CN111435140A

CN111435140A - Clamp type testing device

Info

Publication number: CN111435140A
Application number: CN201811597911.1A
Authority: CN
Inventors: 刘茂盛; 郭修玮; 王铭辉; 温镇州
Original assignee: To Mao Electronics Suzhou Co ltd
Current assignee: To Mao Electronics Suzhou Co ltd
Priority date: 2018-12-26
Filing date: 2018-12-26
Publication date: 2020-07-21
Anticipated expiration: 2038-12-26
Also published as: CN111435140B

Abstract

The invention provides a clamp type testing device which comprises a first clamping piece and a second clamping piece. The first clamping piece is defined with a first surface, a first end and a second end, and is provided with a conductive module which is arranged on the first surface. The second clamping piece is defined with a third end and a fourth end, the fourth end is connected with the second end, the third end and the first end are separated by a first distance, and the first surface of the first clamping piece faces the second clamping piece. The conductive module comprises a base body and a plurality of conductive pieces, the base body is provided with a plurality of jacks, each conductive piece can be contained in one of the jacks in a pluggable mode, each conductive piece is provided with a first cantilever and a first bending portion, the first bending portion is connected with the first cantilever, the first cantilever extends out of one of the jacks, and the first bending portion bends towards the first surface at a first angle.

Description

Clamp type testing device

Technical Field

The present invention relates to a clip-type testing device, and more particularly, to a clip-type testing device capable of replacing a conductive member.

Background

With the development of electric vehicles, the selection that people can move for a long distance by using pure electric energy without using petrochemical fuel is provided. In order to increase the driving distance of electric vehicles, more batteries with higher capacity are often needed to be arranged, however, how to ensure the stability, safety and reliability of the batteries is an important problem at present, and the importance of detecting the quality of the batteries is also highlighted.

At present, when the quality of the battery is detected, the battery can be replaced for charging and discharging tests, so that the voltage and current characteristics of the battery can be accurately measured, and the method is an important key for evaluating the quality of the battery. However, when the battery is manufactured, in order to avoid oxidation or damage of the electrode, a protective film is covered on the surface of the electrode, and if the protective film cannot be effectively scraped, the test connector cannot be directly contacted with the electrode of the battery, so that the voltage and current characteristics of the battery cannot be accurately measured. In practice, it is not easy to remove the protective film, and the electrode may be damaged. For example, the electrode may be a defective product due to an excessive force application or a deviation of the force application angle, which may cause an excessively deep scratch on the electrode.

In addition, the jig for testing may contact the electrodes of the battery using various shapes of conductive members, which are generally fixedly disposed on the surface of the jig. However, if a conductive component is damaged, the conductive component cannot be disassembled, so that the whole fixture inevitably needs to be replaced directly, which obviously causes unnecessary waste. Therefore, there is a need for a testing device capable of scraping the protective film and protecting the electrodes during the detection of the battery, so as to measure the voltage and current characteristics of the battery more quickly and accurately. Moreover, the testing device is required to be capable of replacing the conductive piece therein so as to reduce the maintenance cost.

Disclosure of Invention

In view of the above, the present invention provides a clip-type testing device, which, when clamping a battery electrode, not only uses a conductive member to scrape off a protective film of the electrode to directly detect the voltage and current characteristics of the battery, but also improves the structure of the conductive member to reduce the scratches on the electrode. Moreover, the clamp type testing device can replace the conductive piece therein so as to reduce the maintenance cost.

The invention provides a clamp type testing device, which comprises a first clamping piece and a second clamping piece. The first clamping piece is defined with a first surface, a first end and a second end, and is provided with a conductive module which is arranged on the first surface. The second clamping piece is defined with a third end and a fourth end, the fourth end is connected with the second end, the third end and the first end are separated by a first distance, and the first surface of the first clamping piece faces the second clamping piece. The conductive module comprises a base body and a plurality of conductive pieces, the base body is provided with a plurality of jacks, each conductive piece can be contained in one of the jacks in a pluggable mode, each conductive piece is provided with a first cantilever and a first bending portion, the first bending portion is connected with the first cantilever, the first cantilever extends out of one of the jacks, and the first bending portion bends towards the first surface at a first angle.

