embodiment, when the fan voltage is greater than the voltage default value, it represents that the fan voltage transmitted by the motherboard 10 still belongs to the normal range, and at this time, the processor 150 may calculate a second fan speed according to a second speed formula. In this embodiment, the second rotation speed formula is the second fan rotation speed ═ x (pwm duty ratio/100) (max-base rotation speed) + base rotation speed (step 214).
When the fan voltage is not greater than the voltage default value, it represents that the fan voltage transmitted by the motherboard 10 is not within the normal range, which represents an abnormality, and at this time, the processor 150 obtains a third fan speed. In this embodiment, the third fan speed is 0 (step 215).
Then, please return to fig. 3, in step 230, a corresponding frequency signal is outputted according to the rotation speed of the fan. In the embodiment, after executing the first simulation speed obtaining program, the processor 150 outputs a corresponding first frequency signal to the motherboard 10 according to the obtained first fan speed, the second fan speed or the third fan speed. The motherboard 10 determines whether the first frequency signal returned by the test fixture 100 is within a predetermined range according to the received first frequency signal, and if so, it represents that the first frequency signal is normal, and it can be concluded that the fan control signal sent by the motherboard 10 is normal. If not, it represents that the first frequency signal is abnormal, and it can be concluded that the fan control signal sent by the motherboard 10 is abnormal.
On the other hand, if the processor 150 wants to calculate the fan speed according to the four-pin mode rule, the processor 150 executes a second simulation speed obtaining procedure. Fig. 5 is a flowchart illustrating a second simulated rotation speed obtaining program of the method for testing the fan control signal of the motherboard of fig. 3. Referring to fig. 5, the second simulated rotation speed obtaining process 220 includes the following steps. It is determined whether the fan voltage is greater than a default voltage value, which is, for example, 10V in the present embodiment (step 221), but not limited thereto.
When the fan voltage is greater than the voltage default value, it represents that the fan voltage transmitted by the motherboard 10 still belongs to the normal range, and at this time, the processor 150 can calculate a fourth fan speed according to the second speed formula. In the present embodiment, the second rotation speed formula is the second fan rotation speed ═ x (pwm duty ratio/100) (max-base rotation speed) + base rotation speed (step 222), where the max rotation speed is the set value of the max rotation speed setting switch on the test fixture 100, and the base rotation speed may be a default value, such as 1000rpm, but not limited thereto.
When the fan voltage is not greater than the voltage default value, it represents that the fan voltage transmitted by the motherboard 10 belongs to an abnormal range, and the processor 150 can obtain a third fan speed. In this embodiment, the third fan speed is 0 (step 223).
In the embodiment, since the switch lever 141 of the mode setting switch 140 is adjusted to the off position, the processor 150 calculates the fan speed according to the four-pin mode rule, and at this time, the processor 150 knows that the motherboard 10 determines that the test fixture 100 is a fan with 4 transmission pins. Therefore, the processor 150 does not need to distinguish whether the motherboard 10 transmits three-pin signals or four-pin signals. Therefore, the processor 150 omits the step 211 when executing the second simulated rotation speed obtaining program. In this embodiment, step 222 in fig. 5 is the same as step 214 in fig. 4, and step 223 in fig. 5 is the same as step 215 in fig. 4, but not limited thereto.
After executing the second simulation speed obtaining program, the processor 150 outputs a corresponding second frequency signal to the motherboard 10 according to the obtained third fan speed or the fourth fan speed. Similarly, the motherboard 10 determines whether the second frequency signal returned by the test fixture 100 is within a predetermined range according to the received second frequency signal, and if so, it indicates that the second frequency signal is normal, and it can be inferred that the fan control signal sent by the motherboard 10 is normal. If not, the fan control signal sent by the motherboard 10 is abnormal.
Referring back to fig. 2, in the present embodiment, the test fixture 100 further includes a voltage indicator 120 electrically connected to the processor 150. The voltage indicator 120 is adapted to indicate a signal according to a fan voltage emitted by the motherboard 10. That is, the operator can obtain the information of the fan voltage transmitted from the motherboard 10 from the voltage indicator 120 on the test fixture 100. For example, in the embodiment, the voltage indicator 120 may be a light emitting diode, and may be brighter as the fan voltage sent by the motherboard 10 is higher, so that the operator can determine whether the fan voltage sent by the motherboard 10 is normal. Of course, in other embodiments, the voltage indicator 120 may be a screen or a digital table, indicating the signal by displaying the value of the fan voltage. Alternatively, the voltage indicator 120 may be presented by sound, and the operator may determine whether the fan voltage sent by the motherboard 10 is normal by emitting different sounds or frequencies.
