TW201946339A - Electrical connector and electrical test device wherein the electrical connector includes a substrate and a plurality of contact bodies arranged at intervals along the substrate - Google Patents

Abstract

The invention relates to an electrical connector and an electrical test device. The electrical connector includes a substrate and a plurality of contact bodies arranged at intervals along the substrate. Each contact body has a base portion, and at least one arm portion extended from the base portion to a corresponding side along a direction away from an auxiliary line. A plurality of electrical connectors are formed into a conductive unit in an appropriate type in such a manner that the substrates are stacked on each other. The electrical test device uses the electrical connector and includes a base, a base unit positioned on the base and defined into spaces for accommodating the conductive units, a plurality of the conductive units, and a cover unit capping on the based unit and the conductive units. The electrical test device can secure the conductive units and perform electrical testing by exerting the performance of the electrical connectors.

Description

Electric connector and electric test device

The invention relates to a connector and a test device for electrical testing, and in particular, to an electrical connector and a test device for electrical properties.

Referring to FIG. 1, a conventional electrical test device 9 is suitable for testing a device under test 900 such as a integrated circuit, a wafer, etc., and includes a base 91 made of metal, and a plurality of A spring probe 92 in the base body 91. An electrical connection is formed with the DUT 900 through the spring probe 92 to perform various tests. However, the electrical test device 9 must be designed to cooperate with the device under test 900, and whether it is the placement position of the base body 91 or the spring probes 92, special specifications must be designed according to the device under test 900.

When conducting the electrical test with the current existing technology, the physical electrical connectors directly contact each contact of the electronic component to be tested, and the electronic signal is used to confirm whether the electronic component is a good product. When the electrical connector used (such as spring probe 92 of Figure 1) contacts the electronic component to be tested, in addition to simply contacting and observing the electrical signal conduction, in order to respond to the actual situation of the operation of the electronic component, it may be necessary to make the The electrical connector contacts the electronic component by means of moving scratches or crimping with a certain force. Therefore, the electrical connector needs to have a certain degree of elasticity to facilitate the needs of various contact forms, and to cushion the external force experienced by the contact through appropriate deformation, while at the same time possessing considerable rigidity to maintain the overall Structural strength and support effect.

In addition, because the shape and contact distribution of electronic components are quite diverse, when testing various electronic components, it is usually necessary to design a dedicated test device for a specific electronic component, and it is difficult to design a test device for a specific electronic component. Applicable to other electronic components, not only consumes manufacturing costs, but also wastes material resources.

Therefore, an object of the present invention is to provide an electrical connector capable of cooperating with a variety of test actions, and capable of being flexibly stacked and assembled to test electronic components of various specifications.

Therefore, the electrical connector of the present invention includes a substrate extending along an auxiliary line and made of an insulating material, and a plurality of contact bodies positioned on the substrate and spaced along the auxiliary line and made of a conductive material. . The substrate has two sides parallel to the auxiliary line and spaced apart from each other. Each contact body has a base portion and at least one arm portion extending from the base portion to a direction away from the auxiliary line to the corresponding side edge.

Another object of the present invention is to provide an electrical test device using the electrical connector.

Therefore, the electrical test device of the present invention includes a base, a base unit which must be located on the base, a plurality of conductance units, and a capping unit covered on the base unit and the conductance units.

The base unit includes a bottom plate with a plurality of through holes, a frame surrounding the bottom plate and defining a recessed space with the bottom plate, and a frame plate stacked on the frame. The frame plate has Two end strips spaced parallel to each other, and two side strips respectively connected to opposite ends of the end strips, each end strip having a plurality of protruding portions spaced apart from each other and protruding toward the other end strip, each Each two adjacent protruding portions of one edge strip and two corresponding protruding portions corresponding to the other edge strip collectively define an accommodating slot which is in communication with the recessed space.

The conductance units are respectively positioned in the accommodating grooves, and each conductance unit includes a plurality of electrical connection members of the present invention superimposed on each other. The arms of the electrical connection members facing the same side are separately extended. In the holes of the substrate of the base unit.

The capping unit is arranged on the frame plate of the base unit and the conductive units, and includes a cover plate having a plurality of arms which are mostly penetrating and respectively allow the electrical connecting members to face the other side. Perforation of the body.

The effect of the present invention is that a plurality of the connecting members are superposed on each other to form a desired type of conductivity unit, and the arms of the connecting members correspond to specific contacts to cooperate with various types of electronic component tests. . The electrical test device using the connectors can surely support the conductivity units, prevent the connectors from being damaged during various test operations, and is conducive to the characteristics of the connectors and perform a variety of test operations. .

