JP2006502387A5 - - Google Patents
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- Publication number
- JP2006502387A5 JP2006502387A5 JP2004542019A JP2004542019A JP2006502387A5 JP 2006502387 A5 JP2006502387 A5 JP 2006502387A5 JP 2004542019 A JP2004542019 A JP 2004542019A JP 2004542019 A JP2004542019 A JP 2004542019A JP 2006502387 A5 JP2006502387 A5 JP 2006502387A5
- Authority
- JP
- Japan
- Prior art keywords
- light source
- light
- motor
- sample
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 claims 27
- 230000000903 blocking effect Effects 0.000 claims 13
- 238000005259 measurement Methods 0.000 claims 5
- 239000000835 fiber Substances 0.000 claims 4
- 239000013307 optical fiber Substances 0.000 claims 4
- 238000004519 manufacturing process Methods 0.000 claims 3
- 230000003287 optical effect Effects 0.000 claims 3
- 230000003213 activating effect Effects 0.000 claims 2
- 230000008878 coupling Effects 0.000 claims 2
- 238000010168 coupling process Methods 0.000 claims 2
- 238000005859 coupling reaction Methods 0.000 claims 2
- 238000007689 inspection Methods 0.000 claims 2
- ZXEYZECDXFPJRJ-UHFFFAOYSA-N $l^{3}-silane;platinum Chemical group [SiH3].[Pt] ZXEYZECDXFPJRJ-UHFFFAOYSA-N 0.000 claims 1
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 claims 1
- KXNLCSXBJCPWGL-UHFFFAOYSA-N [Ga].[As].[In] Chemical group [Ga].[As].[In] KXNLCSXBJCPWGL-UHFFFAOYSA-N 0.000 claims 1
- 230000001678 irradiating effect Effects 0.000 claims 1
- 229910021339 platinum silicide Inorganic materials 0.000 claims 1
- GGYFMLJDMAMTAB-UHFFFAOYSA-N selanylidenelead Chemical group [Pb]=[Se] GGYFMLJDMAMTAB-UHFFFAOYSA-N 0.000 claims 1
- 238000002834 transmittance Methods 0.000 claims 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/264,080 US6960769B2 (en) | 2002-10-03 | 2002-10-03 | Infrared measuring apparatus and method for on-line application in manufacturing processes |
| PCT/US2003/031142 WO2004031752A2 (en) | 2002-10-03 | 2003-10-02 | An infrared measuring apparatus and method for on-line application in manufacturing processes |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006502387A JP2006502387A (ja) | 2006-01-19 |
| JP2006502387A5 true JP2006502387A5 (enExample) | 2006-07-13 |
| JP4481825B2 JP4481825B2 (ja) | 2010-06-16 |
Family
ID=32042145
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004542019A Expired - Fee Related JP4481825B2 (ja) | 2002-10-03 | 2003-10-02 | 赤外線測定装置、及び、製造工程への赤外線測定装置のオンライン適用方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6960769B2 (enExample) |
| EP (1) | EP1546690B1 (enExample) |
| JP (1) | JP4481825B2 (enExample) |
| AU (1) | AU2003275370A1 (enExample) |
| CA (1) | CA2499396C (enExample) |
| DE (1) | DE60331668D1 (enExample) |
| WO (1) | WO2004031752A2 (enExample) |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7068366B2 (en) * | 2003-10-31 | 2006-06-27 | Abb Inc. | Simulated calibration sample for a spectrographic measurement sensor and method for use |
| US7301164B2 (en) * | 2004-01-30 | 2007-11-27 | Abb Inc. | Measuring apparatus |
| US7208735B2 (en) * | 2005-06-08 | 2007-04-24 | Rosemount, Inc. | Process field device with infrared sensors |
