CN110187153B

CN110187153B - Clip type probe assembly

Info

Publication number: CN110187153B
Application number: CN201810153946.XA
Authority: CN
Inventors: 温镇州; 王铭辉; 刘茂盛
Original assignee: To Mao Electronics Suzhou Co ltd
Current assignee: To Mao Electronics Suzhou Co ltd
Priority date: 2018-02-22
Filing date: 2018-02-22
Publication date: 2021-04-13
Anticipated expiration: 2038-02-22
Also published as: CN110187153A

Abstract

The invention discloses a clip-type probe assembly which comprises a first clamping piece, a second clamping piece, a first conductive piece and a stop piece. The first clamping piece comprises a first assembling section and a first clamping section. The second clamping piece comprises a second assembling section and a second clamping section which are connected, and the second assembling section is arranged on the first assembling section. The conductivity of the first conductive piece is greater than that of the second clamping piece, and the rigidity of the second clamping piece is greater than that of the first conductive piece. The first conductive piece comprises a first stacking section and a second stacking section which are connected, the second clamping piece is penetrated through by the first conductive piece, and the first stacking section and the second stacking section are respectively positioned on two opposite sides of the second clamping piece and are stacked to form a second assembling section and a second clamping section. The stop piece comprises a connecting section and a stop section which are connected, the connecting section is arranged on the first assembling section or the second assembling section, and the stop section is positioned beside the first clamping section and the second clamping section.

Description

Clip type probe assembly

Technical Field

The present invention relates to a clip-type probe assembly, and more particularly, to a clip-type probe assembly having a first conductive member and a second conductive member.

Background

Many electronic products require testing after production is complete to ensure product yield and reliability. Before the product is sold or shipped, the clip-type probe device is used to perform an electrical test of charging and discharging to obtain the electrical characteristics of the pouch-type battery, so as to ensure that the shipped pouch-type battery can provide electrical energy in the most efficient manner.

Generally, a clip-type probe apparatus is provided with a probe tip on a clamping arm, so as to improve the conductivity of the probe tip, a metal (such as copper) with better conductivity is often used as the material of the probe tip, but the metal with better conductivity is difficult to have good rigidity, so that the probe tip is difficult to return to the position before clamping after the clip-type probe apparatus clamps a pouch-shaped battery. In detail, when the clip-on probe device clamps the pouch-type battery, the probe head will press against the pouch-type battery to deform, so as to form an electrical contact by using the probe head to scrape the battery, but after the clip-on probe device clamps the pouch-type battery, the rigidity of the probe head is insufficient, so that the probe head is difficult to return to the original position, and after the clip-on probe device clamps the pouch-type battery for many times, the force of the deformed probe head scraping the pouch-type battery is weakened, so that the electrical characteristics of the pouch-type battery are difficult to measure. On the contrary, if a metal with higher rigidity is used as the material of the probe tip, the conductive property is weaker, and the electrical test of the pouch type battery is affected.

Disclosure of Invention

The present invention provides a clip-type probe assembly to solve the problem that the probe head of the clip-type probe device in the prior art is difficult to have good conductive property and rigidity.

The invention discloses a clip-on probe assembly suitable for clamping an object to be tested, which comprises a first clamping piece, at least one second clamping piece, at least one first conductive piece and at least one stop piece. The first clamping piece comprises a first assembling section and a first clamping section which are connected. The at least one second clamping piece comprises a second assembling section and a second clamping section which are connected, the second assembling section is arranged on the first assembling section, and the first clamping section and the second clamping section are used for clamping the object to be tested. The conductivity of the at least one first conductive piece is greater than that of the at least one second clamping piece, and the rigidity of the at least one second clamping piece is greater than that of the at least one first conductive piece. The at least one first conductive piece comprises a first stacking section and a second stacking section which are connected, the at least one first conductive piece penetrates through the at least one second clamping piece, and the first stacking section and the second stacking section are respectively positioned on two opposite sides of the at least one second clamping piece and are respectively stacked on the second assembly section and the second clamping section. The stop piece comprises a connecting section and a stop section which are connected, the connecting section of the stop piece is arranged on the first assembling section or the second assembling section, and the stop section of the stop piece is positioned beside the first clamping section and the second clamping section.

