CA2499396C - An infrared measuring apparatus and method for on-line application in manufacturing processes - Google Patents
An infrared measuring apparatus and method for on-line application in manufacturing processes Download PDFInfo
- Publication number
- CA2499396C CA2499396C CA2499396A CA2499396A CA2499396C CA 2499396 C CA2499396 C CA 2499396C CA 2499396 A CA2499396 A CA 2499396A CA 2499396 A CA2499396 A CA 2499396A CA 2499396 C CA2499396 C CA 2499396C
- Authority
- CA
- Canada
- Prior art keywords
- light
- detector
- light source
- shutter
- web
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 title description 19
- 238000004519 manufacturing process Methods 0.000 title description 5
- 239000013307 optical fiber Substances 0.000 claims description 23
- 239000000463 material Substances 0.000 claims description 8
- 238000002156 mixing Methods 0.000 claims description 5
- 238000001514 detection method Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 abstract description 77
- 239000000835 fiber Substances 0.000 abstract description 32
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 abstract description 27
- 230000003595 spectral effect Effects 0.000 abstract description 16
- 238000009826 distribution Methods 0.000 abstract description 13
- 238000012360 testing method Methods 0.000 abstract description 10
- 238000010606 normalization Methods 0.000 abstract description 7
- 239000000047 product Substances 0.000 description 44
- 239000000523 sample Substances 0.000 description 31
- KXNLCSXBJCPWGL-UHFFFAOYSA-N [Ga].[As].[In] Chemical compound [Ga].[As].[In] KXNLCSXBJCPWGL-UHFFFAOYSA-N 0.000 description 26
- 230000003287 optical effect Effects 0.000 description 23
- 238000010521 absorption reaction Methods 0.000 description 21
- 238000012937 correction Methods 0.000 description 14
- 230000000903 blocking effect Effects 0.000 description 13
- 150000003839 salts Chemical class 0.000 description 13
- 230000008859 change Effects 0.000 description 11
- 230000007246 mechanism Effects 0.000 description 11
- 230000035945 sensitivity Effects 0.000 description 9
- 229910052721 tungsten Inorganic materials 0.000 description 9
- 239000010937 tungsten Substances 0.000 description 9
- 230000006870 function Effects 0.000 description 8
- 230000008569 process Effects 0.000 description 8
- 230000005855 radiation Effects 0.000 description 8
- 229910052710 silicon Inorganic materials 0.000 description 8
- 239000010703 silicon Substances 0.000 description 8
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 8
- 238000012545 processing Methods 0.000 description 7
- 230000002829 reductive effect Effects 0.000 description 7
- 230000000694 effects Effects 0.000 description 6
- 229910052736 halogen Inorganic materials 0.000 description 6
- 238000005070 sampling Methods 0.000 description 6
- 238000001816 cooling Methods 0.000 description 5
- 150000002367 halogens Chemical class 0.000 description 5
- 230000004044 response Effects 0.000 description 5
- 230000003068 static effect Effects 0.000 description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 5
- 230000001133 acceleration Effects 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 4
- 238000013461 design Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000036961 partial effect Effects 0.000 description 4
- 230000000737 periodic effect Effects 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 238000004891 communication Methods 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 238000001035 drying Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 230000009467 reduction Effects 0.000 description 3
- RZVAJINKPMORJF-UHFFFAOYSA-N Acetaminophen Chemical compound CC(=O)NC1=CC=C(O)C=C1 RZVAJINKPMORJF-UHFFFAOYSA-N 0.000 description 2
- 230000000712 assembly Effects 0.000 description 2
