JP2008539549A5 - - Google Patents

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Publication number
JP2008539549A5
JP2008539549A5 JP2008508867A JP2008508867A JP2008539549A5 JP 2008539549 A5 JP2008539549 A5 JP 2008539549A5 JP 2008508867 A JP2008508867 A JP 2008508867A JP 2008508867 A JP2008508867 A JP 2008508867A JP 2008539549 A5 JP2008539549 A5 JP 2008539549A5
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JP
Japan
Prior art keywords
chamber
voltage
voltage pulse
applying
conductive surface
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JP2008508867A
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English (en)
Japanese (ja)
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JP2008539549A (ja
JP5268634B2 (ja
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Priority claimed from US11/114,481 external-priority patent/US7291845B2/en
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Publication of JP2008539549A publication Critical patent/JP2008539549A/ja
Publication of JP2008539549A5 publication Critical patent/JP2008539549A5/ja
Application granted granted Critical
Publication of JP5268634B2 publication Critical patent/JP5268634B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2008508867A 2005-04-26 2006-03-31 電子衝撃イオン源におけるイオン不安定性の制御方法及びイオン化装置 Expired - Fee Related JP5268634B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/114,481 2005-04-26
US11/114,481 US7291845B2 (en) 2005-04-26 2005-04-26 Method for controlling space charge-driven ion instabilities in electron impact ion sources
PCT/US2006/011719 WO2006115686A2 (en) 2005-04-26 2006-03-31 Method for controlling space charge-driven ion instabilities in electron impact ion sources

Publications (3)

Publication Number Publication Date
JP2008539549A JP2008539549A (ja) 2008-11-13
JP2008539549A5 true JP2008539549A5 (OSRAM) 2009-05-14
JP5268634B2 JP5268634B2 (ja) 2013-08-21

Family

ID=37038391

Family Applications (1)

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JP2008508867A Expired - Fee Related JP5268634B2 (ja) 2005-04-26 2006-03-31 電子衝撃イオン源におけるイオン不安定性の制御方法及びイオン化装置

Country Status (4)

Country Link
US (1) US7291845B2 (OSRAM)
EP (1) EP1875486B1 (OSRAM)
JP (1) JP5268634B2 (OSRAM)
WO (1) WO2006115686A2 (OSRAM)

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US7323682B2 (en) * 2004-07-02 2008-01-29 Thermo Finnigan Llc Pulsed ion source for quadrupole mass spectrometer and method
JP4692627B2 (ja) * 2006-03-07 2011-06-01 株式会社島津製作所 質量分析装置
US8720728B2 (en) 2007-03-09 2014-05-13 Simplehuman, Llc Trash can
WO2010109907A1 (ja) * 2009-03-27 2010-09-30 国立大学法人大阪大学 イオン源、およびそれを備える質量分析装置
US9434538B2 (en) 2010-03-12 2016-09-06 Simplehuman, Llc Trash can
US9048080B2 (en) * 2010-08-19 2015-06-02 Leco Corporation Time-of-flight mass spectrometer with accumulating electron impact ion source
US10279996B2 (en) 2011-09-16 2019-05-07 Simplehuman, Llc Receptacle with low friction and low noise motion damper for lid
US9790025B2 (en) 2012-03-09 2017-10-17 Simplehuman, Llc Trash can with clutch mechanism
CA2808725C (en) 2012-03-09 2020-03-24 Simplehuman, Llc Trash cans with features to aid in actuation
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US9847214B2 (en) * 2013-11-26 2017-12-19 Perkinelmer Health Sciences, Inc. Detectors and methods of using them
US10279997B2 (en) 2014-03-14 2019-05-07 Simplehuman, Llc Trash can assembly
US9751692B2 (en) 2014-03-14 2017-09-05 Simplehuman, Llc Dual sensing receptacles
US9856080B2 (en) 2014-03-14 2018-01-02 Simplehuman, Llc Containers with multiple sensors
WO2016054109A1 (en) 2014-10-01 2016-04-07 Frank Yang Trash cans
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USD771344S1 (en) * 2015-03-05 2016-11-08 Simplehuman, Llc Trash can
USD759934S1 (en) * 2015-03-05 2016-06-21 Simplehuman, Llc Trash can trim component
US12351390B2 (en) 2015-09-16 2025-07-08 Simplehuman, Llc Containers with multiple sensors
US11242198B2 (en) 2015-11-10 2022-02-08 Simplehuman, Llc Household goods with antimicrobial coatings and methods of making thereof
USD804133S1 (en) 2015-12-09 2017-11-28 Simplehuman, Llc Trash can
US10494175B2 (en) 2016-03-03 2019-12-03 Simplehuman, Llc Receptacle assemblies with motion dampers
USD793642S1 (en) 2016-03-04 2017-08-01 Simplehuman, Llc Trash can
USD798016S1 (en) 2016-03-04 2017-09-19 Simplehuman, Llc Trash can
US9721777B1 (en) * 2016-04-14 2017-08-01 Bruker Daltonics, Inc. Magnetically assisted electron impact ion source for mass spectrometry
USD835376S1 (en) 2016-11-14 2018-12-04 Simplehuman, Llc Trash can
JP7210536B2 (ja) * 2017-04-03 2023-01-23 パーキンエルマー ヘルス サイエンス インコーポレイテッド 電子イオン化源からのイオンの移動
USD855919S1 (en) 2017-06-22 2019-08-06 Simplehuman, Llc Trash can
USD858923S1 (en) 2018-01-12 2019-09-03 Simplehuman, Llc Trash can
USD858024S1 (en) 2018-01-12 2019-08-27 Simplehuman, Llc Trash can
CA3035674C (en) 2018-03-07 2026-01-20 Simplehuman, Llc Trash can assembly
US10622200B2 (en) * 2018-05-18 2020-04-14 Perkinelmer Health Sciences Canada, Inc. Ionization sources and systems and methods using them
USD901815S1 (en) 2019-05-16 2020-11-10 Simplehuman, Llc Slim trash can
USD969291S1 (en) 2020-08-26 2022-11-08 Simplehuman, Llc Odor pod
USD963277S1 (en) 2020-08-26 2022-09-06 Simplehuman, Llc Waste receptacle
CN114566420B (zh) * 2020-11-27 2025-08-08 株式会社岛津制作所 质量分析装置
USD1094941S1 (en) 2022-06-03 2025-09-23 Simplehuman, Llc Waste receptacle
USD1072411S1 (en) 2023-03-02 2025-04-22 Simplehuman, Llc Trash can
USD1072412S1 (en) 2023-03-02 2025-04-22 Simplehuman, Llc Trash can

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US7323682B2 (en) * 2004-07-02 2008-01-29 Thermo Finnigan Llc Pulsed ion source for quadrupole mass spectrometer and method

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