JP2006041540A5 - - Google Patents
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- Publication number
- JP2006041540A5 JP2006041540A5 JP2005221109A JP2005221109A JP2006041540A5 JP 2006041540 A5 JP2006041540 A5 JP 2006041540A5 JP 2005221109 A JP2005221109 A JP 2005221109A JP 2005221109 A JP2005221109 A JP 2005221109A JP 2006041540 A5 JP2006041540 A5 JP 2006041540A5
- Authority
- JP
- Japan
- Prior art keywords
- polarization
- manipulator
- polarization manipulator
- manipulators
- illumination system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000010287 polarization Effects 0.000 claims 33
- 238000005286 illumination Methods 0.000 claims 8
- 230000003287 optical effect Effects 0.000 claims 5
- 101000644712 Arabidopsis thaliana Ubiquitin-conjugating enzyme 15 Proteins 0.000 claims 4
- 230000005684 electric field Effects 0.000 claims 3
- 239000013078 crystal Substances 0.000 claims 2
- 230000005855 radiation Effects 0.000 claims 1
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US59198504P | 2004-07-29 | 2004-07-29 | |
| US60/591,985 | 2004-07-29 | ||
| US63156404P | 2004-11-29 | 2004-11-29 | |
| US60/631,564 | 2004-11-29 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006041540A JP2006041540A (ja) | 2006-02-09 |
| JP2006041540A5 true JP2006041540A5 (enExample) | 2008-09-04 |
| JP4795745B2 JP4795745B2 (ja) | 2011-10-19 |
Family
ID=35241233
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005221109A Expired - Fee Related JP4795745B2 (ja) | 2004-07-29 | 2005-07-29 | マイクロリソグラフィ用投影露光装置のための照明システム |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20060055909A1 (enExample) |
| EP (1) | EP1621930A3 (enExample) |
| JP (1) | JP4795745B2 (enExample) |
| KR (1) | KR101212921B1 (enExample) |
| TW (1) | TWI413853B (enExample) |
Families Citing this family (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101547077B1 (ko) | 2003-04-09 | 2015-08-25 | 가부시키가이샤 니콘 | 노광 방법 및 장치, 그리고 디바이스 제조 방법 |
| JP4323903B2 (ja) * | 2003-09-12 | 2009-09-02 | キヤノン株式会社 | 照明光学系及びそれを用いた露光装置 |
| TWI569308B (zh) | 2003-10-28 | 2017-02-01 | 尼康股份有限公司 | 照明光學裝置、曝光裝置、曝光方法以及元件製造 方法 |
| TWI385414B (zh) * | 2003-11-20 | 2013-02-11 | 尼康股份有限公司 | 光學照明裝置、照明方法、曝光裝置、曝光方法以及元件製造方法 |
| TWI379344B (en) * | 2004-02-06 | 2012-12-11 | Nikon Corp | Polarization changing device, optical illumination apparatus, light-exposure apparatus and light-exposure method |
| US20060204204A1 (en) * | 2004-12-20 | 2006-09-14 | Markus Zenzinger | Method for improving the optical polarization properties of a microlithographic projection exposure apparatus |
| TWI423301B (zh) * | 2005-01-21 | 2014-01-11 | 尼康股份有限公司 | 照明光學裝置、曝光裝置、曝光方法以及元件製造方法 |
| US20080192224A1 (en) * | 2005-02-12 | 2008-08-14 | Carl Zeiss Smt Ag | Microlithographic Projection Exposure Apparatus |
| DE102006031807A1 (de) * | 2005-07-12 | 2007-01-18 | Carl Zeiss Smt Ag | Beleuchtungseinrichtung einer mikrolithographischen Projektionsbelichtungsanlage, sowie Depolarisator |
| KR100835495B1 (ko) | 2006-05-12 | 2008-06-04 | 주식회사 하이닉스반도체 | 반도체 소자의 노광 장비 및 노광 방법 |
| CN101479667B (zh) * | 2006-07-03 | 2011-12-07 | 卡尔蔡司Smt有限责任公司 | 修正/修复光刻投影物镜的方法 |
| DE102006038643B4 (de) * | 2006-08-17 | 2009-06-10 | Carl Zeiss Smt Ag | Mikrolithographische Projektionsbelichtungsanlage sowie mikrolithographisches Belichtungsverfahren |