In addition, in the embodiment, the test fixture 100 further includes a rotation speed indicator 122, and the rotation speed indicator 122 is electrically connected to the processor 150. The rotation speed indicator 122 is adapted to indicate a signal according to the first frequency signal. That is, the operator can obtain the information of the clock signal that the test fixture 100 transmits back to the motherboard 10 from the rotation speed indicator 122 on the test fixture 100. For example, in the embodiment, the rotation speed indicator 122 may be a light emitting diode with another color, and may blink faster as the frequency signal to be transmitted back to the motherboard 10 by the test fixture 100 is larger, so that an operator can determine whether the frequency signal to be transmitted back to the motherboard 10 by the test fixture 100 is within a normal range. Of course, in other embodiments, the rotation speed indicator 122 may be a screen or a digital table, and the signal is indicated by displaying the value of the frequency signal. Alternatively, the rotation speed indicator 122 may be presented by sound, so that the operator can determine whether the frequency signal sent back to the motherboard 10 by the test fixture 100 is normal by emitting different sounds or frequencies.
In the present embodiment, a voltage indicator 120 and a rotation speed indicator 122 are disposed beside each fixture connector 110, so that an operator can conveniently determine whether the fan control signal transmitted through the fixture connector 110 is normal. That is, in the present embodiment, the test fixture 100 may include eight voltage indicators 120 and eight rotation speed indicators 122, which are respectively disposed beside the eight fixture connectors 110. Of course, the number and positions of the voltage indicators 120 and the rotational speed indicators 122 are not limited thereto.
It should be noted that, generally, when there is a problem in the fan control signal of the motherboard 10, if the motherboard 10 is connected to a physical fan, it is difficult to determine whether there is a problem in the fan voltage or a problem in the pwm, and thus it is not easy to debug. In this embodiment, the operator can determine whether the fan voltage is normal by the voltage indicator 120 and determine whether the frequency signal is normal by the rotation speed indicator 122 to determine whether the pwm is normal, which is easier to debug. In addition, in the present embodiment, the test fixture 100 further includes a restart button 160, so as to facilitate the operator to restart the test fixture 100.
The test fixture 100 of the present embodiment is designed as a fan simulator, which can simulate a program of a physical fan from receiving a fan voltage and Pulse Width Modulation (PWM) information transmitted from the motherboard 10 to outputting a Clock signal (Clock) corresponding to a rotation speed, so as to replace the physical fan for fan testing of the computer motherboard 10 or the network motherboard 10. The physical fan has a problem of noise and damage during operation, and the test fixture 100 only has an electrical signal without noise and damage on the operation of the mechanism as the physical fan. Therefore, the testing fixture 100 of the present embodiment is used to test the fan control signal of the motherboard, thereby reducing the testing time and cost.
In the present embodiment, the test fixture 100 can simulate a three Pin (Pin) fan and a four Pin (four Pin) fan, and can support different types of motherboards 10. In addition, the test fixture 100 can simulate a plurality of fan signals, and the test fixture 100 can set various rotation speed modes by the maximum rotation speed setting switch, thereby simplifying the test. In addition, compared to the energy consumption of the physical fan, the test fixture 100 of the present embodiment has a current pumping capacity of about 0.8A and an operating power of about 9.6W when the fan voltage is 12V, which saves energy.
In summary, the method and system for testing the fan control signal of the motherboard of the present invention determine whether the pwm duty cycle is 100% and the fan voltage is greater than the voltage default value by determining whether the fan speed is calculated according to the first, second, or third speed formula, and output the corresponding frequency signal to the motherboard according to the obtained fan speed, so as to simulate the operation of the physical fan. The mainboard judges whether the received frequency signal falls into a preset range, and if so, the fan control signal of the mainboard is normal. If not, the fan control signal of the mainboard is abnormal. The method and the system for testing the fan control signal of the mainboard do not need to connect the physical fan to the mainboard for testing, so that an operator does not need to repeatedly plug and pull the joints of a plurality of physical fans in the process of testing different rotating speed settings, the problems of fan loss and noise are avoided, the testing labor and cost are reduced, and the comfort level of a testing environment is improved.
Although the present invention has been described with reference to the above embodiments, it should be understood that the invention is not limited thereto.
The present invention is capable of other embodiments, and various changes and modifications may be made by one skilled in the art without departing from the spirit and scope of the invention as defined in the appended claims.

Claims (11)

1. A method for testing a fan control signal of a mainboard is characterized by comprising the following steps:
reading a fan voltage and a pulse width modulation signal sent from a mainboard;
calculating a pulse width modulation duty ratio according to the pulse width modulation signal;
executing a first simulated rotation speed obtaining program, comprising:
judging whether the pulse width modulation duty ratio is 100%, wherein when the pulse width modulation duty ratio is 100%, calculating a first fan rotating speed according to a first rotating speed formula;
when the pulse width modulation duty ratio is not 100%, judging whether the fan voltage is greater than a voltage default value, and when the fan voltage is greater than the voltage default value, calculating a second fan rotating speed according to a second rotating speed formula; and
when the fan voltage is not greater than the voltage default value, obtaining a third fan rotating speed;
after executing the first simulation rotating speed obtaining program, outputting a corresponding first frequency signal to the mainboard according to the obtained first fan rotating speed, the second fan rotating speed or the third fan rotating speed; and
the motherboard determines whether the first frequency signal falls within a predetermined range.
