JP2007203042A - 投影式および断層撮影式位相コントラスト画像の作成用のｘ線ｃｔシステム - Google Patents

投影式および断層撮影式位相コントラスト画像の作成用のｘ線ｃｔシステム Download PDF

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JP2007203042A
JP2007203042A JP2007017965A JP2007017965A JP2007203042A JP 2007203042 A JP2007203042 A JP 2007203042A JP 2007017965 A JP2007017965 A JP 2007017965A JP 2007017965 A JP2007017965 A JP 2007017965A JP 2007203042 A JP2007203042 A JP 2007203042A
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ray
rotor
detector
phase contrast
grating
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JP2007203042A5 (enExample
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Hempel Eckhard
ヘンペル エクハルト
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Siemens AG
Siemens Corp
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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/03—Computed tomography [CT]
    • A61B6/032—Transmission computed tomography [CT]
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4291—Arrangements for detecting radiation specially adapted for radiation diagnosis the detector being combined with a grid or grating

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  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Medical Informatics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Molecular Biology (AREA)
  • Veterinary Medicine (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Optics & Photonics (AREA)
  • Pathology (AREA)
  • Public Health (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Biophysics (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Pulmonology (AREA)
  • Theoretical Computer Science (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2007017965A 2006-02-01 2007-01-29 投影式および断層撮影式位相コントラスト画像の作成用のｘ線ｃｔシステム Pending JP2007203042A (ja)

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Application Number Priority Date Filing Date Title
DE102006004604 2006-02-01
DE102006004976 2006-02-01
DE102006046034A DE102006046034A1 (de) 2006-02-01 2006-09-28 Röntgen-CT-System zur Erzeugung projektiver und tomographischer Phasenkontrastaufnahmen

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JP2007203042A true JP2007203042A (ja) 2007-08-16
JP2007203042A5 JP2007203042A5 (enExample) 2010-02-04

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US (1) US7532704B2 (enExample)
JP (1) JP2007203042A (enExample)
DE (1) DE102006046034A1 (enExample)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009150875A (ja) * 2007-11-15 2009-07-09 Csem Centre Suisse D'electronique & De Microtechnique Sa 干渉計デバイス及び干渉法
JP2011504395A (ja) * 2007-11-26 2011-02-10 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Ｘ線位相コントラストイメージングの検出セットアップ
JP2011515143A (ja) * 2008-03-19 2011-05-19 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 位相コントラストイメージングのための回転ｘ線装置
JP2012530270A (ja) * 2009-06-16 2012-11-29 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 傾けられた格子及び傾けられた格子の製造方法
JP2013513417A (ja) * 2009-12-10 2013-04-22 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 微分位相コントラストイメージングに関する、スキャニングシステム
JP2016531659A (ja) * 2013-09-30 2016-10-13 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 可動式格子を含む微分位相コントラスト撮像装置
JP2019523876A (ja) * 2016-06-16 2019-08-29 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 対象物をｘ線イメージングするための装置

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WO2010084389A1 (en) * 2009-01-21 2010-07-29 Koninklijke Philips Electronics N.V. Method and apparatus for large field of view imaging and detection and compensation of motion artifacts
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CN102365687B (zh) * 2009-03-27 2015-08-19 皇家飞利浦电子股份有限公司 消色差的相衬成像
WO2011030257A1 (en) 2009-09-08 2011-03-17 Koninklijke Philips Electronics N.V. X-ray apparatus
CN102781327B (zh) * 2009-12-10 2015-06-17 皇家飞利浦电子股份有限公司 相衬成像
WO2011114845A1 (ja) * 2010-03-18 2011-09-22 コニカミノルタエムジー株式会社 Ｘ線撮影システム
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WO2012094523A2 (en) * 2011-01-06 2012-07-12 The Regents Of The University Of California Lens-free tomographic imaging devices and methods
DE102011082878A1 (de) * 2011-09-16 2013-03-21 Siemens Aktiengesellschaft Röntgendetektor einer gitterbasierten Phasenkontrast-Röntgenvorrichtung und Verfahren zum Betreiben einer gitterbasierten Phasenkontrast-Röntgenvorrichtung
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US9826949B2 (en) * 2012-03-05 2017-11-28 University Of Rochester Methods and apparatus for differential phase-contrast cone-beam CT and hybrid cone-beam CT
DE102012204276A1 (de) * 2012-03-19 2013-09-19 Siemens Aktiengesellschaft Bildaufnahmeeinrichtung
DE102012005767A1 (de) 2012-03-25 2013-09-26 DüRR DENTAL AG Phasenkontrast-Röntgen-Tomographiegerät
KR101378757B1 (ko) * 2012-08-30 2014-03-27 한국원자력연구원 물질 원소 정보 획득 및 영상 차원의 선택이 가능한 방사선 영상화 장치
TWI488612B (zh) * 2012-11-20 2015-06-21 Iner Aec Executive Yuan Ｘ光投影成像裝置
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DE102013205406A1 (de) * 2013-03-27 2014-10-16 Siemens Aktiengesellschaft Röntgenaufnahmesystem zur Röntgenbildgebung bei hohen Bildfrequenzen eines Untersuchungsobjekts mittels direkter Messung des Interferenzmusters
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Cited By (7)

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JP2009150875A (ja) * 2007-11-15 2009-07-09 Csem Centre Suisse D'electronique & De Microtechnique Sa 干渉計デバイス及び干渉法
JP2011504395A (ja) * 2007-11-26 2011-02-10 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Ｘ線位相コントラストイメージングの検出セットアップ
JP2011515143A (ja) * 2008-03-19 2011-05-19 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 位相コントラストイメージングのための回転ｘ線装置
JP2012530270A (ja) * 2009-06-16 2012-11-29 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 傾けられた格子及び傾けられた格子の製造方法
JP2013513417A (ja) * 2009-12-10 2013-04-22 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 微分位相コントラストイメージングに関する、スキャニングシステム
JP2016531659A (ja) * 2013-09-30 2016-10-13 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 可動式格子を含む微分位相コントラスト撮像装置
JP2019523876A (ja) * 2016-06-16 2019-08-29 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 対象物をｘ線イメージングするための装置

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DE102006046034A1 (de) 2007-08-16
US7532704B2 (en) 2009-05-12

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