TWI814198B - Electrical Test Device - Google Patents

Abstract

An electrical testing device is suitable for testing an electronic component with multiple contacts, and includes a main unit made of insulating material, a conductive unit arranged in the main unit, and a cover covering the main unit. Cover unit. The conductive unit includes a plurality of conductive structures respectively corresponding to the contacts and positioned by the main body unit. Each conductive structure has a body within a projection range of the main unit along a first axis, and a second axis extending from the body along a second axis perpendicular to the first axis to outside the projection range, and can Connectors that deform when contacting individual contacts. The covering unit includes a cover plate with a plurality of hole walls surrounding a plurality of limiting holes for accommodating the connecting members respectively, and each hole wall is used to limit the deformation amount of the respective connecting member.

Description

Electrical testing device

The present invention relates to a testing device, in particular to an electrical testing device.

Referring to FIG. 1 , an existing testing device 1 is shown, which is suitable for electrically connecting with an electronic component 2 and performing electrical testing. It includes a body 11 and a plurality of test devices extending from the body 11 and capable of generating electricity when being pressed. The probe 12 deforms and accumulates elastic restoring force. Each of the probes 12 corresponds to an individual electrical contact 21 on the electronic component 2, thereby electrically connecting the electronic component 2 with the testing device 1 to test the function of the electronic component 2. test.

When the electronic component 2 is placed into the testing device 1 to perform testing, since each of the probes 12 is in the form of a single arm, each of the probes 12 contacts an individual electrical contact 21 , will produce deformation along the pressing direction of the electronic component 2 due to its own structural elasticity, thereby also utilizing the elastic restoring force of the probes 12 to make the electrical connection between the testing device 1 and the electronic component 2 more stable. .

However, the probe 12 relying solely on a single-arm structure, specifically, only In point-to-point connections, if the probe 12 has tolerances or wear defects, etc., it is easy to slip at the connection with the electrical contact 21. In addition to causing instability in the electrical connection, it is also possible that the probe 12 may slip. This may cause unnecessary wear on the probe 12 or even on the electronic component 2 . In addition, if the probe 12 is damaged or otherwise deformed due to external force, the degree of deformation may exceed expectations, and the deformation direction may deviate, which may affect the test performance of the test device 1 or even shorten the test time. Wait for the service life of probe 12.

Therefore, an object of the present invention is to provide an electrical testing device that makes electrical connections more stable during testing.

Therefore, the electrical testing device of the present invention is suitable for testing an electronic component with a plurality of contacts spaced apart from each other, and includes a main unit, a conductive unit arranged in the main unit, and a cover covering the main unit. Cover unit.

The main body unit includes at least one carrier made of insulating material.

The conductive unit includes a plurality of conductive structures spaced apart from each other corresponding to the contacts and positioned by at least one carrier. Each conductive structure has a body within a projection range of the carrier along a first axis, and a second axis extending from the body along a second axis perpendicular to the first axis to outside the projection range, and can be in A connector that deforms when it comes into contact with individual contacts.

The covering unit covers the main unit along the second axis, and includes a cover plate having a plurality of hole walls surrounding a plurality of limiting holes for accommodating the connectors. Each hole wall is used to limit a deformation amount of the individual connecting member.

The effect of the present invention is to use the hole walls of the cover plate to respectively limit the deformation amount of the connecting members caused by contacting the contacts respectively when the electronic component contacts the conductive unit with an external force. Utilizing the moderate deformation of the connectors can effectively stabilize the contact relationship between the contacts and the connectors, avoid accidental excessive deformation of the connectors, and reduce the possibility of unnecessary wear or loss of the connectors. properties, so that the connectors can be maintained in a good state of stable contact with the contacts, thus making the electrical connection relationship more stable when detecting the electronic components.

