JP2008509423A5 - - Google Patents
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- Publication number
- JP2008509423A5 JP2008509423A5 JP2007525711A JP2007525711A JP2008509423A5 JP 2008509423 A5 JP2008509423 A5 JP 2008509423A5 JP 2007525711 A JP2007525711 A JP 2007525711A JP 2007525711 A JP2007525711 A JP 2007525711A JP 2008509423 A5 JP2008509423 A5 JP 2008509423A5
- Authority
- JP
- Japan
- Prior art keywords
- contact
- electrical component
- contact element
- housing
- tip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/916,063 US7402994B2 (en) | 2004-08-09 | 2004-08-09 | Self-cleaning lower contact |
| US10/916,063 | 2004-08-09 | ||
| PCT/US2005/028160 WO2006020578A2 (en) | 2004-08-09 | 2005-08-08 | Self-cleaning lower contact |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008509423A JP2008509423A (ja) | 2008-03-27 |
| JP2008509423A5 true JP2008509423A5 (https=) | 2009-06-04 |
| JP5393029B2 JP5393029B2 (ja) | 2014-01-22 |
Family
ID=35756796
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007525711A Expired - Fee Related JP5393029B2 (ja) | 2004-08-09 | 2005-08-08 | 自浄式下部コンタクト |
Country Status (9)
| Country | Link |
|---|---|
| US (2) | US7402994B2 (https=) |
| JP (1) | JP5393029B2 (https=) |
| KR (1) | KR101176776B1 (https=) |
| CN (1) | CN101023528B (https=) |
| DE (1) | DE112005001928T5 (https=) |
| GB (1) | GB2431057B (https=) |
| SG (1) | SG155199A1 (https=) |
| TW (1) | TWI358330B (https=) |
| WO (1) | WO2006020578A2 (https=) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7905471B2 (en) * | 2004-11-22 | 2011-03-15 | Electro Scientific Industries, Inc. | Vacuum ring designs for electrical contacting improvement |
| US7819235B2 (en) * | 2007-01-29 | 2010-10-26 | Electro Scientific Industries, Inc. | Venturi vacuum generator on an electric component handler |
| KR101451499B1 (ko) * | 2013-02-07 | 2014-10-17 | 삼성전기주식회사 | 전자부품 검사장치 |
| CN104880658B (zh) * | 2013-07-23 | 2018-09-07 | 苏州固锝电子股份有限公司 | 用于加速度传感器的测试装置 |
| KR101871698B1 (ko) * | 2014-06-04 | 2018-06-27 | 가부시키가이샤 무라타 세이사쿠쇼 | 반송 장치 |
| DE202014105151U1 (de) * | 2014-10-28 | 2016-01-29 | Ptr Messtechnik Gmbh & Co. Kommanditgesellschaft | Federkontaktvorrichtung |
| JP6459882B2 (ja) * | 2015-10-06 | 2019-01-30 | 株式会社村田製作所 | 通電装置 |
| JP7107589B2 (ja) | 2020-08-28 | 2022-07-27 | 株式会社ヒューモラボラトリー | チップ電子部品検査用のローラ電極接触子を備えた装置 |
| TWI805218B (zh) * | 2022-02-10 | 2023-06-11 | 萬潤科技股份有限公司 | 電子零件測試裝置及其測試板構造、測試板製造方法 |
| TWI800405B (zh) * | 2022-06-14 | 2023-04-21 | 國巨股份有限公司 | 測試探針與測試探針固定裝置 |
| JP2026000255A (ja) | 2024-06-17 | 2026-01-05 | 株式会社村田製作所 | 測定装置 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3340727A (en) * | 1962-03-30 | 1967-09-12 | Emedio M Bracalente | Ablation probe |
| US3915850A (en) * | 1973-11-14 | 1975-10-28 | Gti Corp | Component handler and method and apparatus utilizing same |
| JPS6242377Y2 (https=) * | 1980-12-27 | 1987-10-30 | ||
| US4574236A (en) * | 1983-10-27 | 1986-03-04 | At&T Technologies, Inc. | High frequency test fixture |
| DE3604717A1 (de) * | 1986-02-14 | 1987-08-27 | Nixdorf Computer Ag | Kontaktstiftanordnung |
| EP0256541A3 (de) * | 1986-08-19 | 1990-03-14 | Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung | Kontaktiervorrichtung |
