JP2007531060A5 - - Google Patents
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- Publication number
- JP2007531060A5 JP2007531060A5 JP2007506429A JP2007506429A JP2007531060A5 JP 2007531060 A5 JP2007531060 A5 JP 2007531060A5 JP 2007506429 A JP2007506429 A JP 2007506429A JP 2007506429 A JP2007506429 A JP 2007506429A JP 2007531060 A5 JP2007531060 A5 JP 2007531060A5
- Authority
- JP
- Japan
- Prior art keywords
- objective system
- objective
- light energy
- lens
- mirror array
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007654 immersion Methods 0.000 claims 13
- 230000001747 exhibiting effect Effects 0.000 claims 6
- 239000011521 glass Substances 0.000 claims 6
- 239000000463 material Substances 0.000 claims 6
- 230000004075 alteration Effects 0.000 claims 5
- 239000007788 liquid Substances 0.000 claims 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims 4
- 239000000470 constituent Substances 0.000 claims 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 2
- 239000005350 fused silica glass Substances 0.000 claims 2
- 238000007689 inspection Methods 0.000 claims 2
- 238000000034 method Methods 0.000 claims 2
- 230000003287 optical effect Effects 0.000 claims 2
- 229920001296 polysiloxane Polymers 0.000 claims 2
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/812,111 US7307783B2 (en) | 2003-02-21 | 2004-03-29 | Catadioptric imaging system employing immersion liquid for use in broad band microscopy |
| US10/812,111 | 2004-03-29 | ||
| PCT/US2005/010322 WO2005094304A2 (en) | 2004-03-29 | 2005-03-28 | Catadioptric imaging system employing immersion liquid for use in broad band microscopy |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2007531060A JP2007531060A (ja) | 2007-11-01 |
| JP2007531060A5 true JP2007531060A5 (enExample) | 2008-03-13 |
| JP5172328B2 JP5172328B2 (ja) | 2013-03-27 |
Family
ID=35064278
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007506429A Expired - Fee Related JP5172328B2 (ja) | 2004-03-29 | 2005-03-28 | 浸漬液を用いた広帯域顕微鏡観察用カタジオプトリック結像系 |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US7307783B2 (enExample) |
| EP (1) | EP1749230B1 (enExample) |
| JP (1) | JP5172328B2 (enExample) |
| WO (1) | WO2005094304A2 (enExample) |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002007587A2 (en) | 2000-07-14 | 2002-01-31 | Xillix Technologies Corporation | Compact fluorescent endoscopy video system |
| US20060241496A1 (en) | 2002-01-15 | 2006-10-26 | Xillix Technologies Corp. | Filter for use with imaging endoscopes |
| US7957066B2 (en) * | 2003-02-21 | 2011-06-07 | Kla-Tencor Corporation | Split field inspection system using small catadioptric objectives |
| US7884998B2 (en) * | 2003-02-21 | 2011-02-08 | Kla - Tencor Corporation | Catadioptric microscope objective employing immersion liquid for use in broad band microscopy |
| EP1721201A1 (en) * | 2004-02-18 | 2006-11-15 | Corning Incorporated | Catadioptric imaging system for high numerical aperture imaging with deep ultraviolet light |
| US20090303317A1 (en) * | 2006-02-07 | 2009-12-10 | Novadaq Technologies Inc. | Near infrared imaging |
| GB0625775D0 (en) | 2006-12-22 | 2007-02-07 | Isis Innovation | Focusing apparatus and method |
| EP1986046B1 (en) | 2007-03-08 | 2014-07-16 | Cellavision AB | A method for determining an in-focus position and a vision inspection system |
| US8665536B2 (en) * | 2007-06-19 | 2014-03-04 | Kla-Tencor Corporation | External beam delivery system for laser dark-field illumination in a catadioptric optical system |
| US7633689B2 (en) * | 2007-07-18 | 2009-12-15 | Asml Holding N.V. | Catadioptric optical system for scatterometry |
| WO2009036192A1 (en) * | 2007-09-13 | 2009-03-19 | Applied Precision, Inc. | Method of dispersing immersion liquid on a specimen substrate for high resolution imaging and lithographie |
| JP5909548B2 (ja) * | 2011-06-10 | 2016-04-26 | キヤノン株式会社 | 反射屈折光学系 |
| DE102013112212B4 (de) | 2013-11-06 | 2022-03-10 | Carl Zeiss Smt Gmbh | Optische Zoomeinrichtung, optische Abbildungseinrichtung, optisches Zoomverfahren und Abbildungsverfahren für die Mikroskopie |
| US10656098B2 (en) | 2016-02-03 | 2020-05-19 | Kla-Tencor Corporation | Wafer defect inspection and review systems |
