CN101023528B - 电气组件处理机、触点组装件以及双侧触点元件 - Google Patents

电气组件处理机、触点组装件以及双侧触点元件 Download PDF

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Publication number
CN101023528B
CN101023528B CN200580030153XA CN200580030153A CN101023528B CN 101023528 B CN101023528 B CN 101023528B CN 200580030153X A CN200580030153X A CN 200580030153XA CN 200580030153 A CN200580030153 A CN 200580030153A CN 101023528 B CN101023528 B CN 101023528B
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CN
China
Prior art keywords
contact
contact element
extendible
shell
component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN200580030153XA
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English (en)
Chinese (zh)
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CN101023528A (zh
Inventor
D·J·加西亚
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Electro Scientific Industries Inc
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Electro Scientific Industries Inc
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Publication date
Application filed by Electro Scientific Industries Inc filed Critical Electro Scientific Industries Inc
Publication of CN101023528A publication Critical patent/CN101023528A/zh
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Publication of CN101023528B publication Critical patent/CN101023528B/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
CN200580030153XA 2004-08-09 2005-08-08 电气组件处理机、触点组装件以及双侧触点元件 Expired - Fee Related CN101023528B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/916,063 US7402994B2 (en) 2004-08-09 2004-08-09 Self-cleaning lower contact
US10/916,063 2004-08-09
PCT/US2005/028160 WO2006020578A2 (en) 2004-08-09 2005-08-08 Self-cleaning lower contact

Publications (2)

Publication Number Publication Date
CN101023528A CN101023528A (zh) 2007-08-22
CN101023528B true CN101023528B (zh) 2010-12-29

Family

ID=35756796

Family Applications (1)

Application Number Title Priority Date Filing Date
CN200580030153XA Expired - Fee Related CN101023528B (zh) 2004-08-09 2005-08-08 电气组件处理机、触点组装件以及双侧触点元件

Country Status (9)

Country Link
US (2) US7402994B2 (https=)
JP (1) JP5393029B2 (https=)
KR (1) KR101176776B1 (https=)
CN (1) CN101023528B (https=)
DE (1) DE112005001928T5 (https=)
GB (1) GB2431057B (https=)
SG (1) SG155199A1 (https=)
TW (1) TWI358330B (https=)
WO (1) WO2006020578A2 (https=)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7905471B2 (en) * 2004-11-22 2011-03-15 Electro Scientific Industries, Inc. Vacuum ring designs for electrical contacting improvement
US7819235B2 (en) * 2007-01-29 2010-10-26 Electro Scientific Industries, Inc. Venturi vacuum generator on an electric component handler
KR101451499B1 (ko) * 2013-02-07 2014-10-17 삼성전기주식회사 전자부품 검사장치
CN104880658B (zh) * 2013-07-23 2018-09-07 苏州固锝电子股份有限公司 用于加速度传感器的测试装置
KR101871698B1 (ko) * 2014-06-04 2018-06-27 가부시키가이샤 무라타 세이사쿠쇼 반송 장치
DE202014105151U1 (de) * 2014-10-28 2016-01-29 Ptr Messtechnik Gmbh & Co. Kommanditgesellschaft Federkontaktvorrichtung
JP6459882B2 (ja) * 2015-10-06 2019-01-30 株式会社村田製作所 通電装置
JP7107589B2 (ja) 2020-08-28 2022-07-27 株式会社ヒューモラボラトリー チップ電子部品検査用のローラ電極接触子を備えた装置
TWI805218B (zh) * 2022-02-10 2023-06-11 萬潤科技股份有限公司 電子零件測試裝置及其測試板構造、測試板製造方法
TWI800405B (zh) * 2022-06-14 2023-04-21 國巨股份有限公司 測試探針與測試探針固定裝置
JP2026000255A (ja) 2024-06-17 2026-01-05 株式会社村田製作所 測定装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1198533A (zh) * 1997-05-02 1998-11-11 Atg测试体系有限公司 用以测试未组装之印刷电路板的设备与方法
US5936421A (en) * 1994-10-11 1999-08-10 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith
US6118289A (en) * 1997-03-10 2000-09-12 Canon Kabushiki Kaisha Cleaning method and cleaning device and cleaning tool for board electrical-test probes, and board electrical-test device and method

