CN110658467B - Clamp type testing device - Google Patents

Abstract

The invention provides a clamp type testing device which comprises a first clamping piece, a second clamping piece, a rotating shaft piece and a conductive piece. The first clamping piece is provided with a first pivot part and a first base wall, and the second clamping piece is provided with a second pivot part and a second base wall. The rotating shaft piece is detachably pivoted on the first pivoting part and the second pivoting part. The conductive piece is arranged on the first clamping piece and located between the first base wall and the second base wall, the conductive piece is provided with an upper side face and a lower side face, the lower side face of the conductive piece faces the first base wall, at least part of the conductive piece is wavy, and a first scraping structure is arranged on the upper side face.

Description

Clamp type testing device

Technical Field

The present invention relates to a clip-on testing device, and more particularly, to a clip-on testing device with a scraping structure.

Background

With the development of electric vehicles, the selection that people can move for a long distance by using pure electric energy without using petrochemical fuel is provided. In order to increase the driving distance of electric vehicles, more batteries with higher capacity are often needed to be arranged, however, how to ensure the stability, safety and reliability of the batteries is an important problem at present, and the importance of detecting the quality of the batteries is also highlighted.

At present, when the quality of the battery is detected, the battery can be replaced for charging and discharging tests, so that the voltage and current characteristics of the battery can be accurately measured, and the method is an important key for evaluating the quality of the battery. However, when the battery is manufactured, in order to avoid oxidation or damage of the electrode, a protective film is covered on the surface of the electrode, and if the protective film cannot be effectively scraped, the test connector cannot be directly contacted with the electrode of the battery, so that the voltage and current characteristics of the battery cannot be accurately measured. If the protection film of electrode is removed by special machinery or manpower, obviously the detection efficiency will be reduced, so the industry needs a testing device which can directly scrape the protection film to expose the electrode of the battery when detecting the battery, so as to more rapidly and accurately measure the voltage and current characteristics of the battery.

Disclosure of Invention

The invention provides a clamping type testing device, which can not only scrape the protective film of an electrode by using a scraping structure on a conductive piece, but also directly detect the voltage and current characteristics of a battery by using the conductive piece so as to improve the detection efficiency and accuracy when clamping the battery electrode.

The invention provides a clamp-type testing device, which comprises a first clamping piece, a second clamping piece, a rotating shaft piece and a conductive piece. The first clamping piece is provided with a first pivot part and a first base wall, and the second clamping piece is provided with a second pivot part and a second base wall. The rotating shaft piece is detachably pivoted on the first pivoting part and the second pivoting part. The conductive piece is arranged on the first clamping piece and located between the first base wall and the second base wall, the conductive piece is provided with a first bending portion and a second bending portion, the first bending portion bends towards the upper side face of the conductive piece, the second bending portion bends towards the lower side face of the conductive piece, the second bending portion is provided with a first scraping structure, and the first scraping structure protrudes or is recessed in the upper side face of the conductive piece.

In one embodiment, the lower side surface of the conductive member faces the first base wall, and a distance from the first bent portion to the first base wall is smaller than a distance from the second bent portion to the first base wall. In addition, the clamping type testing device further comprises a metal plate and a measuring piece, wherein the metal plate is arranged on the first clamping piece and positioned between the first base wall and the conductive piece, and the metal plate is contacted with the lower side surface of the conductive piece. The measuring part is provided with a third bending part and a fourth bending part, the third bending part is bent towards the upper side surface of the measuring part, the fourth bending part is bent towards the lower side surface of the measuring part, the fourth bending part is provided with a second scraping structure, and the second scraping structure is protruded or recessed from the upper side surface of the measuring part

The invention provides another clamp-type testing device, which comprises a first clamping piece, a second clamping piece, a rotating shaft piece and a conductive piece. The first clamping piece is provided with a first pivot part and a first base wall, and the second clamping piece is provided with a second pivot part and a second base wall. The rotating shaft piece is detachably pivoted on the first pivoting part and the second pivoting part. The conductive piece is arranged on the first clamping piece and located between the first base wall and the second base wall, the conductive piece is provided with a first bending portion and a second bending portion, the first bending portion is provided with a bottom surface, the second bending portion is provided with a top surface, and the bottom surface and the top surface are at a preset distance. The second bending part is provided with a first scraping structure, and when the distance between the bottom surface and the top surface is smaller than the preset distance, the first scraping structure moves relative to the first base wall.

