CN101826047B - Mainboard measuring device for stimulating central processing unit - Google Patents

Mainboard measuring device for stimulating central processing unit Download PDF

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Publication number
CN101826047B
CN101826047B CN 200910118555 CN200910118555A CN101826047B CN 101826047 B CN101826047 B CN 101826047B CN 200910118555 CN200910118555 CN 200910118555 CN 200910118555 A CN200910118555 A CN 200910118555A CN 101826047 B CN101826047 B CN 101826047B
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mainboard
signal
contact
processor
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CN101826047A (en
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石柏文
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Asustek Computer Inc
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Asustek Computer Inc
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Abstract

A setting unit on a measuring circuit board is utilized to set the voltage and working frequency of a central processing unit (CPU) to be stimulated; when being installed on a CPU socket on a mainboard, a measuring device can stimulate the CPU; the mainboard operates by being supplied with power and outputs corresponding signals according to set voltage and working frequency. A plurality of measuring units are arranged on the measuring device to ensure that a measuring instrument can directly measure the core voltage signal, the CUP reset signal, the power ready signal, the CPU clock signal or other signal to be measured which are provided by the mainboard to the CPU through the measuring units, thus ensuring the signal measurement of the mainboard to be more conveniently and accurately.

Description

The mainboard measuring equipment of simulation central processing unit
Technical field
The relevant a kind of measuring equipment of the present invention refers to a kind ofly on a mainboard especially, can simulate the mainboard measuring equipment of central processing unit.
Background technology
In computer apparatus, mainboard provides the hardware platform of a computation, and cooperates except various peripheral devices, storer and adapter with mainboard, and most important also most crucial element just belongs to central processing unit.Motherboard design and manufacturer when the design element of mainboard and configuration, in the time of must guaranteeing that central processing unit is mounted thereon, can normal operation.Usually correctly reach the test phase of stability at the mainboard signal, when needing the measurement central processing unit to be installed on the mainboard, whether the power supply that the processor clock signal that mainboard provides at central processing unit (CPU clock), processor reset signal (CPU reset), power supply unit offer processor slot one central processing unit is ready to signal (CPU power good, CPU PG), processor core voltage signal (Vcc) ... wait various signals normal.An entity central processing unit up to specification directly is installed on mainboard and known measurement mode is essential, in the normal power supply operation, is measured the signal of each corresponding contact of central processing unit.
Such practice has several problems.First, after mainboard has been installed central processing unit, the probe of measuring instrument also can't deeply measure central processing unit periphery signal contact in addition, only can measure the line segment of peripheral close this signal contact (for example processor clock signal contact) of processor, can't directly measure under the restriction of clock signal end, the numerical value and the actual value that measure just produce gap, cause measurement inaccurate.The second, for the slot contact that installs central processing unit is measured, need strike off the anti-welding lacquer on the mainboard contact usually earlier, make the probe of measuring instrument be able to contact to obtain signal with the metal covering of contact.The 3rd, because central processing unit running meeting produces high heat, can't under the situation that the fan heat radiation is not installed, operate, so the setting of fan causes measurement to be difficult for.The 4th, the signal contact for partly being positioned at the processor slot middle section still can have the signaling point of holes to measure by the processor slot back side in mainboard, and right such practice energy not yet measures the not signal contact of holes.
Summary of the invention