In some embodiments, the base may have an upper surface, and one end of each of the insertion holes is exposed from the upper surface. In addition, the plurality of jacks can be arranged into at least a first row and a second row, the first row and the second row respectively correspond to part of the jacks, and the first row is parallel to the second row. In addition, the plurality of conductive parts can be divided into a first group and a second group, the first group and the second group respectively correspond to part of the conductive parts, and the conductive parts in the first group are accommodated in the jacks in the first row, and the conductive parts in the second group are accommodated in the jacks in the second row. And in the first group, the first cantilever of each conductive member may face the jacks in the second row, and in the second group, the first cantilever of each conductive member faces the jacks in the first row.

In some embodiments, the base may have a plurality of supporting members protruding from the upper surface. In addition, the plurality of supporting members may be arranged at intervals, and the plurality of supporting members are disposed between the first row and the second row. In addition, the base body can be detachably locked on the first surface, the second clamping piece can further comprise an insulating plate piece, the insulating plate piece is arranged between the first clamping piece and the second clamping piece, and the insulating plate piece faces towards the first surface.

In summary, when the clip-type testing device provided by the invention clamps the battery electrode to be tested, the conductive member can contact the battery electrode to be tested and scrape the protective film layer, so that the step of tearing off the protective film layer is not needed. In addition, the clamp-type testing device of the invention can reduce scratches of the conductive piece on the electrode because the bent part on the conductive piece is used for contacting the battery electrode to be tested. In addition, the conductive piece of the invention can be accommodated in the jack of the base in a pluggable manner, so that the whole clamping type testing device is not needed, and the maintenance cost can be reduced.

Other effects and embodiments of the present invention will be described in detail with reference to the accompanying drawings.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments described in the present application, and other drawings can be obtained by those skilled in the art without creative efforts.

FIG. 1 is a schematic perspective view of a clip-on testing device according to an embodiment of the present invention;

FIG. 2 is a schematic perspective view of another embodiment of a clip-on testing device according to the present invention;

FIG. 3 is a schematic perspective view of a conductive module according to an embodiment of the invention;

fig. 4 is a perspective view of a base according to an embodiment of the invention;

fig. 5 is a perspective view of a conductive member according to an embodiment of the present invention.

Description of the symbols

1 first clamping piece of clamp type testing device 10

10a first end 10b second end

10c first surface 10d second surface

12 third end of second clamping piece 12a

12b fourth end 120 dielectric panel

14 conductive module 140 base

142 conductive piece 1420 cantilever

1422 fixing arm with bending part 1424

142a first group 142b second group

144 first row of receptacles 144a

144b second row 146 of supports

146a support surface 16 voltage detector

160 conductive module theta 1 angle

Angle theta 2

Detailed Description

The foregoing and other technical matters, features and effects of the present invention will be apparent from the following detailed description of a preferred embodiment, which is to be read in connection with the accompanying drawings. Directional terms as referred to in the following examples, for example: up, down, left, right, front or rear, etc., are simply directions with reference to the drawings. Accordingly, the directional terminology is used for purposes of illustration and is in no way limiting.

