JP2008039777A - 撮像装置の内部の偏極を低減する方法及び装置 - Google Patents

撮像装置の内部の偏極を低減する方法及び装置 Download PDF

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Publication number
JP2008039777A
JP2008039777A JP2007198408A JP2007198408A JP2008039777A JP 2008039777 A JP2008039777 A JP 2008039777A JP 2007198408 A JP2007198408 A JP 2007198408A JP 2007198408 A JP2007198408 A JP 2007198408A JP 2008039777 A JP2008039777 A JP 2008039777A
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Japan
Prior art keywords
detector
temperature
heat
detection device
image detection
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Pending
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JP2007198408A
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English (en)
Japanese (ja)
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JP2008039777A5 (https=
Inventor
Jean-Paul Bouhnik
ジャン−ポール・ブーニク
Alexander G Fishler
アレキサンダー・ガブリエル・フィシュラー
Hernan Altman
ヘルナン・アルトマン
Uzi Dror
ウジ・ドロアー
Ira Blevis
イラ・ブレヴィス
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GE Medical Systems Israel Ltd
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GE Medical Systems Israel Ltd
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Application filed by GE Medical Systems Israel Ltd filed Critical GE Medical Systems Israel Ltd
Publication of JP2008039777A publication Critical patent/JP2008039777A/ja
Publication of JP2008039777A5 publication Critical patent/JP2008039777A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00—Control of temperature
    • G05D23/19—Control of temperature characterised by the use of electric means
    • G05D23/20—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature
    • G05D23/24—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature the sensing element having a resistance varying with temperature, e.g. a thermistor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/244—Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays

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  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Automation & Control Theory (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2007198408A 2006-08-03 2007-07-31 撮像装置の内部の偏極を低減する方法及び装置 Pending JP2008039777A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/498,589 US7514692B2 (en) 2005-06-22 2006-08-03 Method and apparatus for reducing polarization within an imaging device

Publications (2)

Publication Number Publication Date
JP2008039777A true JP2008039777A (ja) 2008-02-21
JP2008039777A5 JP2008039777A5 (https=) 2011-08-18

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ID=38885195

Family Applications (1)

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JP2007198408A Pending JP2008039777A (ja) 2006-08-03 2007-07-31 撮像装置の内部の偏極を低減する方法及び装置

Country Status (5)

Country Link
US (1) US7514692B2 (https=)
JP (1) JP2008039777A (https=)
CN (1) CN101116620B (https=)
DE (1) DE102007036821A1 (https=)
IL (1) IL184912A0 (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012000386A (ja) * 2010-06-21 2012-01-05 Toshiba Corp Ｘ線ｃｔ装置
JP2017504792A (ja) * 2013-12-20 2017-02-09 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． デジタルポジトロン放出断層撮影（ｐｅｔ）検出器の温度安定性の向上

Families Citing this family (20)