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Publication number Priority date Publication date Assignee Title
US3340727A (en) * 1962-03-30 1967-09-12 Emedio M Bracalente Ablation probe
US3915850A (en) * 1973-11-14 1975-10-28 Gti Corp Component handler and method and apparatus utilizing same
JPS6242377Y2 (https=) * 1980-12-27 1987-10-30
US4574236A (en) * 1983-10-27 1986-03-04 At&T Technologies, Inc. High frequency test fixture
DE3604717A1 (de) * 1986-02-14 1987-08-27 Nixdorf Computer Ag Kontaktstiftanordnung
EP0256541A3 (de) * 1986-08-19 1990-03-14 Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung Kontaktiervorrichtung
US5034749A (en) * 1988-10-06 1991-07-23 Electro Scientific Industries, Inc. Sliding contact test apparatus
EP0418454A3 (en) 1989-09-21 1992-11-04 Electro Scientific Industries, Inc. Sliding contact test apparatus
US5172473A (en) * 1990-05-07 1992-12-22 International Business Machines Corporation Method of making cone electrical contact
US5118299A (en) * 1990-05-07 1992-06-02 International Business Machines Corporation Cone electrical contact
US5842579A (en) * 1995-11-16 1998-12-01 Electro Scientific Industries, Inc. Electrical circuit component handler
US5764072A (en) * 1996-12-20 1998-06-09 Probe Technology Dual contact probe assembly for testing integrated circuits
TW377482B (en) * 1997-04-08 1999-12-21 Tokyo Electron Ltd Cleaner with protuberances for inspection, inspection apparatus and inspection method for integrated circuits
US6040705A (en) 1997-08-20 2000-03-21 Electro Scientific Industries, Inc. Rolling electrical contactor
JP3557887B2 (ja) * 1998-01-14 2004-08-25 日立ハイテク電子エンジニアリング株式会社 Ｉｃデバイスのコンタクト装置
JP2000338156A (ja) * 1999-05-31 2000-12-08 Nitto Kogyo Co Ltd チップの測定端子
JP2003014779A (ja) 2001-07-02 2003-01-15 Nhk Spring Co Ltd 導電性接触子
US6714028B2 (en) * 2001-11-14 2004-03-30 Electro Scientific Industries, Inc. Roller contact with conductive brushes
US6710611B2 (en) 2002-04-19 2004-03-23 Ceramic Component Technologies, Inc. Test plate for ceramic surface mount devices and other electronic components
TWI223084B (en) 2002-04-25 2004-11-01 Murata Manufacturing Co Electronic component characteristic measuring device
US6677772B1 (en) * 2002-08-21 2004-01-13 Micron Technology, Inc. Contactor with isolated spring tips

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5936421A (en) * 1994-10-11 1999-08-10 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith
US6118289A (en) * 1997-03-10 2000-09-12 Canon Kabushiki Kaisha Cleaning method and cleaning device and cleaning tool for board electrical-test probes, and board electrical-test device and method
CN1198533A (zh) * 1997-05-02 1998-11-11 Atg测试体系有限公司 用以测试未组装之印刷电路板的设备与方法

Also Published As

Publication number Publication date
US7402994B2 (en) 2008-07-22
GB2431057A8 (https=) 2008-08-20
WO2006020578A2 (en) 2006-02-23
GB2431057B (en) 2009-04-08
WO2006020578A3 (en) 2006-08-24
CN101023528A (zh) 2007-08-22
US20060028224A1 (en) 2006-02-09
JP5393029B2 (ja) 2014-01-22
US20080252315A1 (en) 2008-10-16
GB0702152D0 (en) 2007-03-14
KR101176776B1 (ko) 2012-08-23
GB2431057A (en) 2007-04-11
JP2008509423A (ja) 2008-03-27
SG155199A1 (en) 2009-09-30
KR20070048721A (ko) 2007-05-09
US7592823B2 (en) 2009-09-22
TWI358330B (en) 2012-02-21
TW200605969A (en) 2006-02-16
DE112005001928T5 (de) 2007-07-12

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