Referring to fig. 1 and 2 together, fig. 1 is a perspective view illustrating a clip-on testing device according to an embodiment of the invention, and fig. 2 is a perspective view illustrating another angle of the clip-on testing device according to an embodiment of the invention. As shown in the drawings, the clip-on testing device 1 has a first clamping member 10 and a second clamping member 12, one end 10a (first end) of the first clamping member 10 and one end 12a (third end) of the second clamping member 12 are separated, and the other end 10b (second end) of the first clamping member 10 and the other end 12b (fourth end) of the second clamping member 12 are combined together, thereby forming a clip-shaped structure. In practice, the first clamping member 10 and the second clamping member 12 may be provided with a stopper at the outer side (e.g. upper and lower sides), and the stopper may abut against the first clamping member 10 and the second clamping member 12 from the outer side. For example, the stopper may move back and forth in one direction, and since the inclined direction of the first clamping member 10 is different from the moving direction of the stopper, when the stopper moves from the other end 10b to the one end 10a by an external force, the stopper may drive the first clamping member 10 to be pressed toward the second clamping member 12.

Similarly, the inclination direction of the second clamping member 12 is different from the moving direction of the stopper, so that when the stopper is moved from the other end 12b to the one end 12a by an external force, the second clamping member 12 is driven to be pressed toward the first clamping member 10. Thus, the first and

second grippers

10 and 12 can approach each other to grip the object. The present embodiment does not limit what kind of object the clip-on testing device 1 is used to hold, and the object belongs to the category of the clip-on testing device 1 suitable for holding as long as the object needs to be electrically tested.

In one example, the first and

second clamping members

10 and 12 are configured to clamp electrodes in the form of sheets, plates, cylinders, or other shapes. In appearance, the end 10a of the first clamping member 10 and the end 12a of the second clamping member 12 may be spaced apart by a predetermined distance (first distance) before unclamping. When the stopper is moved from the outside to the clamped position, the distance between the end 10a of the first clamping member 10 and the end 12a of the second clamping member 12 can be designed to be as close as possible or slightly smaller than the thickness of the electrode, i.e. the electrode can be stably clamped. The present embodiment also does not limit the appearance shape of the first clamping member 10 and the second clamping member 12, for example, the first clamping member 10 and the second clamping member 12 shown in fig. 1 may be used to clamp a sheet-like or plate-like portion of the object to be tested, and the appearance structure of the first clamping member 10 and the second clamping member 12 may also be adjusted, so as to be more suitable for clamping objects of other shapes. For convenience of description, the sheet-shaped electrode in which the object to be measured is a battery and the first clamping member 10 and the second clamping member 12 clamp the battery is exemplified, but the present embodiment is not limited thereto.

In addition, the clip-on testing device 1 has a conductive module 14, the conductive module 14 is disposed on the first surface 10c of the first clamping member 10, and the conductive module 14 may protrude from the first surface 10c of the first clamping member 10. Here, the first surface 10c of the first clamping member 10 is defined as a surface facing the second clamping member 12, and the second surface 10d of the first clamping member 10 is defined as a surface opposite to the first surface 10 c. In one example, the conductive module 14 is disposed near one end 10a of the first clamping member 10, and in order to stably dispose the conductive module 14, a plurality of screws may be used to lock the conductive module 14 on the first surface 10c of the first clamping member 10. Of course, there are many ways to firmly fix the conductive module 14 on the first surface 10c of the first clamping member 10, such as by clipping, adsorbing or adhering, which is not limited herein.

In practical example, the clip-on testing apparatus 1 may be externally connected to a power supply, and perform a charging test on a battery to be tested through the power supply. In practice, the power supply can feed current from the other end 10b of the first clamping member 10, and the fed current can reach the electrode of the battery to be tested through the first clamping member 10 and the conductive member 14, so as to charge the battery to be tested. In addition, the clip-on testing device 1 may further include a voltage detecting element 16, and another conductive module 160 may be disposed on the voltage detecting element 16 for detecting a voltage variation in the battery to be tested, so as to prevent the battery from being overcharged or abnormal in voltage caused by other reasons. In one example, the first clamping member 10 and the voltage detecting member 16 are not electrically connected together, so that it can be avoided that when the power supply feeds current from the first clamping member 10, the fed current interferes with the voltage detecting member 16 to detect the voltage variation in the battery to be tested.