* Cited by examiner, † Cited by third party
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DE102007054832A1 (de) * 2007-11-16 2009-05-14 Siemens Ag Flachbilddetektor mit Temperatursensor
US20100316184A1 (en) * 2008-10-17 2010-12-16 Jan Iwanczyk Silicon photomultiplier detector for computed tomography
DE102009018877B4 (de) * 2008-11-25 2016-07-28 Siemens Healthcare Gmbh Röntgenstrahlungsdetektor zur Verwendung in einem CT-System
US8532250B2 (en) * 2010-02-24 2013-09-10 Kabushiki Kaisha Toshiba X-ray CT apparatus and control method for X-ray CT apparatus
JP5613487B2 (ja) 2010-07-22 2014-10-22 株式会社東芝 Ｘ線ｃｔ装置
JP2012034848A (ja) * 2010-08-06 2012-02-23 Toshiba Corp Ｘ線検出器およびｘ線ｃｔ装置
JP2014519026A (ja) 2011-05-11 2014-08-07 コーニンクレッカ フィリップス エヌ ヴェ 電離放射線の検出
DE102012204766B4 (de) * 2012-03-26 2015-07-02 Siemens Aktiengesellschaft Röntgendetektor mit photonenzählenden direktwandelnden Detektorelementen und Verfahren zur Temperaturkonstanthaltung des Röntgendetektors
DE102012213404B3 (de) * 2012-07-31 2014-01-23 Siemens Aktiengesellschaft Verfahren zur Temperaturstabilisierung, Röntgenstrahlungsdetektor und CT-System
JP2014210047A (ja) * 2013-04-18 2014-11-13 株式会社東芝 Ｘ線ｃｔ装置
DE102013214684B4 (de) * 2013-07-26 2016-12-22 Siemens Healthcare Gmbh Direktkonvertierender Röntgendetektor
CN104337533A (zh) * 2013-07-31 2015-02-11 Ge医疗系统环球技术有限公司 计算机断层扫描设备及用于该设备的加热单元和方法
KR20150036840A (ko) 2013-09-27 2015-04-08 삼성전자주식회사 엑스선 검출기 및 이를 포함한 엑스선 촬영 장치
US9229115B2 (en) 2013-12-20 2016-01-05 Koninklijke Philips N.V. Temperature stability for a digital positron emission tomography (PET) detector
JP6050561B1 (ja) * 2014-09-26 2016-12-21 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 加熱装置を有する放射線検出器、それを動作させる方法及びそれを有するイメージング装置
US9746565B2 (en) 2016-01-13 2017-08-29 General Electric Company Systems and methods for reducing polarization in imaging detectors
US9989654B2 (en) 2016-01-13 2018-06-05 General Electric Company Systems and methods for reducing polarization in imaging detectors
CN108415483A (zh) * 2018-03-23 2018-08-17 中科美其（天津）科技有限公司 摄影测量装置
KR102671817B1 (ko) * 2018-03-29 2024-05-31 루메니스 비 리미티드 건조한 눈의 처치를 위한 장치 및 방법
DE102023202424A1 (de) * 2023-03-20 2024-09-26 Siemens Healthineers Ag Detektormodul für einen Röntgendetektor mit einer Heizschicht

Citations (3)

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Publication number Priority date Publication date Assignee Title
JPS6484176A (en) * 1987-09-28 1989-03-29 Matsushita Electric Industrial Co Ltd Semiconductor radiation detector
JPH04110691A (ja) * 1990-08-30 1992-04-13 Shimadzu Corp 放射線検出器
JP2002202377A (ja) * 2001-01-05 2002-07-19 Shimadzu Corp 放射線検出器

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US6011264A (en) * 1994-08-11 2000-01-04 Urigal Technologies, Ltd. Apparatus, system and method for gamma ray and x-ray detection
US6399951B1 (en) 2000-02-02 2002-06-04 Ut-Battelle, Llc Simultaneous CT and SPECT tomography using CZT detectors
US6404547B1 (en) * 2000-03-01 2002-06-11 Raytheon Company Semi-active focus and thermal compensation of a centrally-obscured reflective telescope
JP2003014860A (ja) * 2001-06-29 2003-01-15 Toshiba Corp 放射線検出器および放射線検査装置
US20040022351A1 (en) * 2002-07-30 2004-02-05 Ge Medical Systems Global Technology Company, Llc Thermoelectrically controlled x-ray detector array
US20040120383A1 (en) * 2002-12-19 2004-06-24 The Boeing Company Non-destructive testing system and method using current flow thermography
CN100437146C (zh) * 2003-10-22 2008-11-26 皇家飞利浦电子股份有限公司 恢复半导体探测器的性能的方法和设备

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6484176A (en) * 1987-09-28 1989-03-29 Matsushita Electric Industrial Co Ltd Semiconductor radiation detector
JPH04110691A (ja) * 1990-08-30 1992-04-13 Shimadzu Corp 放射線検出器
JP2002202377A (ja) * 2001-01-05 2002-07-19 Shimadzu Corp 放射線検出器

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012000386A (ja) * 2010-06-21 2012-01-05 Toshiba Corp Ｘ線ｃｔ装置
JP2017504792A (ja) * 2013-12-20 2017-02-09 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． デジタルポジトロン放出断層撮影（ｐｅｔ）検出器の温度安定性の向上

Also Published As

Publication number Publication date
CN101116620B (zh) 2011-07-06
US20070029496A1 (en) 2007-02-08
US7514692B2 (en) 2009-04-07
IL184912A0 (en) 2008-01-06
CN101116620A (zh) 2008-02-06
DE102007036821A1 (de) 2008-02-07

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