JP2008527690A - メモリ・デバイス製造方法 - Google Patents
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 25
- 238000000034 method Methods 0.000 claims abstract description 68
- 230000015654 memory Effects 0.000 claims abstract description 49
- 238000007639 printing Methods 0.000 claims abstract description 39
- 239000000463 material Substances 0.000 claims abstract description 35
- 230000008569 process Effects 0.000 claims abstract description 19
- 239000011159 matrix material Substances 0.000 claims abstract description 13
- 239000002904 solvent Substances 0.000 claims abstract description 11
- 230000035699 permeability Effects 0.000 claims abstract description 3
- 239000010410 layer Substances 0.000 claims description 44
- 229920000642 polymer Polymers 0.000 claims description 25
- 239000011241 protective layer Substances 0.000 claims description 17
- 239000000758 substrate Substances 0.000 claims description 17
- 229920000144 PEDOT:PSS Polymers 0.000 claims description 13
- 229920001940 conductive polymer Polymers 0.000 claims description 13
- 238000000137 annealing Methods 0.000 claims description 9
- 229920001609 Poly(3,4-ethylenedioxythiophene) Polymers 0.000 claims description 6
- 230000008021 deposition Effects 0.000 claims description 6
- 229920001467 poly(styrenesulfonates) Polymers 0.000 claims description 5
- 229920000131 polyvinylidene Polymers 0.000 claims description 5
- 230000005855 radiation Effects 0.000 claims description 5
- 239000000126 substance Substances 0.000 claims description 5
- 239000000654 additive Substances 0.000 claims description 4
- 229920001577 copolymer Polymers 0.000 claims description 4
- 238000007641 inkjet printing Methods 0.000 claims description 4
- 239000000203 mixture Substances 0.000 claims description 4
- 229920000767 polyaniline Polymers 0.000 claims description 3
- MIZLGWKEZAPEFJ-UHFFFAOYSA-N 1,1,2-trifluoroethene Chemical group FC=C(F)F MIZLGWKEZAPEFJ-UHFFFAOYSA-N 0.000 claims description 2
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 claims description 2
- 230000000996 additive effect Effects 0.000 claims description 2
- 239000002131 composite material Substances 0.000 claims description 2
- 239000002322 conducting polymer Substances 0.000 claims description 2
- 238000005137 deposition process Methods 0.000 claims description 2
- 238000010438 heat treatment Methods 0.000 claims description 2
- 229920000128 polypyrrole Polymers 0.000 claims description 2
- 229920000123 polythiophene Polymers 0.000 claims description 2
- 238000007650 screen-printing Methods 0.000 claims description 2
- 229910000077 silane Inorganic materials 0.000 claims description 2
- BQCIDUSAKPWEOX-UHFFFAOYSA-N 1,1-Difluoroethene Chemical compound FC(F)=C BQCIDUSAKPWEOX-UHFFFAOYSA-N 0.000 claims 2
- NLHHRLWOUZZQLW-UHFFFAOYSA-N Acrylonitrile Chemical compound C=CC#N NLHHRLWOUZZQLW-UHFFFAOYSA-N 0.000 claims 1
- 239000004677 Nylon Substances 0.000 claims 1
- 229920002396 Polyurea Polymers 0.000 claims 1
- 150000001875 compounds Chemical class 0.000 claims 1
- 238000004090 dissolution Methods 0.000 claims 1
- 230000005670 electromagnetic radiation Effects 0.000 claims 1
- 238000007648 laser printing Methods 0.000 claims 1
- 229920001778 nylon Polymers 0.000 claims 1
- 238000007645 offset printing Methods 0.000 claims 1
- ABLZXFCXXLZCGV-UHFFFAOYSA-N phosphonic acid group Chemical group P(O)(O)=O ABLZXFCXXLZCGV-UHFFFAOYSA-N 0.000 claims 1
- 150000003839 salts Chemical group 0.000 claims 1
- 238000007789 sealing Methods 0.000 claims 1
- 238000002174 soft lithography Methods 0.000 claims 1
- ZTWTYVWXUKTLCP-UHFFFAOYSA-N vinylphosphonic acid Chemical compound OP(O)(=O)C=C ZTWTYVWXUKTLCP-UHFFFAOYSA-N 0.000 claims 1
- 230000001681 protective effect Effects 0.000 abstract description 5
