CN215575495U - Wearable equipment mainboard test fixture - Google Patents

Abstract

The wearable equipment mainboard test fixture provided by the utility model has the advantages of simple structure, low cost, stability and reliability, and can be used for effectively detecting the functions of the functional board card of the mainboard. The utility model comprises a main control board (1) used for providing a power supply for a detection device, outputting a set voltage, expanding a control port through I2C communication and completing DCR voltage signal measurement, a signal switching board (2) connected between the main control board (1) and a probe module (3) and used for leading out a voltage signal, the probe module (3) used for communicating a simulation test board (4) and the signal switching board (2), and the simulation test board (4) used for simulating a real wearable equipment mainboard to be tested. The utility model can be applied to the field of testing.

Description

Wearable equipment mainboard test fixture

Technical Field

The utility model relates to the field of measurement, in particular to a wearable equipment mainboard test jig.

Background

With the rapid development of science and technology, the consumer electronics industry is changing day by day, and especially wearable devices gradually become a hot spot from smart bracelets to fitness bracelets and then to VR glasses (VR: Virtual Reality, abbreviated as VR, the specific connotation is a technology for providing immersion feeling in an interactive three-dimensional environment generated on a computer by comprehensively utilizing a computer graphics system and various interface devices such as Reality and control), and the products present the top-end science and technology of the digital intelligence era in front of the people, thereby enriching the lives of the people. Compared with other electronic products, the wearable device motherboard test is more strict, and almost all internal hardware functions need to be accurately measured before the product leaves a factory, such as a chip, a sensor, a wireless module, and the like, so it is important for a related professional developer to design a set of accurate and stable test equipment. Wherein, the test equipment comprises a mainboard test part of the wearable equipment. The device for testing the mainboard of the wearable device is called a mainboard test fixture. When the test fixture is shipped, OQC (Outgoing Quality Control) is performed to ensure the Quality of the shipped fixture.

Because the mainboard size of these wearable equipment can be smaller, and most mainboard area is less than 90 square millimeters, and thickness is less than 1.27 millimeters, because of the secret mechanism of tested mainboard, mainboard test fixture can't use the mainboard of real wearable product to carry out shipment test before shipment moreover. These factors have led to the previous OQC inspection only including pin-point blue film inspection, machine operation aging, machine power supply high voltage inspection, and appearance inspection. But these detection items can not carry out quality verification to the function board card in the tool. Therefore, there is a risk of poor testing after the jig arrives at the installation site, resulting in increased on-site maintenance costs and time costs.

SUMMERY OF THE UTILITY MODEL

The utility model aims to overcome the defects of the prior art and provides a wearable equipment mainboard test fixture which is simple in structure, low in cost, stable and reliable and can effectively detect the functions of the functional board cards of the mainboard.

The technical scheme adopted by the utility model is as follows: it comprises a main control board which is used for providing power supply for the wearable equipment mainboard test fixture, outputting set voltage, expanding a control port through I2C communication and completing DCR voltage signal measurement,

a signal switching board connected between the main control board and the probe module for leading out voltage signals,

a probe module for connecting the analog test board and the signal switch board, and

a simulation test board for simulating the wearable equipment mainboard that really awaits measuring.

The signal switching board is provided with a port expansion circuit, an electronic switch circuit and a constant current source circuit, drives the electronic switch circuit to switch signals through the port expansion circuit, distributes the constant current source circuit and voltage signals to each group of probes of the probe module, and realizes voltage signal acquisition through the main control board.

The main control board is connected with the signal switching board through a connector.

The simulation test board is the same as the real wearable equipment mainboard to be tested in appearance and test point position.

The probe module comprises a probe matrix consisting of a plurality of probes and a needle block for fixing the probe matrix, wherein two ends of the probes of the probe matrix are exposed out of the upper side and the lower side of the needle block.

And the probe arrangement of the probe matrix is arranged according to the positions of the test points on the simulation test board.

The main control board comprises an MCU module, and the MCU module is a single chip microcomputer with the model of STM32F 103.

The utility model has the beneficial effects that: the utility model skillfully carries out system test by simulating the test board, can detect the performance of the probe and various functional board cards in the probe module, and can ensure that the functions of various board cards of the jig are normal when the real mainboard of the wearable equipment can not be obtained aiming at the wearable equipment mainboard test jig with small overall dimension; in addition, on the basis of the original detection items, the DCR test of probes in the jig and the detection of various performance parameters of the functional board card are added, so that the stability and the reliability of the whole jig are greatly improved, and the debugging time and the maintenance cost of the jig are saved; in addition, the design cost is low, the circuit is simple, the test fixture can be conveniently transplanted to each wearable equipment mainboard test fixture, and different system test items can be carried out according to the characteristics of the tested mainboard.

