DE102009004398A1 - Gasanalyse-Verfahren sowie Gasanalyse-Vorrichtung - Google Patents
Gasanalyse-Verfahren sowie Gasanalyse-Vorrichtung Download PDFInfo
- Publication number
- DE102009004398A1 DE102009004398A1 DE102009004398A DE102009004398A DE102009004398A1 DE 102009004398 A1 DE102009004398 A1 DE 102009004398A1 DE 102009004398 A DE102009004398 A DE 102009004398A DE 102009004398 A DE102009004398 A DE 102009004398A DE 102009004398 A1 DE102009004398 A1 DE 102009004398A1
- Authority
- DE
- Germany
- Prior art keywords
- gas
- mass
- analysis
- ion
- ionization
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000000034 method Methods 0.000 title claims abstract description 80
- 238000004868 gas analysis Methods 0.000 title claims description 72
- 150000002500 ions Chemical class 0.000 claims abstract description 162
- 238000004458 analytical method Methods 0.000 claims abstract description 122
- 238000001819 mass spectrum Methods 0.000 claims abstract description 79
- 239000000470 constituent Substances 0.000 claims abstract description 43
- 238000001514 detection method Methods 0.000 claims abstract description 18
- 238000000752 ionisation method Methods 0.000 claims abstract description 17
- 150000001875 compounds Chemical class 0.000 claims description 24
- 230000001174 ascending effect Effects 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 84
- 230000008569 process Effects 0.000 abstract description 33
- 238000004451 qualitative analysis Methods 0.000 abstract description 24
- 239000007789 gas Substances 0.000 description 160
- 239000000523 sample Substances 0.000 description 63
- 238000012545 processing Methods 0.000 description 31
- 239000000203 mixture Substances 0.000 description 25
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 24
- 239000012634 fragment Substances 0.000 description 19
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 18
- 239000000126 substance Substances 0.000 description 16
- 238000000926 separation method Methods 0.000 description 11
- 238000004364 calculation method Methods 0.000 description 9
- 239000003795 chemical substances by application Substances 0.000 description 8
- 238000012360 testing method Methods 0.000 description 8
- 238000003795 desorption Methods 0.000 description 7
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 6
- 239000013074 reference sample Substances 0.000 description 6
- 239000008096 xylene Substances 0.000 description 6
- 230000008859 change Effects 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 5
- 238000010276 construction Methods 0.000 description 4
- -1 parent ions) Chemical class 0.000 description 4
- 238000000451 chemical ionisation Methods 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 238000002156 mixing Methods 0.000 description 3
- 239000012495 reaction gas Substances 0.000 description 3
- 238000010223 real-time analysis Methods 0.000 description 3
- 238000010845 search algorithm Methods 0.000 description 3
- 230000003595 spectral effect Effects 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 238000004422 calculation algorithm Methods 0.000 description 2
- 238000003776 cleavage reaction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000000605 extraction Methods 0.000 description 2
- 239000003595 mist Substances 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 230000007017 scission Effects 0.000 description 2
- 238000004611 spectroscopical analysis Methods 0.000 description 2
- BUHVIAUBTBOHAG-FOYDDCNASA-N (2r,3r,4s,5r)-2-[6-[[2-(3,5-dimethoxyphenyl)-2-(2-methylphenyl)ethyl]amino]purin-9-yl]-5-(hydroxymethyl)oxolane-3,4-diol Chemical compound COC1=CC(OC)=CC(C(CNC=2C=3N=CN(C=3N=CN=2)[C@H]2[C@@H]([C@H](O)[C@@H](CO)O2)O)C=2C(=CC=CC=2)C)=C1 BUHVIAUBTBOHAG-FOYDDCNASA-N 0.000 description 1
- 101100518972 Caenorhabditis elegans pat-6 gene Proteins 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- RBFQJDQYXXHULB-UHFFFAOYSA-N arsane Chemical compound [AsH3] RBFQJDQYXXHULB-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000013467 fragmentation Methods 0.000 description 1
- 238000006062 fragmentation reaction Methods 0.000 description 1
- 238000004817 gas chromatography Methods 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 150000002605 large molecules Chemical class 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 229920002521 macromolecule Polymers 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000000376 reactant Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 210000002023 somite Anatomy 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000002076 thermal analysis method Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/64—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Electrochemistry (AREA)
- Plasma & Fusion (AREA)
- Toxicology (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008001651A JP2009162665A (ja) | 2008-01-08 | 2008-01-08 | ガス分析方法及びガス分析装置 |
| JP2008-001651 | 2008-01-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE102009004398A1 true DE102009004398A1 (de) | 2009-07-09 |
Family
ID=40719587