Before the present invention is described in detail, it should be noted that in the following description, similar elements are represented by the same numbers.

Referring to FIGS. 2 to 4, an embodiment of the electrical connector 3 of the present invention includes a substrate 31 extending from an auxiliary line L and made of an insulating material, and a reference contact 32 fixed at the center of the substrate 31. A plurality of contact bodies 33 positioned on the substrate 31 and spaced along the auxiliary line L and made of a conductive material, a plurality of intermediaries 34 respectively interposed between the contact bodies 33 and the substrate 31, and two Termination bodies 35 are formed on opposite ends of the substrate 31 and made of a conductive material. The substrate 31 has two side edges 311 parallel to the auxiliary line L and spaced apart from each other, and each contact body 33 has a base portion 331 fixed on the substrate 31 and two away from the base line 331 toward the auxiliary line L, respectively. The direction extends to the arms 332 outside the side edges 311. The arm portions 332 of each contact body 33 extend obliquely in a direction toward the reference contact 32, and can deform in a direction toward the substrate 31. Through the intermediaries 34, there is a gap between the contact bodies 33 and the substrate 31, and therefore the arm portions 332 will not directly contact the substrate 31, so the arm portions 332 can be prevented from being affected by friction. In the case, the deformation occurs smoothly when the force is applied, thereby improving the sensitivity of the deformation. In other words, by using the elasticity of each arm portion 332, it can generate a good cushioning effect when receiving an external force while contacting a specific contact and transmitting an electrical signal.

Referring to FIG. 5, in order to cooperate with a plurality of electronic components to be tested with different specifications, a connection structure corresponding to each contact point of the electronic components to be tested must be constructed. The electrical connector 3 of the present invention is mainly connected to corresponding contacts through the arm portions 332 of the contact bodies 33, and a plurality of electrical connectors 3 can cooperate with the electronic components to be tested in such a manner that the substrates 31 are stacked on each other. Instead, the required conductivity unit 30 is constructed. As shown in FIG. 5, it is a conductive unit 30 formed by stacking a plurality of electrical connectors 3 on each other to cooperate with the following description. However, in actual implementation, the number of stacking can be changed according to the requirements, and it can be transmitted through each other. The superposition of the dislocations that do not completely coincide constitutes a more diverse connection structure.

Referring to FIG. 6, a first embodiment of an electrical testing device according to the present invention is provided. The first embodiment includes a base 1, a base unit which must be located on the base 1, and a plurality of base units as shown in FIG. 5. The electrical conductivity unit 30 is formed by overlapping the electrical connecting members 3 with each other, and a cover unit 4 is disposed on the base unit 2 and the electrical conductivity units 30.

Referring to FIGS. 6 and 7, the base unit 2 includes a base plate 21 having a plurality of through holes 210, a frame 22 surrounding the base plate 21 and defining a recessed space 220 together with the base plate 21. A frame plate 23 stacked on the frame 22 and a plurality of ribs 24 protruding from the bottom plate 21 and spaced parallel to each other and connected between opposite sides of the frame 22. Wherein, the frame plate 23 has two end strips 231 spaced parallel to each other, and two side strips 232 respectively connected to opposite ends of the end strips 231, and each end strip 231 has a plurality of spaces spaced apart from each other and faces the other side. A protruding portion 239 protruding from one edge strip 231, two adjacent protruding portions 239 of each edge strip 231 and two protruding portions 239 corresponding to the other edge strip 231 together define a recessed space 220 communicating the receiving slot 230. Each rib 24 corresponds to a respective accommodation slot 230, and when the conductive units 30 are respectively positioned in the accommodation slots 230, the corresponding ribs 24 extend in the same direction as the electrical connectors 3, as shown in FIG. 8 It is shown between two adjacent electrical connections 3. Referring to FIG. 7 and FIG. 8 at the same time, since each electrical connector 3 is in the shape of an elongated strip, it is easy to generate a torsional moment at the longer arm when the external force is directed toward the substrate 31, and the ribs 24 can An electrical conductivity unit 30 produces a supporting effect toward the substrate 31 to prevent the electrical connectors 3 from being damaged by the torsional moment during the test.

