JP5010190B2 - 画像検出装置及び、イメージング・システム - Google Patents
画像検出装置及び、イメージング・システム Download PDFInfo
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- JP5010190B2 JP5010190B2 JP2006169803A JP2006169803A JP5010190B2 JP 5010190 B2 JP5010190 B2 JP 5010190B2 JP 2006169803 A JP2006169803 A JP 2006169803A JP 2006169803 A JP2006169803 A JP 2006169803A JP 5010190 B2 JP5010190 B2 JP 5010190B2
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Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/244—Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Solid State Image Pick-Up Elements (AREA)
Description
12 ガントリ
14 X線源
16 X線
18 スライス検出器アレイ
20 検出器素子
22 患者配置
24 回転中心
26 制御機構
28 X線制御器
30 ガントリ・モータ制御器
32 DAS
34 画像再構成器
36 コンピュータ
38 記憶装置
40 コンソール
42 表示器
44 テーブル・モータ制御器
46 電動式テーブル
48 ガントリ開口
50 読み取り及び受け取り装置
52 コンピュータ読み取り可能な媒体
60 高温
100 検出器
102 検出器素子
104 基材
108 ピクセル電極
110 第一の表面
112 第二の表面
114 長手軸
140 線源
144 フォトン
154 カソード
156 電子
158 正孔
160 読み出し電子回路
200 方法
202 結合するステップ
204 加熱するステップ
300 遮断接点
310 熱源
312 加熱装置
314 第一及び第二の層
316 第二の層
318 発熱体
320 加熱装置
322 ファン・アセンブリ
324 発熱装置
400 断熱層
402 底面
404 第一の側面
406 第二の側面
408 第三の側面
410 第四の側面
412 上面
Claims (10)
- 基材と、
該基材に結合されている遮断接点(300)と、
当該画像検出装置内部の分極を低減するのを容易にするために前記基材の温度を高めるように構成されている熱源(310)と、
を備え、
前記熱源(310)は、前記遮断接点(300)に熱的に接続するように前記遮断接点(300)に結合された発熱体(318)を含んでおり、該発熱体(318)は前記画像検出装置の動作温度を高めるように構成されている、画像検出装置(20)。 - 前記基材はカドミウム亜鉛テルライド(CZT)を含んでいる、請求項1に記載の画像検出装置(20)。
- 前記遮断接点(312)は金材料及び白金材料の少なくとも一方を含んでいる、請求項1又は2に記載の画像検出装置(20)。
- 前記基材の少なくとも一部を包囲しており、当該画像検出装置内部の前記高められた温度を保つのを容易にするように構成されている断熱材(400)をさらに含んでいる請求項1乃至3のいずれかに記載の画像検出装置(20)。
- 前記熱源は、
前記基材に隣接して結合されている発熱装置(310)と、
空気の温度を高めるのを容易にするために前記発熱装置(400)を通る空気流を運搬すると共に、当該画像検出装置の前記動作温度を高めるのを容易にするために前記基材に前記熱せられた空気流を運搬するように構成されているファン・アセンブリ(322)と、
を含んでいる、請求項1に記載の画像検出装置(20)。 - 前記熱源(310)は、前記基材の内部温度を約10℃〜約100℃まで高めるように構成されている、請求項1に記載の画像検出装置(20)。
- 前記熱源(310)は、前記遮断接点(300)の上部に配置されている加熱装置(312)を含み、該加熱装置(312)は、第一の電気的絶縁層(314)、第二の電気的絶縁層(316)及び、該第一及び第二の電気的絶縁層(314、316)の間に配置されている前記発熱体(318)を含んでいる、請求項1乃至6のいずれかに記載の画像検出装置(20)。
- フォトン束を放出するように構成されている放射線源と、
前記フォトン束を受け取って該フォトン束に基づいて応答を発生するように構成されている画像検出装置(20)と、
を備えたイメージング・システム(10)であって、前記画像検出装置は、
カドミウム亜鉛テルライド(CZT)を用いて作製された基材と、
該基材に結合されている遮断接点(300)と、
当該画像検出装置内部の分極を低減するのを容易にするために前記基材の温度を高めるように構成されている熱源(310)と、
を含み、
前記熱源(310)は、前記遮断接点(300)に熱的に接続するように前記遮断接点(300)に結合された発熱体(318)を含んでおり、該発熱体(318)は前記画像検出装置の動作温度を高めるように構成されている、イメージング・システム(10)。 - 前記遮断接点(300)は金材料及び白金材料の少なくとも一方を含んでいる、請求項8に記載のイメージング・システム(10)。
- 前記熱源(310)は、前記遮断接点(300)の上部に配置されている加熱装置(312)を含み、該加熱装置(312)は、第一の電気的絶縁層(314)、第二の電気的絶縁層(316)及び、該第一及び第二の電気的絶縁層(314、316)の間に配置されている前記発熱体(318)を含んでいる、請求項8または9に記載のイメージング・システム(10)。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/159,374 | 2005-06-22 | ||
US11/159,374 US7312458B2 (en) | 2005-06-22 | 2005-06-22 | Method and apparatus for reducing polarization within an imaging device |
Publications (2)
Publication Number | Publication Date |
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JP2007000626A JP2007000626A (ja) | 2007-01-11 |
JP5010190B2 true JP5010190B2 (ja) | 2012-08-29 |
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Application Number | Title | Priority Date | Filing Date |
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JP2006169803A Expired - Fee Related JP5010190B2 (ja) | 2005-06-22 | 2006-06-20 | 画像検出装置及び、イメージング・システム |
Country Status (5)
Country | Link |
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US (1) | US7312458B2 (ja) |
JP (1) | JP5010190B2 (ja) |
CN (1) | CN1895171B (ja) |
DE (1) | DE102006029104A1 (ja) |
IL (1) | IL176405A (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11504079B2 (en) | 2016-11-30 | 2022-11-22 | The Research Foundation For The State University Of New York | Hybrid active matrix flat panel detector system and method |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8258482B2 (en) * | 2008-05-28 | 2012-09-04 | Lawrence Livermore National Security, Llc | Energy resolution in semiconductor gamma radiation detectors using heterojunctions and methods of use and preparation thereof |
