JP2008198355A - 半導体集積回路装置 - Google Patents
半導体集積回路装置 Download PDFInfo
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- JP2008198355A JP2008198355A JP2008130915A JP2008130915A JP2008198355A JP 2008198355 A JP2008198355 A JP 2008198355A JP 2008130915 A JP2008130915 A JP 2008130915A JP 2008130915 A JP2008130915 A JP 2008130915A JP 2008198355 A JP2008198355 A JP 2008198355A
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Abstract
【解決手段】 アドレスにより選択される範囲の容量を越える容量のメモリセル列が配置されたメモリセルアレイを有するメモリ部1と、アドレスを変換してメモリ部1のメモリセル選択を行うアドレス変換回路2とを備え、アドレス変換回路2は、不良メモリセルの分布に応じて、不良メモリセル列を含んで不良メモリセル列より多いメモリセル列を他の正常なメモリセル列で置換するようにアドレスとメモリセル列の対応関係が固定される。
【選択図】図2
Description
Claims (1)
- Nビットの外部アドレスから変換されたN+1ビットの変換アドレスにより選択可能な2N個よりも多いM個のメモリセル列により構成されるメモリセルアレイを有するメモリ部と、
前記Nビットの外部アドレスを、前記M個のメモリセル列から不良メモリセル列を避けて2N個以下のメモリセル列を選択する前記N+1ビットの変換アドレスに変換するアドレス変換回路と
を備え、
前記アドレス変換回路は、
外部アドレスが供給される一次アドレス信号線と、
前記メモリ部のメモリセル選択に必要な、前記外部アドレスより1ビットだけビット数の大きい変換アドレスを発生することを可能とした二次アドレス信号線と、
前記一次アドレス信号線と二次アドレス信号線との間での間でアドレス一次変換を行うプログラマブル論理アレイと
を有することを特徴とする半導体集積回路装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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JP2008130915A JP4786682B2 (ja) | 2008-05-19 | 2008-05-19 | 半導体集積回路装置 |
Applications Claiming Priority (1)
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JP2008130915A JP4786682B2 (ja) | 2008-05-19 | 2008-05-19 | 半導体集積回路装置 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2000065522A Division JP2001256793A (ja) | 2000-03-09 | 2000-03-09 | 半導体集積回路装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2008198355A true JP2008198355A (ja) | 2008-08-28 |
JP2008198355A5 JP2008198355A5 (ja) | 2009-03-05 |
JP4786682B2 JP4786682B2 (ja) | 2011-10-05 |
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JP2008130915A Expired - Fee Related JP4786682B2 (ja) | 2008-05-19 | 2008-05-19 | 半導体集積回路装置 |
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JP (1) | JP4786682B2 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012505491A (ja) * | 2008-10-07 | 2012-03-01 | マイクロン テクノロジー, インク. | スタック型デバイスの再マッピングおよび補修 |
US10878933B2 (en) | 2013-03-15 | 2020-12-29 | Micron Technology, Inc. | Apparatuses and methods for memory testing and repair |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6114540B2 (ja) * | 1976-06-23 | 1986-04-19 | Fujitsu Ltd | |
JPS61157943A (ja) * | 1984-12-28 | 1986-07-17 | Matsushita Electric Ind Co Ltd | マイクロプログラム制御計算機 |
JPH05189327A (ja) * | 1992-01-17 | 1993-07-30 | Fujitsu Ltd | 集積回路の内蔵メモリ故障時の救済方法 |
JP2000021190A (ja) * | 1998-07-06 | 2000-01-21 | Toshiba Corp | 半導体記憶装置 |
-
2008
- 2008-05-19 JP JP2008130915A patent/JP4786682B2/ja not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6114540B2 (ja) * | 1976-06-23 | 1986-04-19 | Fujitsu Ltd | |
JPS61157943A (ja) * | 1984-12-28 | 1986-07-17 | Matsushita Electric Ind Co Ltd | マイクロプログラム制御計算機 |
JPH05189327A (ja) * | 1992-01-17 | 1993-07-30 | Fujitsu Ltd | 集積回路の内蔵メモリ故障時の救済方法 |
JP2000021190A (ja) * | 1998-07-06 | 2000-01-21 | Toshiba Corp | 半導体記憶装置 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012505491A (ja) * | 2008-10-07 | 2012-03-01 | マイクロン テクノロジー, インク. | スタック型デバイスの再マッピングおよび補修 |
US8787101B2 (en) | 2008-10-07 | 2014-07-22 | Micron Technology, Inc. | Stacked device remapping and repair |
US10878933B2 (en) | 2013-03-15 | 2020-12-29 | Micron Technology, Inc. | Apparatuses and methods for memory testing and repair |
Also Published As
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JP4786682B2 (ja) | 2011-10-05 |
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