CN107607746A - Clip probe unit - Google Patents
Clip probe unit Download PDFInfo
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- CN107607746A CN107607746A CN201610541246.9A CN201610541246A CN107607746A CN 107607746 A CN107607746 A CN 107607746A CN 201610541246 A CN201610541246 A CN 201610541246A CN 107607746 A CN107607746 A CN 107607746A
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- push piece
- push
- probe unit
- perforation
- probe
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- 239000000523 sample Substances 0.000 title claims abstract description 142
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 15
- 238000010292 electrical insulation Methods 0.000 claims description 7
- 210000003739 neck Anatomy 0.000 claims description 7
- 238000012360 testing method Methods 0.000 description 27
- 230000000712 assembly Effects 0.000 description 5
- 238000000429 assembly Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 238000003825 pressing Methods 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 101001031591 Mus musculus Heart- and neural crest derivatives-expressed protein 2 Proteins 0.000 description 2
- 240000001439 Opuntia Species 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
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Abstract
A kind of clip probe unit, comprising one first by push piece, one second by push piece and a probe.First by push piece there is one first gripping section, one first to set section and multiple assembly holes.First gripping section is connected to the first setting section, and these assembly holes are located at the first gripping section.Second is had one second connected gripping section and one second setting section by push piece.Second setting section is combined with the first setting section, and the second gripping section and the first gripping section are separated.Probe has multiple contacts.These contacts are respectively comprising two connected kinks.Relative two ends of each contact wear these assembly holes respectively, and two kinks are resisted against the side wall of these assembly holes respectively.
Description
Technical field
The present invention is on a kind of clip probe unit, particularly a kind of folder for being used to carry out electronic component electrical testing
Formula probe unit.
Background technology
Many electronic products need to be tested after production is completed to ensure the yield of product and reliability.General bag
Type battery (pouch-type battery) can carry out discharge and recharge before product is sold or before shipment using clip probe unit
Electrical testing, electric energy can be provided in a manner of full blast by the pouch-type battery for ensuring shipment.
In general, during electrical testing, clip probe unit is to export specific electricity to pouch-type battery with probe
Stream or specific voltage.However, the probe of the known clip probe unit in part is mounted to the driving member for driving probe to move
On part, thus the enough mobile spaces of probe are provided to, cause clip probe unit to be difficult to minimize.Meanwhile clip is visited
Needle device also can not measure substantial amounts of pouch-type battery simultaneously and influence operating efficiency.Furthermore when probe is resisted against pouch-type battery,
Probe can produce stress because of flexure, and stress can then be delivered to the driving element being connected with probe.In order to avoid driving element
It is stressed influence and damages, these driving elements usually requires to make using high intensity material, or need in driving element
Upper additional designs reinforced structure, cause the manufacturing cost of known clip probe unit too high.
The content of the invention
In view of the above problems, the invention discloses a kind of clip probe unit, help solve known clip probe unit
It is difficult to minimize, the problem of operating efficiency is too low and manufacturing cost is too high.
Disclosed herein clip probe unit include one first by push piece, one second by push piece and a probe.
First by push piece there is one first gripping section, one first to set section and multiple assembly holes.First gripping section is connected to first and set
Section is put, and these assembly holes are located at the first gripping section.Second is had one second connected gripping section and one second setting by push piece
Section.Second setting section is combined with the first setting section, and the second gripping section and the first gripping section are separated.Probe has multiple
Contact.These contacts are respectively comprising two connected kinks.Relative two ends of each contact wear these assemblings respectively
Hole, and two kinks are resisted against the side wall of these assembly holes respectively.
According to disclosed herein clip probe unit, the contact of probe includes two kinks, and is had by push piece
There is assembly hole.Contact can wear assembly hole, and two kinks are resisted against the side wall of wherein two assembly holes respectively.Thereby,
The contact of probe can be assembled in by push piece with method of clamping, contribute to the lightweight and miniaturization of clip probe unit.
