JP2008039777A5 - - Google Patents
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- Publication number
- JP2008039777A5 JP2008039777A5 JP2007198408A JP2007198408A JP2008039777A5 JP 2008039777 A5 JP2008039777 A5 JP 2008039777A5 JP 2007198408 A JP2007198408 A JP 2007198408A JP 2007198408 A JP2007198408 A JP 2007198408A JP 2008039777 A5 JP2008039777 A5 JP 2008039777A5
- Authority
- JP
- Japan
- Prior art keywords
- detection device
- image detection
- heat
- heat source
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims 12
- 238000010438 heat treatment Methods 0.000 claims 7
- 238000000034 method Methods 0.000 claims 5
- 239000000758 substrate Substances 0.000 claims 5
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 claims 2
- QWUZMTJBRUASOW-UHFFFAOYSA-N cadmium tellanylidenezinc Chemical compound [Zn].[Cd].[Te] QWUZMTJBRUASOW-UHFFFAOYSA-N 0.000 claims 2
- 230000001419 dependent effect Effects 0.000 claims 2
- 239000000463 material Substances 0.000 claims 2
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 238000003384 imaging method Methods 0.000 claims 1
- 238000013021 overheating Methods 0.000 claims 1
- 230000005855 radiation Effects 0.000 claims 1
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/498,589 US7514692B2 (en) | 2005-06-22 | 2006-08-03 | Method and apparatus for reducing polarization within an imaging device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2008039777A JP2008039777A (ja) | 2008-02-21 |
| JP2008039777A5 true JP2008039777A5 (https=) | 2011-08-18 |
Family
ID=38885195
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007198408A Pending JP2008039777A (ja) | 2006-08-03 | 2007-07-31 | 撮像装置の内部の偏極を低減する方法及び装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7514692B2 (https=) |
| JP (1) | JP2008039777A (https=) |
| CN (1) | CN101116620B (https=) |
| DE (1) | DE102007036821A1 (https=) |
| IL (1) | IL184912A0 (https=) |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102007054832A1 (de) * | 2007-11-16 | 2009-05-14 | Siemens Ag | Flachbilddetektor mit Temperatursensor |
| US20100316184A1 (en) * | 2008-10-17 | 2010-12-16 | Jan Iwanczyk | Silicon photomultiplier detector for computed tomography |
| DE102009018877B4 (de) * | 2008-11-25 | 2016-07-28 | Siemens Healthcare Gmbh | Röntgenstrahlungsdetektor zur Verwendung in einem CT-System |
| US8532250B2 (en) * | 2010-02-24 | 2013-09-10 | Kabushiki Kaisha Toshiba | X-ray CT apparatus and control method for X-ray CT apparatus |
| JP5595804B2 (ja) * | 2010-06-21 | 2014-09-24 | 株式会社東芝 | Ｘ線ｃｔ装置 |
| JP5613487B2 (ja) | 2010-07-22 | 2014-10-22 | 株式会社東芝 | Ｘ線ｃｔ装置 |
| JP2012034848A (ja) * | 2010-08-06 | 2012-02-23 | Toshiba Corp | Ｘ線検出器およびｘ線ｃｔ装置 |
| JP2014519026A (ja) | 2011-05-11 | 2014-08-07 | コーニンクレッカ フィリップス エヌ ヴェ | 電離放射線の検出 |
| DE102012204766B4 (de) * | 2012-03-26 | 2015-07-02 | Siemens Aktiengesellschaft | Röntgendetektor mit photonenzählenden direktwandelnden Detektorelementen und Verfahren zur Temperaturkonstanthaltung des Röntgendetektors |
| DE102012213404B3 (de) * | 2012-07-31 | 2014-01-23 | Siemens Aktiengesellschaft | Verfahren zur Temperaturstabilisierung, Röntgenstrahlungsdetektor und CT-System |
