JP2006194898A5 - - Google Patents

Download PDF

Info

Publication number
JP2006194898A5
JP2006194898A5 JP2006033040A JP2006033040A JP2006194898A5 JP 2006194898 A5 JP2006194898 A5 JP 2006194898A5 JP 2006033040 A JP2006033040 A JP 2006033040A JP 2006033040 A JP2006033040 A JP 2006033040A JP 2006194898 A5 JP2006194898 A5 JP 2006194898A5
Authority
JP
Japan
Prior art keywords
light
workpiece
communicating
tube
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006033040A
Other languages
English (en)
Japanese (ja)
Other versions
JP2006194898A (ja
Filing date
Publication date
Priority claimed from US11/112,044 external-priority patent/US7375362B2/en
Application filed filed Critical
Publication of JP2006194898A publication Critical patent/JP2006194898A/ja
Publication of JP2006194898A5 publication Critical patent/JP2006194898A5/ja
Pending legal-status Critical Current

Links

JP2006033040A 2005-01-13 2006-01-13 光学的テストヘッドの漂遊光を減少又は排除する方法及び装置 Pending JP2006194898A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US64374805P 2005-01-13 2005-01-13
US11/112,044 US7375362B2 (en) 2005-01-13 2005-04-22 Method and apparatus for reducing or eliminating stray light in an optical test head

Publications (2)

Publication Number Publication Date
JP2006194898A JP2006194898A (ja) 2006-07-27
JP2006194898A5 true JP2006194898A5 (enExample) 2009-04-23

Family

ID=36652376

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006033040A Pending JP2006194898A (ja) 2005-01-13 2006-01-13 光学的テストヘッドの漂遊光を減少又は排除する方法及び装置

Country Status (3)

Country Link
US (1) US7375362B2 (enExample)
JP (1) JP2006194898A (enExample)
MY (1) MY145528A (enExample)