2. The method as claimed in claim 1, wherein when executing the first simulation rpm obtaining process, the method determines whether the motherboard transmits a three-pin signal or a four-pin signal according to the pwm duty cycle.
3. The method as claimed in claim 1, wherein the first rotational speed formula is the first fan rotational speed ═ x (max-base rotational speed) + the base rotational speed (fan voltage/12V).
4. The method as claimed in claim 1, wherein the second speed formula is the second fan speed ═ x (max-base speed) + the base speed (pwm duty/100).
5. The method as claimed in claim 1, wherein the third fan speed is 0.
6. The method as claimed in claim 1, wherein after reading the fan voltage, selectively executing the first simulated rotation speed obtaining program or a second simulated rotation speed obtaining program, the second simulated rotation speed obtaining program comprises:
judging whether the fan voltage is greater than the voltage default value, and calculating a fourth fan rotating speed according to the second rotating speed formula when the fan voltage is greater than the voltage default value; and
when the fan voltage is not greater than the voltage default value, obtaining the third fan rotating speed;
after executing the second simulation rotating speed obtaining program, outputting a corresponding second frequency signal to the mainboard according to the obtained third fan rotating speed or the fourth fan rotating speed; and
the motherboard determines whether the second frequency signal falls within the predetermined range.
7. A test system for fan control signals of a mainboard is suitable for testing a mainboard, and is characterized in that the test system for fan control signals of the mainboard comprises:
a test fixture, comprising:
a tool connector, suitable for electrically connecting to the motherboard to obtain a fan voltage and a pulse width modulation signal sent from the motherboard; and
a processor electrically connected to the jig connector, the processor being adapted to calculate a pulse width modulation duty ratio according to the pulse width modulation signal, wherein the processor is adapted to execute a first simulated rotation speed obtaining procedure, the first simulated rotation speed obtaining procedure comprising:
determining whether the PWM duty cycle is 100%, wherein when the PWM duty cycle is 100%, a first fan speed is calculated according to a first speed formula,
when the duty ratio of the PWM is not 100%, determining whether the fan voltage is greater than a voltage default, and when the fan voltage is greater than the voltage default, calculating a second fan speed according to a second speed formula,
when the fan voltage is not greater than the default voltage value, a third fan speed is obtained,
after executing the first simulation rotating speed obtaining program, the processor outputs a corresponding first frequency signal to the mainboard according to the obtained first fan rotating speed, the second fan rotating speed or the third fan rotating speed.
8. The system of claim 7, further comprising:
a maximum speed setting switch electrically connected to the processor for providing a predetermined maximum speed to the processor, wherein the first speed formula is the first fan speed (the fan voltage/12V) x (the maximum speed-a basic speed) + the basic speed, and the second speed formula is the second fan speed (the pwm duty ratio/100) x (the maximum speed-the basic speed) + the basic speed.
9. The system of claim 7, further comprising:
a mode setting switch electrically connected to the processor, the processor selecting to execute the first simulation rotation speed obtaining program or a second simulation rotation speed obtaining program according to the mode setting switch, the second simulation rotation speed obtaining program includes judging whether the fan voltage is greater than the voltage default value, when the fan voltage is greater than the voltage default value, calculating a fourth fan rotation speed according to the second rotation speed formula, when the fan voltage is not greater than the voltage default value, obtaining the third fan rotation speed,
after executing the second simulation rotating speed obtaining program, the processor outputs a corresponding second frequency signal to the mainboard according to the obtained third fan rotating speed or the fourth fan rotating speed.
10. The system of claim 7, further comprising:
and the voltage indicator is electrically connected with the processor and is suitable for indicating a signal according to the fan voltage sent by the mainboard.
11. The system of claim 7, further comprising:
and the rotating speed indicator is electrically connected with the processor and is suitable for indicating a signal according to the first frequency signal.
CN201811597502.1A 2018-12-26 2018-12-26 Method and system for testing fan control signal of mainboard Pending CN111367251A (en)

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CN106681886A (en) * 2016-12-26 2017-05-17 郑州云海信息技术有限公司 Method and system for judging server fan damage
CN107612428A (en) * 2017-09-30 2018-01-19 广东美的环境电器制造有限公司 Direct current generator and its startup control method, device
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Publication number Priority date Publication date Assignee Title
CN101452414A (en) * 2007-12-06 2009-06-10 鸿富锦精密工业(深圳)有限公司 Mainboard fan interface test system and method
CN106533151A (en) * 2016-12-05 2017-03-22 广东美的制冷设备有限公司 Control method and control device of partial PFC circuit and domestic appliance
CN106681886A (en) * 2016-12-26 2017-05-17 郑州云海信息技术有限公司 Method and system for judging server fan damage
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