The invention provides a clip-type testing device, which comprises a first clamping piece, a second clamping piece, a rotating shaft piece and a conductive piece. The first clamping piece is provided with a first pivot part and a first base wall, and the second clamping piece is provided with a second pivot part and a second base wall. The rotating shaft piece is detachably pivoted on the first pivoting part and the second pivoting part. The conductive piece is arranged on the first clamping piece and located between the first base wall and the second base wall, the conductive piece is provided with an upper side face and a lower side face, the lower side face of the conductive piece faces the first base wall, at least part of the conductive piece is wavy, and a first scraping structure is arranged on the upper side face.

In summary, the conductive device of the clip-on testing device provided by the present invention may be a wavy and elastic conductive sheet, and has a scraping structure, when the clip-on testing device performs an electrical test on an object to be tested (such as a battery), the scraping structure on the conductive device may scrape a protective film of the battery electrode when the battery electrode is clamped, so that the conductive device may be used to directly detect the voltage and current characteristics of the battery, thereby improving the detection efficiency and accuracy.

Other effects and embodiments of the present invention will be described in detail with reference to the accompanying drawings.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments described in the present application, and other drawings can be obtained by those skilled in the art without creative efforts.

FIG. 1 is a perspective view of a clip-on testing device according to an embodiment of the present invention;

FIG. 2 is an exploded view of a clip-on testing device according to an embodiment of the present invention;

FIG. 3 is a perspective view of a first clamping member according to an embodiment of the invention;

FIG. 4 is a perspective view of a second clamping member according to an embodiment of the invention;

FIG. 5 is another perspective view of a clip-on testing device according to an embodiment of the present invention;

FIG. 6 is a schematic perspective view illustrating a conductive member according to an embodiment of the present invention;

FIG. 7 is a partial schematic view of a conductive member according to an embodiment of the invention;

fig. 8 is a schematic perspective view illustrating a conductive member and a metal plate according to an embodiment of the invention;

FIG. 9 is a perspective view of a measuring member according to an embodiment of the invention;

fig. 10 is a schematic perspective view illustrating a conductive member according to an embodiment of the invention before being bent;

fig. 11 is a schematic perspective view illustrating a conductive member according to another embodiment of the invention.

Description of the symbols

1: clip-on testing device 10: first clamping part

100: first base walls 102a, 102 b: first pivot joint part

100a, 100 b: region on the first base wall

104: first fixing member 12: second clamping piece

120: second base walls 122a, 122 b: second pivot joint part

124: second fixing member 14: rotating shaft piece

140: the elastic unit 16: conductive member

16 a: upper side 16b of the conductive member: lower side surface of conductive member

160: first bent portion 160 a: bottom surface of the first bending part

162: second bent portion 162 a: top surface of the second bending part

1620: first scraping structure 164: end part

1640: third scraper structure 18: metal plate

19: the measuring part 190: third bent part

192: the fourth bent portion 1920: second scraping structure

26: conductive member 260: a first bending part

262: the second bending portion 2620: first scraping structure

Detailed Description

The foregoing and other technical matters, features and effects of the present invention will be apparent from the following detailed description of a preferred embodiment, which is to be read in connection with the accompanying drawings. Directional terms as referred to in the following examples, for example: up, down, left, right, front or rear, etc., are simply directions with reference to the drawings. Accordingly, the directional terminology is used for purposes of illustration and is in no way limiting.

Referring to fig. 1, fig. 1 is a schematic perspective view illustrating a clip-on testing device according to an embodiment of the invention. As shown in fig. 1, the clip-on testing device 1 includes a first clamping member 10, a second clamping member 12, a rotating shaft member 14, and a conductive member 16. The conductive member 16 is located between the first clamping member 10 and the second clamping member 12 and located closer to the first clamping member 10, and the rotating shaft member 14 is used to pivotally connect the first clamping member 10 and the second clamping member 12 together, so that the first clamping member 10 and the second clamping member 12 can rotate around the rotating shaft member 14. It should be understood by those skilled in the art that the first clamping member 10, the second clamping member 12 and the shaft member 14 may form a clamp together, so that when the first clamping member 10 and the second clamping member 12 are forced at one end, the other ends of the first clamping member 10 and the second clamping member 12 can approach each other to clamp the object to be tested. The present embodiment does not limit what kind of object to be tested the clip-on testing apparatus 1 is used to clamp, and as long as the object to be tested needs to be electrically tested, the object to be tested that the clip-on testing apparatus 1 is suitable for clamping is the object to be tested, for example, the object to be tested may be a battery, and the clip-on testing apparatus 1 can clamp an electrode of the battery to electrically test the battery.