In addition, the present invention is also another to disclose the clip probe unit for including push piece.Push piece can push against first and be pushed away by push piece and second
Part at least one, make probe and the second gripping section closer to each other.Thereby, first by the first gripping section of push piece and second
Determinand can be clamped jointly by the second gripping section of push piece, and can consolidate the position of test surfaces.Meanwhile probe engaged test face
And can output current or voltage carry out electrical testing to determinand.The present invention using push piece pushing and pressing clip probe unit by
Push piece can clamp and test determinand, significantly simplify and promote the mechanism by push piece to form, and then maintain clip probe unit
Miniaturization.In addition, the push piece of the present invention and between by push piece without fixed connection relationship, help avoid first by push piece with
Second by push piece it is close to each other when caused stress be delivered to push piece.Thereby, push piece of the invention uses high without needs
Intensity material makes or needs to form structure to improve the intensity of push piece, and can save manufacturing cost.
Below in conjunction with the drawings and specific embodiments, the present invention will be described in detail, but not as a limitation of the invention.
Brief description of the drawings
Figure 1A is the schematic perspective view according to the clip probe unit of first embodiment of the invention.
Figure 1B is the decomposing schematic representation of Figure 1A clip probe unit.
Fig. 1 C are the schematic perspective view by push piece of Figure 1A clip probe unit.
Fig. 1 D are the cut-away illustration of Figure 1A clip probe unit.
Fig. 1 E are two cut-away illustration between by push piece of the clip probe unit that determinand is arranged to Fig. 1 D.
Fig. 1 F are that Fig. 1 E clip probe unit clamps the cut-away illustration of determinand.
Fig. 2A is the cut-away illustration according to the clip probe unit of second embodiment of the invention.
Fig. 2 B are that Fig. 2A clip probe unit clamps the cut-away illustration of determinand.
Fig. 3 A are the cut-away illustration according to the clip probe unit of third embodiment of the invention.
Fig. 3 B are that Fig. 3 A clip probe unit clamps the cut-away illustration of determinand.
Wherein, reference
1 clip probe unit
2 determinands
10 pedestals
110 microscope carriers
120 electrical insulation parts
130 guide seats
140 support columns
20 probe assemblies
210 first by push piece
211 first set section
212 first gripping sections
213 engraved structures
214a, 214b assembly hole
2141 necks
220 second by push piece
221 second set section
222 second gripping sections
223 engraved structures
224 guide ramps
230 probes
231 contacts
2311 kinks
240 openings
30 power source modules
310 air pressure drive components
40 push pieces
420 perforation
40 first push pieces
410 first lateral margins
420 first perforation
50 second push pieces
510 second lateral margins
520 second perforation
60a, 60b guiding groove
A first directions
B second directions
C third directions
D1, D2 distance
S apertures
Embodiment
Technical solution of the present invention is described in detail with specific embodiment below in conjunction with the accompanying drawings, to be further understood that
The purpose of the present invention, scheme and effect, but it is not intended as the limitation of scope of the appended claims of the present invention.
Referring to Figure 1A to Fig. 1 D.Figure 1A is to be shown according to the solid of the clip probe unit of first embodiment of the invention
It is intended to.Figure 1B is the decomposing schematic representation of Figure 1A clip probe unit.Fig. 1 C are Figure 1A clip probe unit by push piece
Schematic perspective view.Fig. 1 D are the cut-away illustration of Figure 1A clip probe unit.In the present embodiment, clip probe unit 1 wraps
Containing a pedestal 10, two probe assemblies 20, a power source module 30, one first push piece 40 and one second push piece 50.
Pedestal 10 includes a microscope carrier 110 and an electrical insulation part 120.Electrical insulation part 120 is fixed on microscope carrier 110, but
The present invention is not limited thereto.In other embodiments, pedestal 10 can be not provided with electrical insulation part 120, but in the table of microscope carrier 110
Face is coated with the coating that is electrically insulated, and can equally have the effect for preventing that element from leaking electricity.