In practice, the conductive module 160 may have a structure and a function similar to those of the conductive module 14, but the voltage detecting element 16 is used for measuring the voltage of the battery to be tested, and the size of the conductive module 160 disposed on the voltage detecting element 16 may be smaller than that of the conductive module 14 disposed on the first clamping element 10. Unlike the first clamping member 10 that may need to carry a larger current, the area of the first clamping member 10 may be larger than that of the voltage detecting member 16, so as to reduce the resistance in the first clamping member 10 and facilitate the heat dissipation.

To describe the structure and function of the conductive module 14 in detail, please refer to fig. 3 and fig. 4 together, in which fig. 3 is a schematic perspective view illustrating the conductive module according to an embodiment of the invention, and fig. 4 is a schematic perspective view illustrating a base according to an embodiment of the invention. As shown in the figure, the conductive module 14 may have a base 140 and a plurality of conductive members 142, and the conductive members 142 may be regularly arranged in the base 140. The base 140 has an upper surface 140a, and the base 140 may have a plurality of insertion holes 144, and each insertion hole 144 may or may not pass through the base 140, which is not limited herein. In one example, regardless of whether receptacle 144 extends through housing 140, at least receptacle 144 is located in upper surface 140a of housing 140. In other words, each of the insertion holes 144 can be directly observed from the upper surface 140a, i.e., one end of the insertion hole 144 is exposed to the upper surface 140 a. In practice, the conductive member 142 is removable from the receptacle 144. Here, the present embodiment does not limit how to insert or extract the conductive member 142 into or from the insertion hole 144, and may be operated by a robot arm, for example, or may be manually operated only by an engineer.

In the example shown in fig. 4, the plurality of insertion holes 144 may be arranged in an array, for example, at least a first row 144a and a second row 144b are arranged, the first row 144a and the second row 144b respectively correspond to a portion of the insertion holes 144, and the first row 144a is parallel to the second row 144 b. The present embodiment does not limit the spacing or arrangement between the receptacles 144. In practice, the plurality of insertion holes 144 may be arranged arbitrarily as long as the conductive members 142 accommodated in the insertion holes 144 do not interfere or contact with each other and do not affect the holding of the object to be tested (for example, the electrode of the battery to be tested), and the embodiment is not limited herein. For ease of description, the following description is made with the receptacles 144 arranged in a first row 144a and a second row 144 b.

In the example of fig. 3, the conductive elements 142 are also divided into a first group 142a and a second group 142b, and the first group 142a and the second group 142b respectively correspond to a portion of the conductive elements 142. In one example, the conductive elements 142 can be received in the insertion holes 144 one-to-one, for example, the conductive elements 144 in the first group 142a can be received in the insertion holes 144 in the first row 144a correspondingly, and the conductive elements 142 in the second group 142b can be received in the insertion holes 144 in the second row 144b correspondingly. In other words, the number of the conductive members 142 may be the same as the number of the insertion holes 144, although the embodiment is not limited thereto. It should be noted that the plurality of insertion holes 144 of the present embodiment can achieve complete functions even though they are arranged in a single row, for example, only the first row 144a and only the second row 144 b.

In one example, the conductive module 14 arranges a plurality of conductive members 142 side-by-side. When the electrode of the battery to be tested is firmly clamped by the clip-on testing device 1, the conductive members 142 in the conductive module 14 can simultaneously contact the electrode of the battery to be tested, so as to disperse the stress when contacting the electrode and avoid excessive force application when scraping the protective film. In addition, each conductive member 142 may have elasticity, and when the clip-on testing device 1 clips an electrode of a battery to be tested, each conductive member 142 may be slightly deformed, and also may disperse stress when contacting the electrode. Here, the deformation should not damage the structure of the conductive member 142 so that the conductive member 142 can be repeatedly used. In addition, in order to avoid the first clamping member 10 and the second clamping member 12 from excessively pressing the electrodes, which may cause the conductive member 142 to excessively deform and damage the structure of the conductive member 142, the conductive module 14 may further have a plurality of supporting members 146, and the supporting members 146 may protrude from the upper surface 140 a.