In addition, the present embodiment does not limit the appearance shape of the object to be tested, for example, the first clamping member 10 and the second clamping member 12 shown in fig. 1 are portions capable of clamping a sheet, a plate, a cylinder or other shapes on the object to be tested. In one example, when the first clamping member 10 and the second clamping member 12 are stressed at one end, the first clamping member 10 and the second clamping member 12 are used for clamping one end of the object to be tested, and the appearance of the first clamping member 10 and the second clamping member 12 can be designed to be as close as possible or slightly smaller than the thickness of the part to be clamped, that is, the effect of stably clamping the object to be tested is achieved. Of course, the present embodiment also does not limit the appearance shape of the first clamping member 10 and the second clamping member 12, for example, the first clamping member 10 and the second clamping member 12 shown in fig. 1 may be used to clamp a sheet-like or plate-like portion of the object to be measured, or the appearance shape of the first clamping member 10 and the second clamping member 12 may be adjusted to be slightly curved, so as to be more suitable for clamping a cylindrical portion of the object to be measured. For convenience of description, the object to be measured is a battery, and the sheet-like electrode is sandwiched by the battery.

Since fig. 1 illustrates the assembled state of the clip-on testing apparatus 1, some components are not easily seen from fig. 1, and the clip-on testing apparatus 1 is disassembled for illustration. Referring to fig. 1 and 2 together, fig. 2 is an exploded view illustrating a clip-on testing device according to an embodiment of the invention. As shown in fig. 2, the clip-on testing device 1 may further include a metal plate member 18 and a measuring member 19 in addition to the first clamping member 10, the second clamping member 12, the rotating shaft member 14 and the conductive member 16, however, the metal plate member 18 and the measuring member 19 are not essential components, and will be described in detail later. In addition, regarding the functions and descriptions of the components, the following description will be further described with reference to the three-dimensional schematic diagrams of the components.

Referring to fig. 2 and 3, fig. 3 is a schematic perspective view illustrating a first clamping member according to an embodiment of the invention. As shown, the first clamping member 10 has a first base wall 100 and first pivoting portions 102a and 102 b. The present embodiment does not limit the shape and appearance of the first base wall 100, and the configuration of the bottom surface of the first clamping member 10 is only suitable for the first base wall 100 of the present embodiment. The first pivoting portions 102a and 102b are connected to the first base wall 100, and the first pivoting portions 102a and 102b may have through holes, so that the rotating shaft 14 passes through the through holes and can rotate properly. In practice, although two first pivoting portions 102a and 102b are shown in the drawings, as long as the first pivoting portion can pivot the rotating shaft 14, it is consistent with the spirit of the present invention, and therefore, there may be only one first pivoting portion or more first pivoting portions, and the number of the first pivoting portions is not limited in the embodiment. In addition, although the rotating shaft 14 is inserted into the first pivoting portions 102a and 102b in the embodiment, a person skilled in the art may also replace the means for pivoting between the first clamping member 10 and the rotating shaft 14, and the embodiment is not limited thereto.

In one example, the first base wall 100 has a first fixing member 104, and the first fixing member 104 can be used to position the elastic unit 140 on the rotating shaft member 14, so that the elastic unit 140 can be exactly clamped in the center of the first base wall 100, thereby preventing the elastic unit 140 from sliding relative to the rotating shaft member 14 or the first base wall 100, and affecting the clamping force of the clip-on testing apparatus 1 for clamping the object to be tested, or releasing the restoring force of the object to be tested. In practice, the elastic unit 140 may be a spring or a leaf spring for clamping or expanding the first clamping member 10 and the second clamping member 12, and the embodiment does not limit the kind of the elastic unit 140. In addition, the first fixing element 104 may protrude from the first base wall 100 and penetrate through the conductive element 16 when the clip-on testing device 1 is assembled, so as to assist in positioning the conductive element 16 and prevent the conductive element 16 from being separated from the predetermined position when an external force is applied.