Each probe assembly 20 includes one first by push piece 210, one second by the probe 230 of push piece 220 and one.First
One first to be connected is included by push piece 210 gripping section 212 of section 211 and 1 first is set, and second is included what is be connected by push piece 220
One second sets the gripping section 222 of section 221 and 1 second.First setting section 211 is all fixed on the second setting section 221 to be electrically insulated
Part 120.In other words, first is fixed on microscope carrier 110 by push piece 220 by push piece 210 and second via electrical insulation part 120.The
One gripping section 212 and the second gripping section 222 are facing.Probe 230 includes multiple contacts 231, and it is arranged at the first clamping
Section 212 and at least partly between the first gripping section 212 and the second gripping section 222.The gripping section of probe 230 and second
222 are separated and form an opening 240.
In addition, as shown in figure iD, the first gripping section 212 of a wherein probe assembly 20 of the present embodiment and another probe groups
The distance between second gripping section 222 of part 20 D1 is 2.0 millimeters (millimeters), and the of each probe assembly 20
Ultimate range D2 between one gripping section 212 and the second gripping section 222 is 16.5 millimeters.But the present invention is not limited thereto.
In section Example, distance D1 can be less than or equal to 2.0 millimeters, and distance D2 can be more than or equal to 16.5 millimeters.Also, in part
In embodiment, distance D1 can be more than 2.0 millimeters, and distance D2 can be less than 16.5 millimeters.
Power source module 30 is, for example, multiple air pressure drive components, oil pressure actuated component or motor.The power of the present embodiment
Source module 30 is by taking two air pressure drive components 310 as an example, and air pressure drive component 310 can for example include cylinder and piston.Two
Air pressure drive component 310 is all arranged at the microscope carrier 110 of pedestal 10, and two air pressure drive components 310 are located at probe assembly 20 respectively
Relative two sides.
First push piece 40 is connected to a wherein air pressure drive component 310, and the first push piece for power source module 30
40 have 2 first lateral margins 410.Specifically, first push piece 40 of the present embodiment has 2 first perforation 420, and 2 first
Lateral margin 410 is respectively positioned at least part side wall of 2 first perforation 420.Second push piece 50 is connected to power source module 30
Another air pressure drive component 310, and the second push piece 50 has 2 second lateral margins 510.Specifically, the second of the present embodiment
Push piece 50 has 2 second perforation 520, and 2 second lateral margins 510 are respectively positioned at least part side wall of 2 second perforation 520
Face.Probe assembly 20 is between the first lateral margin 410 of the first push piece 40 and the second lateral margin 510 of the second push piece 50.In detail
For thin, two probe assemblies 20 wear 2 first perforation 420 of the first push piece 40 respectively, and two probe assemblies 20 also same time-division
2 second perforation 520 of the second push piece 50 are not worn.Two air pressure drive components 310 of power source module 30 can drive respectively
One push piece 40 moves with the second push piece 50 relative to probe assembly 20, and makes the first lateral margin 410 be pushed away respectively with the second lateral margin 510
To probe assembly 20 first by push piece 210 and second by push piece 220.Specifically, as shown in figure iD, power source module 30 can
Drive the first push piece 40 to be moved along a first direction A and push against the first of each probe assembly 20 by push piece 210, and second
Push piece 50 moves along a second direction B opposite with first direction A and pushes against the second of each probe assembly 20 by push piece
220。
The quantity of the probe assembly 20 of the present embodiment be two, and the first push piece 40 and the second push piece 50 respectively with pair
Answer the first perforation 420 and the second perforation 520 of the quantity of probe assembly 20, but the perforation of the perforation of probe assembly 20, first 420 and second
520 quantity is simultaneously not used to the limitation present invention.In addition, first push piece 40 of the present embodiment and the second push piece 50 are via opening up
Perforation is to form the first lateral margin 410 and the second lateral margin 510, but the present invention is not limited thereto.In some embodiments, probe is worked as
When the quantity of component 20 is multiple, the first push piece 40 can not have perforation with the second push piece 50 but have respectively multiple
Groove, the first lateral margin 410 are located at least part trough wall surface of the groove of the first push piece 40, and the second lateral margin 510 pushes away positioned at second
At least part trough wall surface of the groove of arrived piece 50, and probe assembly 20 can be stretched into groove.In some embodiments, probe groups are worked as
The quantity of part 20 is for the moment, the first push piece 40 and the second push piece 50 can also not have perforation, now the first lateral margin 410
The side of probe assembly 20 is faced in the first push piece 40, and the second lateral margin 510 is located at the second push piece 50 and faces probe assembly
20 side.