Families Citing this family (70)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5117895B2 (ja) 2008-03-17 2013-01-16 ダブリュディ・メディア・シンガポール・プライベートリミテッド 磁気記録媒体及びその製造方法
JP2009238299A (ja) 2008-03-26 2009-10-15 Hoya Corp 垂直磁気記録媒体および垂直磁気記録媒体の製造方法
JP5453666B2 (ja) 2008-03-30 2014-03-26 ダブリュディ・メディア・シンガポール・プライベートリミテッド 磁気ディスク及びその製造方法
WO2010038773A1 (ja) 2008-09-30 2010-04-08 Hoya株式会社 磁気ディスク及びその製造方法
US8877359B2 (en) 2008-12-05 2014-11-04 Wd Media (Singapore) Pte. Ltd. Magnetic disk and method for manufacturing same
WO2010116908A1 (ja) 2009-03-28 2010-10-14 Hoya株式会社 磁気ディスク用潤滑剤化合物及び磁気ディスク
JP2010257567A (ja) 2009-03-30 2010-11-11 Wd Media Singapore Pte Ltd 垂直磁気記録媒体およびその製造方法
US20100300884A1 (en) 2009-05-26 2010-12-02 Wd Media, Inc. Electro-deposited passivation coatings for patterned media
US8496466B1 (en) 2009-11-06 2013-07-30 WD Media, LLC Press system with interleaved embossing foil holders for nano-imprinting of recording media
US9330685B1 (en) 2009-11-06 2016-05-03 WD Media, LLC Press system for nano-imprinting of recording media with a two step pressing method
JP5643516B2 (ja) 2010-01-08 2014-12-17 ダブリュディ・メディア・シンガポール・プライベートリミテッド 垂直磁気記録媒体
JP5574414B2 (ja) 2010-03-29 2014-08-20 ダブリュディ・メディア・シンガポール・プライベートリミテッド 磁気ディスクの評価方法及び磁気ディスクの製造方法
JP5634749B2 (ja) 2010-05-21 2014-12-03 ダブリュディ・メディア・シンガポール・プライベートリミテッド 垂直磁気ディスク
JP5645476B2 (ja) 2010-05-21 2014-12-24 ダブリュディ・メディア・シンガポール・プライベートリミテッド 垂直磁気ディスク
JP2011248968A (ja) 2010-05-28 2011-12-08 Wd Media (Singapore) Pte. Ltd 垂直磁気ディスク
JP2011248969A (ja) 2010-05-28 2011-12-08 Wd Media (Singapore) Pte. Ltd 垂直磁気ディスク
JP2011248967A (ja) 2010-05-28 2011-12-08 Wd Media (Singapore) Pte. Ltd 垂直磁気ディスクの製造方法
JP2012009086A (ja) 2010-06-22 2012-01-12 Wd Media (Singapore) Pte. Ltd 垂直磁気記録媒体及びその製造方法
US8889275B1 (en) 2010-08-20 2014-11-18 WD Media, LLC Single layer small grain size FePT:C film for heat assisted magnetic recording media
US8743666B1 (en) 2011-03-08 2014-06-03 Western Digital Technologies, Inc. Energy assisted magnetic recording medium capable of suppressing high DC readback noise
US8711499B1 (en) 2011-03-10 2014-04-29 WD Media, LLC Methods for measuring media performance associated with adjacent track interference
US8491800B1 (en) 2011-03-25 2013-07-23 WD Media, LLC Manufacturing of hard masks for patterning magnetic media
US9028985B2 (en) 2011-03-31 2015-05-12 WD Media, LLC Recording media with multiple exchange coupled magnetic layers
US8565050B1 (en) 2011-12-20 2013-10-22 WD Media, LLC Heat assisted magnetic recording media having moment keeper layer
US9029308B1 (en) 2012-03-28 2015-05-12 WD Media, LLC Low foam media cleaning detergent
US9269480B1 (en) 2012-03-30 2016-02-23 WD Media, LLC Systems and methods for forming magnetic recording media with improved grain columnar growth for energy assisted magnetic recording
US8941950B2 (en) 2012-05-23 2015-01-27 WD Media, LLC Underlayers for heat assisted magnetic recording (HAMR) media
US8993134B2 (en) 2012-06-29 2015-03-31 Western Digital Technologies, Inc. Electrically conductive underlayer to grow FePt granular media with (001) texture on glass substrates
CN103076343B (zh) * 2012-12-27 2016-09-14 深圳市华星光电技术有限公司 素玻璃激光检查机及素玻璃检查方法
US9034492B1 (en) 2013-01-11 2015-05-19 WD Media, LLC Systems and methods for controlling damping of magnetic media for heat assisted magnetic recording
US10115428B1 (en) 2013-02-15 2018-10-30 Wd Media, Inc. HAMR media structure having an anisotropic thermal barrier layer
US9153268B1 (en) 2013-02-19 2015-10-06 WD Media, LLC Lubricants comprising fluorinated graphene nanoribbons for magnetic recording media structure
US9183867B1 (en) 2013-02-21 2015-11-10 WD Media, LLC Systems and methods for forming implanted capping layers in magnetic media for magnetic recording
US9196283B1 (en) 2013-03-13 2015-11-24 Western Digital (Fremont), Llc Method for providing a magnetic recording transducer using a chemical buffer
US9190094B2 (en) 2013-04-04 2015-11-17 Western Digital (Fremont) Perpendicular recording media with grain isolation initiation layer and exchange breaking layer for signal-to-noise ratio enhancement
US9093122B1 (en) 2013-04-05 2015-07-28 WD Media, LLC Systems and methods for improving accuracy of test measurements involving aggressor tracks written to disks of hard disk drives