The invention provides a kind of mainboard measuring equipment of simulating central processing unit, be used for being installed on a processor slot of a mainboard, this processor slot has a plurality of signal contacts, and this mainboard measuring equipment includes a circuit board, a setup unit and measures the unit.This setup unit is arranged on this circuit board, and electrically connects with the signal contact of this processor slot.This measurement unit is arranged on this circuit board, have a gauge point and a contact point, one signal contact of this contact point and this processor slot electrically connects, and this gauge point and a measuring instrument electrically connect to provide this signal contact signal of this processor slot to this measuring instrument.
Description of drawings
Fig. 1 simulates the mainboard measuring equipment of central processing unit and the synoptic diagram of the processor slot on the mainboard for the present invention.
Fig. 2 is the synoptic diagram at the measuring equipment back side of Fig. 1.
Fig. 3 is the synoptic diagram that measuring equipment is connected with the signal of processor slot.
Embodiment
Please refer to Fig. 1, Fig. 1 the present invention simulates the mainboard measuring equipment 1 of central processing unit and the synoptic diagram of the processor slot 21 on the mainboard 2.Measuring equipment 1 is installed on the processor slot 21 of mainboard 2, with analog processor, makes mainboard 2 can start shooting and send the signal relevant with central processing unit.Measuring equipment 1 has a circuit board 11, then is provided with a voltage setup unit 12, a frequency setting unit 13 and a plurality of measurements unit 14~17 on circuit board 11.Characteristic at the central processing unit of desire simulation has a plurality of adjustment switches 121 on the voltage setup unit 12, in the time of can adjusting measuring equipment 1 and be installed on processor slot 21, simulate the operating voltage of corresponding central processing unit; And have a plurality of adjustment switches 131 on the frequency setting unit 13 can adjust measuring equipment 1 and be installed on processor slot 21 time, simulate the frequency of operation of corresponding central processing unit.The frequencies that the voltage that 2 of mainboards are set according to switch 121 and switch 131 are set provide magnitude of voltage and the clock signal of corresponding supply central processing unit.This magnitude of voltage and clock signal then can get by the aforementioned quantities measurement unit measures the signal contact 22 in the processor slot 21.
In addition, because different processor specifications has the signal contact 22 of varying number and different deployment way, in embodiments of the invention, 21 of processor slots are for meeting contact array encapsulation (LandGrid Array, LGA) cpu socket of 775 specifications then has 775 signal contacts 22 in processor slot 21.Therefore measuring equipment 1 namely is used for simulation and meets contact array encapsulation (Land GridArray, LGA) central processing unit of 775 specifications.Yet the disclosed technology of the present invention is not limited to central processing unit and the mainboard of aforementioned specification, respectively measures unit 14~17 and setup unit 12 in the icon, 13 connecting point position also only is the usefulness of explanation.
Please in the lump with reference to figure 2, Fig. 2 is the schematic rear view of measuring equipment 1.The processor contact 111 that then has a plurality of signal contacts 22 on the difference alignment processing device slot 21 of a plurality of positions in the back side of measuring equipment 1.The back side that voltage setup unit 12 extends to circuit board 11 is a plurality of setting contacts 122, in its position difference alignment processing device slot 21, the voltage identification unit of 2 pairs of processors of mainboard (Voltageidentification, the position of a plurality of signal contacts 22 VID).When measurement device 1 is installed on the processor slot 21, sets contact 122 and electrically connect with the signal contact 22 that the voltage identification unit comprises, so that the electric voltage identification code of the mainboard central processing unit that 2 desires are simulated to be provided.And to extend to the back side of circuit board 11 be a plurality of setting contacts 132 in frequency setting unit 13, and its position is respectively in alignment processing device slot 21, the position of a plurality of signal contacts 22 of the frequency selected cell of 2 pairs of processors of mainboard (B select pin).When measurement device 1 is installed on the processor slot 21, sets contact 132 and electrically connect with the signal contact 22 that the frequency selected cell comprises, so that the frequency of operation of the mainboard central processing unit that 2 desires are simulated to be provided.
