JP2008507802A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2008507802A5 JP2008507802A5 JP2007522558A JP2007522558A JP2008507802A5 JP 2008507802 A5 JP2008507802 A5 JP 2008507802A5 JP 2007522558 A JP2007522558 A JP 2007522558A JP 2007522558 A JP2007522558 A JP 2007522558A JP 2008507802 A5 JP2008507802 A5 JP 2008507802A5
- Authority
- JP
- Japan
- Prior art keywords
- programming
- volatile memory
- program time
- memory system
- voltage pump
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 claims 10
- 230000004044 response Effects 0.000 claims 2
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/896,096 US7110298B2 (en) | 2004-07-20 | 2004-07-20 | Non-volatile system with program time control |
| US10/896,096 | 2004-07-20 | ||
| PCT/US2005/024701 WO2006019740A1 (en) | 2004-07-20 | 2005-07-08 | Non-volatile memory system with program time control |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008507802A JP2008507802A (ja) | 2008-03-13 |
| JP2008507802A5 true JP2008507802A5 (enExample) | 2008-08-14 |
| JP4995721B2 JP4995721B2 (ja) | 2012-08-08 |
Family
ID=35149504
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007522558A Expired - Fee Related JP4995721B2 (ja) | 2004-07-20 | 2005-07-08 | プログラム時間制御を有する不揮発性メモリシステム |
Country Status (9)
| Country | Link |
|---|---|
| US (2) | US7110298B2 (enExample) |
| EP (1) | EP1769508B1 (enExample) |
| JP (1) | JP4995721B2 (enExample) |
| KR (1) | KR101039238B1 (enExample) |
| CN (1) | CN101031978B (enExample) |
| AT (1) | ATE382183T1 (enExample) |
| DE (1) | DE602005004027T2 (enExample) |
| TW (1) | TWI391933B (enExample) |
| WO (1) | WO2006019740A1 (enExample) |
Families Citing this family (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7110298B2 (en) * | 2004-07-20 | 2006-09-19 | Sandisk Corporation | Non-volatile system with program time control |
| US7838596B2 (en) * | 2005-09-16 | 2010-11-23 | Eastman Chemical Company | Late addition to effect compositional modifications in condensation polymers |
| US7339832B2 (en) * | 2005-11-21 | 2008-03-04 | Atmel Corporation | Array source line (AVSS) controlled high voltage regulation for programming flash or EE array |
| TWI303763B (en) * | 2006-01-25 | 2008-12-01 | Via Tech Inc | Device and method for controlling refresh rate of memory |
| US7728574B2 (en) * | 2006-02-17 | 2010-06-01 | Micron Technology, Inc. | Reference circuit with start-up control, generator, device, system and method including same |
| US7330373B2 (en) * | 2006-03-28 | 2008-02-12 | Sandisk Corporation | Program time adjustment as function of program voltage for improved programming speed in memory system |
| ATE515035T1 (de) * | 2006-03-28 | 2011-07-15 | Sandisk Corp | Programmzeiteinstellung als programmspannungsfunktion für erhöhte programmiergeschwindigkeit |
| US7327608B2 (en) * | 2006-03-28 | 2008-02-05 | Sandisk Corporation | Program time adjustment as function of program voltage for improved programming speed in programming method |
| US7292495B1 (en) * | 2006-06-29 | 2007-11-06 | Freescale Semiconductor, Inc. | Integrated circuit having a memory with low voltage read/write operation |
| US7961511B2 (en) * | 2006-09-26 | 2011-06-14 | Sandisk Corporation | Hybrid programming methods and systems for non-volatile memory storage elements |
| US7793172B2 (en) * | 2006-09-28 | 2010-09-07 | Freescale Semiconductor, Inc. | Controlled reliability in an integrated circuit |
| US7688656B2 (en) * | 2007-10-22 | 2010-03-30 | Freescale Semiconductor, Inc. | Integrated circuit memory having dynamically adjustable read margin and method therefor |
| KR100932368B1 (ko) * | 2007-11-21 | 2009-12-16 | 주식회사 하이닉스반도체 | 플래시 메모리 소자의 동작 방법 |
