JP2008256927A5 - - Google Patents

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Publication number
JP2008256927A5
JP2008256927A5 JP2007098630A JP2007098630A JP2008256927A5 JP 2008256927 A5 JP2008256927 A5 JP 2008256927A5 JP 2007098630 A JP2007098630 A JP 2007098630A JP 2007098630 A JP2007098630 A JP 2007098630A JP 2008256927 A5 JP2008256927 A5 JP 2008256927A5
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JP
Japan
Prior art keywords
optical system
confocal microscope
microscope apparatus
system space
scanning confocal
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Application number
JP2007098630A
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English (en)
Japanese (ja)
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JP2008256927A (ja
JP5047669B2 (ja
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Priority to JP2007098630A priority Critical patent/JP5047669B2/ja
Priority claimed from JP2007098630A external-priority patent/JP5047669B2/ja
Priority to US12/058,956 priority patent/US20080247038A1/en
Publication of JP2008256927A publication Critical patent/JP2008256927A/ja
Publication of JP2008256927A5 publication Critical patent/JP2008256927A5/ja
Application granted granted Critical
Publication of JP5047669B2 publication Critical patent/JP5047669B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2007098630A 2007-04-04 2007-04-04 走査型共焦点顕微鏡装置 Expired - Fee Related JP5047669B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2007098630A JP5047669B2 (ja) 2007-04-04 2007-04-04 走査型共焦点顕微鏡装置
US12/058,956 US20080247038A1 (en) 2007-04-04 2008-03-31 Scanning confocal microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007098630A JP5047669B2 (ja) 2007-04-04 2007-04-04 走査型共焦点顕微鏡装置

Publications (3)

Publication Number Publication Date
JP2008256927A JP2008256927A (ja) 2008-10-23
JP2008256927A5 true JP2008256927A5 (enExample) 2011-03-24
JP5047669B2 JP5047669B2 (ja) 2012-10-10

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ID=39826647

Family Applications (1)

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JP2007098630A Expired - Fee Related JP5047669B2 (ja) 2007-04-04 2007-04-04 走査型共焦点顕微鏡装置

Country Status (2)

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US (1) US20080247038A1 (enExample)
JP (1) JP5047669B2 (enExample)