- 230000010287 polarization Effects 0.000 description 14
- 239000004065 semiconductor Substances 0.000 description 10
- 239000010408 film Substances 0.000 description 9
- 238000005516 engineering process Methods 0.000 description 7
- 239000000976 ink Substances 0.000 description 7
- 239000004020 conductor Substances 0.000 description 6
- 238000000151 deposition Methods 0.000 description 6
- 229920002120 photoresistant polymer Polymers 0.000 description 6
- 239000011368 organic material Substances 0.000 description 5
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 4
- 239000002019 doping agent Substances 0.000 description 4
- 230000005669 field effect Effects 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 229920000620 organic polymer Polymers 0.000 description 4
- 229920006254 polymer film Polymers 0.000 description 4
- 239000002033 PVDF binder Substances 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 229920003227 poly(N-vinyl carbazole) Polymers 0.000 description 3
- 229920002981 polyvinylidene fluoride Polymers 0.000 description 3
- 238000004528 spin coating Methods 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 2
- 239000004971 Cross linker Substances 0.000 description 2
- 239000007900 aqueous suspension Substances 0.000 description 2
- AFYCEAFSNDLKSX-UHFFFAOYSA-N coumarin 460 Chemical compound CC1=CC(=O)OC2=CC(N(CC)CC)=CC=C21 AFYCEAFSNDLKSX-UHFFFAOYSA-N 0.000 description 2
- 238000013500 data storage Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 239000011888 foil Substances 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- -1 glycidyl oxypropyl Chemical group 0.000 description 2
- 230000002779 inactivation Effects 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 238000000059 patterning Methods 0.000 description 2
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- 239000004926 polymethyl methacrylate Substances 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- 239000011232 storage material Substances 0.000 description 2
- 239000000725 suspension Substances 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- XLOFNXVVMRAGLZ-UHFFFAOYSA-N 1,1-difluoroethene;1,1,2-trifluoroethene Chemical group FC(F)=C.FC=C(F)F XLOFNXVVMRAGLZ-UHFFFAOYSA-N 0.000 description 1
- 241001479434 Agfa Species 0.000 description 1
- LSNNMFCWUKXFEE-UHFFFAOYSA-M Bisulfite Chemical compound OS([O-])=O LSNNMFCWUKXFEE-UHFFFAOYSA-M 0.000 description 1
- XFXPMWWXUTWYJX-UHFFFAOYSA-N Cyanide Chemical compound N#[C-] XFXPMWWXUTWYJX-UHFFFAOYSA-N 0.000 description 1
- OIFBSDVPJOWBCH-UHFFFAOYSA-N Diethyl carbonate Chemical compound CCOC(=O)OCC OIFBSDVPJOWBCH-UHFFFAOYSA-N 0.000 description 1
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 229910019093 NaOCl Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000001994 activation Methods 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000006229 carbon black Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000010924 continuous production Methods 0.000 description 1
- VBVAVBCYMYWNOU-UHFFFAOYSA-N coumarin 6 Chemical compound C1=CC=C2SC(C3=CC4=CC=C(C=C4OC3=O)N(CC)CC)=NC2=C1 VBVAVBCYMYWNOU-UHFFFAOYSA-N 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- 239000003431 cross linking reagent Substances 0.000 description 1