| TWI358827B (en) | 2007-11-26 | 2012-02-21 | Nanya Technology Corp | Data programming circuits and memory programming m |
| CN101458959B (zh) * | 2007-12-12 | 2011-09-21 | 南亚科技股份有限公司 | 数据编程电路 |
| JP2011210338A (ja) * | 2010-03-30 | 2011-10-20 | Toshiba Corp | 不揮発性半導体記憶装置 |
| US9741436B2 (en) | 2010-07-09 | 2017-08-22 | Seagate Technology Llc | Dynamically controlling an operation execution time for a storage device |
| US8432752B2 (en) | 2011-06-27 | 2013-04-30 | Freescale Semiconductor, Inc. | Adaptive write procedures for non-volatile memory using verify read |
| US8509001B2 (en) * | 2011-06-27 | 2013-08-13 | Freescale Semiconductor, Inc. | Adaptive write procedures for non-volatile memory |
| CN102255499B (zh) * | 2011-06-28 | 2015-12-09 | 上海华虹宏力半导体制造有限公司 | 电压稳压器 |
| KR101893864B1 (ko) * | 2012-02-06 | 2018-08-31 | 에스케이하이닉스 주식회사 | 비휘발성 메모리 장치 및 프로그램 방법과 이를 이용하는 데이터 처리 시스템 |
| US9299443B1 (en) | 2014-09-29 | 2016-03-29 | Sandisk Technologies Inc. | Modifying program pulses based on inter-pulse period to reduce program noise |
| US11574691B2 (en) | 2016-02-24 | 2023-02-07 | Samsung Electronics Co., Ltd. | Memory device and memory system |
| KR102458918B1 (ko) * | 2016-02-24 | 2022-10-25 | 삼성전자주식회사 | 메모리 장치 및 메모리 시스템 |
| US10628049B2 (en) | 2017-07-12 | 2020-04-21 | Sandisk Technologies Llc | Systems and methods for on-die control of memory command, timing, and/or control signals |
| US11211131B2 (en) * | 2018-12-10 | 2021-12-28 | Micron Technology, Inc. | Adjusting program effective time using program step characteristics |
| CN110189783B (zh) * | 2019-04-15 | 2021-04-06 | 华中科技大学 | 非易失性三维半导体存储器件的多值编程方法及系统 |
| CN110176269B (zh) * | 2019-04-16 | 2020-11-17 | 华中科技大学 | 一种精确调控非易失性存储单元状态的方法及系统 |
| CN111798905B (zh) * | 2020-07-01 | 2021-03-16 | 深圳市芯天下技术有限公司 | 减少非型闪存编程时间的方法、系统、存储介质和终端 |
| US12198765B2 (en) * | 2022-05-23 | 2025-01-14 | Sandisk Technologies Llc | Pump skip for fast single-level cell non-volatile memory |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61166159A (ja) * | 1985-01-18 | 1986-07-26 | Mitsubishi Electric Corp | 半導体装置 |
| JP3417630B2 (ja) * | 1993-12-17 | 2003-06-16 | 株式会社日立製作所 | 半導体集積回路装置とフラッシュメモリ及び不揮発性記憶装置 |
| EP0830684B1 (en) | 1995-06-07 | 2004-08-25 | Macronix International Co., Ltd. | Automatic programming algorithm for page mode flash memory with variable programming pulse height and pulse width |
| US5596532A (en) * | 1995-10-18 | 1997-01-21 | Sandisk Corporation | Flash EEPROM self-adaptive voltage generation circuit operative within a continuous voltage source range |
| US5956272A (en) * | 1997-12-01 | 1999-09-21 | Micron Technology, Inc. | Programming pulse with varying amplitude |
| JPH11297860A (ja) * | 1998-03-26 | 1999-10-29 | Newcore Technol Inc | 半導体記憶装置 |
| US5991201A (en) * | 1998-04-27 | 1999-11-23 | Motorola Inc. | Non-volatile memory with over-program protection and method therefor |
| JPH11328981A (ja) * | 1998-05-12 | 1999-11-30 | Matsushita Electric Ind Co Ltd | 半導体記憶装置,およびレギュレータ |
| US6208542B1 (en) * | 1998-06-30 | 2001-03-27 | Sandisk Corporation | Techniques for storing digital data in an analog or multilevel memory |
| JP2000149582A (ja) * | 1998-09-08 | 2000-05-30 | Toshiba Corp | 昇圧回路,電圧発生回路及び半導体メモリ |
| US6040996A (en) * | 1998-11-16 | 2000-03-21 | Chartered Semiconductor Manufacturing, Ltd. | Constant current programming waveforms for non-volatile memories |
| JP2000173194A (ja) * | 1998-12-10 | 2000-06-23 | Fujitsu Ltd | Pll回路、pll回路の制御装置、及びディスク装置 |
| US6320797B1 (en) * | 1999-02-24 | 2001-11-20 | Micron Technology, Inc. | Method and circuit for regulating the output voltage from a charge pump circuit, and memory device using same |