In addition, the first base wall 100 may be divided into two regions 100a and 100b for accommodating the measuring part 19 and the conductive part 16, respectively, and since the measuring part 19 and the conductive part 16 have different electrical measurement purposes, the regions 100a and 100b on the first base wall 100 are required to prevent the measuring part 19 and the conductive part 16 from being electrically connected to each other. In practice, the regions 100a and 100b on the first base wall 100 may be two recesses, respectively, the recess shape of the region 100a is exactly matched with the shape of the measuring part 19, and the recess shape of the region 100b is matched with the shape of the conductive part 16, so that the sliding of the measuring part 19 and the conductive part 16 can be reduced. In addition, the measuring element 19 and the conductive element 16 may also be directly locked or snapped in the areas 100a and 100b, respectively, and the embodiment is not limited herein.

Referring to fig. 2 and 4 together, fig. 4 is a schematic perspective view illustrating a second clamping member according to an embodiment of the invention. As shown, the second clamping member 12 has a second base wall 120 and second pivoting portions 122a and 122 b. Similarly, the present embodiment does not limit the shape and appearance of the second base wall 120, and the configuration of the bottom surface of the second clamping member 12 is only suitable for the second base wall 120 of the present embodiment. The second pivot portions 122a and 122b are connected to the second base wall 120, the second pivot portions 122a and 122b may have through holes, and in practice, the rotating shaft 14 may simultaneously penetrate through the first pivot portions 102a and 102b and the second pivot portions 122a and 122b, so that the first clamping member 10 and the second clamping member 12 are pivoted together by the rotating shaft 14, and the first clamping member 10 and the second clamping member 12 can rotate around the rotating shaft 14.

In one example, the second base wall 120 has a second fixing member 124, and the second fixing member 124 can be used to position the elastic unit 140 on the shaft member 14, so that the elastic unit 140 can be exactly clamped in the center of the second base wall 120, and the elastic unit 140 is prevented from sliding relative to the shaft member 14 or the second base wall 120. Here, although the embodiment exemplifies that the first base wall 100 and the second base wall 120 have respective fasteners, in practice, the fasteners are not necessarily required, or only one of the first base wall 100 and the second base wall 120 has or does not have a fastener. In addition, the embodiment exemplifies that the conductive member 16 is assembled on the first clamping member 10, in practice, the conductive member may also be assembled on the second clamping member 12, or the first clamping member 10 and the second clamping member 12 are each assembled with a conductive member.

It should be noted that, although the first pivoting portions 102a and 102b are illustrated in the embodiment at a position approximately near the middle of the first base wall 100, that is, the first pivoting portions 102a and 102b are approximately at two sides of the middle of the first clamping member 10, and the second pivoting portions 122a and 122b are illustrated in the embodiment at a position approximately near the middle of the second base wall 120, that is, the second pivoting portions 122a and 122b are approximately at two sides of the middle of the second clamping member 12, the embodiment is not limited thereto. In one example, the first pivoting portions 102a and 102b and the second pivoting portions 122a and 122b may be at the same end of the first base wall 100 and the second base wall 120. It should be understood by those skilled in the art that the positions of the first pivot portions 102a and 102b and the second pivot portions 122a and 122b are related to how to drive the first clamping member 10 and the second clamping member 12. For example, the first clamping member 10 and the second clamping member 12 are driven by pressing or pushing one end of the first base wall 100 and the second base wall 120 to open or close the other end of the first base wall 100 and the second base wall 120, and the first pivot portions 102a and 102b and the second pivot portions 122a and 122b can be substantially near the middle of the first base wall 100 and the second base wall 120, respectively, as illustrated in this embodiment.

In addition, since the clip-on testing apparatus 1 is used for electrical testing of an object to be tested, the first clamping member 10 and the second clamping member 12 can be made of an insulating material, such as plastic, so as to prevent the first clamping member 10 and the second clamping member 12 from interfering with the electrical testing result. In this case, the first base wall 100 and the first pivot portions 102a and 102b of the first clamping member 10 may be integrally formed, and the second base wall 120 and the second pivot portions 122a and 122b of the second clamping member 12 may be integrally formed.