In embodiments of the invention, detect after electric voltage identification code that measuring equipment 1 sends and frequency of operation set at mainboard 2, measurement unit 13~17 on the measuring equipment 1, the power supply that can obtain processor core voltage signal (Vcc) that mainboard 2 offers central processing unit, processor reset signal (CPUreset), processor slot respectively is ready to signal (CPU power good, CPU PG) and the processor clock signal of processor slot (CPU clock), whether operate normally with these signals that measure and the checking mainboard sends.
The back side that each measurement unit 14~17 extends to circuit board 11 is respectively its contact point 142~172, in its position difference alignment processing device slot 21, mainboard 2 offers processor core voltage signal contact (Vcc), the processor reset signal contact (CPU reset) of central processing unit, the power supply of processor slot is ready to signal contact (CPU power good, CPU PG) and the position of the processor clock signal contact (CPU clock) of processor slot, these contacts all are included in a plurality of signal contacts 22.Measure the contact point 142~172 of unit 14~17 and setup unit 12,13 setting contact 122,132 then is included in a plurality of processor contacts 111, as for other contact that does not use in the processor contact 111 then as idle contact, only have the outward appearance of contact at circuit board 11 back sides, the signal contact 22 with its opposite position does not electrically connect.
Each measures unit 14~17 and then have gauge point 141~171 respectively on circuit board 11 front of Fig. 1.Be installed on processor slot 21 and mainboard 2 in open state and provide in the environment of corresponding processor signal when measuring device 1, the probe 31 that utilizes measuring instrument 3 directly each gauge point 141~171 of contact to measure each mainboard signal.Thus, the disclosed measuring equipment 1 of the present invention at the anti-welding lacquer that does not need to strike off in addition the mainboard contact, do not need the actual installation central processing unit and be subject under the situation of fan, can make the probe 31 of measuring instrument 3 directly measure the numerical value of clock pulse signal end and other is positioned at the signal of the signal contact of processor middle position, obtain accurate metric data.
Please refer to Fig. 3, Fig. 3 is the synoptic diagram that measuring equipment 1 is connected with the signal of processor slot 21.For example, the contact of output processor core voltage signal (Vcc) electrically connects in the contact point 142 of the first measurement unit 14 and the processor slot 21, and probe 31 contacts first of measuring equipment 3 measure gauge point 141 (because the characteristic of voltage signal of unit 14, in preferred embodiment of the present invention, gauge point 141 is outstanding stitch, can guarantee that probe 31 firmly touches gauge point 141), to measure the processor core voltage signal (Vcc) of mainboard 2 outputs.The contact of output processor reset signal (CPU reset) electrically connects in the contact point 152 of the second measurement unit 15 and the processor slot 21, and probe 31 contacts second of measuring equipment 3 measure the gauge point 151 of unit 15, to measure the processor reset signal (CPU reset) of mainboard 2 outputs.Out-put supply is ready to signal (CPU power good in the contact point 162 of the 3rd measurement unit 16 and the processor slot 21, CPU PG) contact electrically connects, and probe 31 contacts the 3rd of measuring equipment 3 measure the gauge point 161 of unit 16, be ready to signal (CPU power good, CPU PG) with the power supply that measures mainboard 2 outputs.The contact of output processor clock signal (CPU clock) electrically connects in the contact point 172 of the 4th measurement unit 17 and the processor slot 21, and probe 31 contacts the 4th of measuring equipment 3 measure the gauge point 171 of unit 17, to measure the processor clock signal (CPU clock) of mainboard 2 outputs.
The disclosed measuring equipment of the present invention utilizes setup unit to set voltage and the frequency of operation of the central processing unit of simulation, can simulate central processing unit during processor slot on being installed on mainboard, voltage and frequency of operation that main board power supply running and foundation are set are exported corresponding signal.Has a plurality of measurements unit on the measuring equipment, make the direct throughput measurement unit of measuring instrument measure core voltage signal, processor reset signal, the power supply that mainboard offers processor and be ready to the signal that signal, processor clock signal or other desire measure, make the measurement of mainboard signal convenient, accurate.
The above only is preferred embodiment of the present invention, and all equalizations of doing according to claims of the present invention change and modify, and all should belong to covering scope of the present invention.