3: Main unit

31: Carrier

32:Partition

4: Conductive unit

41:Conduction structure

411:Subject

412: Connector

412a: Connector

412b: Connector

419:Arm joint

421: Structural piece

429:Arm joint

5: Covering unit

51: cover plate

510: Limit hole

511:hole wall

6: Separation unit

61: Intermediaryware

7: Base shell

70: Configuration slot

9: Electronic components

91:Contact

L1: first axis

L2: Second axis

L3: The third axis

Other features and effects of the present invention will be clearly presented in the embodiments with reference to the drawings, wherein: Figure 1 is a schematic diagram illustrating an existing test device; Figure 2 is a three-dimensional exploded view illustrating the electrical properties of the present invention. A first embodiment of a testing device; Figure 3 is a partially enlarged side view illustrating a conductive structure of a conductive unit of the first embodiment; Figure 4 is a partially enlarged cross-sectional view illustrating a covering unit of the first embodiment; Figure 5 is a perspective exploded view illustrating the detection of an electronic component through the first embodiment; Figure 6 is a partially enlarged The schematic diagram of FIG. 5 illustrates the effect produced by the cover plate of the covering unit; FIG. 7 is a perspective exploded view illustrating a second embodiment of the electrical testing device of the present invention; FIG. 8 is a partially enlarged perspective view , illustrating a connector of one of the conductive structures of the second embodiment; and FIG. 9 is a schematic diagram illustrating the detection of the electronic component through the second embodiment.

Before the present invention is described in detail, it should be noted that in the following description, similar elements are designated with the same numbering.

Referring to Figure 2, a first embodiment of an electrical testing device of the present invention is shown. This first embodiment is suitable for testing an electronic component 9 having a plurality of contacts 91 spaced apart from each other (shown in Figures 4 and 5) , and includes a main unit 3, a conductive unit 4 arranged in the main unit 3, a covering unit 5 covering the main unit 3, and a conductive unit 4 arranged in the main unit 3. A partition unit 6 is provided in the main unit 3 and is spaced apart from the conductive unit 4 . For ease of explanation, a first axis L1, a second axis L2, and a third axis L3 that are perpendicular to each other are first defined, and the electronic component 9 is electrically connected to the first embodiment along the second axis L2. .

The main unit 3 includes a plurality of carriers 31 made of insulating material and spaced apart along the first axis L1. In the first embodiment, there are six carriers 31 spaced apart along the first axis L1. To illustrate, each piece of carrier 31 extends along the plane formed by the second axis L2 and the third axis L3. Each carrier 31 is in the shape of a rectangle with its long side parallel to the third axis L3, and the number of the carriers 31 and the shape of each carrier 31 are mainly determined according to the detection requirements and the need to position the conductive unit 4 The configuration is not limited to the aspect presented in the first embodiment. In addition, in order to facilitate the mounting of the main unit 3, in the first embodiment, the main unit 3 is disposed in a base shell 7 having a correspondingly shaped placement slot 70 to facilitate subsequent packaging and use.

The conductive unit 4 includes a plurality of conductive structures 41 spaced apart from each other corresponding to the contacts 91 and positioned by the carriers 31 . Specifically, each conductive structure 41 is a conductive element extending along the second axis L2, and both opposite ends can be electrically connected to other elements respectively. The conductive structures 41 are arranged at intervals along the third axis L3 between two adjacent carriers 31 and are made of a single-layer structure through a semiconductor process. Therefore, in this first embodiment With the six-piece carrier 31, there are five layers of media conductive components in it. As shown in Figure 3 and with reference to Figure 2, each conductive structure 41 has a body 411 within a projection range of the carriers 31 along the first axis L1, and two bodies 411 along the second axis L1. The axis L2 extends to opposite sides respectively outside the projection range, and can generate deformation connecting pieces 412 when contacting individual contacts 91 (see FIG. 4 ). That is to say, the body 411 is the part clamped and positioned between the two carriers 31 , and the connectors 412 extend to opposite sides along the second axis L2 and are suitable for connecting to the outside. component part.

Continuing to refer to FIG. 3 and in conjunction with FIG. 2 , in the first embodiment, each conductive structure 41 has two different types of connectors 412 . For ease of explanation, two different types of connectors 412 will be used below. They are respectively labeled as connecting piece 412a and connecting piece 412b. Each connecting member 412a is an elastic arm capable of deforming along the second axis L2, and each connecting member 412b has two arm portions 419 spaced apart from each other along the third axis L3. The arm portions 419 Can deform in directions away from each other.