To illustrate how the first clamping member 10 and the second clamping member 12 are pivotally connected together by the shaft member 14, please refer to fig. 2 and 5 together, and fig. 5 is another perspective view illustrating the clip-on testing device according to an embodiment of the invention. As shown in the drawings, the distance between the two first pivoting portions 102a and 102b of the first clamping member 10 of the exemplary embodiment is slightly greater than the distance between the two second pivoting portions 122a and 122b of the second clamping member 12, so that the two first pivoting portions 102a and 102b of the first clamping member 10 can be just outside the two second pivoting portions 122a and 122b of the second clamping member 12. The rotating shaft 14 has a long rod passing through the through holes of the first pivoting portions 102a and 102b and the second pivoting portions 122a and 122b, and has clips fixed to the outer sides of the first pivoting portions 102a and 102b so that the first clamping member 10 and the second clamping member 12 can be pivoted together by the rotating shaft 14.

Referring to fig. 2 and fig. 6 together, fig. 6 is a schematic perspective view illustrating a conductive member according to an embodiment of the invention. As shown in the figure, the conductive element 16 has a first bent portion 160 and a second bent portion 162, the first bent portion 160 is bent toward the upper side 16a of the conductive element 16, and the second bent portion 162 is bent toward the lower side 16b of the conductive element 16. In detail, the conductive element 16 is located on the first base wall 100, and the present embodiment does not limit whether the lower side surface 16b of the conductive element 16 directly contacts the first base wall 100, as long as the lower side surface 16b of the conductive element 16 faces the first base wall 100. In addition, part of the conductive element 16 is wavy, the first bent portion 160 refers to a portion of the wavy conductive element 16 that is bent toward the upper side 16a of the conductive element 16, and the second bent portion 162 refers to a portion of the wavy conductive element 16 that is bent toward the lower side 16b of the conductive element 16. It can be seen that the first bent portion 160 is below the second bent portion 162, so that the distance from the first bent portion 160 to the first base wall 100 is smaller than the distance from the second bent portion 162 to the first base wall 100.

The number of the first bending portion 160 and the second bending portion 162 is not limited in the present embodiment, and it can be known to those skilled in the art that if the number of the wavy conductive element 16 has more bending portions, the number of the first bending portion 160 and the second bending portion 162 is certainly more, as long as the conductive element 16 has at least one first bending portion 160 and one second bending portion 162, which is in accordance with the scope of the conductive element 16 of the present embodiment. In addition, the present embodiment exemplifies an arrangement manner in which the first bending portion 160 and the second bending portion 162 are parallel to each other, and the two first bending portions 160 and the one second bending portion 162 are adjacent to each other, but not limited thereto, for example, the first bending portion 160 and the second bending portion 162 may be W-shaped or V-shaped, so that although the first bending portion 160 and the second bending portion 162 are alternately spaced, they are not necessarily parallel to each other.

For more clearly describing the structure of the conductive element 16, especially the first scraping structure 1620 of the second bending portion 162, please refer to fig. 6 and fig. 7 together, and fig. 7 is a partial schematic view illustrating the conductive element according to an embodiment of the invention. As shown, the second bending portion 162 has a first scraping structure 1620, and the first scraping structure 1620 is located on the upper side surface 16a of the conductive device 16. In practice, since the lower side surface 16b of the conductive element 16 faces the first base wall 100 and is not used for contacting the object to be tested, the first scraping structure 1620 needs to be designed on the side of the upper side surface 16a of the conductive element 16, and the first scraping structure 1620 can contact the object to be tested when the first clamping member 10 and the second clamping member 12 clamp the object to be tested.

In practice, the conductive element 16 has a function of providing voltage and current to the object to be tested, so the conductive element 16 may be made of metal or conductive material. In other words, the conductive element 16 is elastic, and particularly, the conductive element 16 further has a first bent portion 160 and a second bent portion 162, when an external force is applied between a bottom surface 160a of the first bent portion 160 (i.e., the lower side surface 16b of the conductive element 16) and a top surface 162a of the second bent portion 162 (i.e., the upper side surface 16a of the conductive element 16), a distance between the bottom surface 160a and the top surface 162a is slightly shortened, and the conductive element 16 can extend toward an end 164 of one end thereof, so that the total length of the conductive element 16 relative to the first base wall 100 is slightly increased.