Drawings

FIG. 1 is a simplified schematic diagram of the present invention;

FIG. 2 is a simplified schematic diagram of the simulated test board pins;

FIG. 3 is a schematic diagram of the structure of the probe module;

FIG. 4 is a schematic diagram of a port expansion circuit on the signal switch board;

FIG. 5 is a schematic diagram of an electronic switching circuit on the signal switcher board;

FIG. 6 is a schematic diagram of a constant current source circuit on the signal switching board;

FIG. 7 is a simplified electrical schematic of the connector;

fig. 8 is a circuit schematic diagram of the MCU module of the main control board.

Detailed Description

Specific examples of the present invention are as follows.

As shown in fig. 1, the present invention includes a main control board 1 for providing power to the wearable device motherboard test fixture, outputting a set voltage, expanding a control port through I2C communication, and completing DCR voltage signal measurement,

a signal switching board 2 connected between the main control board 1 and the probe module 3 for leading out voltage signals,

a probe module 3 for connecting the analog testing board 4 and the signal switching board 2, and

and the simulation test board 4 is used for simulating a real wearable device mainboard to be tested. The simulation test board 4 is the same as the real wearable equipment mainboard to be tested in appearance and test point position.

As shown in fig. 4 to 6, a port expansion circuit, an electronic switch circuit and a constant current source circuit are arranged on the signal switching board 2, the signal switching board 2 drives the electronic switch circuit to switch signals through the port expansion circuit, the constant current source circuit and voltage signals are distributed to each group of probes of the probe module 3, and the main control board 1 is used for collecting the voltage signals. As shown in fig. 7 and 8, the main control board 1 is connected to the signal switching board 2 through a connector, and the signal switching board is fixedly connected to the probe module through a screw. The main control board 1 comprises an MCU module, and the MCU module is a single chip microcomputer with the model of STM32F 103.

As shown in fig. 3, the probe module 3 includes a probe matrix composed of a plurality of probes and a probe block for fixing the probe matrix, and two ends of the probes of the probe matrix are exposed to the upper and lower sides of the probe block. The probe arrangement of the probe matrix is arranged according to the test point positions on the simulation test board 4. As can be seen from fig. 3, the simulation test board is located on the upper portion of the probe module, the middle portion is a probe block for fixing the probe matrix, and the lower portion is a signal switching board. As shown in fig. 2, when performing the DCR test of the probe module, the signals of the adjacent pins in the analog test board may be connected, and then the constant current provided in the signal switch board is returned through the probe, and the DCR test of the probe may be completed by adopting four-wire wiring.

The utility model aims to ensure that the test board for various functions of the jig is normal when the jig is shipped. Therefore, a signal switching board and a simulation test board are added on the basis of an original jig, signal leading-out is realized through the signal switching board, and various performances of the mainboard of the wearable device to be tested are simulated through the simulation test board, so that the performance test of the mainboard of the wearable device can be completed without testing the mainboard of the wearable device. For example, the main control board in the utility model performs system test during OQC detection, the main control board is connected with the signal switching board through a connector (as shown in fig. 7), and a MCU module (as shown in fig. 8) is used to complete DCR test, and the function verification of the main control board includes voltage setting, I2C communication, voltage acquisition, etc., and the main control board is calibrated through an interface on the signal switching board, thereby ensuring that the main control board is shipped to a customer site normally.

Claims (7)

1. The utility model provides a wearable equipment mainboard test fixture which characterized in that: wearable equipment mainboard test fixture includes

A main control board (1) for providing power supply for the wearable equipment mainboard test fixture, outputting set voltage, expanding a control port through I2C communication and completing DCR voltage signal measurement,

a signal switching board (2) connected between the main control board (1) and the probe module (3) and used for leading out voltage signals,

a probe module (3) for communicating the analog test board (4) with the signal switch board (2), and

and the simulation test board (4) is used for simulating a real wearable device mainboard to be tested.

2. The wearable equipment mainboard test fixture of claim 1, characterized in that: the probe module is characterized in that a port expansion circuit, an electronic switch circuit and a constant current source circuit are arranged on the signal switching board (2), the signal switching board (2) drives the electronic switch circuit to switch signals through the port expansion circuit, the constant current source circuit and voltage signals are distributed to each group of probes of the probe module (3), and the main control board (1) is used for achieving voltage signal collection.

3. The wearable equipment mainboard test fixture of claim 1, characterized in that: the main control board (1) is connected with the signal switching board (2) through a connector.

4. The wearable equipment mainboard test fixture of claim 1, characterized in that: the simulation test board (4) is the same as the real wearable equipment mainboard to be tested in appearance and test point position.

5. The wearable device mainboard test fixture of claim 4, wherein: the probe module (3) comprises a probe matrix consisting of a plurality of probes and a needle block for fixing the probe matrix, and two ends of the probes of the probe matrix are exposed out of the upper side and the lower side of the needle block.

6. The wearable device mainboard test fixture of claim 5, wherein: the probe arrangement of the probe matrix is arranged according to the positions of the test points on the simulation test board (4).

7. The wearable device motherboard test fixture of any one of claims 1 to 6, wherein: the main control board (1) comprises an MCU module, and the MCU module is a single chip microcomputer with the model of STM32F 103.

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