According to the clip-type probe assembly disclosed in the above embodiment, since the electrical conductivity of the first conductive member is greater than the electrical conductivity of the second clamping member, the rigidity of the second clamping member is greater than the rigidity of the first conductive member, and the first stacking section and the second stacking section of the first conductive member are respectively located on two opposite sides of the second clamping member and are respectively stacked on the second assembling section and the second clamping section, after the first clamping section and the second clamping section clamp the object to be tested, the second assembling section and the second clamping section with higher rigidity respectively drive the first stacking section and the second stacking section to return to the positions before clamping. Therefore, the composite structure formed by the first conductive piece penetrating through the second clamping piece can ensure that the clip-on probe assembly has good conductivity and good rigidity. Therefore, even after the clip-type probe assembly clamps the object to be tested for a plurality of times, the force of the second overlapped section for scraping the object to be tested can be still maintained so as to be electrically contacted with the object to be tested.

In addition, when the first clamping section and the second clamping section clamp the object to be tested, the stop section of the stop piece is positioned beside the first clamping section and the second clamping section, so that the stop piece can be abutted against the object to be tested to prevent the object to be tested from moving when being clamped, and the success rate of the clamp-type probe assembly for measuring the electrical property of the object to be tested can be improved.

The foregoing summary of the invention, as well as the following detailed description of the embodiments, is provided to illustrate and explain the principles and spirit of the invention, and to provide further explanation of the invention as claimed.

Drawings

Fig. 1 is a perspective view of a clip-on probe assembly according to a first embodiment of the present invention.

Fig. 2 is an exploded view of fig. 1.

Fig. 3 is a side view of fig. 1.

Fig. 4 is a side view from another perspective of fig. 1.

Fig. 5 is a side view of the clip-on probe assembly of fig. 1 gripping a test object.

Fig. 6 is a side view of the clip-on probe assembly of fig. 1 from another perspective for holding an object to be tested.

Fig. 7 is a side view of a clip-on probe assembly according to a second embodiment of the present invention.

Fig. 8 is a side view of a clip-on probe assembly according to a third embodiment of the present invention.

Fig. 9 is a side view of a clip-on probe assembly according to a fourth embodiment of the present invention.

Fig. 10 is a side view of a clip-on probe assembly according to a fifth embodiment of the present invention.

Fig. 11 is a perspective view of a clip-on probe assembly according to a sixth embodiment of the present invention.

Wherein, the reference numbers:

10a, 10b, 10c, 10f clip-on probe assembly

11 test substance

13a clamping space

131a open side

132a, 132c, 132d, 132e sealed side

100a, 100d, 100e, 100f first clamping member

110a, 110c, 110d, 110e first assembly section

120a, 120c first clamping section

200a, 300a, 200f second clamp

210a, 310b, 310c a second assembly section

220a, 320c second clamping section

400a, 500c, 500d, 500e, 500f first conductive member

410a, 510b, 510c a first stacking segment

420a, 520c, 520d, 520e second stacked segment

600a, 700b, 700c, 700d, 700e, 700f stop

610a, 710b, 710c connecting segments

620a, 720b, 720c, 720d, 720e stop segment

800a, 800f second conductive member

810a third Stacking segment

820a fourth stacking segment

900a insulating part

Included angles theta 1, theta 2, theta 3 and theta 4

Acute angle theta 5 and theta 6

D1 and D2 directions

Obtuse angle alpha

Detailed Description

The detailed features and advantages of the present invention are described in detail in the following embodiments, which are sufficient for those skilled in the art to understand the technical contents of the present invention and to implement the same, and the related objects and advantages of the present invention can be easily understood by those skilled in the art from the disclosure of the present specification, claims and drawings. The following examples further illustrate aspects of the present invention in detail, but are not intended to limit the scope of the present invention in any way.