In the present embodiment, clip probe unit 1 further includes multiple guiding groove 60a, the 60b for being arranged at pedestal 10.In detail
For thin, pedestal 10 further includes a guide seat 130.The microscope carrier 110 of pedestal 10 is provided with two guiding groove 60a, guide seat 130
Provided with another two guiding grooves 60b.First push piece 40 and the second push piece 50 are between microscope carrier 110 and guide seat 130.First
Relative two sides of push piece 40 are respectively arranged at a wherein guiding groove 60a for microscope carrier 110 and wherein the one of guide seat 130 leads
Draw chute 60b, and relative two sides of the second push piece 50 are respectively arranged at another guiding groove 60a and the guiding of microscope carrier 110
Another guiding groove 60b of seat 130.The present embodiment is arranged at microscope carrier 110 and guide seat 130 with multiple guiding groove 60a, 60b
Exemplified by, but the present invention is not limited thereto.In other embodiments, pedestal 10, which can be free of, guide seat 130, but only in microscope carrier
110 set one or more guiding groove 60a.
In addition, in the present embodiment, the first of probe assembly 20 is had one respectively by push piece 210 and second by push piece 220
Engraved structure 213,223.Specifically, the engraved structure 213,223 of the present embodiment is respectively multiple perforates.First by push piece
210 perforate is between first sets the gripping section 212 of section 211 and first, and first is set by the perforate of push piece 220 positioned at second
Put between the gripping section 222 of section 221 and second.
In addition, the second of the present embodiment is had more a guide ramp 224 by push piece 220.Guide ramp 224 is positioned at the second folder
Section 222 is held, and faces first the first gripping section 212 by push piece 210.
In the present embodiment, the first of probe assembly 20 is had more multiple assembly hole 214a, 214b, its position by push piece 210
In first by push piece 210 one end.Specifically, as shown in Figure 1 C, multiple assembly hole 214a arrange in the first gripping section 212
It is in a row, and multiple assembly hole 214b are arranged in another row in the first gripping section 212.One of assembly hole 214a with mutually it is right
Neat one of assembly hole 214b is in pairs.The contact 231 of probe 230 can include two connected kinks 2311.
Relative two ends of contact 231 wear assembly hole 214a and assembly hole 214b in pairs respectively.When contact 231 wears group
When filling hole 214a, 214b, two kinks 2311 are born against in two assembly hole 214a, 214b side wall.Specifically, assemble
Hole 214a, 214b can have multiple necks 2141 respectively.Among assembly hole 214a, 214b in pairs, assembly hole 214a
Neck 2141 be located at assembly hole 214a in assembly hole 214b side wall, similarly assembly hole 214b neck 2141
Positioned at assembly hole 214b in assembly hole 214a side wall.User can pull the kink 2311 of contact 231 and
The both ends of contact 231 are made to stretch to be passed through assembly hole 214a, 214b.When contact 231 passes through assembly hole 214a, 214b
Afterwards, user discharges contact 231 and makes two kinks 2311 reset to be resisted against two assembly hole 214a, 214b side wall,
It is respectively clamped into wherein in a neck 2141 of assembly hole 214a, 214b simultaneously.Thereby, the contact 231 of probe 230 is with clamping
Mode is assembled in first by push piece 210, contributes to the lightweight and miniaturization of probe assembly 20.In addition, the design of neck 2141
Contribute to the position of firm each contact 231.Assembly hole 214a, 214b quantity and it is not used to limit this hair in the present embodiment
Bright, the quantity of assembly hole can be two in other embodiments.
