JP2008270813A5 - - Google Patents
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- Publication number
- JP2008270813A5 JP2008270813A5 JP2008109120A JP2008109120A JP2008270813A5 JP 2008270813 A5 JP2008270813 A5 JP 2008270813A5 JP 2008109120 A JP2008109120 A JP 2008109120A JP 2008109120 A JP2008109120 A JP 2008109120A JP 2008270813 A5 JP2008270813 A5 JP 2008270813A5
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- circuit
- current
- reference potential
- control
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000000903 blocking effect Effects 0.000 claims 5
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 230000003071 parasitic effect Effects 0.000 claims 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102007018237.8A DE102007018237B4 (de) | 2007-04-18 | 2007-04-18 | Schaltung mit verbessertem ESD-Schutz bei repetierender Pulsbelastung |
| DE102007018237.8 | 2007-04-18 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008270813A JP2008270813A (ja) | 2008-11-06 |
| JP2008270813A5 true JP2008270813A5 (enExample) | 2011-05-06 |
| JP5582686B2 JP5582686B2 (ja) | 2014-09-03 |
Family
ID=39767833
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008109120A Expired - Fee Related JP5582686B2 (ja) | 2007-04-18 | 2008-04-18 | 反復されるパルス負荷のもとでの改善されたesd保護機能を備えた回路 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP5582686B2 (enExample) |
| DE (1) | DE102007018237B4 (enExample) |
| IT (1) | ITMI20080605A1 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104332467A (zh) * | 2014-09-03 | 2015-02-04 | 上海华虹宏力半导体制造有限公司 | 硅控整流器esd保护结构 |
| US9490245B1 (en) * | 2015-06-19 | 2016-11-08 | Qualcomm Incorporated | Circuit and layout for a high density antenna protection diode |
| EP3518284A1 (en) | 2018-01-25 | 2019-07-31 | Nexperia B.V. | Semiconductor device and method of operation |
| FR3098346B1 (fr) * | 2019-07-01 | 2025-08-15 | Wisekey Semiconductors | Procede et dispositif de protection d’un circuit integre contre les decharges electrostatiques |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5982600A (en) | 1998-04-20 | 1999-11-09 | Macronix International Co., Ltd. | Low-voltage triggering electrostatic discharge protection |
| US20050212051A1 (en) | 2003-04-16 | 2005-09-29 | Sarnoff Corporation | Low voltage silicon controlled rectifier (SCR) for electrostatic discharge (ESD) protection of silicon-on-insulator technologies |
| TWI247411B (en) | 2004-07-01 | 2006-01-11 | Toppoly Optoelectronics Corp | Electrostatic discharge protecting device |
| US7592673B2 (en) | 2006-03-31 | 2009-09-22 | Freescale Semiconductor, Inc. | ESD protection circuit with isolated diode element and method thereof |
-
2007
- 2007-04-18 DE DE102007018237.8A patent/DE102007018237B4/de active Active
-
2008
- 2008-04-08 IT IT000605A patent/ITMI20080605A1/it unknown
- 2008-04-18 JP JP2008109120A patent/JP5582686B2/ja not_active Expired - Fee Related
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