For example, when the object to be tested is a battery, the first clamping member 10 and the second clamping member 12 may clamp the electrodes of the battery for electrical testing, however, when the battery leaves the factory, in order to prevent the battery from being oxidized or damaged, a film layer made of an insulating material is often attached for protection. Therefore, the conductive member 16 has another function of scraping the protective film layer on the electrode, so that the electrical test can be directly performed without additionally removing the protective film layer. The first scraping structure 1620 protrudes from the upper side surface 16a of the conductive element 16, and the first scraping structure 1620 is inclined toward the end 164 for scraping the protective film on the electrode.

As mentioned above, when the first clamping member 10 and the second clamping member 12 clamp the electrode of the battery, the top surface 162a of the second bending portion 162 of the conductive member 16 (especially the first scraping structure 1620) is supported by the first base wall 100 against the electrode of the battery by the bottom surface 160a of the first bending portion 160 opposite to the top surface 162a, so that the conductive member 16 is subjected to an external force between the bottom surface 160a and the top surface 162a, and at this time, the conductive member 16 may be slightly deformed because the conductive member 16 is slightly elastic due to the material and the wavy appearance. In other words, the distance between the bottom surface 160a and the top surface 162a is slightly shorter, and the total length of the conductive member 16 relative to the first base wall 100 is slightly longer. In this way, the first scraping structure 1620 abuts against the electrode of the battery and has a proper displacement, so that the effect of scraping the protective film on the electrode can be achieved by the friction between the first scraping structure 1620 and the electrode.

The arrangement, number, shape or size of the first scraping structures 1620 are not limited in this embodiment, for example, the first scraping structures 1620 may be arranged in a plurality of groups or arranged in a specific pattern, and the first scraping structures 1620 may be triangular, trapezoidal, rectangular or other shapes as viewed from the upper side 16a of the conductive device 16, as long as the protective film on the electrode can be scraped, which belongs to the category of the first scraping structures 1620 in this embodiment. In addition, in one example, only a portion of the first scraping structures 1620 may be inclined toward the end 164, and another portion of the first scraping structures 1620 may be inclined toward another direction, so as to achieve the purpose of scraping the protective film on the electrode. In short, the present embodiment does not limit where the first scraping structure 1620 inclines, and even though the protection film layer on the electrode is directly penetrated without inclining, the conductive member 16 can contact the electrode of the battery, and the electrical test can be performed as well. In addition, the edge portion 164 of the conductive member 16 may also have a third scraping structure 1640, and the arrangement, number, shape or size of the third scraping structure 1640 may be the same as or different from that of the first scraping structure 1620, which is not limited in this embodiment.

In practice, since the conductive device 16 can provide voltage and current to the object to be tested, although the thickness of the conductive device 16 is not limited in this embodiment, a metal plate 18 may be disposed between the conductive device 16 and the first base wall 100 if the conductive device 16 is made too thin, which may result in a higher resistance value. Referring to fig. 2 and 8 together, fig. 8 is a schematic perspective view illustrating a conductive member and a metal plate according to an embodiment of the invention. As shown, the conductive member 16 is closely attached to the metal plate member 18, so that when performing an electrical test, not only can the conductive member 16 be used to transmit current, but also the metal plate member 18 can provide another current path, thereby facilitating the performance of the electrical test. As previously mentioned, the sheet metal element 18 is not an essential component because the conductive element 16 may be directly fixed to the first base wall 100 if the electrical test does not require the use of a large current, or the conductive element 16 has a sufficient thickness, whereas the conductive element 16 needs to be fixed to the first base wall 100 together with the sheet metal element 18 if the electrical test requires the use of a large current, or the conductive element 16 is too thin. In either case, however, the description that the conductive member 16 is disposed on the first clamping member 10 between the first base wall 100 and the second base wall 120 should be followed.