In the present embodiment, when probe assembly 20 first by push piece 210 and second by push piece 220 by the first push piece 40
When being pushed against with the second push piece 50, it is arranged at first and is clamped by the probe 230 and second of push piece 210 by the second of push piece 220
Section 222 is closer to each other and can clamp determinand and carry out electrical testing.Please with reference to Fig. 1 E and 1F.Fig. 1 E are to set determinand
It is placed in two cut-away illustration between by push piece of Fig. 1 D clip probe unit.The clip probe unit that Fig. 1 F are Fig. 1 E clamps
The cut-away illustration of determinand.In the present embodiment, probe assembly 20 can clamp a determinand 2 to carry out electrical testing to it.
Determinand 2 for example can be battery electrode or semiconductor wafer.
The method for illustrating to test determinand 2 using clip probe unit 1 below.As referring to figure 1E, by determinand 2
The first of probe assembly 20 is arranged at by push piece 210 and second between by push piece 220 via opening 240.It is furthermore, it is understood that to be measured
Thing 2 is moved by the guide ramp 224 of push piece 220 from opening 240 along second and is positioned at first and is pushed away by push piece 210 and second
Between part 220.Now, the test surfaces (being, for example, the surface of metal ohmic contact pad, do not illustrate) of determinand 2 are positioned at the first clamping
Between the gripping section 222 of section 212 and second.Probe 230 is separated in face of this test surfaces and with test surfaces.
Then, power source module 30 is made to drive the first push piece 40 and the second push piece 50 respectively in opposite direction (first
Direction A, second direction B) it is mobile, and the first lateral margin 410 and the second lateral margin 510 is pushed against first respectively by push piece 210 and second
By push piece 220.As shown in fig. 1F, when the first push piece 40 and the second push piece 50 push against first by push piece 210 and second respectively
During by push piece 220, probe 230 with second by push piece 220 the second gripping section 222 it is closer to each other, and the first gripping section 212 with
The distance between second gripping section 222 also gradually decreases.Thereby, determinand 2 is by the first gripping section 212 and the second gripping section 222
Common clamping, and the position of test surfaces can be consolidated.Meanwhile the engaged test face of probe 230 and can output current or voltage to being treated
Thing 2 is surveyed to carry out electrical testing.
In summary, the clip probe unit 1 of the present embodiment pushes against the of probe assembly 20 using two push pieces respectively
One can be made the clamping of probe assembly 20 and test determinand 2, while the first push piece 40 by push piece 210 and second by push piece 220
With the second push piece 50 all with probe assembly 20 without sealed or the fixed connection relationship such as engage, help significantly to simplify promotion and visit
The mechanism composition of needle assemblies 20, and then maintain the miniaturization of clip probe unit 1.In addition, it helps adjacent two probe of reduction
The distance between component 20 D1, and clip probe unit 1 can be made to test a large amount of determinands 2 within the same time, test can be improved
Efficiency.In addition, also help avoid first by push piece 210 and second by push piece 220 it is close to each other when caused stress transmission
To the first push piece 40 and the second push piece 50.Thereby, first push piece 40 of the present embodiment and the second push piece 50 can be adopted
With cheap, the simple in construction plate body (such as glass mat) of cost, make or need without high intensity material to be used
Structure is formed to improve the intensity of push piece.
In the present embodiment, probe assembly 20 is had guide ramp 224 in second by push piece 220.When user will be set
When determinand 2 is set, determinand 2 can be moved to first by push piece 210 by user to be resisted against second in a manner of by push piece 220
With second between by push piece 220.Determinand 2 can move along guide ramp 224 and finally be positioned at first by push piece 210 and the
Two between by push piece 220.Thereby, guide ramp 224 makes user determinand 2 can be resisted against into the second side by push piece 220
Formula moves, and determinand 2 is tried one's best in the provisioning process and keeps enough distances with probe 230, and then avoids determinand 2
Test surfaces are in the provisioning process by the scratch of probe 230.