US8947987B1 (en) 2013-05-03 2015-02-03 WD Media, LLC Systems and methods for providing capping layers for heat assisted magnetic recording media
US8867322B1 (en) 2013-05-07 2014-10-21 WD Media, LLC Systems and methods for providing thermal barrier bilayers for heat assisted magnetic recording media
US9296082B1 (en) 2013-06-11 2016-03-29 WD Media, LLC Disk buffing apparatus with abrasive tape loading pad having a vibration absorbing layer
US9406330B1 (en) 2013-06-19 2016-08-02 WD Media, LLC Method for HDD disk defect source detection
US9607646B2 (en) 2013-07-30 2017-03-28 WD Media, LLC Hard disk double lubrication layer
US9389135B2 (en) 2013-09-26 2016-07-12 WD Media, LLC Systems and methods for calibrating a load cell of a disk burnishing machine
US9177585B1 (en) 2013-10-23 2015-11-03 WD Media, LLC Magnetic media capable of improving magnetic properties and thermal management for heat-assisted magnetic recording
US9581510B1 (en) 2013-12-16 2017-02-28 Western Digital Technologies, Inc. Sputter chamber pressure gauge with vibration absorber
US9382496B1 (en) 2013-12-19 2016-07-05 Western Digital Technologies, Inc. Lubricants with high thermal stability for heat-assisted magnetic recording
US9824711B1 (en) 2014-02-14 2017-11-21 WD Media, LLC Soft underlayer for heat assisted magnetic recording media
US9447368B1 (en) 2014-02-18 2016-09-20 WD Media, LLC Detergent composition with low foam and high nickel solubility
US9431045B1 (en) 2014-04-25 2016-08-30 WD Media, LLC Magnetic seed layer used with an unbalanced soft underlayer
US9042053B1 (en) 2014-06-24 2015-05-26 WD Media, LLC Thermally stabilized perpendicular magnetic recording medium
US9159350B1 (en) 2014-07-02 2015-10-13 WD Media, LLC High damping cap layer for magnetic recording media
US10054363B2 (en) 2014-08-15 2018-08-21 WD Media, LLC Method and apparatus for cryogenic dynamic cooling
US9082447B1 (en) 2014-09-22 2015-07-14 WD Media, LLC Determining storage media substrate material type
US9227324B1 (en) 2014-09-25 2016-01-05 WD Media, LLC Mandrel for substrate transport system with notch
US8995078B1 (en) 2014-09-25 2015-03-31 WD Media, LLC Method of testing a head for contamination
US9685184B1 (en) 2014-09-25 2017-06-20 WD Media, LLC NiFeX-based seed layer for magnetic recording media
US9449633B1 (en) 2014-11-06 2016-09-20 WD Media, LLC Smooth structures for heat-assisted magnetic recording media
US9818442B2 (en) 2014-12-01 2017-11-14 WD Media, LLC Magnetic media having improved magnetic grain size distribution and intergranular segregation
US9401300B1 (en) 2014-12-18 2016-07-26 WD Media, LLC Media substrate gripper including a plurality of snap-fit fingers
US9218850B1 (en) 2014-12-23 2015-12-22 WD Media, LLC Exchange break layer for heat-assisted magnetic recording media
US9257134B1 (en) 2014-12-24 2016-02-09 Western Digital Technologies, Inc. Allowing fast data zone switches on data storage devices
US9990940B1 (en) 2014-12-30 2018-06-05 WD Media, LLC Seed structure for perpendicular magnetic recording media
US9280998B1 (en) 2015-03-30 2016-03-08 WD Media, LLC Acidic post-sputter wash for magnetic recording media
US9822441B2 (en) 2015-03-31 2017-11-21 WD Media, LLC Iridium underlayer for heat assisted magnetic recording media
US9275669B1 (en) 2015-03-31 2016-03-01 WD Media, LLC TbFeCo in PMR media for SNR improvement
US11074934B1 (en) 2015-09-25 2021-07-27 Western Digital Technologies, Inc. Heat assisted magnetic recording (HAMR) media with Curie temperature reduction layer
US10236026B1 (en) 2015-11-06 2019-03-19 WD Media, LLC Thermal barrier layers and seed layers for control of thermal and structural properties of HAMR media
US9406329B1 (en) 2015-11-30 2016-08-02 WD Media, LLC HAMR media structure with intermediate layer underlying a magnetic recording layer having multiple sublayers
US10121506B1 (en) 2015-12-29 2018-11-06 WD Media, LLC Magnetic-recording medium including a carbon overcoat implanted with nitrogen and hydrogen
US11249319B2 (en) * 2016-05-04 2022-02-15 Mac Cal Inc. Reduced footprint collimator device to focus light beam over length of optical path
CN212621375U (zh) * 2020-05-27 2021-02-26 三赢科技(深圳)有限公司 测试光箱