- 238000000429 assembly Methods 0.000 description 2
- 229920002678 cellulose Polymers 0.000 description 2
- 239000001913 cellulose Substances 0.000 description 2
- -1 for example Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000000382 optic material Substances 0.000 description 2
- 239000002985 plastic film Substances 0.000 description 2
- 229920006255 plastic film Polymers 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 238000004886 process control Methods 0.000 description 2
- 239000005297 pyrex Substances 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- GGYFMLJDMAMTAB-UHFFFAOYSA-N selanylidenelead Chemical compound [Pb]=[Se] GGYFMLJDMAMTAB-UHFFFAOYSA-N 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 238000009987 spinning Methods 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- ZXEYZECDXFPJRJ-UHFFFAOYSA-N $l^{3}-silane;platinum Chemical compound [SiH3].[Pt] ZXEYZECDXFPJRJ-UHFFFAOYSA-N 0.000 description 1
- KCTKQZUYHSKJLP-UHFFFAOYSA-N 2-(4-methyl-5-oxo-4-propan-2-yl-1h-imidazol-2-yl)pyridine-3-carboxylate;propan-2-ylazanium Chemical compound CC(C)[NH3+].N1C(=O)C(C(C)C)(C)N=C1C1=NC=CC=C1C([O-])=O KCTKQZUYHSKJLP-UHFFFAOYSA-N 0.000 description 1
- 230000005457 Black-body radiation Effects 0.000 description 1
- 238000004566 IR spectroscopy Methods 0.000 description 1
- 238000012369 In process control Methods 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 238000009529 body temperature measurement Methods 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 230000003116 impacting effect Effects 0.000 description 1
- 238000010965 in-process control Methods 0.000 description 1
- 238000002329 infrared spectrum Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- XCAUINMIESBTBL-UHFFFAOYSA-N lead(ii) sulfide Chemical compound [Pb]=S XCAUINMIESBTBL-UHFFFAOYSA-N 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 239000000123 paper Substances 0.000 description 1
- 229910021339 platinum silicide Inorganic materials 0.000 description 1
- 230000003449 preventive effect Effects 0.000 description 1
- 239000002516 radical scavenger Substances 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000013589 supplement Substances 0.000 description 1
- 239000004753 textile Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 150000003657 tungsten Chemical class 0.000 description 1
- 238000009827 uniform distribution Methods 0.000 description 1
- 238000001429 visible spectrum Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/86—Investigating moving sheets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/34—Paper
- G01N33/346—Paper sheets
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/02—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the intensity of light
- G02B26/04—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the intensity of light by periodically varying the intensity of light, e.g. using choppers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
- G01N2021/8917—Paper, also ondulated
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Optics & Photonics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
- Radiation Pyrometers (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/264,080 US6960769B2 (en) | 2002-10-03 | 2002-10-03 | Infrared measuring apparatus and method for on-line application in manufacturing processes |
| US10/264,080 | 2002-10-03 | ||
| PCT/US2003/031142 WO2004031752A2 (en) | 2002-10-03 | 2003-10-02 | An infrared measuring apparatus and method for on-line application in manufacturing processes |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2499396A1 CA2499396A1 (en) | 2004-04-15 |
| CA2499396C true CA2499396C (en) | 2012-09-18 |
Family
ID=32042145