Referring to fig. 1 to 4, fig. 1 is a perspective view illustrating a clip-on probe assembly according to a first embodiment of the present invention. Fig. 2 is an exploded view of fig. 1. Fig. 3 is a side view of fig. 1. Fig. 4 is a side view from another perspective of fig. 1.

The clip-on probe assembly 10a of the present embodiment is used for holding an object 11 to be tested (please refer to fig. 4 first), and the object 11 to be tested is, for example, a pouch-type battery. The pouch-shaped battery is provided with electrodes for the clip-on probe assembly 10a to measure electrical characteristics of the object 11 to be measured, or for current to be conducted from the clip-on probe assembly 10 a.

The clip-on probe assembly 10a includes a first clamping member 100a, two

second clamping members

200a, 300a, two first

conductive members

400a, 500a, two

stoppers

600a, 700a, and a second conductive member 800 a. The first clamping member 100a includes a first assembling section 110a and a first clamping section 120a connected together.

The two

second clamping members

200a, 300a are arranged side by side, and each of the two

second clamping members

200a, 300a includes a

second assembling section

210a, 310a and a

second clamping section

220a, 320 a. The two

second assembling sections

210a and 310a are disposed on the first assembling section 110a, and the two

second clamping sections

220a and 320a are respectively connected to the two

second assembling sections

210a and 310 a. The first clamping section 120a and the two

second clamping sections

220a, 320a form a clamping space 13a therebetween, and the clamping space 13a has an opening side 131a and a sealing side 132a opposite to each other. In the present embodiment, the two

second clamping segments

220a and 320a extend toward the opening side 131a to form two included angles θ 1 and θ 2 with the two

second assembling segments

210a and 310a, respectively, and the two included angles θ 1 and θ 2 are respectively smaller than 180 degrees. In addition, the opening side 131a is used for placing the object 11 to be tested, so that the first clamping section 120a and the two

second clamping sections

220a and 320a clamp the object 11 to be tested in the clamping space 13 a.

In the present embodiment, the clip-type probe assembly 10a further includes an insulating member 900a, the two

second assembling segments

210a and 310a are disposed on the first assembling segment 110a through the insulating member 900a, and the insulating member 900a is used to electrically insulate the first clamping member 100a from the two

second clamping members

200a and 300a, but not limited thereto. In other embodiments, the second assembly section and the first assembly section may be free of insulation, and instead, the second assembly section or the first assembly section may be coated with an electrically insulating coating.

The two first

conductive members

400a, 500a are made of copper, for example, and the two

second clamping members

200a, 300a are made of stainless steel, for example. The electrical conductivity of the two first