| JP4836588B2 (ja) * | 2006-02-01 | 2011-12-14 | Ｎｔｎ株式会社 | 軸受の潤滑剤劣化検出装置および検出装置付き軸受 |
| JP2007218650A (ja) * | 2006-02-15 | 2007-08-30 | Ntn Corp | 潤滑剤劣化検出装置および検出装置付き軸受 |
| WO2007088701A1 (ja) * | 2006-02-01 | 2007-08-09 | Ntn Corporation | 潤滑剤劣化検出装置および検出装置付き軸受 |
| US20080074898A1 (en) * | 2006-06-02 | 2008-03-27 | Bookham Technology Plc | Light source assemblies |
| JP5029036B2 (ja) * | 2007-01-25 | 2012-09-19 | 住友電気工業株式会社 | 光源装置およびスペクトル分析装置 |
| AT505464B1 (de) * | 2007-05-14 | 2009-06-15 | Durst Phototech Digital Tech | Tintenversorgungssystem für einen tintenstrahldrucker |
| JP5481943B2 (ja) * | 2009-06-01 | 2014-04-23 | 日本テキサス・インスツルメンツ株式会社 | 微粒子感知装置 |
| US8148690B2 (en) * | 2009-09-24 | 2012-04-03 | ABB, Ltd. | Method and apparatus for on-line web property measurement |
| CN103314307B (zh) * | 2011-01-10 | 2016-04-13 | 皇家飞利浦电子股份有限公司 | 用于探测由辐射源发射的光子的探测装置 |
| US8527212B2 (en) * | 2011-02-14 | 2013-09-03 | Honeywell Asca Inc. | Increased absorption-measurement accuracy through windowing of photon-transit times to account for scattering in continuous webs and powders |
| EP3023757B1 (en) * | 2014-11-21 | 2019-04-03 | SLM Solutions Group AG | Pyrometric detection device, method for calibrating the same, and apparatus for producing three-dimensional work pieces |
| US10445869B2 (en) | 2014-12-03 | 2019-10-15 | Bombardier Inc. | Online inspection for composite structures |
| CN104677827B (zh) * | 2015-02-13 | 2017-09-05 | 中国科学院合肥物质科学研究院 | 一种基于便携式光纤光谱仪的可见近红外漫反射基线信号的扣除装置及其方法 |
| JP6793352B2 (ja) * | 2016-03-31 | 2020-12-02 | パナソニックＩｐマネジメント株式会社 | 光源と、光検出器と、制御回路とを備える撮像装置 |
| EP3309546A1 (en) * | 2016-10-14 | 2018-04-18 | ABB Schweiz AG | Method for detecting a deflection, scanning apparatus, and use of a blocking device for detecting a deflection |
| JP6849811B2 (ja) | 2017-01-11 | 2021-03-31 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | セレン化鉛プレート検出器アセンブリ上に一体化された温度センサ |
| DE102018005915A1 (de) * | 2018-07-27 | 2020-01-30 | Dräger Safety AG & Co. KGaA | Homogenisierungsvorrichtung, Detektorvorrichtung sowie Gasdetektorsystem |
| JP2022016023A (ja) * | 2020-07-10 | 2022-01-21 | コニカミノルタ株式会社 | 光沢度検査装置、光沢度検査方法、及び画像形成装置 |
| CN114965311B (zh) * | 2022-05-09 | 2024-04-26 | 北京航空航天大学 | 一种高温可见-红外光谱测量装置和测量方法 |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3455637A (en) * | 1964-08-07 | 1969-07-15 | Giannini Controls Corp | Method and apparatus for measuring the opacity of sheet material |
| US3793524A (en) * | 1972-09-05 | 1974-02-19 | Measurex Corp | Apparatus for measuring a characteristic of sheet materials |
| US4027161A (en) * | 1976-04-05 | 1977-05-31 | Industrial Nucleonics Corporation | Minimizing wave interference effects on the measurement of thin films having specular surfaces using infrared radiation |
| US4052615A (en) * | 1976-07-30 | 1977-10-04 | Industrial Nucleonics Corporation | Spherical cavity method and apparatus for measuring a sheet material property using infrared radiation |
| US4710807A (en) * | 1985-11-11 | 1987-12-01 | Kabushiki Kaisha Machida Seisakusho | Illuminating light supply system in electronic endoscope apparatus |
| US4733078A (en) * | 1986-08-25 | 1988-03-22 | Accuray Corporation | Measurement of moisture-stratified sheet material |