Referring again to FIGS. 6 to 8, the conductive units 30 are respectively positioned in the receiving grooves 230, and the arm portions 332 of the electrical connectors 3 facing the same side are respectively extended to the base unit 2. In the holes 210 of the substrate 31, a specific type of circuit is formed. The terminating bodies 35 of the electrical connectors 3 are supported on the frame 22 of the base unit 2 and abut against the frame plate 23 of the base unit 2 so that the electrical connectors 3 and The base unit 2 is electrically connected.

The capping unit 4 includes a cover plate 41 disposed on the frame plate 23, a ring frame 42 surrounding the cover plate 41 and defining a receiving space 420 together with the cover plate 41, and a plurality of protrusions. The ribs 43 provided on the cover 41 and spaced parallel to each other and connected to the opposite sides of the ring frame 42. Each of the ribs 43 corresponds to a corresponding receiving slot 230 and is adjacent to each other. The electrical connection members 3 can also support the electrical connection members 3. The cover plate 41 has a plurality of through-holes 410 which are penetrating and are respectively provided for the electrical connections 3 to face the arms 332 on the other side, and the arms 332 of the electrical connections 3 extend through the holes. After the perforation 410, a specific type of circuit can be formed together to cooperate with the required test. The bottom plate 21 of the base unit 2 and the surface of the cover plate 41 of the capping unit 4 are coated with a dielectric film 7 to prevent the arms 332 of the electrical connectors 3 from contacting the bottom plate 21 or When the cover 41 is used, an unexpected electrical conduction occurs to ensure the accuracy of the detection.

Referring to FIG. 9 and FIG. 8, when using the electrical testing device of the first embodiment to test a component under test 81, a plug socket 82 is provided for the component under test 81. The base 1 can be combined with the plug socket 82 and surround a plug slot 100 recessed inward from one side opposite to the base unit 2 and in a shape that fits the component 81 to be tested. The socket 82 is connected to the base 1, and the component under test 81 is inserted into the socket 100 of the base 1, so that electrical conduction can be generated through the arms 332 of the electrical connector 3. The electrical signals transmitted from the plug socket 82 and the base 1 to each other confirm whether the function of the DUT 81 is normal.

It should be particularly noted that the detection method shown in FIG. 9 belongs to Package On Package (POP) detection, which is only one of the preferred methods of using the electrical test device of the present invention. It can also be used in practical applications. Based on the characteristics of the electrical connectors 3 that can be assembled freely, a test circuit that can directly test the component under test 81 is formed, or the elasticity of the arm portions 332 is used to perform a scratch test. The detection shown is limited.

Referring to FIG. 10, a second embodiment of the electrical test device according to the present invention is different from the first embodiment in that the bottom plate 21 of the base unit 2 and the cover plate of the cover unit 4 are different. 41 is made of a dielectric material, so the base plate 21 and the cover plate 41 have an electrical insulation effect. The second embodiment of the electrical test device of the present invention differs only in the manner in which the dielectric material is formed. In addition, the same effect as that of the first embodiment can be achieved, and the user can use existing equipment or process technology, It is the special needs of detection to select the appropriate embodiment.

To sum up, through the characteristics that the electrical connectors 3 of the present invention can be stacked and assembled with each other, it is easy to form an appropriate shape according to the detection requirements. Using the elasticity of the arms 332 of the electrical connectors 3, a variety of different types can be made. In addition, the electrical test device of the present invention can also generate an appropriate supporting effect according to the shape of the electrical connectors 3, and constitute a systemized device that can be connected to the component under test 81 to make use of the electrical connectors 3 Test performance, it can indeed achieve the purpose of cost invention.

However, the above are only examples of the present invention. When the scope of implementation of the present invention cannot be limited in this way, any simple equivalent changes and modifications made in accordance with the scope of the patent application and the content of the patent specification of the present invention are still Within the scope of the invention patent.