Claims (9)

1. mainboard measuring equipment of simulating central processing unit is used for being installed on the processor slot of mainboard, and above-mentioned processor slot has a plurality of signal contacts, it is characterized in that, above-mentioned mainboard measuring equipment includes:
Circuit board;
Setup unit is arranged on the foregoing circuit plate, simulates operating voltage and the frequency of operation of above-mentioned central processing unit by a plurality of adjustment switches, and electrically connects with the signal contact of above-mentioned processor slot; And
Measure the unit, be arranged on the foregoing circuit plate, have gauge point and contact point, a signal contact of above-mentioned contact point and above-mentioned processor slot electrically connects, and above-mentioned gauge point and measuring instrument electrically connect to provide the signal contact signal of above-mentioned processor slot to above-mentioned measuring instrument.
2. mainboard measuring equipment according to claim 1, it is characterized in that, wherein a plurality of signal contacts that comprise of the voltage identification unit of above-mentioned a plurality of adjustment switches of above-mentioned setup unit and above-mentioned processor slot electrically connect, and are used to provide the mainboard voltage identification code.
3. mainboard measuring equipment according to claim 1, it is characterized in that, wherein a plurality of signal contacts that comprise of the frequency selected cell of above-mentioned a plurality of adjustment switches of above-mentioned setup unit and above-mentioned processor slot electrically connect, and are used to provide the mainboard frequency and select signal.
4. mainboard measuring equipment according to claim 1, it is characterized in that, wherein the above-mentioned processor slot of above-mentioned mainboard is to meet the cpu socket that contact array encapsulates 775 specifications, the foregoing circuit plate of above-mentioned mainboard measuring equipment has a plurality of processor contacts, and is corresponding and contact a plurality of signal contacts of above-mentioned cpu socket.
5. mainboard measuring equipment according to claim 4, it is characterized in that, wherein above-mentioned setup unit has a plurality of setting contacts, electrically connect with above-mentioned a plurality of signal contacts of above-mentioned cpu socket, above-mentioned a plurality of processor contacts comprise the above-mentioned contact point of above-mentioned a plurality of setting contact and above-mentioned measurement unit.
6. mainboard measuring equipment according to claim 1 is characterized in that, wherein the processor core voltage signal contact of the above-mentioned contact point of above-mentioned measurement unit and above-mentioned processor slot electrically connects.
7. mainboard measuring equipment according to claim 1 is characterized in that, wherein the processor reset signal contact of the above-mentioned contact point of above-mentioned measurement unit and above-mentioned processor slot electrically connects.
8. mainboard measuring equipment according to claim 1 is characterized in that, wherein the power supply of the above-mentioned contact point of above-mentioned measurement unit and above-mentioned processor slot is ready to signal contact and electrically connects.
9. mainboard measuring equipment according to claim 1 is characterized in that, wherein the processor clock signal contact of the above-mentioned contact point of above-mentioned measurement unit and above-mentioned processor slot electrically connects.
CN 200910118555 2009-03-04 2009-03-04 Mainboard measuring device for stimulating central processing unit Active CN101826047B (en)

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CN101826047B true CN101826047B (en) 2013-08-07

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TWI756322B (en) * 2017-12-13 2022-03-01 英業達股份有限公司 Detecting conduction system for multiple power pins and ground pins of central processing unit socket and method thereof

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2560989Y (en) * 2002-08-14 2003-07-16 技嘉科技股份有限公司 Master board testing tool
CN2613799Y (en) * 2003-03-13 2004-04-28 鸿富锦精密工业(深圳)有限公司 Mainboard test machine
CN1503132A (en) * 2002-11-21 2004-06-09 ��ʢ���ӹɷ����޹�˾ Apparatus for testing output and of mainboard of computer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2560989Y (en) * 2002-08-14 2003-07-16 技嘉科技股份有限公司 Master board testing tool
CN1503132A (en) * 2002-11-21 2004-06-09 ��ʢ���ӹɷ����޹�˾ Apparatus for testing output and of mainboard of computer
CN2613799Y (en) * 2003-03-13 2004-04-28 鸿富锦精密工业(深圳)有限公司 Mainboard test machine

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