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE102009004398A Withdrawn DE102009004398A1 (de) | 2008-01-08 | 2009-01-08 | Gasanalyse-Verfahren sowie Gasanalyse-Vorrichtung |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7989761B2 (https=) |
| JP (1) | JP2009162665A (https=) |
| DE (1) | DE102009004398A1 (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011209062A (ja) * | 2010-03-29 | 2011-10-20 | Mitsui Eng & Shipbuild Co Ltd | マススペクトルデータの二次解析方法およびマススペクトルデータの二次解析システム |
| JP6178964B2 (ja) * | 2013-04-23 | 2017-08-16 | ナノフォトン株式会社 | ラマンスペクトルデータベースの構築方法 |
| CN104517799B (zh) | 2014-12-31 | 2017-09-15 | 同方威视技术股份有限公司 | 检测设备和检测方法 |
| JP6505268B1 (ja) * | 2018-01-11 | 2019-04-24 | 株式会社日立ハイテクサイエンス | 質量分析装置及び質量分析方法 |
| JP6943897B2 (ja) * | 2019-01-18 | 2021-10-06 | 日本電子株式会社 | マススペクトル処理装置及び方法 |
| CN111446147B (zh) * | 2020-03-20 | 2023-07-04 | 北京雪迪龙科技股份有限公司 | 基于飞行时间质谱仪的气体成分测量方法、电子设备 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007108211A1 (ja) | 2006-03-17 | 2007-09-27 | Rigaku Corporation | ガス分析装置 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2569601B2 (ja) * | 1987-09-21 | 1997-01-08 | 株式会社島津製作所 | 質量分析装置 |
| JPH03285158A (ja) * | 1990-03-30 | 1991-12-16 | Shimadzu Corp | 質量分析装置におけるデータ検索方法 |
| JP4802104B2 (ja) * | 2003-11-25 | 2011-10-26 | サイオネックス コーポレイション | サンプルの分析を改善するための分散特性、サンプル解離及び／又は圧力制御を用いた移動度ベースの装置及び方法 |
| WO2005067582A2 (en) * | 2004-01-13 | 2005-07-28 | Sionex Corporation | Methods and apparatus for enhanced sample identification based on combined analytical techniques |
| WO2005106450A1 (en) * | 2004-04-28 | 2005-11-10 | Sionex Corporation | System and method for ion species analysis with enhanced condition control and data interpretation using differential mobility spectrometers |
| JP4337678B2 (ja) * | 2004-07-27 | 2009-09-30 | 株式会社島津製作所 | クロマトグラフ質量分析装置 |
| JP2006322899A (ja) * | 2005-05-20 | 2006-11-30 | Hitachi Ltd | ガスモニタリング装置 |
| JP4982087B2 (ja) * | 2006-02-08 | 2012-07-25 | 株式会社日立製作所 | 質量分析装置及び質量分析方法 |
-
2008
- 2008-01-08 JP JP2008001651A patent/JP2009162665A/ja active Pending
- 2008-12-31 US US12/347,377 patent/US7989761B2/en not_active Expired - Fee Related
-
2009
- 2009-01-08 DE DE102009004398A patent/DE102009004398A1/de not_active Withdrawn
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007108211A1 (ja) | 2006-03-17 | 2007-09-27 | Rigaku Corporation | ガス分析装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2009162665A (ja) | 2009-07-23 |
| US7989761B2 (en) | 2011-08-02 |
| US20090173879A1 (en) | 2009-07-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE3918948C2 (https=) | ||
| DE102010043410B4 (de) | Ionentrichter für die Massenspektrometrie | |
| DE68929513T2 (de) | Massenspektrometer und Verfahren mit verbesserter Ionenübertragung | |
| DE60126055T2 (de) | Massenspektrometer und massenspektrometrisches Verfahren | |
| EP1557667B1 (de) | Gasanalyseverfahren und ionisationsdetektor zur ausführung des verfahrens | |
| DE68927093T2 (de) | Methode und vorrichtung für gasanalyse mit doppelkolonne und doppeldetektor | |
| DE69019884T2 (de) | Massenspektrometer zur Analyse von Stoffen. | |
| DE4032491C2 (de) | Massenspektroskopisches Verfahren und massenspektroskopische Vorrichtung | |
| DE102015201624B4 (de) | SCHNELLES VERFAHREN ZUM MESSEN EINES STOßQUERSCHNITTS VON IONEN UNTER VERWENDUNG VON IONENBEWEGLICHKEITSSPEKTROMETRIE | |
| DE102018010478B3 (de) | Verfahren in der massenspektrometrie unter verwendung von kollisionsgas als ionenquelle | |
| DE102013201499A1 (de) | Verfahren zur massenspektrometrischen Untersuchung von Gasgemischen sowie Massenspektrometer hierzu | |
| DE102013213501A1 (de) | Massenspektrometer, dessen Verwendung, sowie Verfahren zur massenspektrometrischen Untersuchung eines Gasgemisches | |
| DE102012214217A1 (de) | In-Situ-Konditionieren bei Massenspektrometersystemen | |
| DE102017127189B4 (de) | Bestimmung von isobaren Interferenzen in einem Massenspektrometer | |
| DE112014001431T5 (de) | Verfahren und Vorrichtung zum Steuern eines Plasmas für eine Spektrometrie | |
| DE102009004398A1 (de) | Gasanalyse-Verfahren sowie Gasanalyse-Vorrichtung | |
| DE102017005345A1 (de) | Vorrichtunq und Verfahren für statische Gasmassenspektrometrie | |
| DE102013114421A1 (de) | Gasanalyseeinrichtung und Verfahren zur Gasanalyse | |
| DE112019001934T5 (de) | Verfahren und Vorrichtung zum Betreiben einer Vakuumschnittstelle eines Massenspektrometers | |
| DE112016007051B4 (de) | Ionenanalysevorrichtung | |
| DE112012004981B4 (de) | Ionisierungsvorrichtung | |
| EP0290711B1 (de) | Verfahren und Einrichtung zur Konzentrationsmessung an Gasgemischen | |
| DE102006050136A1 (de) | Verfahren und Vorrichtung zur Erzeugung von positiv und/oder negativ ionisierten Gasanalyten für die Gasanalyse | |
| DE3887922T2 (de) | Entladungsionisierungsquelle zum Analysieren der Atmosphäre. | |
| DE2521344A1 (de) | Massenspektrometisches system zur schnellen automatischen, spezifischen indentifizierung und quantitativen bestimmung von verbindungen |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OR8 | Request for search as to paragraph 43 lit. 1 sentence 1 patent law | ||
| R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |
Effective date: 20130801 |