1‧‧‧ base

100‧‧‧Socket

2‧‧‧ base unit

21‧‧‧ floor

210‧‧‧ Hole

22‧‧‧ border

220‧‧‧ Depression space

23‧‧‧Frame board

230‧‧‧ Receiving trough

231‧‧‧Edge

232‧‧‧Sidebar

239‧‧‧ convex

24‧‧‧ rib

3‧‧‧electrical connector

30‧‧‧ Conductivity unit

31‧‧‧ substrate

311‧‧‧side

32‧‧‧ benchmark contacts

33‧‧‧Contact

331‧‧‧base

332‧‧‧arm

34‧‧‧ intermediary

35‧‧‧ terminator

4‧‧‧ Capping Unit

41‧‧‧ Cover

410‧‧‧perforation

42‧‧‧ ring frame

420‧‧‧accommodating space

43‧‧‧ raised rib

7‧‧‧ Dielectric film

81‧‧‧DUT

82‧‧‧Socket

L‧‧‧ auxiliary line

Other features and effects of the present invention will be clearly presented in the embodiment with reference to the drawings, wherein: FIG. 1 is a cross-sectional view illustrating a conventional electrical test device; FIG. 2 is a front view illustrating the electrical device of the present invention; An embodiment of the connector; Figure 3 is an incomplete enlarged front view illustrating the multiple contacts of the electrical connector; Figure 4 is a side view illustrating a mediator of the electrical connector; Figure 5 is a A perspective view illustrating a case where a plurality of embodiments of the electrical connector of the present invention are combined with each other to form a conductivity unit; FIG. 6 is an exploded perspective view illustrating a first embodiment of the electrical test device of the present invention; FIG. 7 is a three-dimensional view Exploded view, assisting FIG. 6 to explain the situation in which a plurality of conductivity units of the first embodiment are respectively positioned in a plurality of accommodating slots; FIG. 8 is an incomplete cross-sectional view illustrating the assembly of the first embodiment of the electrical test device of the present invention Completed situation; Figure 9 is a schematic diagram illustrating a case where a component under test is tested using the first embodiment of the electrical testing device of the present invention; and Figure 10 is an incomplete cross-sectional view illustrating the electrical performance of the present invention A second embodiment of the test device.

Claims (10)

An electrical connector includes: a substrate extending along an auxiliary line and made of insulating material, and having two sides parallel to the auxiliary line and spaced from each other; and a plurality of contact bodies positioned on the substrate and along the The auxiliary lines are arranged at intervals and are made of conductive material. Each contact body has a base portion and at least one arm portion extending from the base portion to a direction away from the auxiliary line to the corresponding side edge. The electrical connector according to claim 1, further comprising a reference contact fixed in the center of the substrate, wherein the arm portions of each contact body extend obliquely toward the reference contact, and can Deformation occurs in a direction toward the substrate. The electrical connector according to claim 1 or 2, further comprising two termination bodies formed on opposite ends of the substrate and made of a conductive material. The electrical connector according to claim 1, further comprising a plurality of interposers interposed between the contact bodies and the substrate, and made of a conductive material, so that each contact body is spaced apart from the substrate. . An electrical test device includes: a base; a base unit positioned on the base and including a base plate with a plurality of through holes, a base space surrounding the base plate and defining a depression space together with the base plate Frame, and a stack of frame plates placed on the frame, the frame plate has two end strips spaced parallel to each other, and two side strips respectively connected to opposite ends of the end strips, and each end strip There are a plurality of protrusions spaced apart from each other and protruding toward the other end edge strip. Each two adjacent protrusions of each end edge strip and the two protrusion portions corresponding to the other end edge strip collectively define one and the same. Accommodating grooves communicated in the recessed space; a plurality of conductive units are respectively positioned in the accommodating grooves, and each of the conductive units includes a plurality of electrical connection members as described in claim 3 and superimposed on each other, such electrical connection members The arms facing the same side are respectively extended into the holes of the base plate of the base unit; and a cover unit is placed on the frame plate of the base unit and the conductivity units, and includes A cover plate having a plurality of Shape and are worn for such electrical connection of these perforations toward the other arm is bored. The electrical test device according to claim 5, wherein the base unit further includes a plurality of ribs protruding from the bottom plate and spaced parallel to each other and connected to opposite sides of the frame, each rib corresponding to a respective one Receiving grooves. When the conductive units are respectively positioned in the accommodating grooves, the corresponding ribs extend in the same direction as the electrical connecting members and are interposed between two adjacent electrical connecting members. The electrical test device according to claim 5, wherein the capping unit further comprises a ring frame surrounding the cover plate and jointly defining a receiving space with the cover plate, and a plurality of protrusions provided on the cover. The ribs of the plate are parallel to each other and are connected to the opposite sides of the ring frame. Each rib is corresponding to a corresponding receiving slot and is interposed between two adjacent electrical connecting members. The electrical test device according to claim 5, wherein the termination bodies of the electrical connectors are supported on the frame of the base unit and abut against the frame plate of the base unit. The electrical testing device according to claim 5, wherein the bottom plate of the base unit and the surface of the cover plate of the capping unit are coated with a dielectric material. The electrical testing device according to claim 5, wherein the bottom plate of the base unit and the cover plate of the capping unit are made of a dielectric material.