| US8035803B2 (en) * | 2006-09-06 | 2011-10-11 | Carl Zeiss Smt Gmbh | Subsystem of an illumination system of a microlithographic projection exposure apparatus |
| DE102006050653A1 (de) | 2006-10-24 | 2008-04-30 | Carl Zeiss Smt Ag | Verfahren und Vorrichtung zum stoffschlüssigen Verbinden eines optischen Elementes mit einer Fassung |
| WO2008064859A2 (en) | 2006-12-01 | 2008-06-05 | Carl Zeiss Smt Ag | Optical system with an exchangeable, manipulable correction arrangement for reducing image aberrations |
| DE102007009867A1 (de) * | 2007-02-28 | 2008-09-11 | Carl Zeiss Smt Ag | Abbildungsvorrichtung mit auswechselbaren Blenden sowie Verfahren hierzu |
| DE102007031691A1 (de) | 2007-07-06 | 2009-01-08 | Carl Zeiss Smt Ag | Verfahren zum Betreiben einer Mikrolithographischen Projektionsbelichtunganlagen |
| US8077388B2 (en) * | 2007-09-13 | 2011-12-13 | University Of Utah Research Foundation | Light polarization converter for converting linearly polarized light into radially polarized light and related methods |
| DE102007055567A1 (de) | 2007-11-20 | 2009-05-28 | Carl Zeiss Smt Ag | Optisches System |
| DE102008009601A1 (de) * | 2008-02-15 | 2009-08-20 | Carl Zeiss Smt Ag | Optisches System für eine mikrolithographische Projektionsbelichtungsanlage sowie mikrolithographisches Belichtungsverfahren |
| EP2202580B1 (en) | 2008-12-23 | 2011-06-22 | Carl Zeiss SMT GmbH | Illumination system of a microlithographic projection exposure apparatus |
| US20110037962A1 (en) * | 2009-08-17 | 2011-02-17 | Nikon Corporation | Polarization converting unit, illumination optical system, exposure apparatus, and device manufacturing method |
| JP5531518B2 (ja) * | 2009-09-08 | 2014-06-25 | 株式会社ニコン | 偏光変換ユニット、照明光学系、露光装置、およびデバイス製造方法 |
| US8982324B2 (en) * | 2009-12-15 | 2015-03-17 | Asml Holding N.V. | Polarization designs for lithographic apparatus |
| DE102009055184B4 (de) | 2009-12-22 | 2011-11-10 | Carl Zeiss Smt Gmbh | Optisches System, insbesondere einer mikrolithographischen Projektionsbelichtungsanlage |
| US20110205519A1 (en) * | 2010-02-25 | 2011-08-25 | Nikon Corporation | Polarization converting unit, illumination optical system, exposure apparatus, and device manufacturing method |
| US9389519B2 (en) * | 2010-02-25 | 2016-07-12 | Nikon Corporation | Measuring method and measuring apparatus of pupil transmittance distribution, exposure method and exposure apparatus, and device manufacturing method |
| NL2006196A (en) * | 2010-03-12 | 2011-09-13 | Asml Netherlands Bv | Lithographic apparatus and method. |
| WO2012041339A1 (en) * | 2010-09-28 | 2012-04-05 | Carl Zeiss Smt Gmbh | Optical system of a microlithographic projection exposure apparatus and method of reducing image placement errors |
| US8654332B2 (en) * | 2011-06-22 | 2014-02-18 | Teledyne Scientific & Imaging, Llc | Chip-scale optics module for optical interrogators |
| DE102012206150B9 (de) | 2012-04-16 | 2014-06-12 | Carl Zeiss Smt Gmbh | Optisches System, insbesondere einer mikrolithographischen Projektionsbelichtungsanlage |
| DE102012206151A1 (de) | 2012-04-16 | 2013-05-02 | Carl Zeiss Smt Gmbh | Optisches System, insbesondere einer mikrolithographischen Projektionsbelichtungsanlage |