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WO2007145233A1 (ja) * 2006-06-13 2007-12-21 Nikon Corporation 顕微鏡装置
JP4409586B2 (ja) * 2007-06-20 2010-02-03 オリンパス株式会社 箱型電動顕微鏡
US8282735B2 (en) 2007-11-27 2012-10-09 Asm Genitech Korea Ltd. Atomic layer deposition apparatus
CN101387514B (zh) * 2008-08-28 2010-07-28 上海科勒电子科技有限公司 距离检测感应装置
JP5317672B2 (ja) * 2008-12-19 2013-10-16 三洋電機株式会社 観察ユニット
DE102009016512B4 (de) * 2009-04-08 2011-05-12 Forschungszentrum Jülich GmbH Verfahren und Vorrichtung zur Durchführung einer quantitativen ortsaufgelösten Lokal- und Verteilungsanalyse chemischer Elemente und in-situ Charakterisierung der ablatierten Oberflächenregionen
EP2246725A3 (en) * 2009-04-30 2011-01-26 Olympus Corporation Microscope with fixed imaging unit and movable objective lens
FR2945818A1 (fr) * 2009-05-20 2010-11-26 Pasteur Institut Dispositif pour cultiver in vitro des biofilms et ensemble d'observation non-invasive du developpement de biofilms sur surface inerte ou sur surface vivante par microscopie confocale
EP2312367A1 (en) * 2009-10-16 2011-04-20 Olympus Corporation Laser scanning microscope
JP5638793B2 (ja) 2009-12-03 2014-12-10 オリンパス株式会社 顕微鏡装置
WO2011096181A1 (ja) 2010-02-03 2011-08-11 株式会社ニコン 観察装置及び観察方法
JP5722115B2 (ja) * 2011-05-11 2015-05-20 オリンパス株式会社 走査型顕微鏡装置
CN103048300A (zh) * 2012-12-17 2013-04-17 江苏大学 一种激光扫描共聚焦显微镜
GB201318919D0 (en) * 2013-10-25 2013-12-11 Isis Innovation Compact microscope
DE102014101172A1 (de) * 2014-01-30 2015-07-30 Jpk Instruments Ag Anordnung für ein optisches Messsystem zum Bestimmen einer Probe und Probenkammeranordnung
JP6146335B2 (ja) * 2014-02-17 2017-06-14 ソニー株式会社 走査ユニット、レーザ走査型顕微鏡及び温度調節方法
JP6270560B2 (ja) * 2014-03-14 2018-01-31 オリンパス株式会社 培養顕微鏡
DE112015001461B4 (de) * 2014-05-29 2022-07-07 Hitachi High-Tech Corporation Mikroskopbetrachtungsbehälter und dessen Verwendung
CN105445227B (zh) * 2014-08-29 2019-04-02 清华大学 一种观测一维纳米材料的方法及装置
US9892893B2 (en) * 2015-03-23 2018-02-13 Molecular Devices, Llc Cooled photomultiplier tube based light detector with reduced condensation, and related apparatuses and methods
GB201507021D0 (en) 2015-04-24 2015-06-10 Isis Innovation Compact microscope
JP6438364B2 (ja) * 2015-08-17 2018-12-12 浜松ホトニクス株式会社 測定装置
AU2019297911B2 (en) * 2018-07-06 2025-01-23 Nipro Corporation Observation device
JP6982198B2 (ja) * 2018-09-27 2021-12-17 富士フイルム株式会社 観察装置および方法並びに観察装置制御プログラム
JP7168911B2 (ja) * 2019-01-29 2022-11-10 株式会社島津製作所 撮像環境測定器および撮像環境測定システム
GB201907953D0 (en) 2019-06-04 2019-07-17 Smi Drug Discovery Ltd An optical microscope
EP3872555A1 (en) * 2020-02-25 2021-09-01 Leica Instruments (Singapore) Pte. Ltd. Microscope stand and module and housing therefor
EP3904938B1 (en) * 2020-04-28 2025-10-15 Leica Microsystems CMS GmbH System for microscopic examination of an incubated sample
DE102020120790B4 (de) 2020-08-06 2022-09-08 Leica Microsystems Cms Gmbh Inverses Mikroskop mit Inkubationsraum und Temperatursensor
EP4092468A1 (en) * 2021-05-17 2022-11-23 Leica Microsystems CMS GmbH Controlling system and examination system for microscopic examination of a sample and corresponding methods
DE102023123481B3 (de) 2023-08-31 2024-09-12 Histolution GmbH Sicherheitsvorrichtung für ein Lasermikroskop und Lasermikroskop mit einer solchen Sicherheitsvorrichtung
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JP2524574B2 (ja) * 1985-03-27 1996-08-14 オリンパス光学工業株式会社 走査型光学顕微鏡
JP2004070307A (ja) * 2002-06-11 2004-03-04 Olympus Corp 液浸媒質供給装置、蛍光分光検査装置及び培養顕微鏡
JP4546019B2 (ja) * 2002-07-03 2010-09-15 株式会社日立製作所 露光装置
JP2004170573A (ja) * 2002-11-19 2004-06-17 Keyence Corp カラー共焦点顕微鏡システムとその調整に使用される二次元テストパターン
JP2004317661A (ja) * 2003-04-14 2004-11-11 Olympus Corp マイクロプレート、クリーニングプレート、光分析装置および倒立型顕微鏡
JP2005003992A (ja) * 2003-06-12 2005-01-06 Olympus Corp 試料支持装置
US7706863B2 (en) * 2004-01-21 2010-04-27 University Of Washington Methods for assessing a physiological state of a mammalian retina
JP4819383B2 (ja) * 2004-03-26 2011-11-24 オリンパス株式会社 光学顕微鏡と光学的観察方法
US20050282268A1 (en) * 2004-05-26 2005-12-22 Olympus Corporation Culture microscope and computer program controlling culture microscope
JP2006025789A (ja) * 2004-06-17 2006-02-02 Olympus Corp 生体試料観察システムおよび生体試料の観察方法
JP3837145B2 (ja) * 2004-07-07 2006-10-25 オリンパス株式会社 顕微鏡撮像装置
DE102004058565B4 (de) * 2004-10-18 2022-04-21 Leica Microsystems Cms Gmbh Scanmikroskop
JP4767536B2 (ja) * 2004-12-28 2011-09-07 オリンパス株式会社 培養観察装置
JP2006201605A (ja) * 2005-01-21 2006-08-03 Nikon Corp 顕微鏡観察装置
JP4669302B2 (ja) * 2005-02-24 2011-04-13 富士通株式会社 レンズカバー

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