| WO2017136286A1 (en) | 2016-02-03 | 2017-08-10 | Kla-Tencor Corporation | Wafer defect inspection and review systems |
| US10293122B2 (en) | 2016-03-17 | 2019-05-21 | Novadaq Technologies ULC | Endoluminal introducer with contamination avoidance |
| CN107505692B (zh) * | 2017-09-26 | 2020-04-10 | 张家港中贺自动化科技有限公司 | 一种折反射式物镜 |
| CN108254912B (zh) * | 2018-01-23 | 2020-03-27 | 电子科技大学 | 一种用于氮化物mocvd外延生长模式的实时显微监测系统 |
| CN108873289B (zh) | 2018-09-04 | 2024-02-09 | 中国科学院长春光学精密机械与物理研究所 | 显微物镜光学系统及光学设备 |
| CN109298517B (zh) * | 2018-11-05 | 2020-10-30 | 中国航空工业集团公司洛阳电光设备研究所 | 一种多光谱同轴折反式无焦光学系统 |
| CA3160205A1 (en) | 2019-11-22 | 2021-05-27 | Howard Hughes Medical Institute | Catadioptric microscopy |
| EP3893038A1 (en) * | 2020-04-10 | 2021-10-13 | Universität Zürich | Multi-immersion microscope objective with minimally refractive surfaces |
| JP7772525B2 (ja) * | 2020-10-28 | 2025-11-18 | 株式会社エビデント | 光信号検出装置、ゲル部材、光信号検出方法 |
| US11561476B1 (en) * | 2021-07-10 | 2023-01-24 | Kenneth Carlisle Johnson | UV lithography system |
| CN119270451A (zh) * | 2024-10-16 | 2025-01-07 | 苏州佳智彩光电科技有限公司 | 基于折返式光学装置的调焦方法、系统、计算机设备和存储介质 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2801570A (en) * | 1952-05-29 | 1957-08-06 | Centre Nat Rech Scient | Mirror type optical objectives for microscopes |
| JPS5510172B2 (enExample) * | 1975-02-14 | 1980-03-14 | ||
| CH613597B (de) * | 1975-08-14 | Bbc Brown Boveri & Cie | Hinter einem frontglas eines zeitmessgeraetes angeordnete fluessigkristallanzeige. | |
| JPS62208016A (ja) * | 1986-03-07 | 1987-09-12 | Matsushita Electric Ind Co Ltd | テレビジヨン画像投写装置 |
| JPH043104A (ja) * | 1990-04-20 | 1992-01-08 | Dainippon Screen Mfg Co Ltd | 顕微鏡用対物レンズ |
| US5159495A (en) * | 1990-12-11 | 1992-10-27 | Eastman Kodak Company | Graded index optical elements and catadioptric optical systems |
| JPH06167653A (ja) * | 1992-11-27 | 1994-06-14 | Olympus Optical Co Ltd | 液浸油 |
| JPH06175034A (ja) * | 1992-12-10 | 1994-06-24 | Olympus Optical Co Ltd | 長作動距離対物レンズ |
| US6512631B2 (en) * | 1996-07-22 | 2003-01-28 | Kla-Tencor Corporation | Broad-band deep ultraviolet/vacuum ultraviolet catadioptric imaging system |
| JP3123457B2 (ja) * | 1996-05-13 | 2001-01-09 | 株式会社ニコン | 顕微鏡 |
| US5999310A (en) * | 1996-07-22 | 1999-12-07 | Shafer; David Ross | Ultra-broadband UV microscope imaging system with wide range zoom capability |
| US6064517A (en) * | 1996-07-22 | 2000-05-16 | Kla-Tencor Corporation | High NA system for multiple mode imaging |
| US6483638B1 (en) * | 1996-07-22 | 2002-11-19 | Kla-Tencor Corporation | Ultra-broadband UV microscope imaging system with wide range zoom capability |
| US5717518A (en) * | 1996-07-22 | 1998-02-10 | Kla Instruments Corporation | Broad spectrum ultraviolet catadioptric imaging system |
| US5825043A (en) * | 1996-10-07 | 1998-10-20 | Nikon Precision Inc. | Focusing and tilting adjustment system for lithography aligner, manufacturing apparatus or inspection apparatus |
| JP2002082285A (ja) * | 2000-09-07 | 2002-03-22 | Nikon Corp | 反射屈折光学系および該光学系を備えた露光装置 |
| US7136159B2 (en) * | 2000-09-12 | 2006-11-14 | Kla-Tencor Technologies Corporation | Excimer laser inspection system |
| JP2003015046A (ja) * | 2001-06-28 | 2003-01-15 | Nikon Corp | 液浸系顕微鏡対物レンズ |
| JP2003029162A (ja) * | 2001-07-11 | 2003-01-29 | Nikon Corp | 顕微鏡用対物レンズおよび顕微鏡 |
| JP4066079B2 (ja) * | 2001-11-26 | 2008-03-26 | 株式会社ニコン | 対物レンズ及びそれを用いた光学装置 |
| WO2004019128A2 (en) * | 2002-08-23 | 2004-03-04 | Nikon Corporation | Projection optical system and method for photolithography and exposure apparatus and method using same |
| US7180658B2 (en) * | 2003-02-21 | 2007-02-20 | Kla-Tencor Technologies Corporation | High performance catadioptric imaging system |
| US8675276B2 (en) * | 2003-02-21 | 2014-03-18 | Kla-Tencor Corporation | Catadioptric imaging system for broad band microscopy |
-
2004
- 2004-03-29 US US10/812,111 patent/US7307783B2/en not_active Expired - Fee Related
-
2005
- 2005-03-28 WO PCT/US2005/010322 patent/WO2005094304A2/en not_active Ceased
- 2005-03-28 JP JP2007506429A patent/JP5172328B2/ja not_active Expired - Fee Related
- 2005-03-28 EP EP05731783.6A patent/EP1749230B1/en not_active Expired - Lifetime
-
2007
- 2007-12-05 US US11/999,558 patent/US7633675B2/en not_active Expired - Fee Related
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