conductive members

400a, 500a is greater than the electrical conductivity of the two

second clamping members

200a, 300a, respectively, and the rigidity of the two

second clamping members

200a, 300a is greater than the rigidity of the two first

conductive members

400a, 500a, respectively. Each of the two first

conductive members

400a, 500a includes a first stacking

section

410a, 510a and a second stacking

section

420a, 520 a. The second stacking section 420a is connected to the first stacking section 410a and extends toward the opening side 131a to form an included angle θ 3, and the included angle θ 3 is smaller than 180 degrees. The first conductive member 400a penetrates the second clamping member 200a, and the first stacking section 410a and the second stacking section 420a are respectively located at two opposite sides of the second clamping member 200 a. In detail, the first stacking section 410a is stacked on the side of the second assembling section 210a far from the first assembling section 110 a. The second stacking section 420a is stacked on a side of the second clamping section 220a adjacent to the first clamping section 120a, and at least one section of the second stacking section 420a away from the first stacking section 410a directly contacts the second clamping section 220 a. Similarly, the second stacking segment 520a is connected to the first stacking segment 510a and extends toward the opening side 131a to form an included angle θ 4, and the included angle θ 4 is smaller than 180 degrees. The first conductive member 500a penetrates the second clamping member 300a, the first stacking section 510a and the second stacking section 520a are respectively located at two opposite sides of the second clamping member 300a, the first stacking section 510a is respectively stacked at a side of the second assembling section 310a far away from the first assembling section 110a, the second stacking section 520a is stacked at a side of the second clamping section 320a near the first clamping section 120a, and at least one section of the second stacking section 520a far away from the first stacking section 510a directly contacts the second clamping section 320 a.

In the present embodiment, when the clip-on probe assembly 10a is used for measuring the electrical characteristics of the object 11, the first conductive member 500a is used for inputting a current to the object 11, and the first conductive member 400a is used for outputting a current from the object 11 to obtain the electrical characteristics of the object 11.

The two

stoppers

600a and 700a are made of stainless steel, for example, and the two

stoppers

600a and 700a are arranged side by side and respectively correspond to the two

second clamping members

200a and 300 a. The two

stops

600a, 700a each comprise a connecting

section

610a, 710a and a

stop section

620a, 720 a. The connecting section 610a is stacked on the first stacking section 410a away from the second assembling section 210a and disposed on the second assembling section 210a, and the stopping section 620a is connected to the connecting section 610a and extends toward the sealing side 132a to form an acute angle θ 5 with the connecting section 610 a. The stopping section 620a is far from the sealing side 132a compared to the second stacking section 420a, and the stopping section 620a is located beside the first clamping section 120a and the second clamping section 220 a. The connecting section 710a is disposed on the second assembly section 310a through a second conductive member 800a, which will be described later, and the stopping section 720a is connected to the connecting section 710a and extends toward the sealing side 132a to form an acute angle θ 6 with the connecting section 710 a. The stopping section 720a is far from the sealing side 132a compared to the second overlapping section 520a, and the stopping section 720a is located beside the first clamping section 120a and the second clamping section 320 a.

The material of the second conductive member 800a is, for example, copper metal, and the electrical conductivity of the second conductive member 800a is greater than the electrical conductivity of the two

stoppers

600a, 700a, and the rigidity of the two

stoppers

600a, 700a is greater than the rigidity of the second conductive member 800 a. The second conductive member 800a includes a third stacking section 810a and a fourth stacking section 820a connected to each other, the second conductive member 800a penetrates the stopper 700a, and the third stacking section 810a and the fourth stacking section 820a are respectively located at two opposite sides of the stopper 700 a. The third stacking section 810a is stacked between the first stacking section 510a and the connecting section 710a, such that the connecting section 710a is disposed on the second assembling section 310a, and the fourth stacking section 820a is stacked on the side of the stopping section 720a adjacent to the first clamping section 120 a. In the present embodiment, the second conductive member 800a and the first conductive member 500a are used together for inputting a large current (e.g. from tens of amperes to hundreds of amperes) to the object 11 to be tested.

Next, how the clip-on probe assembly 10a measures the electrical characteristics of the dut 11 is described with reference to fig. 5 and 6. Fig. 5 is a side view of the clip-on probe assembly of fig. 1 gripping a test object. Fig. 6 is a side view of the clip-on probe assembly of fig. 1 from another perspective for holding an object to be tested.