- 230000009849 deactivation Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 239000000975 dye Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 238000009472 formulation Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000002209 hydrophobic effect Effects 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000002346 layers by function Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 229910001092 metal group alloy Inorganic materials 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- VOFUROIFQGPCGE-UHFFFAOYSA-N nile red Chemical compound C1=CC=C2C3=NC4=CC=C(N(CC)CC)C=C4OC3=CC(=O)C2=C1 VOFUROIFQGPCGE-UHFFFAOYSA-N 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000005240 physical vapour deposition Methods 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 239000001044 red dye Substances 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- SUKJFIGYRHOWBL-UHFFFAOYSA-N sodium hypochlorite Chemical compound [Na+].Cl[O-] SUKJFIGYRHOWBL-UHFFFAOYSA-N 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000007790 solid phase Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 230000008961 swelling Effects 0.000 description 1
- 229920001897 terpolymer Polymers 0.000 description 1
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 1
- 230000001988 toxicity Effects 0.000 description 1
- 231100000419 toxicity Toxicity 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
- H01L27/105—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration including field-effect components
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
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- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/48463—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/8538—Bonding interfaces outside the semiconductor or solid-state body
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- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H—ELECTRICITY
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Abstract
Description
1.印刷プロセスで使用される水や溶剤に耐性を持つ。
2.電気的に分離すべき印刷された導電性ポリマー構造間のリーク電流の原因となる横方向の顕著な導電性を付加しない。
3.保護層を覆う電界を最小に留めるために、保護層を貫通する方向(対向する電極間の方向)に沿う電気的性質は、十分高い電導度又は高い誘電率でなければならない。
4.強誘電体メモリ層に対するおよび保護層の上に印刷すべき電極層に対する良好な接着を促進する。
Claims (18)
- エレクトレット又は強誘電体材料の形の電気的に分極可能なメモリ材料をベースとするメモリ・デバイスの製造方法であって、ここで、本メモリ・デバイスは、もっぱら又は部分的に印刷プロセスによって供給される回路構造を備えた1又は複数の層を含んでおり、前記1又は複数の層は、一層ごとに下層を完全又は部分的に覆って又は並置されて共通基板上に逐次的な堆積工程によって堆積され、少なくとも1つの層は、溶媒に溶解させた層材料を用いて堆積され、
前記メモリ・デバイスの少なくとも2つの層の間に少なくとも1つの中間保護層が提供され、前記中間保護層が前記メモリ・デバイス中の他の層の堆積に採用された任意の溶剤に対して低い溶解度および低い浸透性を示し、それによって回路構造を備えた前記1又は複数の層の溶解、膨張又は化学的損傷が防止されることを特徴とする前記メモリ・デバイスの製造方法。 - 請求項1記載の方法であって、前記保護層を全体を覆う層として堆積させることを特徴とする前記方法。
- 請求項1記載の方法であって、前記保護層をパターン化された層として堆積させることを特徴とする前記方法。
- 請求項1記載の方法であって、前記エレクトレット又は前記強誘電体材料として、ポリマー、コポリマー、オリゴマー、コオリゴマー、又はそれらの混合物又は複合物のうち1又は複数のものを選択することを特徴とする前記方法。
- 請求項4記載の方法であって、前記エレクトレット又は前記強誘電体材料として、ポリ(ビニリデン・ジフロライド)(PVDF)、ポリ(ビニリデン・トリフルオロエチレン)コポリマー(P(VDF−TrFE))、ポリ尿素、奇数ナイロン又はポリ(ビニール・シアン化物)のうち1又は複数のものを選択することを特徴とする前記方法。
- 請求項4記載の方法であって、前記メモリ・デバイスを柔軟な基板上に構築することを特徴とする前記方法。
- 請求項4記載の方法であって、前記メモリ・デバイスをコンデンサ様構造の受動マトリクス・アドレッシング可能なアレイとして構築することを特徴とする前記方法。
- 請求項1記載の方法であって、大きい誘電率、好ましくは、周波数域1kHz−1GHzで10よりも大きい誘電率を持つ前記保護層材料を選択することを特徴とする前記方法。
- 請求項1記載の方法であって、前記保護層の材料として、導電性ポリマー又は添加物を含む導電性ポリマーのうち1又は複数のものを選択することを特徴とする前記方法。
- 請求項1記載の方法であって、ホスホン酸グループ又はそれの塩に結合した分子の一部分を含む1又は複数の前記保護層材料を選択することを特徴とする前記方法。
- 請求項10記載の方法であって、前記1又は複数の材料がポリ(ビニール・ホスホン酸)(PVPA)を含むことを特徴とする前記方法。
- 請求項1記載の方法であって、前記保護層材料として、ポリチオフェン、ポリピロール又はポリアニリン又はそれらの誘導体のグループから選ばれた前記導電性ポリマーを選択することを特徴とする前記方法。
- 請求項12記載の方法であって、導電性ポリマーとして、純粋な形又は添加物を含む形のいずれかで、対イオンのポリ(スチレン・サルフォネート)を含むポリ(エチレン・ジオキシチオフェン)、PEDOT:PSSを選択することを特徴とする前記方法。
- 請求項12記載の方法であって、シランを含む化合物で架橋されたPEDOT:PSSを選択することを特徴とする前記方法。
- 請求項1記載の方法であって、前記印刷プロセスとして、インク・ジェット印刷、スクリーン印刷、フレキソ印刷、オフセット印刷、電子写真印刷、ソフト・リソグラフィ、レーザ印刷、ワックス・ジェット印刷のうち1又は複数のものを選択することを特徴とする前記方法。
- 請求項1記載の方法であって、溶剤除去又はアニールを実現するために、少なくとも1つの層を、赤外放射又はマイクロ波放射から選ばれた波長を持つ電磁放射を用いた高速加熱プロセスに曝すことを特徴とする前記方法。
- 請求項1記載の方法であって、少なくとも1つの堆積工程を制御された湿度雰囲気で実行することを特徴とする前記方法。
- 請求項1記載の方法であって、堆積工程の少なくとも1又は複数の工程で、湿気をシールする層を適用することを特徴とする前記方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NO20045727A NO322202B1 (no) | 2004-12-30 | 2004-12-30 | Fremgangsmate i fremstillingen av en elektronisk innretning |
PCT/NO2005/000481 WO2006071122A1 (en) | 2004-12-30 | 2005-12-23 | A method in the fabrication of a memory device |