| EP0296259A1 (en) | 1987-06-22 | 1988-12-28 | Pacific Scientific Company | Spectrometer with combined visible and ultraviolet sample illumination |
| US4823008A (en) * | 1987-11-05 | 1989-04-18 | Process Automation Business, Inc. | Apparatus and methods employing infrared absorption means to measure the moisture content of heavy grades of paper |
| CA1319273C (en) | 1988-03-10 | 1993-06-22 | Steven Perry Sturm | Clay sensor |
| US5067810A (en) * | 1990-06-21 | 1991-11-26 | Reliance Comm/Tec Corporation | Shared laser tandem optical time domain reflectometer |
| DE4031633A1 (de) * | 1990-10-05 | 1992-04-16 | Sick Optik Elektronik Erwin | Optische inspektionsvorrichtung |
| US5124552A (en) * | 1991-01-28 | 1992-06-23 | Measurex Corporation | Sensor and method for measuring web moisture with optimal temperature insensitivity over a wide basis weight range |
| US5818048A (en) | 1992-07-15 | 1998-10-06 | Optix Lp | Rapid non-invasive optical analysis using broad bandpass spectral processing |
| JPH06273626A (ja) | 1993-03-19 | 1994-09-30 | Matsuda Denshi Kogyo:Kk | 光ファイバーによる光束分離体 |
| EP0795743A3 (en) | 1996-03-15 | 1998-02-25 | Japan Tobacco Inc. | Method and apparatus for infra-red moisture measurement |
| DE29709504U1 (de) | 1996-05-31 | 1997-07-24 | Honeywell Ag, 63067 Offenbach | Vorrichtung zur Messung von physikalischen Eigenschaften eines blattförmigen Materials |
| US5870826A (en) * | 1997-11-17 | 1999-02-16 | Lewan; Stephen J. | Nail clipper gripping aid |
| US6046836A (en) * | 1998-03-06 | 2000-04-04 | Electro-Optical Products Corporation | Low frequency optical shutter |
| US5967048A (en) * | 1998-06-12 | 1999-10-19 | Howard A. Fromson | Method and apparatus for the multiple imaging of a continuous web |
| JP3438624B2 (ja) * | 1998-12-01 | 2003-08-18 | ウシオ電機株式会社 | ランプの黒化検出方法 |
| WO2001016578A1 (en) * | 1999-08-31 | 2001-03-08 | Cme Telemetrix Inc. | Method for determination of analytes using near infrared, adjacent visible spectrum and an array of longer near infrared wavelengths |
| DE10056783A1 (de) * | 1999-12-11 | 2001-06-13 | Qualico Gmbh | Vorrichtung zum Erfassen von Eigenschaften einer bewegten Papierbahn mit einer IR-Lichtquelle |
| FI113088B (fi) | 2000-02-10 | 2004-02-27 | Metso Automation Oy | Menetelmä ja laite paperirainan lämpötilan mittaamiseksi |
| FI115856B (fi) * | 2000-02-10 | 2005-07-29 | Metso Automation Oy | Menetelmä ja laite päällysteen mittaamiseksi |
| JP5205683B2 (ja) * | 2000-04-19 | 2013-06-05 | 株式会社ニコン | 光学装置、露光装置、および露光方法 |
-
2002
- 2002-10-03 US US10/264,080 patent/US6960769B2/en not_active Expired - Lifetime
-
2003
- 2003-10-02 EP EP03759646A patent/EP1546690B1/en not_active Expired - Lifetime
- 2003-10-02 DE DE60331668T patent/DE60331668D1/de not_active Expired - Lifetime
- 2003-10-02 WO PCT/US2003/031142 patent/WO2004031752A2/en not_active Ceased
- 2003-10-02 AU AU2003275370A patent/AU2003275370A1/en not_active Abandoned
- 2003-10-02 JP JP2004542019A patent/JP4481825B2/ja not_active Expired - Fee Related
- 2003-10-02 CA CA2499396A patent/CA2499396C/en not_active Expired - Lifetime
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