JP4481825B2 - 赤外線測定装置、及び、製造工程への赤外線測定装置のオンライン適用方法 - Google Patents

赤外線測定装置、及び、製造工程への赤外線測定装置のオンライン適用方法 Download PDF

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Publication number
JP4481825B2
JP4481825B2 JP2004542019A JP2004542019A JP4481825B2 JP 4481825 B2 JP4481825 B2 JP 4481825B2 JP 2004542019 A JP2004542019 A JP 2004542019A JP 2004542019 A JP2004542019 A JP 2004542019A JP 4481825 B2 JP4481825 B2 JP 4481825B2
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Japan
Prior art keywords
light source
light
detector
shutter
blocking
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Expired - Fee Related
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JP2004542019A
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Japanese (ja)
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JP2006502387A (ja
JP2006502387A5 (enExample
Inventor
バーク，ゲーリー，ネイル
ドミン，トーマス，マイケル
マックソン，ロドニイ，デイル
ドーハティ，デニス，チャールズ
スツルム，スティーブン，ペリー
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Abb Inc
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Abb Inc
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Publication of JP2006502387A5 publication Critical patent/JP2006502387A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/34—Paper
    • G01N33/346—Paper sheets
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/02—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the intensity of light
    • G02B26/04—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the intensity of light by periodically varying the intensity of light, e.g. using choppers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8917—Paper, also ondulated

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Radiation Pyrometers (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP2004542019A 2002-10-03 2003-10-02 赤外線測定装置、及び、製造工程への赤外線測定装置のオンライン適用方法 Expired - Fee Related JP4481825B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/264,080 US6960769B2 (en) 2002-10-03 2002-10-03 Infrared measuring apparatus and method for on-line application in manufacturing processes
PCT/US2003/031142 WO2004031752A2 (en) 2002-10-03 2003-10-02 An infrared measuring apparatus and method for on-line application in manufacturing processes

Publications (3)

Publication Number Publication Date
JP2006502387A JP2006502387A (ja) 2006-01-19
JP2006502387A5 JP2006502387A5 (enExample) 2006-07-13
JP4481825B2 true JP4481825B2 (ja) 2010-06-16

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JP2004542019A Expired - Fee Related JP4481825B2 (ja) 2002-10-03 2003-10-02 赤外線測定装置、及び、製造工程への赤外線測定装置のオンライン適用方法

Country Status (7)

Country Link
US (1) US6960769B2 (enExample)
EP (1) EP1546690B1 (enExample)
JP (1) JP4481825B2 (enExample)
AU (1) AU2003275370A1 (enExample)
CA (1) CA2499396C (enExample)
DE (1) DE60331668D1 (enExample)
WO (1) WO2004031752A2 (enExample)

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US7068366B2 (en) * 2003-10-31 2006-06-27 Abb Inc. Simulated calibration sample for a spectrographic measurement sensor and method for use
US7301164B2 (en) * 2004-01-30 2007-11-27 Abb Inc. Measuring apparatus
US7208735B2 (en) * 2005-06-08 2007-04-24 Rosemount, Inc. Process field device with infrared sensors
JP4836588B2 (ja) * 2006-02-01 2011-12-14 Ｎｔｎ株式会社 軸受の潤滑剤劣化検出装置および検出装置付き軸受
JP2007218650A (ja) * 2006-02-15 2007-08-30 Ntn Corp 潤滑剤劣化検出装置および検出装置付き軸受
WO2007088701A1 (ja) * 2006-02-01 2007-08-09 Ntn Corporation 潤滑剤劣化検出装置および検出装置付き軸受
US20080074898A1 (en) * 2006-06-02 2008-03-27 Bookham Technology Plc Light source assemblies
JP5029036B2 (ja) * 2007-01-25 2012-09-19 住友電気工業株式会社 光源装置およびスペクトル分析装置
AT505464B1 (de) * 2007-05-14 2009-06-15 Durst Phototech Digital Tech Tintenversorgungssystem für einen tintenstrahldrucker
JP5481943B2 (ja) * 2009-06-01 2014-04-23 日本テキサス・インスツルメンツ株式会社 微粒子感知装置
US8148690B2 (en) * 2009-09-24 2012-04-03 ABB, Ltd. Method and apparatus for on-line web property measurement
CN103314307B (zh) * 2011-01-10 2016-04-13 皇家飞利浦电子股份有限公司 用于探测由辐射源发射的光子的探测装置
US8527212B2 (en) * 2011-02-14 2013-09-03 Honeywell Asca Inc. Increased absorption-measurement accuracy through windowing of photon-transit times to account for scattering in continuous webs and powders
EP3023757B1 (en) * 2014-11-21 2019-04-03 SLM Solutions Group AG Pyrometric detection device, method for calibrating the same, and apparatus for producing three-dimensional work pieces
US10445869B2 (en) 2014-12-03 2019-10-15 Bombardier Inc. Online inspection for composite structures
CN104677827B (zh) * 2015-02-13 2017-09-05 中国科学院合肥物质科学研究院 一种基于便携式光纤光谱仪的可见近红外漫反射基线信号的扣除装置及其方法
JP6793352B2 (ja) * 2016-03-31 2020-12-02 パナソニックＩｐマネジメント株式会社 光源と、光検出器と、制御回路とを備える撮像装置
EP3309546A1 (en) * 2016-10-14 2018-04-18 ABB Schweiz AG Method for detecting a deflection, scanning apparatus, and use of a blocking device for detecting a deflection
JP6849811B2 (ja) 2017-01-11 2021-03-31 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． セレン化鉛プレート検出器アセンブリ上に一体化された温度センサ
DE102018005915A1 (de) * 2018-07-27 2020-01-30 Dräger Safety AG & Co. KGaA Homogenisierungsvorrichtung, Detektorvorrichtung sowie Gasdetektorsystem
JP2022016023A (ja) * 2020-07-10 2022-01-21 コニカミノルタ株式会社 光沢度検査装置、光沢度検査方法、及び画像形成装置
CN114965311B (zh) * 2022-05-09 2024-04-26 北京航空航天大学 一种高温可见-红外光谱测量装置和测量方法

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US3455637A (en) * 1964-08-07 1969-07-15 Giannini Controls Corp Method and apparatus for measuring the opacity of sheet material
US3793524A (en) * 1972-09-05 1974-02-19 Measurex Corp Apparatus for measuring a characteristic of sheet materials
US4027161A (en) * 1976-04-05 1977-05-31 Industrial Nucleonics Corporation Minimizing wave interference effects on the measurement of thin films having specular surfaces using infrared radiation
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JP5205683B2 (ja) * 2000-04-19 2013-06-05 株式会社ニコン 光学装置、露光装置、および露光方法

Also Published As

Publication number Publication date
DE60331668D1 (de) 2010-04-22
AU2003275370A1 (en) 2004-04-23
CA2499396C (en) 2012-09-18
CA2499396A1 (en) 2004-04-15
JP2006502387A (ja) 2006-01-19
WO2004031752A3 (en) 2004-07-15
EP1546690A2 (en) 2005-06-29
AU2003275370A8 (en) 2004-04-23
US6960769B2 (en) 2005-11-01
EP1546690B1 (en) 2010-03-10
WO2004031752A2 (en) 2004-04-15
US20040065829A1 (en) 2004-04-08

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