| JP3863330B2 (ja) * | 1999-09-28 | 2006-12-27 | 株式会社東芝 | 不揮発性半導体メモリ |
| US6927441B2 (en) * | 2001-03-20 | 2005-08-09 | Stmicroelectronics S.R.L. | Variable stage charge pump |
| US6522580B2 (en) * | 2001-06-27 | 2003-02-18 | Sandisk Corporation | Operating techniques for reducing effects of coupling between storage elements of a non-volatile memory operated in multiple data states |
| US6560152B1 (en) * | 2001-11-02 | 2003-05-06 | Sandisk Corporation | Non-volatile memory with temperature-compensated data read |
| US6597603B2 (en) * | 2001-11-06 | 2003-07-22 | Atmel Corporation | Dual mode high voltage power supply for providing increased speed in programming during testing of low voltage non-volatile memories |
| JP3726753B2 (ja) * | 2002-01-23 | 2005-12-14 | セイコーエプソン株式会社 | 不揮発性半導体記憶装置の昇圧回路 |
| JP3700173B2 (ja) * | 2002-05-28 | 2005-09-28 | ソニー株式会社 | 電圧変換制御回路及び方法 |
| TW544989B (en) * | 2002-07-25 | 2003-08-01 | Mediatek Inc | Leakage free automatic gain control device |
| JP4133166B2 (ja) * | 2002-09-25 | 2008-08-13 | 株式会社ルネサステクノロジ | 不揮発性半導体記憶装置 |
| US6882567B1 (en) * | 2002-12-06 | 2005-04-19 | Multi Level Memory Technology | Parallel programming of multiple-bit-per-cell memory cells on a continuous word line |
| US6937520B2 (en) * | 2004-01-21 | 2005-08-30 | Tsuyoshi Ono | Nonvolatile semiconductor memory device |
| US7110298B2 (en) * | 2004-07-20 | 2006-09-19 | Sandisk Corporation | Non-volatile system with program time control |
-
2004
- 2004-07-20 US US10/896,096 patent/US7110298B2/en not_active Expired - Lifetime
-
2005
- 2005-07-08 DE DE602005004027T patent/DE602005004027T2/de not_active Expired - Lifetime
- 2005-07-08 WO PCT/US2005/024701 patent/WO2006019740A1/en not_active Ceased
- 2005-07-08 AT AT05770198T patent/ATE382183T1/de not_active IP Right Cessation
- 2005-07-08 KR KR1020077001555A patent/KR101039238B1/ko not_active Expired - Fee Related
- 2005-07-08 CN CN2005800301648A patent/CN101031978B/zh not_active Expired - Fee Related
- 2005-07-08 EP EP05770198A patent/EP1769508B1/en not_active Expired - Lifetime
- 2005-07-08 JP JP2007522558A patent/JP4995721B2/ja not_active Expired - Fee Related
- 2005-07-20 TW TW094124533A patent/TWI391933B/zh not_active IP Right Cessation
-
2006
- 2006-08-07 US US11/462,920 patent/US7262998B2/en not_active Expired - Fee Related
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2008507802A5 (enExample) | ||
| JP4995721B2 (ja) | プログラム時間制御を有する不揮発性メモリシステム | |
| KR101212739B1 (ko) | 비휘발성 메모리장치 및 이의 동작방법 | |
| CN109428572A (zh) | 半导体装置和半导体装置的断电方法 | |
| US11379394B2 (en) | Methods and devices that utilize hardware to move blocks of operating parameter data from memory to a register set | |
| US7330373B2 (en) | Program time adjustment as function of program voltage for improved programming speed in memory system | |
| CN108053853A (zh) | 字线电压产生电路和方法、编程装置和方法 | |
| WO2023049195A1 (en) | Controller design using stability region | |
| US7327608B2 (en) | Program time adjustment as function of program voltage for improved programming speed in programming method | |
| KR101312503B1 (ko) | 개선된 프로그래밍 속도를 위해 프로그램 전압의 함수로서 프로그램 시간 조절 | |
| JP2009531806A5 (enExample) | ||
| US9762174B2 (en) | Increasing PWM resolution for digitally controlled motor control applications | |
| CN114583924B (zh) | 电路的控制方法、终端及存储介质 | |
| CN111048129B (zh) | 时序校正系统及其方法 | |
| CN106847247B (zh) | 和弦音输出控制方法和系统 | |
| JP2023031078A5 (ja) | 電源制御回路、制御方法、メモリシステム | |
| CN120052617A (zh) | 一种电子烟的加热控制方法和电子烟 | |
| JP6079620B2 (ja) | 電磁弁制御装置 | |
| US7557629B2 (en) | Pulse stream generator | |
| JPH09212475A (ja) | 学習方式 |