The support 146 may be used to block the second clamping member 12 and prevent the second clamping member 12 from being too close to the first clamping member 10. In practice, the top surfaces of the supporting members 146 may form a supporting surface 146a, and the conductive member 142 may slightly protrude from the supporting surface 146a when the conductive member 142 is not pressed by an external force (e.g., does not contact the electrode). When the conductive member 142 is pressed by an external force (e.g., clamping the electrode), the supporting member 146 can withstand the second clamping member 12, so that the conductive member 142 is only pressed above the supporting surface 146a, and the conductive member 142 is prevented from being compressed toward the upper surface 140a without limitation. Here, the height of the supporting member 146 protruding from the upper surface 140a, the width of the supporting member 146, or the position of the supporting member 146 on the upper surface 140a are not limited in this embodiment. It should be understood by those skilled in the art that the height of the supporting member 146 (i.e. the height of the supporting surface) may depend on the elasticity of the conductive member 142, and the height of the supporting member 146 protruding from the upper surface 140a may be lower as the elasticity of the conductive member 142 is better. In addition, as long as the supporting member 146 can withstand the second clamping member 12, the width of the supporting member 146 or the position of the supporting member 146 on the upper surface 140a can be freely designed.

Taking the supporting members 146 illustrated in fig. 3 and 4 as an example, the supporting members 146 are regularly arranged between the insertion holes 144 of the first row 144a and the insertion holes 144 of the second row 144 b. In addition, when the plurality of conductive members 142 are respectively received in the corresponding insertion holes 144, at least one conductive member 142 in the first group 142a and at least one conductive member 142 in the second group 142b may be disposed between two adjacent supporting members 146. Of course, the embodiment does not limit how many conductive elements 142 are between two adjacent supporting elements 146, as long as the supporting elements 146 can protect the conductive elements 142 from being excessively pressed, which is consistent with the scope of the supporting elements 146 of the embodiment.

To illustrate the arrangement of the plurality of conductive elements 142 on the base 140 and to illustrate the structure of the conductive elements 142. Referring to fig. 3, 4 and 5, fig. 5 is a schematic perspective view illustrating a conductive member according to an embodiment of the invention. The plurality of conductive elements 142 may have the same structure, and fig. 5 illustrates the conductive elements 142 in the first group 142 a. The conductive element 142 may have a cantilever 1420 (first cantilever), a bending part 1422 (first bending part), and a fixing arm 1424. The cantilever 1420 is located between the bending portion 1422 and the fixing arm 1424. In one example, the conductive member 142 may be integrally formed, and a material having high conductive efficiency, such as a copper material, may be used. The diameter of the fixing arm 1424 illustrated in fig. 5 may be slightly smaller than the diameter of the corresponding insertion hole 144, so that when the fixing arm 1424 may be inserted into the corresponding insertion hole 144, the cantilever 1420 may be located above the upper surface 140a, and the cantilever 1420 does not directly contact the upper surface 140 a.

In one example, the cantilever 1420 can be seen to extend out from the receptacle 144 on the upper surface 140a, and the bent portion 1422 is bent into the upper surface 140 a. In practice, cantilever 1420 is not perpendicular to upper surface 140a, but is at an angle to upper surface 140a, which may be an acute angle (between 0 degrees and 90 degrees), such as 15 degrees, 30 degrees, 45 degrees, 60 degrees, or 75 degrees. In contrast, the conductive elements 142 in the second group 142b may also form the same angle with the upper surface 140a, so that the conductive elements 142 in the first group 142a and the second group 142b may have a symmetrical structure in appearance.