In the embodiment, the clip-on probe assembly 10a is mounted on a machine, for example, the machine pushes the first clamping member 100a in the direction D1 and pushes the

second clamping members

200a, 300a in the direction D2, so that the first clamping member 100a and the

second clamping members

200a, 300a are close to each other to clamp the object 11. When the first clamping member 100a and the two

second clamping members

200a, 300a clamp the object 11, the two second stacking

sections

420a, 520a of the two first

conductive members

400a, 500a and the fourth stacking section 820a of the second conductive member 800a press against the electrode of the object 11 to be tested and deform. In addition, in the process that the two second stacking

segments

420a and 520a and the fourth stacking segment 820a press against the object 11 to be tested, the second stacking

segments

420a and 520a and the fourth stacking segment 820a scrape the electrodes of the object 11 to be tested to form electrical contact. At this time, after the current or voltage for measuring the electrical characteristic of the object 11 is input to the object 11 through the first conductive member 500a and the second conductive member 800a, the current or voltage is output from the first conductive member 400a to obtain the electrical characteristic of the object 11.

When the measurement of the clip-on probe assembly 10a is completed, the

second assembling segments

210a, 310a and the

second clamping segments

220a, 320a of the two

second clamping members

200a, 300a rebound due to their own rigidity to respectively drive the two first stacking

segments

410a, 510a and the two second stacking

segments

420a, 520a to reset. In addition, the stopper 700a rebounds due to its own rigidity to drive the third stacking segment 810a and the fourth stacking segment 820a to reset.

In this way, the three

conductive members

400a, 500a, 800a respectively penetrate through the two

second clamping members

200a, 300a and the stopper 700a to form a composite structure, so that the clip-on probe assembly 10a has good conductivity through the three

conductive members

400a, 500a, 800a, and when the measurement of the clip-on probe assembly 10a is completed, the three

conductive members

400a, 500a, 800a are forced to return to the positions before clamping by the two

second clamping members

200a, 300a and the stopper 700a with good rigidity. Therefore, even after the clip-on probe assembly 10a clamps the electrode of the object 11 for a plurality of times, the three

conductive members

400a, 500a, 800a can still be maintained to scrape the electrode of the object 11 to be tested to electrically contact the object 11.

In addition, since the stopping

sections

620a and 720a of the two

stoppers

600a and 700a are located beside the first clamping section 120a and the two

second clamping sections

220a and 320a, and the extending directions of the two

second clamping sections

220a and 320a are opposite to the extending directions of the two stopping

sections

620a and 720a, respectively, when the first clamping section 120a and the two

second clamping sections

220a and 320a clamp the object 11, the acting force of the two

second clamping sections

220a and 320a pushing against the object 11 and the acting force of the two stopping

sections

620a and 720a pushing against the object 11 can be cancelled out, so that the stability of the object 11 when clamped by the clip-type probe assembly 10a can be improved, and the success rate of the clip-type probe assembly 10a measuring the electrical characteristics of the object 11 can be improved.

In the foregoing description, the first conductive member 500a and the second conductive member 800a are disposed to input a large current (e.g., from tens of amperes to hundreds of amperes) to the object 11, but the invention is not limited thereto. In other embodiments, if only a small current is required to be input to the object to be tested, the first conductive member 500a and the second conductive member 800a can be alternatively disposed. In detail, please refer to fig. 7 and 8. Fig. 7 is a side view of a clip-on probe assembly according to a second embodiment of the present invention. Fig. 8 is a side view of a clip-on probe assembly according to a third embodiment of the present invention.

As shown in fig. 7, in the present embodiment, the connecting section 710b of the stopper 700b is directly stacked on the first stacking section 510b at a side away from the second assembling section 310b, and is disposed on the second assembling section 310 b. In addition, in order to further increase the stability of the object to be tested (as shown in fig. 5) clamped by the clip-on probe assembly 10b, the stopping section 720b of the stopping member 700b may be a non-slip pad, or the stopping section 720b may be made of rubber, so as to increase the friction between the object to be tested (as shown in fig. 5) and the clip-on probe assembly 10b, and further increase the stability of the object to be tested (as shown in fig. 5) when clamped.