Family Cites Families (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3089484A (en) * 1961-01-26 1963-05-14 American Cystoscope Makers Inc Flexible optical instrument particularly for carrying out surgical procedures
US3335715A (en) * 1964-09-18 1967-08-15 American Optical Corp Fiber optic catheter
JPS53102792A (en) * 1977-02-21 1978-09-07 Hitachi Ltd Simultaneous inspecting apparatus of inside and outside of body to be inspected
JPS5879240A (ja) * 1981-11-06 1983-05-13 Nippon Kogaku Kk <Nikon> 異物検出装置
US4794265A (en) * 1987-05-08 1988-12-27 Qc Optics, Inc. Surface pit detection system and method
US4794264A (en) * 1987-05-08 1988-12-27 Qc Optics, Inc. Surface defect detection and confirmation system and method
JPH02159544A (ja) * 1988-12-13 1990-06-19 Fuji Photo Film Co Ltd 生化学分析校正方法および生化学分析装置
JPH07286967A (ja) * 1994-04-15 1995-10-31 Sony Corp 光ディスクの検査方法と検査装置
US5637863A (en) * 1994-08-24 1997-06-10 Mdt Corporation Surgical light with touchless switch
US5649897A (en) * 1994-11-02 1997-07-22 Terumo Kabushiki Kaisha Endoscope apparatus for compensating for change in polarization state during image transmission
US5677769A (en) * 1995-05-30 1997-10-14 Imra America Optical sensor utilizing rare-earth-doped integrated-optic lasers
JP3494762B2 (ja) * 1995-07-19 2004-02-09 富士通株式会社 表面欠陥検査装置
WO1997026529A1 (en) * 1996-01-19 1997-07-24 Phase Metrics Surface inspection apparatus and method
US5943130A (en) * 1996-10-21 1999-08-24 Insitec, Inc. In situ sensor for near wafer particle monitoring in semiconductor device manufacturing equipment
US5719840A (en) * 1996-12-30 1998-02-17 Phase Metrics Optical sensor with an elliptical illumination spot
US6624884B1 (en) * 1997-04-28 2003-09-23 International Business Machines Corporation Surface inspection tool
CA2303885A1 (en) * 1997-09-22 1999-04-01 Infineon Technologies Ag Optical system for injecting laser radiation into an optical conductor, and a method for its production
US7123357B2 (en) * 1997-09-22 2006-10-17 Candela Instruments Method of detecting and classifying scratches and particles on thin film disks or wafers
US6548821B1 (en) * 1999-06-21 2003-04-15 Komag, Inc. Method and apparatus for inspecting substrates
US6566674B1 (en) * 1999-06-21 2003-05-20 Komag, Inc. Method and apparatus for inspecting substrates
US7227817B1 (en) * 1999-12-07 2007-06-05 Dphi Acquisitions, Inc. Low profile optical head
US7079472B2 (en) * 1999-06-23 2006-07-18 Dphi Acquisitions, Inc. Beamshaper for optical head
JP2002107597A (ja) * 2000-09-28 2002-04-10 Anritsu Corp レンズ鏡筒及びその製造方法
US6630996B2 (en) * 2000-11-15 2003-10-07 Real Time Metrology, Inc. Optical method and apparatus for inspecting large area planar objects
JP2003025625A (ja) * 2001-07-16 2003-01-29 Ricoh Co Ltd 光プリントヘッドおよび画像形成装置
US6597006B1 (en) * 2001-10-09 2003-07-22 Kla-Tencor Technologies Corp. Dual beam symmetric height systems and methods
US6686602B2 (en) * 2002-01-15 2004-02-03 Applied Materials, Inc. Patterned wafer inspection using spatial filtering
GB0201969D0 (en) * 2002-01-29 2002-03-13 Qinetiq Ltd Integrated optics devices
JP3936220B2 (ja) * 2002-03-28 2007-06-27 株式会社レイテックス 端部傷検査装置
JP2004163240A (ja) * 2002-11-13 2004-06-10 Silicon Technology Co Ltd 表面評価装置
US6888988B2 (en) * 2003-03-14 2005-05-03 Agilent Technologies, Inc. Small form factor all-polymer optical device with integrated dual beam path based on total internal reflection optical turn
JP3984971B2 (ja) * 2003-04-16 2007-10-03 アンリツ株式会社 黒色粒子および黒色粒子を用いた光吸収体
US20050088748A1 (en) * 2003-10-28 2005-04-28 Leupold & Stevens, Inc. Molded baffles for controlling stray light in an optical system
US7605913B2 (en) * 2004-12-19 2009-10-20 Kla-Tencor Corporation System and method for inspecting a workpiece surface by analyzing scattered light in a front quartersphere region above the workpiece

