CN101116620B - 用于减少成像设备中极化作用的方法和装置 - Google Patents

用于减少成像设备中极化作用的方法和装置 Download PDF

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Publication number
CN101116620B
CN101116620B CN200710149416XA CN200710149416A CN101116620B CN 101116620 B CN101116620 B CN 101116620B CN 200710149416X A CN200710149416X A CN 200710149416XA CN 200710149416 A CN200710149416 A CN 200710149416A CN 101116620 B CN101116620 B CN 101116620B
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China
Prior art keywords
image detecting
detector
temperature
ohmic contact
thermal source
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Expired - Fee Related
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CN200710149416XA
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English (en)
Chinese (zh)
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CN101116620A (zh
Inventor
J·-P·布尼克
A·G·费什勒
H·阿尔特曼
U·德罗尔
I·布列维斯
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GE Medical Systems Israel Ltd
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GE Medical Systems Israel Ltd
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00—Control of temperature
    • G05D23/19—Control of temperature characterised by the use of electric means
    • G05D23/20—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature
    • G05D23/24—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature the sensing element having a resistance varying with temperature, e.g. a thermistor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/244—Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays

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  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Automation & Control Theory (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
CN200710149416XA 2006-08-03 2007-08-03 用于减少成像设备中极化作用的方法和装置 Expired - Fee Related CN101116620B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/498,589 US7514692B2 (en) 2005-06-22 2006-08-03 Method and apparatus for reducing polarization within an imaging device
US11/498589 2006-08-03

Publications (2)

Publication Number Publication Date
CN101116620A CN101116620A (zh) 2008-02-06
CN101116620B true CN101116620B (zh) 2011-07-06

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CN200710149416XA Expired - Fee Related CN101116620B (zh) 2006-08-03 2007-08-03 用于减少成像设备中极化作用的方法和装置

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US (1) US7514692B2 (https=)
JP (1) JP2008039777A (https=)
CN (1) CN101116620B (https=)
DE (1) DE102007036821A1 (https=)
IL (1) IL184912A0 (https=)

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DE102007054832A1 (de) * 2007-11-16 2009-05-14 Siemens Ag Flachbilddetektor mit Temperatursensor
US20100316184A1 (en) * 2008-10-17 2010-12-16 Jan Iwanczyk Silicon photomultiplier detector for computed tomography
DE102009018877B4 (de) * 2008-11-25 2016-07-28 Siemens Healthcare Gmbh Röntgenstrahlungsdetektor zur Verwendung in einem CT-System
US8532250B2 (en) * 2010-02-24 2013-09-10 Kabushiki Kaisha Toshiba X-ray CT apparatus and control method for X-ray CT apparatus
JP5595804B2 (ja) * 2010-06-21 2014-09-24 株式会社東芝 Ｘ線ｃｔ装置
JP5613487B2 (ja) 2010-07-22 2014-10-22 株式会社東芝 Ｘ線ｃｔ装置
JP2012034848A (ja) * 2010-08-06 2012-02-23 Toshiba Corp Ｘ線検出器およびｘ線ｃｔ装置
JP2014519026A (ja) 2011-05-11 2014-08-07 コーニンクレッカ フィリップス エヌ ヴェ 電離放射線の検出
DE102012204766B4 (de) * 2012-03-26 2015-07-02 Siemens Aktiengesellschaft Röntgendetektor mit photonenzählenden direktwandelnden Detektorelementen und Verfahren zur Temperaturkonstanthaltung des Röntgendetektors
DE102012213404B3 (de) * 2012-07-31 2014-01-23 Siemens Aktiengesellschaft Verfahren zur Temperaturstabilisierung, Röntgenstrahlungsdetektor und CT-System
JP2014210047A (ja) * 2013-04-18 2014-11-13 株式会社東芝 Ｘ線ｃｔ装置
DE102013214684B4 (de) * 2013-07-26 2016-12-22 Siemens Healthcare Gmbh Direktkonvertierender Röntgendetektor
CN104337533A (zh) * 2013-07-31 2015-02-11 Ge医疗系统环球技术有限公司 计算机断层扫描设备及用于该设备的加热单元和方法
KR20150036840A (ko) 2013-09-27 2015-04-08 삼성전자주식회사 엑스선 검출기 및 이를 포함한 엑스선 촬영 장치
JP6297700B2 (ja) * 2013-12-20 2018-03-20 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． デジタルポジトロン放出断層撮影（ｐｅｔ）検出器の温度安定性の向上
US9229115B2 (en) 2013-12-20 2016-01-05 Koninklijke Philips N.V. Temperature stability for a digital positron emission tomography (PET) detector
JP6050561B1 (ja) * 2014-09-26 2016-12-21 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 加熱装置を有する放射線検出器、それを動作させる方法及びそれを有するイメージング装置
US9746565B2 (en) 2016-01-13 2017-08-29 General Electric Company Systems and methods for reducing polarization in imaging detectors
US9989654B2 (en) 2016-01-13 2018-06-05 General Electric Company Systems and methods for reducing polarization in imaging detectors
CN108415483A (zh) * 2018-03-23 2018-08-17 中科美其（天津）科技有限公司 摄影测量装置
KR102671817B1 (ko) * 2018-03-29 2024-05-31 루메니스 비 리미티드 건조한 눈의 처치를 위한 장치 및 방법
DE102023202424A1 (de) * 2023-03-20 2024-09-26 Siemens Healthineers Ag Detektormodul für einen Röntgendetektor mit einer Heizschicht

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US6011264A (en) * 1994-08-11 2000-01-04 Urigal Technologies, Ltd. Apparatus, system and method for gamma ray and x-ray detection
CN1475192A (zh) * 2002-07-30 2004-02-18 GEҽ��ϵͳ���������޹�˾ 热电控制的x射线检测器阵列
EP1431754A2 (en) * 2002-12-19 2004-06-23 The Boeing Company Thermographic system and method using ohmic heating of the test part by applying an electric current through the test part itself

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JPH0627852B2 (ja) * 1990-08-30 1994-04-13 株式会社島津製作所 放射線検出器
US6399951B1 (en) 2000-02-02 2002-06-04 Ut-Battelle, Llc Simultaneous CT and SPECT tomography using CZT detectors
US6404547B1 (en) * 2000-03-01 2002-06-11 Raytheon Company Semi-active focus and thermal compensation of a centrally-obscured reflective telescope
JP2002202377A (ja) * 2001-01-05 2002-07-19 Shimadzu Corp 放射線検出器
JP2003014860A (ja) * 2001-06-29 2003-01-15 Toshiba Corp 放射線検出器および放射線検査装置
CN100437146C (zh) * 2003-10-22 2008-11-26 皇家飞利浦电子股份有限公司 恢复半导体探测器的性能的方法和设备

Patent Citations (3)

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Publication number Priority date Publication date Assignee Title
US6011264A (en) * 1994-08-11 2000-01-04 Urigal Technologies, Ltd. Apparatus, system and method for gamma ray and x-ray detection
CN1475192A (zh) * 2002-07-30 2004-02-18 GEҽ��ϵͳ���������޹�˾ 热电控制的x射线检测器阵列
EP1431754A2 (en) * 2002-12-19 2004-06-23 The Boeing Company Thermographic system and method using ohmic heating of the test part by applying an electric current through the test part itself

Also Published As

Publication number Publication date
US20070029496A1 (en) 2007-02-08
US7514692B2 (en) 2009-04-07
IL184912A0 (en) 2008-01-06
CN101116620A (zh) 2008-02-06
JP2008039777A (ja) 2008-02-21
DE102007036821A1 (de) 2008-02-07

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