Further, the bending portion 1422 is bent toward the first surface 10c at a fixed angle θ 1 (first angle). In practice, since the base 140 is a substantially rectangular solid, the upper surface 140a is substantially parallel to the first surface 10 c. Therefore, the bent portion 1422 may also be considered to be bent toward the upper surface 140a at the angle θ 1. Of course, the shape and appearance of the base 140 are not limited in this embodiment, for example, the upper surface 140a may not be a plane, or the upper surface 140a may not be parallel to the first surface 10 c. In one example, the angle θ 1 may be an obtuse angle (between 90 degrees and 180 degrees), such as 105 degrees, 120 degrees, 135 degrees, 150 degrees, or 165 degrees, which is not limited herein. Preferably, the bending portion 1422 can be bent toward the upper surface 140a, but does not abut against the upper surface 140a, so that the conductive member 142 can retain better elasticity.

In the example shown in fig. 3, in the conductive elements 142 of the first group 142a, the cantilever 1420 of each conductive element 142 faces the support 146 (the central region of the conductive module 14), i.e., the jacks 144 of the second row 144 b. In the second group 142b of conductors 142, the cantilever 1420 of each conductor 142 is also directed toward the support 146 (the central region of the conductive module 14), i.e., toward the receptacle 144 of the first row 144 a. From another perspective, in the arrangement of the conductive elements 142 in fig. 3, the central region of the conductive module 14 is substantially the region where the conductive elements 142 protrude from the upper surface 140a, so that the support member 146 is disposed in the central region of the conductive module 14, theoretically protecting the conductive elements 142. Therefore, persons skilled in the art can determine the arrangement position of the supporting member 146 according to the arrangement of the conductive members 142, and also determine the arrangement of the conductive members 142 according to the arrangement position of the supporting member 146, which is not limited herein.

In addition, the fixing arm 1424 of the conductive member 142 may also be slightly bent with an angle θ 2 (second angle). In practice, the insertion hole 144 of the base 140 may be a substantially cylindrical hole, and the angle θ 2 may be an obtuse angle (between 90 degrees and 180 degrees) as described above, and may be, for example, 165 degrees, 170 degrees or 175 degrees, which is not limited herein. Here, when the fixing arm 1424 with the angle θ 2 is received in the cylindrical insertion hole 144, the points a and B shown in fig. 5 contact the inner wall of the insertion hole 144 at the same time, and the fixing arm 1424 can be clamped in the insertion hole 144 by friction, so that the conductive member 142 can be stably received in the insertion hole 144. On the other hand, when the conductive member 142 is to be detached from the insertion hole 144, it should be understood by those skilled in the art that the conductive member 142 can be withdrawn from the insertion hole 144 by repeatedly shaking the conductive member 142 or rotating the conductive member 142 by a certain angle.

In other words, each conductive member 142 of the conductive module 14 can be easily extracted by the above method, and the conductive module 14 can be detached from the first clamping member 10. Therefore, when a certain conductive device 142 is damaged, only the damaged conductive device 142 can be replaced without replacing the entire clip test apparatus 1. In addition, the embodiment does not limit the fixing arm 1424 of the conductive device 142 to have an angle, for example, even if the fixing arm 1424 is straight, the diameter of the fixing arm 1424 is selected to be slightly smaller than the diameter of the corresponding insertion hole 144 to achieve a tight fit, and the same effect can be obtained.

In practice, when the first clamping member 10 and the second clamping member 12 are ready to clamp the electrode of the battery to be tested, the bending portions 1422 of the conductive members 142 gradually contact the electrode. As the first clamping member 10 and the second clamping member 12 get closer to each other, each bending part 1422 contacting the electrode is pressed by external force, and thus is slightly deformed and slides. Therefore, the protection film on the electrode can be scraped while the bending portion 1422 is deformed and slides. In addition, since the bending portion 1422 is bent toward the first surface 10c (or the upper surface 140a), a gentler side (e.g., with a radian) can be used to contact the electrode, and the end of the bending portion 1422 is not used to directly scrape off the protective film on the electrode, so as to avoid a deep scratch on the electrode. In addition, the same material, such as copper material with better conductivity, can be used for the conductive module 14, the conductive member 142 and the first clamping member 10. For example, each conductive element 142 may be formed by bending a copper bar, and the magnitude of the current that can be carried by the conductive element 142 is related to the diameter of the copper bar. Assuming that conductive element 142 is made of a copper strip capable of carrying 3 amps of current, bend 1422 is shown as being available to deliver 3 amps of current to the electrode.