Similar Documents

Publication Publication Date Title
JP2006194898A5 (enExample)
JP2006194899A5 (enExample)
JP2007519004A5 (enExample)
JP2012145583A5 (enExample)
WO2009076730A3 (en) Sorting device, sorting method and sensor element for a sorting device
CN105954160A (zh) 细灰尘测量方法和确定细灰尘的颗粒大小的细灰尘传感器
WO2007112300A3 (en) Systems and methods for measuring one or more characteristics of patterned features on a specimen
EA201000088A1 (ru) Оптическая кювета
NO20075629L (no) Anordninger og fremgangsmater for mengdebestemmelse av vaesker i bronner med gasskondensater i
ATE489619T1 (de) Verfahren zur abbildung der strahlung eines objekts auf einer detektorvorrichtung und inspektionsvorrichtung zur inspektion eines objekts
WO2007100615A3 (en) High-sensitivity surface detection system and method
WO2011093523A3 (en) X-ray imaging apparatus and x-ray imaging method
RU2012145430A (ru) Способ и устройство для оптического измерения распределения размеров и концентраций дисперсных частиц в жидкостях и газах с использованием одноэлементных и матричных фотоприемников лазерного излучения
AR073966A1 (es) Metodo y aparato para medir la distribucion de tamanos de particula en un fluido para perforacion
DE602008006373D1 (de) Verfahren und vorrichtung zur optischen gewebeanalyse
WO2008043079A3 (en) Systems and methods for detection and classification of waterborne particles using a multiple angle light scattering (mals) instrument
SG142202A1 (en) Apparatus and method for quick imaging and inspecting moving target
ATE404860T1 (de) Vorrichtung und verfahren zur inspektion granularer materialien
EP2381245A3 (en) Image inspection device and image forming apparatus
WO2015067961A3 (en) Skin-print fluorescence analysis method and apparatus
JP2014044070A (ja) 食品検査装置
EP1772703A3 (en) Position detecting device and inclination sensor device of surveying apparatus using the same, and position measuring method
TW201520534A (zh) 螢光試紙、螢光激發裝置以及可攜式螢光分析系統
JP2013031784A5 (ja) X線撮像装置
KR102085411B1 (ko) 검사 프로브