| JP2014210047A (ja) * | 2013-04-18 | 2014-11-13 | 株式会社東芝 | Ｘ線ｃｔ装置 |
| DE102013214684B4 (de) * | 2013-07-26 | 2016-12-22 | Siemens Healthcare Gmbh | Direktkonvertierender Röntgendetektor |
| CN104337533A (zh) * | 2013-07-31 | 2015-02-11 | Ge医疗系统环球技术有限公司 | 计算机断层扫描设备及用于该设备的加热单元和方法 |
| KR20150036840A (ko) | 2013-09-27 | 2015-04-08 | 삼성전자주식회사 | 엑스선 검출기 및 이를 포함한 엑스선 촬영 장치 |
| JP6297700B2 (ja) * | 2013-12-20 | 2018-03-20 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | デジタルポジトロン放出断層撮影（ｐｅｔ）検出器の温度安定性の向上 |
| US9229115B2 (en) | 2013-12-20 | 2016-01-05 | Koninklijke Philips N.V. | Temperature stability for a digital positron emission tomography (PET) detector |
| JP6050561B1 (ja) * | 2014-09-26 | 2016-12-21 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | 加熱装置を有する放射線検出器、それを動作させる方法及びそれを有するイメージング装置 |
| US9746565B2 (en) | 2016-01-13 | 2017-08-29 | General Electric Company | Systems and methods for reducing polarization in imaging detectors |
| US9989654B2 (en) | 2016-01-13 | 2018-06-05 | General Electric Company | Systems and methods for reducing polarization in imaging detectors |
| CN108415483A (zh) * | 2018-03-23 | 2018-08-17 | 中科美其（天津）科技有限公司 | 摄影测量装置 |
| KR102671817B1 (ko) * | 2018-03-29 | 2024-05-31 | 루메니스 비 리미티드 | 건조한 눈의 처치를 위한 장치 및 방법 |
| DE102023202424A1 (de) * | 2023-03-20 | 2024-09-26 | Siemens Healthineers Ag | Detektormodul für einen Röntgendetektor mit einer Heizschicht |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6484176A (en) * | 1987-09-28 | 1989-03-29 | Matsushita Electric Industrial Co Ltd | Semiconductor radiation detector |
| JPH0627852B2 (ja) * | 1990-08-30 | 1994-04-13 | 株式会社島津製作所 | 放射線検出器 |
| US6011264A (en) * | 1994-08-11 | 2000-01-04 | Urigal Technologies, Ltd. | Apparatus, system and method for gamma ray and x-ray detection |
| US6399951B1 (en) | 2000-02-02 | 2002-06-04 | Ut-Battelle, Llc | Simultaneous CT and SPECT tomography using CZT detectors |
| US6404547B1 (en) * | 2000-03-01 | 2002-06-11 | Raytheon Company | Semi-active focus and thermal compensation of a centrally-obscured reflective telescope |
| JP2002202377A (ja) * | 2001-01-05 | 2002-07-19 | Shimadzu Corp | 放射線検出器 |
| JP2003014860A (ja) * | 2001-06-29 | 2003-01-15 | Toshiba Corp | 放射線検出器および放射線検査装置 |
| US20040022351A1 (en) * | 2002-07-30 | 2004-02-05 | Ge Medical Systems Global Technology Company, Llc | Thermoelectrically controlled x-ray detector array |
| US20040120383A1 (en) * | 2002-12-19 | 2004-06-24 | The Boeing Company | Non-destructive testing system and method using current flow thermography |
| CN100437146C (zh) * | 2003-10-22 | 2008-11-26 | 皇家飞利浦电子股份有限公司 | 恢复半导体探测器的性能的方法和设备 |
-
2006
- 2006-08-03 US US11/498,589 patent/US7514692B2/en not_active Expired - Fee Related
-
2007
- 2007-07-29 IL IL184912A patent/IL184912A0/en active IP Right Grant
- 2007-07-31 JP JP2007198408A patent/JP2008039777A/ja active Pending
- 2007-08-03 DE DE102007036821A patent/DE102007036821A1/de not_active Withdrawn
- 2007-08-03 CN CN200710149416XA patent/CN101116620B/zh not_active Expired - Fee Related
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