In one example, when the clip-on testing device 1 is externally connected to a power supply, the charging current may only flow through the first clip member 10. Referring to fig. 2, the surface of the second clamping member 12 facing the first clamping member 10 may further be provided with an insulating plate 120. Here, the insulation plate member 120 is disposed between the first clamping member 10 and the second clamping member 12, and faces the first surface 10c of the first clamping member 10. In other words, the second clamping member 12 and the first clamping member 10 can be insulated from each other, and the second clamping member 12 only functions to abut against one side of the object to be tested (e.g. an electrode), and the first clamping member 10 performs the processes of scraping the protective film, charging or electrical testing. In practice, when the clip-on testing device 1 further comprises the voltage detector 16, the voltage detector 16 can perform the operations of scraping the protective film and measuring the voltage by the second clamping member 12 abutting against one side of the electrode. At the same time, it is also possible to avoid charging current from entering from the second clamping member 12, disturbing the accuracy of the measured voltage. In other words, the area of the second clamping member 12 may be substantially equal to the sum of the first clamping member 10 and the voltage detecting member 16, and the embodiment is not limited herein.

The above-described embodiments and/or implementations are only for illustrating the preferred embodiments and/or implementations of the present technology, and are not intended to limit the implementations of the present technology in any way, and those skilled in the art can make many modifications or changes without departing from the scope of the technology disclosed in the present disclosure, but should be construed as technology or implementations that are substantially the same as the present technology.

Claims

1. A clip-on testing device, comprising:

the first clamping piece is defined with a first surface, a first end and a second end, and is provided with a conductive module which is arranged on the first surface; and

a second clamping member defining a third end and a fourth end, the fourth end being connected to the second end, the third end being spaced a first distance from the first end, and the first surface of the first clamping member facing the second clamping member;

the conductive module comprises a base and a plurality of conductive pieces, the base is provided with a plurality of jacks, each conductive piece can be accommodated in one of the jacks in a pluggable manner, each conductive piece is provided with a first cantilever and a first bending part, the first bending part is connected with the first cantilever, the first cantilever extends out from one of the jacks, and the first bending part is bent towards the first surface at a first angle.

2. The clip-on testing device of claim 1, wherein the housing has an upper surface, and one end of each socket is exposed at the upper surface.

3. The clip-on testing device of claim 2, wherein the plurality of sockets are arranged in at least a first row and a second row, the first row and the second row respectively corresponding to a portion of the plurality of sockets, and the first row is parallel to the second row.

4. The clip-on testing device of claim 3, wherein the conductive members are divided into a first group and a second group, the first group and the second group respectively correspond to a portion of the conductive members, and the conductive members in the first group are received in the insertion holes of the first row, and the conductive members in the second group are received in the insertion holes of the second row.

5. The clip-on testing device of claim 4, wherein the first cantilever arm of each of the conductive members in the first group faces the plurality of jacks in the second row, and wherein the first cantilever arm of each of the conductive members in the second group faces the plurality of jacks in the first row.

6. The clip-on testing device of claim 3, wherein the housing has a plurality of supporting members protruding from the upper surface.

7. The clip-on testing device of claim 6, wherein the supporting members are spaced apart and disposed between the first row and the second row.

8. The clip-on testing device of claim 1, wherein the housing is detachably secured to the first surface.

9. The clip-on testing device of claim 1, wherein the second clip further comprises an insulating plate disposed between the first clip and the second clip, the insulating plate facing the first surface.