The present embodiment does not limit the shape or size of the metal plate 18, and the present embodiment is only applicable to be placed between the conductive component 16 and the first base wall 100, and can provide a current path from an external testing machine to the battery electrode, that is, the present embodiment falls into the category of the metal plate 18. On the other hand, the clip-on testing device 1 may further include a measuring device 19, please refer to fig. 2 and 9 together, and fig. 9 is a schematic perspective view illustrating the measuring device according to an embodiment of the invention. As shown, the measuring member 19 may have an external shape similar to the conductive member 16, and also be located between the first base wall 100 and the second base wall 120, however, the size of the measuring member 19 is slightly smaller than the conductive member 16. The embodiment exemplifies that the measuring part 19 is assembled on the first holding part 10, in practice, the measuring part may also be assembled on the second holding part 12, or the first holding part 10 and the second holding part 12 are each assembled with a measuring part.

In addition, the measuring member 19 may have a third bending portion 190 and a fourth bending portion 192, the third bending portion is also bent toward the upper side of the measuring member 19, the fourth bending portion 192 is bent toward the lower side of the measuring member 19, the fourth bending portion also has a second scraping structure 1920, and the second scraping structure 1920 may be protruded (or recessed) from the upper side of the measuring member. Since the measuring component 19 and the conductive component 16 are similar to the conductive component 16, the structural details of the measuring component 19 can refer to the above description of the conductive component 16, and the detailed description of the embodiment is omitted here.

In detail, the function of the conductive member 16 may include providing a large current to the battery, so that in order to maintain good transmission efficiency, the conductive member 16 may be stacked on the metal plate member 18, and the size of the conductive member 16 should be slightly larger, and the function of the measuring member 19 is to detect the current voltage of the battery to prevent voltage abnormality caused by overcharge of the battery or other reasons, and since it is not necessary to carry a large current, the measuring member 19 is not required to be stacked on the metal plate member in practice, and the size of the measuring member 19 should be slightly smaller. Of course, the measuring member 19 is not stacked on the metal plate members, but in order to maintain the accuracy of the voltage measurement of the measuring member 19, the measuring member 19 is not electrically connected to the conductive member 16, that is, the measuring member 19 and the conductive member 16 use respective metal plate members. If the measuring element 19 and the conductive element 16 share the same metal plate 18, the measuring element 19 can be regarded as a part of the conductive element 16, and although the respective functions of the measuring element 19 and the conductive element 16 cannot be achieved in practice, the measuring element 19 is easily interfered by the voltage or current supplied by the conductive element 16, and it is not easy to accurately measure the current voltage of the battery.

In manufacturing the measuring member 19 of the conductive member 16, the first bending portion 160 and the second bending portion 162 arranged in a wavy shape may be integrally formed by pressing a plate material. Taking the conductive member 16 as an example, please refer to fig. 10, and fig. 10 is a schematic perspective view illustrating the conductive member before being bent according to an embodiment of the invention. As shown in fig. 10, the conductive component 16 may be a planar plate before being bent, and the first scraping structure 1620 is formed by stamping and is also bent to form the first bent portion 160 and the second bent portion 162 arranged in a wavy shape by stamping. In practice, the first scraping structure 1620 and the first bent portion 160 and the second bent portion 162 bent to form a wave shape may be formed in one stamping step at the same time, and there is no specific order to form the first scraping structure 1620 first. In addition, as known to those skilled in the art, it is most convenient to form the first scraping structure 1620 and the first bending portion 160 and the second bending portion 162 by bending and arranging the first scraping structure and the second bending portion 160 and the second bending portion 162 in a wavy shape in a stamping manner.

Finally, the first scraping structure 1620 is not limited to protrude from the upper side surface 16a of the conductive element 16 in the embodiment, please refer to fig. 11, and fig. 11 is a schematic perspective view illustrating a conductive element according to another embodiment of the present invention. As shown in fig. 11, another design of the conductive device 26 may also have the first bending portion 260 and the second bending portion 262 arranged in a wavy shape, and the first scraping structure 2620 may be recessed in the upper side surface of the conductive device 26, so that the top surface of the second bending portion 262 has recessed and non-recessed portions, thereby forming a rough or uneven surface, and also can be used to scrape the protective film on the electrode. Alternatively, the top surface of the second bending portion 262 may be rough, so that when the clip-on testing device 1 clips the electrode, the top surface of the second bending portion 262 abuts against the electrode, and the second bending portion 262 rubs against the electrode by the extension of the conductive member 26, thereby achieving the effect of scraping the protective film on the electrode.