In addition, in the present embodiment, the first of probe assembly 20 had respectively by push piece 220 by push piece 210 and second by
The engraved structure 213,223 that multiple perforates are formed.Thereby, engraved structure 213,223 contribute to lifting first by push piece 210 with
Second by push piece 220 flexible curvature, avoid first produce excessive stresses when being pressurized by push piece 210 and second by push piece 220 and
Deform or offset.
In addition, in the present embodiment, the first push piece 40 and the second push piece 50 are all arranged at guiding groove 60a, 60b,
Therefore the first push piece 40 and the second push piece 50 can move along guiding groove 60a, 60b and push against probe assembly 20.Thereby, lead
Drawing chute 60a, 60b helps to maintain the moving direction of the first push piece 40 and the second push piece 50, avoids the first push piece 40
Offset with the second push piece 50 in moving process and cause first to be differed by push piece 210 with second by the amount of movement of push piece 220
Cause.
What first embodiment pushed against probe assembly respectively with two push pieces first is completed by push piece with second by push piece
The step of clamping determinand, but the present invention is not limited thereto.Referring to Fig. 2A and Fig. 2 B.Fig. 2A is according to the present invention the
The cut-away illustration of the clip probe unit of two embodiments.The cutting that the clip probe unit that Fig. 2 B are Fig. 2A clamps determinand is shown
It is intended to.Because second embodiment is similar with first embodiment, therefore only deviation is illustrated below.
In the present embodiment, clip probe unit 1 includes only one push piece 40.It is fixed in addition, pedestal 10 has more
A support column 140 on microscope carrier 110.The second of probe assembly 20 is resisted against or is fixed on support column 140 by push piece 220.It is dynamic
Power source module 30 can drive push piece 40 to move and make the pushing and pressing first of the first lateral margin 410 by push piece 210 so that probe 230 with
Second by push piece 220 the second gripping section 222 it is closer to each other.Thereby, the present embodiment can make probe groups using a push piece
Part 20 clamps and test determinand 2.In addition, the push piece 40 of the present embodiment does not have any perforation, and the first lateral margin 410 is located at
Push piece 40 close to first by push piece 210 side.
The present embodiment so that second is arranged at by push piece 220 support column 140 and first is promoted by push piece 210 as an example, but
The present invention is not limited thereto.In other embodiments, it can be first is arranged at support column 140 and second by push piece 210
Promoted by push piece 220.
The push piece of first embodiment and second embodiment moves along the normal direction of vertical base, but the present invention not with
This is limited.Referring to Fig. 3 A and Fig. 3 B.Fig. 3 A are to be shown according to the cutting of the clip probe unit of third embodiment of the invention
It is intended to.Fig. 3 B are that Fig. 3 A clip probe unit clamps the cut-away illustration of determinand.Because 3rd embodiment and second are implemented
Example is similar, therefore is only illustrated below with regard to deviation.
In the present embodiment, clip probe unit 1 includes only one push piece 40, and power source 30 can drive push piece
40 edge third direction C of the moving direction of push piece in second embodiment are moved.In the present embodiment, due to pushing and pressing
The aperture S of the perforation 420 of part 40 is less than first and clamped by the first gripping section 212 and second of push piece 210 by the second of push piece 220
Section the distance between 222, therefore when push piece 40 is towards close to the movement of the direction of probe 230, first by push piece 210 and second
Can be closer to each other with respect to the internal face pushing and pressing of two sides by perforation 420 by push piece 220.Thereby, the present embodiment is pushed away using one
Arrived piece can make the clamping of probe assembly 20 and test determinand 2.
