JP2009103563A5 - - Google Patents

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Publication number
JP2009103563A5
JP2009103563A5 JP2007275074A JP2007275074A JP2009103563A5 JP 2009103563 A5 JP2009103563 A5 JP 2009103563A5 JP 2007275074 A JP2007275074 A JP 2007275074A JP 2007275074 A JP2007275074 A JP 2007275074A JP 2009103563 A5 JP2009103563 A5 JP 2009103563A5
Authority
JP
Japan
Prior art keywords
contact
recess
rear end
upward
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2007275074A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009103563A (ja
JP5113481B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from JP2007275074A external-priority patent/JP5113481B2/ja
Priority to JP2007275074A priority Critical patent/JP5113481B2/ja
Priority to TW097136420A priority patent/TW200924314A/zh
Priority to US12/237,289 priority patent/US7753693B2/en
Priority to KR1020080099848A priority patent/KR101001642B1/ko
Priority to DE102008052360.7A priority patent/DE102008052360B4/de
Priority to CN2008101730044A priority patent/CN101419244B/zh
Publication of JP2009103563A publication Critical patent/JP2009103563A/ja
Publication of JP2009103563A5 publication Critical patent/JP2009103563A5/ja
Publication of JP5113481B2 publication Critical patent/JP5113481B2/ja
Application granted granted Critical
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2007275074A 2007-10-23 2007-10-23 接触子及びこれを用いる電気的接続装置 Active JP5113481B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2007275074A JP5113481B2 (ja) 2007-10-23 2007-10-23 接触子及びこれを用いる電気的接続装置
TW097136420A TW200924314A (en) 2007-10-23 2008-09-23 Contact and electrical connecting apparatus using it
US12/237,289 US7753693B2 (en) 2007-10-23 2008-09-24 Contacts and electrical connecting apparatus using the same
KR1020080099848A KR101001642B1 (ko) 2007-10-23 2008-10-10 접촉자 및 이를 이용한 전기적 접속 장치
DE102008052360.7A DE102008052360B4 (de) 2007-10-23 2008-10-20 Elektrische Verbindungsvorrichtung
CN2008101730044A CN101419244B (zh) 2007-10-23 2008-10-23 触头及使用该触头的电气连接装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007275074A JP5113481B2 (ja) 2007-10-23 2007-10-23 接触子及びこれを用いる電気的接続装置

Publications (3)

Publication Number Publication Date
JP2009103563A JP2009103563A (ja) 2009-05-14
JP2009103563A5 true JP2009103563A5 (https=) 2010-10-21
JP5113481B2 JP5113481B2 (ja) 2013-01-09

Family

ID=40490492

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007275074A Active JP5113481B2 (ja) 2007-10-23 2007-10-23 接触子及びこれを用いる電気的接続装置

Country Status (6)

Country Link
US (1) US7753693B2 (https=)
JP (1) JP5113481B2 (https=)
KR (1) KR101001642B1 (https=)
CN (1) CN101419244B (https=)
DE (1) DE102008052360B4 (https=)
TW (1) TW200924314A (https=)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5906579B2 (ja) * 2011-04-08 2016-04-20 セイコーエプソン株式会社 端子モジュールおよび記録装置
CN104769442B (zh) * 2012-11-07 2018-02-02 欧姆龙株式会社 连接端子和使用该连接端子的导通检查设备
TWI657362B (zh) * 2015-03-23 2019-04-21 群創光電股份有限公司 觸控裝置
US9343830B1 (en) * 2015-06-08 2016-05-17 Xcerra Corporation Integrated circuit chip tester with embedded micro link
WO2018003507A1 (ja) * 2016-06-28 2018-01-04 株式会社日本マイクロニクス 電気的接続装置及び接触子
WO2020022085A1 (ja) * 2018-07-27 2020-01-30 日置電機株式会社 測定装置
CN111060802A (zh) * 2019-11-28 2020-04-24 苏州韬盛电子科技有限公司 用于大电流测试以及高频测试的金属接触器
WO2021207153A1 (en) * 2020-04-07 2021-10-14 Smiths Interconnect Americas, Inc. Test socket for semiconductor integrated circuits
CN115877170A (zh) * 2021-09-27 2023-03-31 史密斯互连美洲公司 具有擦拭触件的测试插座的系统和方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW302022U (en) * 1996-09-20 1997-04-01 Tian-Yi Chen Conducting interface apparatus for testing jig of integrated circuit
US5888075A (en) * 1997-02-10 1999-03-30 Kabushiki Kaisha Nihon Micronics Auxiliary apparatus for testing device
JP2001035578A (ja) * 1999-05-14 2001-02-09 Mitsubishi Electric Corp 電子回路装置のテスト用ソケット及びその製造方法
JP2003123874A (ja) 2001-10-16 2003-04-25 Micronics Japan Co Ltd 接触子及びその製造方法並びに電気的接続装置
US7121842B2 (en) * 2004-01-13 2006-10-17 Kabushiki Kaisha Nihon Micronics Electrical connector
JP4592292B2 (ja) * 2004-01-16 2010-12-01 株式会社日本マイクロニクス 電気的接続装置
EP1753100A4 (en) * 2004-06-03 2008-05-07 Nihon Micronics Kk CONTACTOR AND ELECTRICAL CONNECTOR
WO2006114895A1 (ja) * 2005-04-21 2006-11-02 Kabushiki Kaisha Nihon Micronics 電気的接続装置
TWM302022U (en) 2006-05-29 2006-12-01 Tangerine System Co Ltd Transmitting interface apparatus of integrated circuit test fixture

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