In summary, the clip-on testing device provided by the invention has the wavy conductive member, and when the object to be tested is clamped, the conductive member not only contacts the object to be tested and can slightly deform, so that the protective film layer of the battery electrode can be scraped by using the scraping structure on the conductive member, and the voltage and current characteristics of the battery can be directly detected without additionally tearing off the protective film layer, thereby improving the detection efficiency and accuracy of the electrical test of the battery.

The above-described embodiments and/or implementations are only for illustrating the preferred embodiments and/or implementations of the present technology, and are not intended to limit the implementations of the present technology in any way, and those skilled in the art can make many modifications or changes without departing from the scope of the technology disclosed in the present disclosure, but should be construed as technology or implementations that are substantially the same as the present technology.

Claims (14)

1. A clip-on testing device, comprising:

a first clamping member having a first base wall and a first pivot portion;

a second clamping piece, which is provided with a second base wall and a second pivoting part;

the rotating shaft piece is detachably pivoted on the first pivoting part and the second pivoting part; and

the conductive piece is arranged between the first base wall and the second base wall and provided with a first bending part and a second bending part, the first bending part is bent towards the upper side face of the conductive piece, the second bending part is bent towards the lower side face of the conductive piece, the second bending part is provided with a first scraping structure, and the first scraping structure protrudes or sinks from the upper side face of the conductive piece.

2. The clip-on testing device of claim 1, wherein the lower side of the conductive member faces the first base wall, and the distance from the first bent portion to the first base wall is smaller than the distance from the second bent portion to the first base wall.

3. The clip-on testing device of claim 2, further comprising a metal plate disposed between the first base wall and the conductive member, the metal plate contacting the lower side of the conductive member.

4. The clip-on testing device of claim 3, further comprising a measuring member disposed between the first and second base walls, the measuring member having a third bending portion and a fourth bending portion, the third bending portion being bent toward an upper side of the measuring member, the fourth bending portion being bent toward a lower side of the measuring member, the fourth bending portion having a second scraping structure, the second scraping structure protruding from or recessed into the upper side of the measuring member.

5. The clip-on testing device of claim 4, wherein the conductive member is not electrically connected to the measuring member, and the upper side of the conductive member is substantially coplanar with the upper side of the measuring member.

6. The clip-on test device of claim 1, wherein the conductive member is made of metal, and the first bending portion and the second bending portion are integrally formed.

7. The clip-on testing device of claim 1, wherein an end of the conductive member is adjacent to the first bending portion, and the end has a third scraping structure.

8. A clip-on testing device, comprising:

a first clamping member having a first base wall and a first pivot portion;

a second clamping piece, which is provided with a second base wall and a second pivoting part;

the rotating shaft piece is detachably pivoted on the first pivoting part and the second pivoting part; and

the conductive piece is arranged on the first clamping piece and positioned between the first base wall and the second base wall, the conductive piece is provided with a first bending part and a second bending part, the first bending part is provided with a bottom surface, the second bending part is provided with a top surface, and the bottom surface and the top surface have a preset distance;

the second bending part is provided with a first scraping structure, and when the distance between the bottom surface and the top surface is smaller than the preset distance, the first scraping structure moves relative to the first base wall.

9. The clip-on testing device of claim 8, wherein the bottom surface of the first bent portion faces the first base wall, the top surface of the second bent portion faces the second base wall, and a distance from the first bent portion to the first base wall is smaller than a distance from the second bent portion to the first base wall.

10. The clip-on testing device of claim 9, further comprising a metal plate disposed between the first base wall and the conductive member, the metal plate contacting the conductive member.

11. The clip-on testing device of claim 10, further comprising a measuring member disposed between the first and second base walls, the measuring member having a third bending portion and a fourth bending portion, the third bending portion being bent toward an upper side of the measuring member, the fourth bending portion being bent toward a lower side of the measuring member, the fourth bending portion having a second scraping structure, the second scraping structure protruding from or recessed into the upper side of the measuring member.

12. The clip-on testing device of claim 11, wherein the electrically conductive member is not electrically connected to the measuring member.

13. The clip-on test device of claim 8, wherein the conductive member is made of metal, and the first bending portion and the second bending portion are integrally formed.

14. The clip-on testing device of claim 8, wherein an end of the conductive member is adjacent to the first bending portion, and the end has a third scraping structure.

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