In summary, disclosed herein clip probe unit in, push piece can be mobile relative to probe assembly and push against
First by push piece and second by push piece at least one.When first by push piece and this second pushed against by push piece when, probe
It is closer to each other with the second gripping section.Thereby, first can be total to by the second gripping section of push piece with second by the first gripping section of push piece
With clamping determinand, and the position of test surfaces can be consolidated.Meanwhile probe engaged test face and can output current or voltage to being treated
Thing is surveyed to carry out electrical testing.The present invention can be made probe assembly clamping by push piece with surveying using push piece pushing and pressing probe assembly
Try determinand, while push piece and probe assembly help significantly to simplify promotion without sealed or the fixed connection relationship such as engage
The mechanism composition of probe assembly, and then maintain the miniaturization of clip probe unit.In addition, it helps adjacent two probe groups of reduction
The distance between part, and clip probe unit can be made to test a large amount of determinands within the same time, testing efficiency can be improved.Separately
Outside, also help avoid first by push piece and second by push piece it is close to each other when caused stress be delivered to push piece.Thereby,
The push piece of the present embodiment can use cheap, the simple in construction plate body of cost, made without high intensity material to be used or
It is to need to form structure to improve the intensity of push piece.
In addition, probe contact can include two kinks, and there can be assembly hole by push piece.Contact can wear two
Assembly hole, and two kinks are resisted against the side wall of two assembly holes respectively.Thereby, the contact of probe can use clamping side
Formula is assembled in by push piece, contributes to the lightweight and miniaturization of probe assembly.
Certainly, the present invention can also have other various embodiments, ripe in the case of without departing substantially from spirit of the invention and its essence
Know those skilled in the art when can be made according to the present invention it is various it is corresponding change and deformation, but these corresponding change and become
Shape should all belong to the protection domain of appended claims of the invention.
Claims (10)
1. a kind of clip probe unit, it is characterised in that include：
One first by push piece, and section is set comprising one first connected gripping section and one first, and this first is had multiple groups by push piece
Hole is filled, those assembly holes are located at first gripping section；
One second by push piece, and section is set comprising one second connected gripping section and one second, and the second setting section first is set with this
Put section to be combined, second gripping section is separated with first gripping section；And
One probe, has multiple contacts, and each contact includes two connected kinks, each contact it is relative
Two ends wear two of those assembly holes wherein respectively, and two kink is resisted against the side wall of those assembly holes respectively.
2. clip probe unit as claimed in claim 1, it is characterised in that additionally comprise：
One pedestal；
One first push piece, there is one first lateral margin；And
One second push piece, has one second lateral margin, first push piece can be relatively moved with second push piece make this first
Lateral margin and second lateral margin push against respectively this first by push piece and this second by push piece, when this first second is pushed away by push piece with this
When part is pushed against, the probe and second gripping section are closer to each other.
3. clip probe unit as claimed in claim 2, it is characterised in that the pedestal includes a microscope carrier and is fixed on the load
One electrical insulation part of platform, and this first by push piece and this second be fixed on the microscope carrier via the electrical insulation part by push piece.
4. clip probe unit as claimed in claim 2, it is characterised in that first push piece moved along a first direction and
This is pushed against first by push piece, and second push piece along a second direction opposite with the first direction move and push against this second
By push piece.
5. clip probe unit as claimed in claim 2, it is characterised in that first push piece has one first perforation, should
Second push piece has one second perforation, and first lateral margin is located at first perforation, and second lateral margin is located at second perforation, should
First by push piece and this second all worn by push piece first perforation and second perforation.
6. clip probe unit as claimed in claim 2, it is characterised in that further include the power source mould for being arranged at the pedestal
Block, wherein first push piece are both connected to the power source module with second push piece, and the power source module can drive this
First push piece relatively moves with second push piece.
7. clip probe unit as claimed in claim 2, it is characterised in that further include the two guiding cunnings for being arranged at the pedestal
Groove, and first push piece is respectively arranged at two guiding groove with second push piece.
8. clip probe unit as claimed in claim 1, it is characterised in that each assembly hole has multiple cards in side wall
Groove, those contacts are partly arranged in those necks respectively.