| US5034749A (en) * | 1988-10-06 | 1991-07-23 | Electro Scientific Industries, Inc. | Sliding contact test apparatus |
| EP0418454A3 (en) | 1989-09-21 | 1992-11-04 | Electro Scientific Industries, Inc. | Sliding contact test apparatus |
| US5172473A (en) * | 1990-05-07 | 1992-12-22 | International Business Machines Corporation | Method of making cone electrical contact |
| US5118299A (en) * | 1990-05-07 | 1992-06-02 | International Business Machines Corporation | Cone electrical contact |
| US5936421A (en) * | 1994-10-11 | 1999-08-10 | Virginia Panel Corporation | Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith |
| US5842579A (en) * | 1995-11-16 | 1998-12-01 | Electro Scientific Industries, Inc. | Electrical circuit component handler |
| DE19718637A1 (de) * | 1997-05-02 | 1998-11-05 | Atg Test Systems Gmbh | Vorrichtung und Verfahren zum Prüfen von Leiterplatten |
| US5764072A (en) * | 1996-12-20 | 1998-06-09 | Probe Technology | Dual contact probe assembly for testing integrated circuits |
| US6118289A (en) * | 1997-03-10 | 2000-09-12 | Canon Kabushiki Kaisha | Cleaning method and cleaning device and cleaning tool for board electrical-test probes, and board electrical-test device and method |
| TW377482B (en) * | 1997-04-08 | 1999-12-21 | Tokyo Electron Ltd | Cleaner with protuberances for inspection, inspection apparatus and inspection method for integrated circuits |
| US6040705A (en) | 1997-08-20 | 2000-03-21 | Electro Scientific Industries, Inc. | Rolling electrical contactor |
| JP3557887B2 (ja) * | 1998-01-14 | 2004-08-25 | 日立ハイテク電子エンジニアリング株式会社 | Ｉｃデバイスのコンタクト装置 |
| JP2000338156A (ja) * | 1999-05-31 | 2000-12-08 | Nitto Kogyo Co Ltd | チップの測定端子 |
| JP2003014779A (ja) | 2001-07-02 | 2003-01-15 | Nhk Spring Co Ltd | 導電性接触子 |
| US6714028B2 (en) * | 2001-11-14 | 2004-03-30 | Electro Scientific Industries, Inc. | Roller contact with conductive brushes |
| US6710611B2 (en) | 2002-04-19 | 2004-03-23 | Ceramic Component Technologies, Inc. | Test plate for ceramic surface mount devices and other electronic components |
| TWI223084B (en) | 2002-04-25 | 2004-11-01 | Murata Manufacturing Co | Electronic component characteristic measuring device |
| US6677772B1 (en) * | 2002-08-21 | 2004-01-13 | Micron Technology, Inc. | Contactor with isolated spring tips |
-
2004
- 2004-08-09 US US10/916,063 patent/US7402994B2/en not_active Expired - Lifetime
-
2005
- 2005-08-08 SG SG200905294-5A patent/SG155199A1/en unknown
- 2005-08-08 GB GB0702152A patent/GB2431057B/en not_active Expired - Fee Related
- 2005-08-08 CN CN200580030153XA patent/CN101023528B/zh not_active Expired - Fee Related
- 2005-08-08 WO PCT/US2005/028160 patent/WO2006020578A2/en not_active Ceased
- 2005-08-08 JP JP2007525711A patent/JP5393029B2/ja not_active Expired - Fee Related
- 2005-08-08 KR KR1020077002993A patent/KR101176776B1/ko not_active Expired - Fee Related
- 2005-08-08 DE DE112005001928T patent/DE112005001928T5/de not_active Withdrawn
- 2005-08-09 TW TW094126935A patent/TWI358330B/zh not_active IP Right Cessation
-
2008
- 2008-06-20 US US12/143,301 patent/US7592823B2/en not_active Expired - Fee Related
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