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA2499396A Expired - Lifetime CA2499396C (en) | 2002-10-03 | 2003-10-02 | An infrared measuring apparatus and method for on-line application in manufacturing processes |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6960769B2 (enExample) |
| EP (1) | EP1546690B1 (enExample) |
| JP (1) | JP4481825B2 (enExample) |
| AU (1) | AU2003275370A1 (enExample) |
| CA (1) | CA2499396C (enExample) |
| DE (1) | DE60331668D1 (enExample) |
| WO (1) | WO2004031752A2 (enExample) |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7068366B2 (en) * | 2003-10-31 | 2006-06-27 | Abb Inc. | Simulated calibration sample for a spectrographic measurement sensor and method for use |
| US7301164B2 (en) * | 2004-01-30 | 2007-11-27 | Abb Inc. | Measuring apparatus |
| US7208735B2 (en) * | 2005-06-08 | 2007-04-24 | Rosemount, Inc. | Process field device with infrared sensors |
| JP4836588B2 (ja) * | 2006-02-01 | 2011-12-14 | Ｎｔｎ株式会社 | 軸受の潤滑剤劣化検出装置および検出装置付き軸受 |
| JP2007218650A (ja) * | 2006-02-15 | 2007-08-30 | Ntn Corp | 潤滑剤劣化検出装置および検出装置付き軸受 |
| WO2007088701A1 (ja) * | 2006-02-01 | 2007-08-09 | Ntn Corporation | 潤滑剤劣化検出装置および検出装置付き軸受 |
| US20080074898A1 (en) * | 2006-06-02 | 2008-03-27 | Bookham Technology Plc | Light source assemblies |
| JP5029036B2 (ja) * | 2007-01-25 | 2012-09-19 | 住友電気工業株式会社 | 光源装置およびスペクトル分析装置 |
| AT505464B1 (de) * | 2007-05-14 | 2009-06-15 | Durst Phototech Digital Tech | Tintenversorgungssystem für einen tintenstrahldrucker |
| JP5481943B2 (ja) * | 2009-06-01 | 2014-04-23 | 日本テキサス・インスツルメンツ株式会社 | 微粒子感知装置 |
| US8148690B2 (en) * | 2009-09-24 | 2012-04-03 | ABB, Ltd. | Method and apparatus for on-line web property measurement |
| CN103314307B (zh) * | 2011-01-10 | 2016-04-13 | 皇家飞利浦电子股份有限公司 | 用于探测由辐射源发射的光子的探测装置 |
| US8527212B2 (en) * | 2011-02-14 | 2013-09-03 | Honeywell Asca Inc. | Increased absorption-measurement accuracy through windowing of photon-transit times to account for scattering in continuous webs and powders |
| EP3023757B1 (en) * | 2014-11-21 | 2019-04-03 | SLM Solutions Group AG | Pyrometric detection device, method for calibrating the same, and apparatus for producing three-dimensional work pieces |
| US10445869B2 (en) | 2014-12-03 | 2019-10-15 | Bombardier Inc. | Online inspection for composite structures |
| CN104677827B (zh) * | 2015-02-13 | 2017-09-05 | 中国科学院合肥物质科学研究院 | 一种基于便携式光纤光谱仪的可见近红外漫反射基线信号的扣除装置及其方法 |
| JP6793352B2 (ja) * | 2016-03-31 | 2020-12-02 | パナソニックＩｐマネジメント株式会社 | 光源と、光検出器と、制御回路とを備える撮像装置 |
| EP3309546A1 (en) * | 2016-10-14 | 2018-04-18 | ABB Schweiz AG | Method for detecting a deflection, scanning apparatus, and use of a blocking device for detecting a deflection |
| JP6849811B2 (ja) | 2017-01-11 | 2021-03-31 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | セレン化鉛プレート検出器アセンブリ上に一体化された温度センサ |
| DE102018005915A1 (de) * | 2018-07-27 | 2020-01-30 | Dräger Safety AG & Co. KGaA | Homogenisierungsvorrichtung, Detektorvorrichtung sowie Gasdetektorsystem |
| JP2022016023A (ja) * | 2020-07-10 | 2022-01-21 | コニカミノルタ株式会社 | 光沢度検査装置、光沢度検査方法、及び画像形成装置 |
| CN114965311B (zh) * | 2022-05-09 | 2024-04-26 | 北京航空航天大学 | 一种高温可见-红外光谱测量装置和测量方法 |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3455637A (en) * | 1964-08-07 | 1969-07-15 | Giannini Controls Corp | Method and apparatus for measuring the opacity of sheet material |
| US3793524A (en) * | 1972-09-05 | 1974-02-19 | Measurex Corp | Apparatus for measuring a characteristic of sheet materials |
| US4027161A (en) * | 1976-04-05 | 1977-05-31 | Industrial Nucleonics Corporation | Minimizing wave interference effects on the measurement of thin films having specular surfaces using infrared radiation |
| US4052615A (en) * | 1976-07-30 | 1977-10-04 | Industrial Nucleonics Corporation | Spherical cavity method and apparatus for measuring a sheet material property using infrared radiation |
| US4710807A (en) * | 1985-11-11 | 1987-12-01 | Kabushiki Kaisha Machida Seisakusho | Illuminating light supply system in electronic endoscope apparatus |