| DE102012206287A1 (de) | 2012-04-17 | 2013-10-17 | Carl Zeiss Smt Gmbh | Optisches System, insbesondere einer mikrolithographischen Projektionsbelichtungsanlage |
| DE102012212864A1 (de) | 2012-07-23 | 2013-08-22 | Carl Zeiss Smt Gmbh | Optisches System, insbesondere einer mikrolithographischen Projektionsbelichtungsanlage |
| DE102012223230A1 (de) | 2012-12-14 | 2014-02-13 | Carl Zeiss Smt Gmbh | Optisches System, insbesondere einer mikrolithographischen Projektionsbelichtungsanlage |
| DE102023210859A1 (de) * | 2023-11-02 | 2025-05-08 | Carl Zeiss Smt Gmbh | Projektionssystem mit minimierten thermisch induzierten oszillierenden Aberrationen |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2569711B2 (ja) * | 1988-04-07 | 1997-01-08 | 株式会社ニコン | 露光制御装置及び該装置による露光方法 |
| US5233460A (en) | 1992-01-31 | 1993-08-03 | Regents Of The University Of California | Method and means for reducing speckle in coherent laser pulses |
| US5442184A (en) | 1993-12-10 | 1995-08-15 | Texas Instruments Incorporated | System and method for semiconductor processing using polarized radiant energy |
| US6285443B1 (en) | 1993-12-13 | 2001-09-04 | Carl-Zeiss-Stiftung | Illuminating arrangement for a projection microlithographic apparatus |
| EP0658810B1 (de) * | 1993-12-13 | 1998-11-25 | Carl Zeiss | Beleuchtungseinrichtung für ein optisches System mit einem Reticle-Maskierungssystem |
| DE19520563A1 (de) * | 1995-06-06 | 1996-12-12 | Zeiss Carl Fa | Beleuchtungseinrichtung für ein Projektions-Mikrolithographie-Gerät |
| US5815247A (en) * | 1995-09-21 | 1998-09-29 | Siemens Aktiengesellschaft | Avoidance of pattern shortening by using off axis illumination with dipole and polarizing apertures |
| DE19535392A1 (de) * | 1995-09-23 | 1997-03-27 | Zeiss Carl Fa | Radial polarisationsdrehende optische Anordnung und Mikrolithographie-Projektionsbelichtungsanlage damit |
| DE19921795A1 (de) | 1999-05-11 | 2000-11-23 | Zeiss Carl Fa | Projektions-Belichtungsanlage und Belichtungsverfahren der Mikrolithographie |
| US6392890B1 (en) | 2000-12-20 | 2002-05-21 | Nortel Networks Limited | Method and device for heat dissipation in an electronics system |
| TW200412617A (en) * | 2002-12-03 | 2004-07-16 | Nikon Corp | Optical illumination device, method for adjusting optical illumination device, exposure device and exposure method |
| EP1668420B1 (en) * | 2003-09-26 | 2008-05-21 | Carl Zeiss SMT AG | Exposure method as well as projection exposure system for carrying out the method |
| US6970233B2 (en) * | 2003-12-03 | 2005-11-29 | Texas Instruments Incorporated | System and method for custom-polarized photolithography illumination |
| JP4497968B2 (ja) * | 2004-03-18 | 2010-07-07 | キヤノン株式会社 | 照明装置、露光装置及びデバイス製造方法 |
-
2005
- 2005-06-29 EP EP05014065A patent/EP1621930A3/en not_active Withdrawn
- 2005-07-12 TW TW094123614A patent/TWI413853B/zh not_active IP Right Cessation
- 2005-07-27 KR KR1020050068360A patent/KR101212921B1/ko not_active Expired - Fee Related
- 2005-07-29 US US11/191,925 patent/US20060055909A1/en not_active Abandoned
- 2005-07-29 JP JP2005221109A patent/JP4795745B2/ja not_active Expired - Fee Related
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