JP2008066680A5 - - Google Patents

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Publication number
JP2008066680A5
JP2008066680A5 JP2006246176A JP2006246176A JP2008066680A5 JP 2008066680 A5 JP2008066680 A5 JP 2008066680A5 JP 2006246176 A JP2006246176 A JP 2006246176A JP 2006246176 A JP2006246176 A JP 2006246176A JP 2008066680 A5 JP2008066680 A5 JP 2008066680A5
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JP
Japan
Prior art keywords
film
barrier film
copper
forming
manufacturing
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JP2006246176A
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English (en)
Japanese (ja)
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JP5214125B2 (ja
JP2008066680A (ja
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Priority to JP2006246176A priority Critical patent/JP5214125B2/ja
Priority claimed from JP2006246176A external-priority patent/JP5214125B2/ja
Publication of JP2008066680A publication Critical patent/JP2008066680A/ja
Publication of JP2008066680A5 publication Critical patent/JP2008066680A5/ja
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Publication of JP5214125B2 publication Critical patent/JP5214125B2/ja
Expired - Fee Related legal-status Critical Current
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JP2006246176A 2006-09-11 2006-09-11 配線構造と配線形成方法及び薄膜トランジスタ基板とその製造方法 Expired - Fee Related JP5214125B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006246176A JP5214125B2 (ja) 2006-09-11 2006-09-11 配線構造と配線形成方法及び薄膜トランジスタ基板とその製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006246176A JP5214125B2 (ja) 2006-09-11 2006-09-11 配線構造と配線形成方法及び薄膜トランジスタ基板とその製造方法

Publications (3)

Publication Number Publication Date
JP2008066680A JP2008066680A (ja) 2008-03-21
JP2008066680A5 true JP2008066680A5 (enrdf_load_stackoverflow) 2009-10-15
JP5214125B2 JP5214125B2 (ja) 2013-06-19

Family

ID=39289074

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006246176A Expired - Fee Related JP5214125B2 (ja) 2006-09-11 2006-09-11 配線構造と配線形成方法及び薄膜トランジスタ基板とその製造方法

Country Status (1)

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JP (1) JP5214125B2 (enrdf_load_stackoverflow)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3227353B2 (ja) * 1995-07-13 2001-11-12 東芝セラミックス株式会社 炭化珪素膜被覆部材及びその製造方法
KR20070049278A (ko) * 2005-11-08 2007-05-11 삼성전자주식회사 배선, 이를 포함하는 박막 트랜지스터 기판과 그 제조 방법
JP5412026B2 (ja) * 2006-09-11 2014-02-12 三星ディスプレイ株式會社 配線構造と配線形成方法及び薄膜トランジスタ基板とその製造方法
US8105937B2 (en) * 2008-08-13 2012-01-31 International Business Machines Corporation Conformal adhesion promoter liner for metal interconnects
US9715845B2 (en) * 2009-09-16 2017-07-25 Semiconductor Energy Laboratory Co., Ltd. Semiconductor display device
CN102598278B (zh) * 2009-10-09 2015-04-08 株式会社半导体能源研究所 半导体器件
US8736793B2 (en) 2010-02-24 2014-05-27 Sharp Kabushiki Kaisha Liquid crystal display panel, and liquid crystal display device
JP2011258871A (ja) * 2010-06-11 2011-12-22 Fujitsu Ltd 回路基板及びその製造方法
KR101975263B1 (ko) * 2012-02-07 2019-05-08 삼성디스플레이 주식회사 박막트랜지스터 표시판과 이를 제조하는 방법
US9166054B2 (en) * 2012-04-13 2015-10-20 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2606548B2 (ja) * 1993-04-27 1997-05-07 日本電気株式会社 Cu配線およびその形成方法
JPH10133597A (ja) * 1996-07-26 1998-05-22 Canon Inc 配線基板、該配線基板の製造方法、該配線基板を備えた液晶素子及び該液晶素子の製造方法
US6111619A (en) * 1999-05-27 2000-08-29 Sharp Laboratories Of America, Inc. Method of forming polycrystalline silicon TFTs with TiN/Cu/TiN interconnections for a liquid crystal display pixel array
TW451447B (en) * 1999-12-31 2001-08-21 Samsung Electronics Co Ltd Contact structures of wirings and methods for manufacturing the same, and thin film transistor array panels including the same and methods for manufacturing the same
KR20070049278A (ko) * 2005-11-08 2007-05-11 삼성전자주식회사 배선, 이를 포함하는 박막 트랜지스터 기판과 그 제조 방법
JP5412026B2 (ja) * 2006-09-11 2014-02-12 三星ディスプレイ株式會社 配線構造と配線形成方法及び薄膜トランジスタ基板とその製造方法

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