9. clip probe unit as claimed in claim 1, it is characterised in that additionally comprise：
One pedestal；And
One push piece, be movably arranged at the pedestal and push against this first by push piece and this second by push piece at least within it
One, so that the probe and second gripping section are closer to each other.
10. clip probe unit as claimed in claim 9, it is characterised in that the push piece has a perforation, and this first is pushed away
Part second is all worn the perforation by push piece with this, when the push piece move, the perforation with respect to two sides push against respectively this first
By push piece and this second by push piece.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610541246.9A CN107607746B (en) | 2016-07-11 | 2016-07-11 | Clip type probe device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610541246.9A CN107607746B (en) | 2016-07-11 | 2016-07-11 | Clip type probe device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107607746A true CN107607746A (en) | 2018-01-19 |
| CN107607746B CN107607746B (en) | 2024-04-09 |
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| CN201610541246.9A Active CN107607746B (en) | 2016-07-11 | 2016-07-11 | Clip type probe device |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN110187153A (en) * | 2018-02-22 | 2019-08-30 | 致茂电子(苏州)有限公司 | Clip probe assembly |
| CN111366856A (en) * | 2018-12-26 | 2020-07-03 | 致茂电子(苏州)有限公司 | Clamp type testing device |
| CN111435140A (en) * | 2018-12-26 | 2020-07-21 | 致茂电子(苏州)有限公司 | Clamp type testing device |
| CN112147374A (en) * | 2019-06-26 | 2020-12-29 | 致茂电子(苏州)有限公司 | Clamp type testing device and conductive module |
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| TWM280482U (en) * | 2005-07-01 | 2005-11-11 | Triple Pillar Co Ltd | Improved structure for testing probe of electronic objects |
| EP1777529A2 (en) * | 2005-09-14 | 2007-04-25 | Gunsei Kimoto | Electric signal connecting device and probe assembly using the same |
| CN103245807A (en) * | 2012-02-06 | 2013-08-14 | 景美科技股份有限公司 | Probe unit structure and manufacturing method thereof |
| CN105572556A (en) * | 2014-10-17 | 2016-05-11 | 致茂电子(苏州)有限公司 | Spot testing apparatus used for testing electronic component |
| CN205809112U (en) * | 2016-07-11 | 2016-12-14 | 致茂电子(苏州)有限公司 | Clip probe unit |
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| TWM280482U (en) * | 2005-07-01 | 2005-11-11 | Triple Pillar Co Ltd | Improved structure for testing probe of electronic objects |
| EP1777529A2 (en) * | 2005-09-14 | 2007-04-25 | Gunsei Kimoto | Electric signal connecting device and probe assembly using the same |
| CN103245807A (en) * | 2012-02-06 | 2013-08-14 | 景美科技股份有限公司 | Probe unit structure and manufacturing method thereof |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN110187153A (en) * | 2018-02-22 | 2019-08-30 | 致茂电子(苏州)有限公司 | Clip probe assembly |
| CN110187153B (en) * | 2018-02-22 | 2021-04-13 | 致茂电子(苏州)有限公司 | Clip type probe assembly |
| CN111366856A (en) * | 2018-12-26 | 2020-07-03 | 致茂电子(苏州)有限公司 | Clamp type testing device |
| CN111435140A (en) * | 2018-12-26 | 2020-07-21 | 致茂电子(苏州)有限公司 | Clamp type testing device |
| CN111435140B (en) * | 2018-12-26 | 2023-03-10 | 致茂电子(苏州)有限公司 | Clamp type testing device |
| CN112147374A (en) * | 2019-06-26 | 2020-12-29 | 致茂电子(苏州)有限公司 | Clamp type testing device and conductive module |
| CN112147374B (en) * | 2019-06-26 | 2023-03-10 | 致茂电子(苏州)有限公司 | Clamp type testing device and conductive module |
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| CN107607746B (en) | 2024-04-09 |
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