| US4733078A (en) * | 1986-08-25 | 1988-03-22 | Accuray Corporation | Measurement of moisture-stratified sheet material |
| EP0296259A1 (en) | 1987-06-22 | 1988-12-28 | Pacific Scientific Company | Spectrometer with combined visible and ultraviolet sample illumination |
| US4823008A (en) * | 1987-11-05 | 1989-04-18 | Process Automation Business, Inc. | Apparatus and methods employing infrared absorption means to measure the moisture content of heavy grades of paper |
| CA1319273C (en) | 1988-03-10 | 1993-06-22 | Steven Perry Sturm | Clay sensor |
| US5067810A (en) * | 1990-06-21 | 1991-11-26 | Reliance Comm/Tec Corporation | Shared laser tandem optical time domain reflectometer |
| DE4031633A1 (de) * | 1990-10-05 | 1992-04-16 | Sick Optik Elektronik Erwin | Optische inspektionsvorrichtung |
| US5124552A (en) * | 1991-01-28 | 1992-06-23 | Measurex Corporation | Sensor and method for measuring web moisture with optimal temperature insensitivity over a wide basis weight range |
| US5818048A (en) | 1992-07-15 | 1998-10-06 | Optix Lp | Rapid non-invasive optical analysis using broad bandpass spectral processing |
| JPH06273626A (ja) | 1993-03-19 | 1994-09-30 | Matsuda Denshi Kogyo:Kk | 光ファイバーによる光束分離体 |
| EP0795743A3 (en) | 1996-03-15 | 1998-02-25 | Japan Tobacco Inc. | Method and apparatus for infra-red moisture measurement |
| DE29709504U1 (de) | 1996-05-31 | 1997-07-24 | Honeywell Ag, 63067 Offenbach | Vorrichtung zur Messung von physikalischen Eigenschaften eines blattförmigen Materials |
| US5870826A (en) * | 1997-11-17 | 1999-02-16 | Lewan; Stephen J. | Nail clipper gripping aid |
| US6046836A (en) * | 1998-03-06 | 2000-04-04 | Electro-Optical Products Corporation | Low frequency optical shutter |
| US5967048A (en) * | 1998-06-12 | 1999-10-19 | Howard A. Fromson | Method and apparatus for the multiple imaging of a continuous web |
| JP3438624B2 (ja) * | 1998-12-01 | 2003-08-18 | ウシオ電機株式会社 | ランプの黒化検出方法 |
| WO2001016578A1 (en) * | 1999-08-31 | 2001-03-08 | Cme Telemetrix Inc. | Method for determination of analytes using near infrared, adjacent visible spectrum and an array of longer near infrared wavelengths |
| DE10056783A1 (de) * | 1999-12-11 | 2001-06-13 | Qualico Gmbh | Vorrichtung zum Erfassen von Eigenschaften einer bewegten Papierbahn mit einer IR-Lichtquelle |
| FI113088B (fi) | 2000-02-10 | 2004-02-27 | Metso Automation Oy | Menetelmä ja laite paperirainan lämpötilan mittaamiseksi |
| FI115856B (fi) * | 2000-02-10 | 2005-07-29 | Metso Automation Oy | Menetelmä ja laite päällysteen mittaamiseksi |
| JP5205683B2 (ja) * | 2000-04-19 | 2013-06-05 | 株式会社ニコン | 光学装置、露光装置、および露光方法 |
-
2002
- 2002-10-03 US US10/264,080 patent/US6960769B2/en not_active Expired - Lifetime
-
2003
- 2003-10-02 EP EP03759646A patent/EP1546690B1/en not_active Expired - Lifetime
- 2003-10-02 DE DE60331668T patent/DE60331668D1/de not_active Expired - Lifetime
- 2003-10-02 WO PCT/US2003/031142 patent/WO2004031752A2/en not_active Ceased
- 2003-10-02 AU AU2003275370A patent/AU2003275370A1/en not_active Abandoned
- 2003-10-02 JP JP2004542019A patent/JP4481825B2/ja not_active Expired - Fee Related
- 2003-10-02 CA CA2499396A patent/CA2499396C/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| DE60331668D1 (de) | 2010-04-22 |
| AU2003275370A1 (en) | 2004-04-23 |
| CA2499396A1 (en) | 2004-04-15 |
| JP2006502387A (ja) | 2006-01-19 |
| WO2004031752A3 (en) | 2004-07-15 |
| EP1546690A2 (en) | 2005-06-29 |
| AU2003275370A8 (en) | 2004-04-23 |
| US6960769B2 (en) | 2005-11-01 |
| EP1546690B1 (en) | 2010-03-10 |
| WO2004031752A2 (en) | 2004-04-15 |
| US20040065829A1 (en) | 2004-04-08 |
| JP4481825B2 (ja) | 2010-06-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request | ||
| MKEX | Expiry |
Effective date: 20231003 |