US8093094B2 (en) * | 2008-06-12 | 2012-01-10 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Blocking contacts for N-type cadmium zinc telluride |
US20100078559A1 (en) * | 2008-09-26 | 2010-04-01 | Csaba Szeles | Infra-red light stimulated high-flux semiconductor x-ray and gamma-ray radiation detector |
DE102008051045B4 (de) * | 2008-10-09 | 2016-02-11 | Siemens Aktiengesellschaft | Strahlungsdirektkonverter |
JP4747195B2 (ja) * | 2008-11-19 | 2011-08-17 | 株式会社日立製作所 | 放射線計測回路,核医学診断装置,放射線計測方法 |
DE102009018877B4 (de) * | 2008-11-25 | 2016-07-28 | Siemens Healthcare Gmbh | Röntgenstrahlungsdetektor zur Verwendung in einem CT-System |
US8463363B2 (en) | 2011-01-11 | 2013-06-11 | General Electric Company | SPECT image reconstruction methods and systems |
US8927937B2 (en) | 2011-05-11 | 2015-01-06 | Koninklijke Philips N.V. | Ionizing radiation detection |
CN105026958B (zh) | 2013-03-01 | 2019-05-31 | 皇家飞利浦有限公司 | 半导体辐射探测器 |
JP2014210047A (ja) * | 2013-04-18 | 2014-11-13 | 株式会社東芝 | X線ct装置 |
DE102013214684B4 (de) * | 2013-07-26 | 2016-12-22 | Siemens Healthcare Gmbh | Direktkonvertierender Röntgendetektor |
KR20150036840A (ko) * | 2013-09-27 | 2015-04-08 | 삼성전자주식회사 | 엑스선 검출기 및 이를 포함한 엑스선 촬영 장치 |
WO2015092630A1 (en) * | 2013-12-20 | 2015-06-25 | Koninklijke Philips N.V. | Improved temperature stability for a digital positron emission tomography (pet) detector |
CN109601011B (zh) * | 2016-08-11 | 2023-04-21 | 棱镜传感器公司 | 具有减少功耗的光子计数探测器 |
JP7152209B2 (ja) * | 2017-07-20 | 2022-10-12 | キヤノンメディカルシステムズ株式会社 | X線ct装置 |
CN115052116B (zh) * | 2022-06-14 | 2023-09-19 | 无锡鉴微华芯科技有限公司 | 像素单元非均匀分布的厚硅像素探测器及制备方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3824680A (en) * | 1968-03-28 | 1974-07-23 | Levina Fizichesky I I Lebedeva | Nuclear radiation detector and method of manufacturing same |
US6114696A (en) | 1986-07-14 | 2000-09-05 | Lockheed Martin Corporation | Uncooled infrared detector |
JPH0627852B2 (ja) * | 1990-08-30 | 1994-04-13 | 株式会社島津製作所 | 放射線検出器 |
EP0473125B1 (en) * | 1990-08-30 | 1996-01-31 | Shimadzu Corporation | Radiation detector |
US6373062B1 (en) | 1999-06-30 | 2002-04-16 | Siemens Medical Solutions Usa, Inc. | Interdigital photodetector for indirect x-ray detection in a radiography imaging system |
JP2002202377A (ja) * | 2001-01-05 | 2002-07-19 | Shimadzu Corp | 放射線検出器 |
JP2003014860A (ja) * | 2001-06-29 | 2003-01-15 | Toshiba Corp | 放射線検出器および放射線検査装置 |
JP2003294844A (ja) * | 2002-04-03 | 2003-10-15 | Hitachi Ltd | X線センサ信号処理回路及びx線ct装置 |
US7154100B2 (en) * | 2002-12-13 | 2006-12-26 | Konstantinos Spartiotis | Switching/depolarizing power supply for a radiation imaging device |
-
2005
- 2005-06-22 US US11/159,374 patent/US7312458B2/en active Active
-
2006
- 2006-06-19 IL IL176405A patent/IL176405A/en active IP Right Grant
- 2006-06-20 JP JP2006169803A patent/JP5010190B2/ja not_active Expired - Fee Related
- 2006-06-22 CN CN2006101064716A patent/CN1895171B/zh active Active
- 2006-06-22 DE DE102006029104A patent/DE102006029104A1/de not_active Withdrawn
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11504079B2 (en) | 2016-11-30 | 2022-11-22 | The Research Foundation For The State University Of New York | Hybrid active matrix flat panel detector system and method |
Also Published As
Publication number | Publication date |
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US7312458B2 (en) | 2007-12-25 |
CN1895171B (zh) | 2010-05-12 |
DE102006029104A1 (de) | 2007-01-18 |
IL176405A0 (en) | 2006-10-05 |
US20060289773A1 (en) | 2006-12-28 |
CN1895171A (zh) | 2007-01-17 |
IL176405A (en) | 2010-06-16 |
JP2007000626A (ja) | 2007-01-11 |
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