Referring to FIG. 4 in conjunction with FIG. 2 , the covering unit 5 covers the main unit 3 along the second axis L2 and includes two cover plates 51 covering from opposite sides. Each cover plate 51 has a plurality of hole walls 511 surrounding a plurality of limiting holes 510 for accommodating the connectors 412. That is, the two cover plates 51 of the first embodiment are respectively as shown in the figure. 3 shows two different types of connectors 412a and 412b. Specifically, the distribution, diameter, width, and depth of the limiting holes 510 of each cover plate 51 mainly correspond to the type of the corresponding connector 412 and the designed deformation amplitude. The depth is generally based on the The ends of the connecting parts 412 are flush with the cover plate 51 on the same side, and the diameter and width are sufficient to allow each connecting part 412 to produce the expected deformation range.

The partition unit 6 includes a plurality of intermediaries 61 positioned between two adjacent carriers 31 and made of conductive material. The arrangement position of the intermediaries 61 can be adjusted according to the distribution of the conductive structures 41, so as to maintain an appropriate distance between the adjacent carriers 31, thereby allowing each connecting member 412 to have room for deformation. space. In addition, since the intermediaries 61 are made of conductive material, it is relatively easy to configure electrical connection wiring from the outside, so that the layered conductive element structures located between the carriers 31 can be connected to each other. In view of the current trend of miniaturization and densification as the main axis, there is no need to install additional redundant components specifically to make the layered structures conductive to each other, which is more conducive to responding to the trends of miniaturization and densification.

Referring to Figures 4 and 5 in conjunction with Figure 2, when the first embodiment is used to detect the electronic component 9, the contacts 91 of the electronic component 9 are respectively aligned with the limits on the cover plate 51. The holes 510 are used to accurately align the contacts 91 with the connectors 412 accommodated in the limiting holes 510, so that the electronic component 9 and the connectors 412 are electrically connected. Achieve the basic purpose of electrical testing. For each connector 412 in the form of a single arm, when it is resisted by the corresponding contact point 91, it mainly produces deformation along the second axis L2, and due to the original inclination along the third axis L3 The shape will also cause a slight displacement along the third axis L3. Among them, each hole wall 511 can be used to limit individual connections through its appropriate depth and diameter width design. The joint 412 produces an amount of deformation. Specifically, due to the inclined shape of the connecting member 412, the main deformation along the second axis L2 is bound to be accompanied by deformation along the third axis L3. Therefore, as long as the hole wall 511 is used to limit the deformation along the third axis L3, The movement of the three-axis L3 can properly limit the deformation amount of the connecting piece 412.

As shown in FIG. 6 , that is, another type of connecting member 412 is located in the corresponding limiting hole 510 . The connecting member 412 has two connecting arm portions 419 spaced apart along the third axis L3. , when pushed by the corresponding contact point 91 , the deformation of the arm portions 419 away from each other is mainly generated, that is, the amount of deformation along the third axis L3. Similarly, as long as the diameter width of the hole wall 511 is properly set, the deformation amount of the arm portions 419 can be limited.

Whether it is the connector 412 in Figure 4 or Figure 6, through the limiting effect of the hole walls 511, the contacts 91 of the electronic component 9 can be in contact with the connectors 412 respectively. When the connectors 412 produce the expected optimal amount of deformation, it is ensured that the contacts 91 achieve the expected buffering and that the contacts 91 achieve stable electrical connections with the connectors 412 respectively, thereby ensuring that the electrical Stability of sexual connections and optimization of detection performance. In addition, since the connectors 412 will not produce unexpected deformations, when the cover plate 51 has a blocking effect on the electronic component 9 , they will not be subjected to excessive suppressive external force, so this can be avoided. The connecting piece 412 is excessively worn or bent, thereby prolonging the service life of the conductive structures 41 .

Referring to Figures 7 and 8, a second embodiment of the electrical testing device of the present invention is shown. The difference between this second embodiment and the first embodiment is that the main unit 3 also includes a plurality of partitions 32 respectively disposed between two adjacent carriers 31 , and each conductive structure 41 is positioned Between the opposite sides of the partition 32 and the two adjacent carriers 31 . Wherein, the connector 412 of each conductive structure 41 of the conductive unit 4 has two structural pieces 421 respectively located on opposite sides of the partition 32 , and each structural piece 421 has two spaced apart from each other along the third axis L3. The arm portions 429 can deform in directions away from each other.