As shown in fig. 8, in the clip-on probe assembly 10c of the present embodiment, the first stacking section 510c of the first conductive member 500c is stacked on the side of the second assembling section 310c adjacent to the first assembling section 110c, and the second stacking section 520c is stacked on the side of the second clamping section 320c adjacent to the first clamping section 120 c. The stopper 700c is stacked on the first stacking section 510c and disposed on the second assembling section 310c at a side away from the second assembling section 310 c. The stopping section 720c of the stopper 700c is closer to the sealing side 132c than the second overlapping section 520c of the first conductive member 500 c. In addition, an obtuse angle α is formed between the stopping section 720c and the connecting section 710c of the stopper 700 c.

In the above embodiment, since the clip-type probe assembly is used for clamping the object to be tested, and the object to be tested is thin and soft, the pouch-type battery is easy to bend, and therefore the stop member and the second clamping section of the second clamping member are both disposed on the same side. That is, the stopper is provided at the second assembly section to prevent the pouch type battery from being bent, but not limited thereto. In other embodiments, if the object to be measured is other harder and thicker batteries, the stop member may be disposed on the first assembly section instead. In detail, referring to fig. 9 and 10, fig. 9 is a side view of a clip-on probe assembly according to a fourth embodiment of the present invention, and fig. 10 is a side view of a clip-on probe assembly according to a fifth embodiment of the present invention.

As shown in fig. 9, in the present embodiment, the stop member 700d is disposed on the first assembling section 110d of the first clamping member 100d, and the stop section 720d of the stop member 700d is farther from the sealing side 132d than the second overlapping section 520d of the first conductive member 500 d.

As shown in fig. 10, in the present embodiment, the stop member 700e is disposed on the first assembling section 110e of the first clamping member 100e, and the stop section 720e of the stop member 700e is closer to the sealing side 132e than the second overlapping section 520e of the first conductive member 500 e.

In the embodiment of fig. 1, the first conductive member 400a is used for outputting a current to obtain an electrical characteristic of the object 11 to be measured, but not limited thereto. In other embodiments, if the clip-on probe assembly is used to conduct current to the object to be tested, the first clamping member 200a, the first conductive member 400a and the stop member 600a may not be provided. In detail, referring to fig. 11, fig. 11 is a perspective view of a clip-on probe assembly according to a sixth embodiment of the present invention.

In the clip-on probe assembly 10f of the present embodiment, the clip-on probe assembly 10f only includes a first clamping member 100f, a second clamping member 200f, a first conductive member 500f, a stop member 700f and a second conductive member 800 f. The first conductive member 500f penetrates through the second clamping member 200f and is located at two opposite sides of the second clamping member 200f, and the second conductive member 800f penetrates through the stop member 700f and is located at two opposite sides of the stop member 700 f.

According to the clip-type probe assembly of the above embodiment, the conductive member penetrates through the composite structure formed by the two second clamping members or the stop member, so that the clip-type probe assembly can have good conductivity through the conductive member, and when the measurement of the clip-type probe assembly is completed, the conductive member can be forced to return to the position before clamping by the second clamping members and the stop member with good rigidity. Therefore, even after the clamp-type probe assembly clamps the object to be tested for a plurality of times, the force of the conductive piece scraping the electrode of the object to be tested can be maintained to be electrically contacted with the object to be tested.

In addition, because the backstop section of the stop part is positioned beside the first clamping section and the second clamping section, and the extension direction of the second clamping section is opposite to that of the backstop section respectively, when the first clamping section and the second clamping section clamp the object to be tested, the acting force of the second clamping section pushing the object to be tested can be mutually offset with the acting force of the backstop section pushing the object to be tested, so the stability of the object to be tested when the object to be tested is clamped by the clamp-type probe assembly can be improved, and the success rate of the clamp-type probe assembly for measuring the electrical property of the object to be tested can be improved.

Although the present invention has been described with reference to the above embodiments, it is not intended to limit the invention. All changes and modifications that come within the spirit and scope of the invention are desired to be protected by the following claims. With regard to the scope of protection defined by the present invention, reference should be made to the appended claims.