Publications (1)
Publication Number | Publication Date |
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JP2008527690A true JP2008527690A (ja) | 2008-07-24 |
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JP2007549297A Pending JP2008527690A (ja) | 2004-12-30 | 2005-12-23 | メモリ・デバイス製造方法 |
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US (1) | US20060160251A1 (ja) |
EP (1) | EP1831893A1 (ja) |
JP (1) | JP2008527690A (ja) |
KR (1) | KR100891391B1 (ja) |
CN (1) | CN100585731C (ja) |
NO (1) | NO322202B1 (ja) |
WO (1) | WO2006071122A1 (ja) |
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SG135079A1 (en) * | 2006-03-02 | 2007-09-28 | Sony Corp | Memory device which comprises a multi-layer capacitor |
US20090116275A1 (en) * | 2006-04-28 | 2009-05-07 | Leenders Luc | Conventionally printable non-volatile passive memory element and method of making thereof |
JP5297633B2 (ja) * | 2006-11-22 | 2013-09-25 | 富士フイルム株式会社 | 反射防止フィルムの製造方法 |
US8110450B2 (en) | 2007-12-19 | 2012-02-07 | Palo Alto Research Center Incorporated | Printed TFT and TFT array with self-aligned gate |
US20090167496A1 (en) * | 2007-12-31 | 2009-07-02 | Unity Semiconductor Corporation | Radio frequency identification transponder memory |
US7573063B1 (en) * | 2008-05-15 | 2009-08-11 | Xerox Corporation | Organic thin film transistors |
JP6023188B2 (ja) | 2011-06-27 | 2016-11-09 | シン フイルム エレクトロニクス エイエスエイ | フレキシブルな基板上に設けられた積層体を含む電子コンポーネント中の短絡回路の低減 |
EP2724342B1 (en) | 2011-06-27 | 2018-10-17 | Xerox Corporation | Short circuit reduction in a ferroelectric memory cell comprising a stack of layers arranged on a flexible substrate |
WO2013146750A1 (ja) * | 2012-03-30 | 2013-10-03 | アルプス電気株式会社 | 導電パターン形成基板の製造方法 |
KR101382890B1 (ko) * | 2012-06-21 | 2014-04-08 | 청주대학교 산학협력단 | 나노 박막을 이용한 전기 광학 변조기 및 그 제조방법 |
CN104409632B (zh) * | 2014-05-31 | 2017-05-10 | 福州大学 | 一种多层结构有机阻变存储器的3d打印制备方法 |
WO2015191254A1 (en) * | 2014-06-09 | 2015-12-17 | Sabic Global Technologies B.V. | Processing of thin film organic ferroelectric materials using pulsed electromagnetic radiation |
CN104810361B (zh) * | 2015-04-30 | 2019-01-29 | 于翔 | 一种存储器 |
EP3226271B1 (en) * | 2016-04-01 | 2021-03-17 | RISE Research Institutes of Sweden AB | Electrochemical device |
US10636471B2 (en) * | 2016-04-20 | 2020-04-28 | Micron Technology, Inc. | Memory arrays, ferroelectric transistors, and methods of reading and writing relative to memory cells of memory arrays |
CN105742501B (zh) * | 2016-05-03 | 2018-07-06 | 苏州大学 | 基于经膦酸或三氯硅烷修饰的ito玻璃基底的有机电存储器件及其制备方法 |
US10832775B1 (en) | 2019-07-18 | 2020-11-10 | International Business Machines Corporation | Cross-point array of polymer junctions with individually-programmed conductances that can be reset |
CN111180582B (zh) * | 2020-02-12 | 2021-12-21 | 福州大学 | 一种基于驻极体的突触晶体管及其制备方法 |
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- 2005-12-23 WO PCT/NO2005/000481 patent/WO2006071122A1/en active Application Filing
- 2005-12-23 CN CN200580048829A patent/CN100585731C/zh not_active Expired - Fee Related
- 2005-12-23 KR KR1020077015819A patent/KR100891391B1/ko not_active IP Right Cessation
- 2005-12-23 JP JP2007549297A patent/JP2008527690A/ja active Pending
- 2005-12-29 US US11/319,383 patent/US20060160251A1/en not_active Abandoned
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Also Published As
Publication number | Publication date |
---|---|
KR20070087022A (ko) | 2007-08-27 |
CN100585731C (zh) | 2010-01-27 |
US20060160251A1 (en) | 2006-07-20 |
KR100891391B1 (ko) | 2009-04-02 |
NO322202B1 (no) | 2006-08-28 |
CN101133460A (zh) | 2008-02-27 |
EP1831893A1 (en) | 2007-09-12 |
NO20045727D0 (no) | 2004-12-30 |
WO2006071122A1 (en) | 2006-07-06 |
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