Referring to Figures 7 to 9 at the same time, specifically, each contact 91 of the electronic component 9 is located corresponding to two structural pieces 421 located on opposite sides of the partition 32, that is, spaced along the first axis L1. That is to say, each contact point 91 will correspond to four arm portions 429 distributed approximately at four corners, thereby achieving more stable support for the contact points 91 . In addition, the connectors 412 are also correspondingly configured with the cover plate 51, so when the arm portions 429 of the same structural piece 421 are pressed by the corresponding contacts 91, the amount of deformation generated will also be As shown in FIG. 6 , they are limited by the corresponding hole walls 511 on the cover plate 51 , so the same limiting effect as the first embodiment can be achieved, and excessive wear or bending of the connectors 412 can be avoided. Extend the service life of the conductive structures 41.

To sum up, the electrical testing device of the present invention can use the hole walls 511 of the cover plate 51 to respectively limit the shapes of the connectors 412 when the electronic component 9 contacts the conductive unit 4 with an external force. variables to ensure that the appropriate deformation of the connectors 412 is sufficient It can stabilize the connection with the contacts 91 and prevent the connectors 412 from accidentally causing excessive deformation, thereby reducing the possibility of unnecessary wear or loss of the connectors 412, thus allowing the electronic component 9 to be detected. The electrical connection relationship can be more stable. Therefore, the purpose of the present invention can indeed be achieved.

However, the above are only examples of the present invention, and should not be used to limit the scope of the present invention. All simple equivalent changes and modifications made based on the patent scope of the present invention and the content of the patent specification are still within the scope of the present invention. Within the scope covered by the patent of this invention.

3·············· Main unit 31············· Carrier 4··············· Conductive unit 41·············Conduction structure 411············ Subject 412············ Connectors 5·············· Covering unit 51············· Cover panel 510············ Limit hole 6···············Separation unit 61············· Intermediary software 7··············· Base shell 70············· Configuration slot L1·············First axis L2············· Second axis L3············· The third axis

Claims (10)

An electrical testing device, suitable for testing an electronic component with a plurality of contacts spaced apart from each other, and includes: a main unit including at least one carrier made of insulating material; a conductive unit configured in the main unit , and includes a plurality of conductive structures spaced apart from each other corresponding to the contacts and positioned by at least one carrier, each conductive structure having a bit within a projection range of the carrier along a first axis A main body, and a connecting piece extending from the main body to outside the projection range along a second axis perpendicular to the first axis, and capable of deforming when contacting individual contacts; and a covering unit, along the second axis The axis covers the main unit and includes a cover plate with a plurality of hole walls surrounding a plurality of limiting holes for accommodating the connectors, and each of the hole walls is used to limit the individual said The amount of deformation caused by the deformation of the connecting piece. The electrical testing device of claim 1, wherein the main unit includes a plurality of carriers spaced apart from each other along the first axis, and each conductive structure is positioned between two adjacent carriers. The electrical testing device as claimed in claim 2, wherein the connecting member of each conductive structure of the conductive unit is an elastic arm capable of deforming along the second axis. The electrical testing device of claim 2 defines a third axis that is perpendicular to the first axis and the second axis at the same time, wherein the connector of each conductive structure of the conductive unit has two edges along the The third axes are spaced apart from each other and the arm portions can deform in directions away from each other. The electrical testing device according to claim 2, further comprising a partition unit arranged in the main unit and spaced apart from the conductive unit, wherein the partition unit includes a plurality of units positioned between two adjacent carriers. of intermediaries. The electrical testing device of claim 5, wherein the intermediaries are made of conductive materials. The electrical testing device as claimed in claim 1, wherein the main unit includes a plurality of carriers spaced apart from each other along the first axis, and a plurality of partitions respectively disposed between two adjacent carriers, Each conductive structure is positioned between opposite sides of the separator and two adjacent carriers. The electrical testing device as claimed in claim 7, wherein the connector of each conductive structure of the conductive unit has two structural pieces located on opposite sides of the partition, defining an axis that is simultaneously perpendicular to the first axis. As for the third axis of the second axis, each structural piece has two arm portions spaced apart from each other along the third axis, and the arm portions can deform in directions away from each other. The electrical testing device according to claim 7, further comprising a partition unit disposed in the main unit and spaced apart from the conductive unit, wherein the partition unit includes a plurality of partitions positioned on opposite sides of the partitions Intermediaries between adjacent carriers. The electrical testing device of claim 9, wherein the intermediaries are made of conductive materials.

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