Claims

1. A clip-on probe assembly adapted to hold an object to be tested, comprising:

the first clamping piece comprises a first assembling section and a first clamping section which are connected;

the second clamping piece comprises a second assembly section and a second clamping section which are connected, the second assembly section is arranged on the first assembly section, and the first clamping section and the second clamping section are used for clamping the object to be detected;

the electric conductivity of the at least one first conductive piece is greater than that of the at least one second clamping piece, the rigidity of the at least one second clamping piece is greater than that of the at least one first conductive piece, the at least one first conductive piece comprises a first stacking section and a second stacking section which are connected, the at least one first conductive piece penetrates through the at least one second clamping piece, and the first stacking section and the second stacking section are respectively positioned on two opposite sides of the at least one second clamping piece and are respectively stacked on the second assembling section and the second clamping section; and

at least one stop member, including a connecting section and a stop section, the connecting section of the stop member is arranged on the first assembling section or the second assembling section, the stop section of the stop member is arranged beside the first clamping section and the second clamping section,

wherein, the second stacking section is far away from at least one section of the first stacking section and is directly contacted with the second clamping section.

2. The clip-on probe assembly according to claim 1, wherein the first clamping section and the second clamping section define a clamping space therebetween, the clamping space having an open side and a closed side opposite to each other, the stop section of the at least one stop member being spaced apart from the closed side compared to the second overlapping section.

3. The clip-on probe assembly according to claim 2, wherein the stop section and the connecting section form an acute angle therebetween.

4. The clip-on probe assembly of claim 2, wherein the first stacking segment is stacked on a side of the second assembling segment away from the first assembling segment, and the second stacking segment is stacked on a side of the second clamping segment adjacent to the first clamping segment.

5. The clip-on probe assembly according to claim 4, further comprising a second conductive member having a conductivity greater than that of the at least one stopper and a rigidity greater than that of the second conductive member, wherein the second conductive member includes a third stacking section and a fourth stacking section connected to each other, the second conductive member penetrates the at least one stopper, the third stacking section and the fourth stacking section are respectively disposed on opposite sides of the at least one stopper, the third stacking section is stacked between the first stacking section and the connecting section, and the connecting section is disposed on the second assembling section, and the fourth stacking section is stacked on a side of the stopping section adjacent to the first clamping section.

6. The clip-on probe assembly according to claim 5, wherein the at least one second clamping member is two in number, the two second clamping pieces are arranged side by side, the number of the at least one first conductive piece is two, the two first conductive pieces are respectively penetrated through the two second clamping pieces, and the first stacking section and the second stacking section of each first conductive member are respectively positioned at two opposite sides of one of the second clamping members, the two first overlapping sections are respectively overlapped on one side of the two second assembling sections far away from the two first assembling sections, the two second overlapping sections are respectively overlapped on one side of the two second clamping sections adjacent to the first clamping section, the number of the at least one stop piece is two, the two stop pieces are arranged side by side, the connecting section of each stop piece is respectively arranged on the two second assembling sections, the two stopping sections of the two stopping parts are respectively far away from the sealing side compared with the two second overlapping sections.

7. The clip-on probe assembly according to claim 1, wherein the first clamping section and the second clamping section define a clamping space therebetween, the clamping space having an open side and a closed side opposite to each other, the stop section of the at least one stop member being adjacent to the closed side compared to the second overlapping section.

8. The clip-on probe assembly of claim 7, wherein the first stacking segment is stacked on a side of the second assembling segment adjacent to the first assembling segment, and the second stacking segment is stacked on a side of the second clamping segment adjacent to the first clamping segment.

9. The clip-on probe assembly according to claim 7, wherein the stop section and the connecting section form an obtuse angle therebetween.

10. The clip-on probe assembly according to claim 1, wherein the connecting section of the at least one stop is disposed on the second assembly section.