JP2009162665A5 - - Google Patents

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Publication number
JP2009162665A5
JP2009162665A5 JP2008001651A JP2008001651A JP2009162665A5 JP 2009162665 A5 JP2009162665 A5 JP 2009162665A5 JP 2008001651 A JP2008001651 A JP 2008001651A JP 2008001651 A JP2008001651 A JP 2008001651A JP 2009162665 A5 JP2009162665 A5 JP 2009162665A5
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JP
Japan
Prior art keywords
gas
molecular weight
mass
mass spectrum
read
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2008001651A
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English (en)
Japanese (ja)
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JP2009162665A (ja
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Publication date
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Priority to JP2008001651A priority Critical patent/JP2009162665A/ja
Priority claimed from JP2008001651A external-priority patent/JP2009162665A/ja
Priority to US12/347,377 priority patent/US7989761B2/en
Priority to DE102009004398A priority patent/DE102009004398A1/de
Publication of JP2009162665A publication Critical patent/JP2009162665A/ja
Publication of JP2009162665A5 publication Critical patent/JP2009162665A5/ja
Pending legal-status Critical Current

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JP2008001651A 2008-01-08 2008-01-08 ガス分析方法及びガス分析装置 Pending JP2009162665A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2008001651A JP2009162665A (ja) 2008-01-08 2008-01-08 ガス分析方法及びガス分析装置
US12/347,377 US7989761B2 (en) 2008-01-08 2008-12-31 Gas analyzing method and gas analyzing apparatus
DE102009004398A DE102009004398A1 (de) 2008-01-08 2009-01-08 Gasanalyse-Verfahren sowie Gasanalyse-Vorrichtung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008001651A JP2009162665A (ja) 2008-01-08 2008-01-08 ガス分析方法及びガス分析装置

Publications (2)

Publication Number Publication Date
JP2009162665A JP2009162665A (ja) 2009-07-23
JP2009162665A5 true JP2009162665A5 (https=) 2011-02-10

Family

ID=40719587

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008001651A Pending JP2009162665A (ja) 2008-01-08 2008-01-08 ガス分析方法及びガス分析装置

Country Status (3)

Country Link
US (1) US7989761B2 (https=)
JP (1) JP2009162665A (https=)
DE (1) DE102009004398A1 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011209062A (ja) * 2010-03-29 2011-10-20 Mitsui Eng & Shipbuild Co Ltd マススペクトルデータの二次解析方法およびマススペクトルデータの二次解析システム
JP6178964B2 (ja) * 2013-04-23 2017-08-16 ナノフォトン株式会社 ラマンスペクトルデータベースの構築方法
CN104517799B (zh) 2014-12-31 2017-09-15 同方威视技术股份有限公司 检测设备和检测方法
JP6505268B1 (ja) * 2018-01-11 2019-04-24 株式会社日立ハイテクサイエンス 質量分析装置及び質量分析方法
JP6943897B2 (ja) * 2019-01-18 2021-10-06 日本電子株式会社 マススペクトル処理装置及び方法
CN111446147B (zh) * 2020-03-20 2023-07-04 北京雪迪龙科技股份有限公司 基于飞行时间质谱仪的气体成分测量方法、电子设备

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2569601B2 (ja) * 1987-09-21 1997-01-08 株式会社島津製作所 質量分析装置
JPH03285158A (ja) * 1990-03-30 1991-12-16 Shimadzu Corp 質量分析装置におけるデータ検索方法
JP4802104B2 (ja) * 2003-11-25 2011-10-26 サイオネックス コーポレイション サンプルの分析を改善するための分散特性、サンプル解離及び／又は圧力制御を用いた移動度ベースの装置及び方法
WO2005067582A2 (en) * 2004-01-13 2005-07-28 Sionex Corporation Methods and apparatus for enhanced sample identification based on combined analytical techniques
WO2005106450A1 (en) * 2004-04-28 2005-11-10 Sionex Corporation System and method for ion species analysis with enhanced condition control and data interpretation using differential mobility spectrometers
JP4337678B2 (ja) * 2004-07-27 2009-09-30 株式会社島津製作所 クロマトグラフ質量分析装置
JP2006322899A (ja) * 2005-05-20 2006-11-30 Hitachi Ltd ガスモニタリング装置
JP4982087B2 (ja) * 2006-02-08 2012-07-25 株式会社日立製作所 質量分析装置及び質量分析方法
JP4958258B2 (ja) * 2006-03-17 2012-06-20 株式会社リガク ガス分析装置

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