JP2006502399A5 - - Google Patents

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Publication number
JP2006502399A5
JP2006502399A5 JP2004542562A JP2004542562A JP2006502399A5 JP 2006502399 A5 JP2006502399 A5 JP 2006502399A5 JP 2004542562 A JP2004542562 A JP 2004542562A JP 2004542562 A JP2004542562 A JP 2004542562A JP 2006502399 A5 JP2006502399 A5 JP 2006502399A5
Authority
JP
Japan
Prior art keywords
light
mirror
mirrors
detection device
emitted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004542562A
Other languages
English (en)
Japanese (ja)
Other versions
JP2006502399A (ja
Filing date
Publication date
Priority claimed from FR0212467A external-priority patent/FR2845487B1/fr
Application filed filed Critical
Publication of JP2006502399A publication Critical patent/JP2006502399A/ja
Publication of JP2006502399A5 publication Critical patent/JP2006502399A5/ja
Pending legal-status Critical Current

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JP2004542562A 2002-10-08 2003-10-07 色収差無発生型且つ吸収低減型の光収集システムで、特に光学的分光分析に適応させたシステム Pending JP2006502399A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0212467A FR2845487B1 (fr) 2002-10-08 2002-10-08 Systeme de collecte de lumiere, amplificateur, achromatique et d'absorption reduite, particulierement adapte a l'analyse spectrometrique optique
PCT/FR2003/002947 WO2004034119A1 (fr) 2002-10-08 2003-10-07 Systeme de collecte de lumiere , achromatique et d'absorption reduite, particulierement adapte a l'analyse spectrometrique optique

Publications (2)

Publication Number Publication Date
JP2006502399A JP2006502399A (ja) 2006-01-19
JP2006502399A5 true JP2006502399A5 (enExample) 2010-01-14

Family

ID=32011494

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004542562A Pending JP2006502399A (ja) 2002-10-08 2003-10-07 色収差無発生型且つ吸収低減型の光収集システムで、特に光学的分光分析に適応させたシステム

Country Status (8)

Country Link
US (1) US7492454B2 (enExample)
EP (1) EP1549987A1 (enExample)
JP (1) JP2006502399A (enExample)
CN (1) CN100342260C (enExample)
AU (1) AU2003299446B2 (enExample)
CA (1) CA2501441A1 (enExample)
FR (1) FR2845487B1 (enExample)
WO (1) WO2004034119A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101229021B1 (ko) * 2006-06-20 2013-02-01 엘지디스플레이 주식회사 확대된 영상을 표시하는 영상표시장치 및 이를 이용한 영상표시방법
CN102680120B (zh) * 2012-05-24 2014-10-22 哈尔滨工业大学 极紫外光刻光源Xe10+离子状态的检测系统
US9304287B2 (en) * 2012-12-18 2016-04-05 Suncentral, Inc. Light concentrating apparatus
KR102167221B1 (ko) * 2017-02-10 2020-10-19 주식회사 엘지화학 비대칭 투과필름
CN110107857B (zh) * 2019-06-04 2024-04-12 华域视觉科技(上海)有限公司 近光iii区照明模组、车辆前照灯及车辆

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2218270A (en) * 1935-11-25 1940-10-15 Homer C Snook Microscopy
GB941813A (en) * 1960-09-15 1963-11-13 Llewellyn Ernest Hunt Improved means for concentrating solar energy
US3460892A (en) * 1966-05-27 1969-08-12 Warner Swasey Co Rapid scan spectrometer that sweeps corner mirrors through the spectrum
US3540825A (en) * 1968-01-18 1970-11-17 Mcpherson Instr Corp Double beam spectrometer readout system
US3641350A (en) * 1970-09-08 1972-02-08 Us Navy Infrared analyzer for indicating the scintillation spectrum, shimmer and modulation transfer function of the radiation path
GB1421897A (en) * 1973-05-24 1976-01-21 Bruker Physik Ag Spectrometers
US3983385A (en) * 1974-08-23 1976-09-28 Union Carbide Corporation Method and apparatus for operating a mercury vapor lamp
US4205902A (en) * 1978-10-12 1980-06-03 The Perkin-Elmer Corporation Laser beam expander
JPH0746598B2 (ja) * 1986-05-29 1995-05-17 東芝ライテック株式会社 蛍光ランプ
US4988858A (en) * 1986-11-12 1991-01-29 The Boeing Company Catoptric multispectral band imaging and detecting device
JPH02165042A (ja) * 1988-12-20 1990-06-26 Shimadzu Corp Ｘ線分析装置
JPH0776745B2 (ja) * 1989-11-03 1995-08-16 株式会社堀場製作所 顕微分光測定装置
US5107526A (en) * 1990-10-31 1992-04-21 The United State Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Water window imaging x-ray microscope
US5452085A (en) * 1993-01-27 1995-09-19 Acton Research Corporation Spectrographic astigmatism correction system
DE4434814A1 (de) * 1994-09-29 1996-04-04 Microparts Gmbh Infrarotspektrometrischer Sensor für Gase
NL1001952C2 (nl) * 1995-12-21 1997-06-24 Tno Telescoop met groot gezichtsveld.
JPH09250966A (ja) * 1996-03-15 1997-09-22 Nikon Corp 反射率測定装置
US5867329A (en) 1996-05-31 1999-02-02 The United States Of America As Represented By The Secretary Of The Navy Multiple-pass reflection filter
CN1091255C (zh) * 1996-12-21 2002-09-18 中国科学院福建物质结构研究所 实时高温红外光谱光学泵浦采集系统
JP2000081371A (ja) * 1998-09-07 2000-03-21 Nec Corp 薄膜分子配向評価方法、評価装置及び記録媒体
JP2001221687A (ja) * 2000-02-04 2001-08-17 Shimadzu Corp 分光光度計
DE10063376A1 (de) * 2000-12-19 2002-06-20 Philips Corp Intellectual Pty Hochdruckentladungslampe

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