JP2005533254A5 - - Google Patents

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Publication number
JP2005533254A5
JP2005533254A5 JP2004521866A JP2004521866A JP2005533254A5 JP 2005533254 A5 JP2005533254 A5 JP 2005533254A5 JP 2004521866 A JP2004521866 A JP 2004521866A JP 2004521866 A JP2004521866 A JP 2004521866A JP 2005533254 A5 JP2005533254 A5 JP 2005533254A5
Authority
JP
Japan
Prior art keywords
electrical
contactor
interposer
test
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004521866A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005533254A (ja
Filing date
Publication date
Priority claimed from US10/197,104 external-priority patent/US6867608B2/en
Priority claimed from US10/197,133 external-priority patent/US6853209B1/en
Application filed filed Critical
Priority claimed from PCT/US2003/022125 external-priority patent/WO2004008163A2/en
Publication of JP2005533254A publication Critical patent/JP2005533254A/ja
Publication of JP2005533254A5 publication Critical patent/JP2005533254A5/ja
Pending legal-status Critical Current

Links

JP2004521866A 2002-07-16 2003-07-15 被試験部品上の電気回路を試験するために被試験部品を試験機械に電気的に接続するための組立体 Pending JP2005533254A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/197,104 US6867608B2 (en) 2002-07-16 2002-07-16 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
US10/197,133 US6853209B1 (en) 2002-07-16 2002-07-16 Contactor assembly for testing electrical circuits
PCT/US2003/022125 WO2004008163A2 (en) 2002-07-16 2003-07-15 Assembly for connecting a test device to an object to be tested

Publications (2)

Publication Number Publication Date
JP2005533254A JP2005533254A (ja) 2005-11-04
JP2005533254A5 true JP2005533254A5 (enExample) 2006-08-17

Family

ID=30117843

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004521866A Pending JP2005533254A (ja) 2002-07-16 2003-07-15 被試験部品上の電気回路を試験するために被試験部品を試験機械に電気的に接続するための組立体

Country Status (6)

Country Link
EP (1) EP1523685A2 (enExample)
JP (1) JP2005533254A (enExample)
KR (1) KR20050029215A (enExample)
CN (1) CN100523826C (enExample)
AU (1) AU2003249276A1 (enExample)
WO (1) WO2004008163A2 (enExample)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5085534B2 (ja) 2005-04-27 2012-11-28 エイアー テスト システムズ 電子デバイスを試験するための装置
CN101051067B (zh) * 2006-04-03 2010-08-11 航天科工防御技术研究试验中心 电连接器综合检测控制装置设计方法
MY152599A (en) 2007-02-14 2014-10-31 Eles Semiconductor Equipment S P A Test of electronic devices at package level using test boards without sockets
EP1959265A1 (en) * 2007-02-16 2008-08-20 Eles Semiconductor Equipment S.P.A. Testing integrated circuits on a wafer with a cartridge leaving exposed a surface thereof
US7557594B2 (en) * 2007-08-14 2009-07-07 Electro Scientific Industries, Inc. Automated contact alignment tool
US7800382B2 (en) 2007-12-19 2010-09-21 AEHR Test Ststems System for testing an integrated circuit of a device and its method of use
CN101545926B (zh) * 2008-03-25 2011-05-11 旺矽科技股份有限公司 探针测试装置
DE102009012021B4 (de) * 2009-03-10 2011-02-03 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Messvorrichtung zur elektrischen Vermessung einer einseitig an einer Messseite elektrisch kontaktierbaren Messstruktur
US8030957B2 (en) 2009-03-25 2011-10-04 Aehr Test Systems System for testing an integrated circuit of a device and its method of use
TWI440412B (zh) * 2011-12-28 2014-06-01 巨擘科技股份有限公司 超薄多層基板之封裝方法
CN103808979A (zh) * 2012-11-08 2014-05-21 富泰华工业（深圳）有限公司 用于承载待测试电子装置的治具
CN103808969A (zh) * 2012-11-08 2014-05-21 富泰华工业（深圳）有限公司 用于承载待测试电子装置的治具
CN105548859A (zh) * 2015-12-09 2016-05-04 上海精密计量测试研究所 用于环境测试的测试设备及方法
KR102842851B1 (ko) 2016-01-08 2025-08-05 에어 테스트 시스템즈 일렉트로닉스 테스터 내의 디바이스들의 열 제어를 위한 방법 및 시스템
CN106200239B (zh) * 2016-09-14 2019-03-15 海信集团有限公司 光机照明系统
US10782316B2 (en) * 2017-01-09 2020-09-22 Delta Design, Inc. Socket side thermal system
EP4653878A2 (en) 2017-03-03 2025-11-26 AEHR Test Systems Electronics tester
CN120254561A (zh) 2020-10-07 2025-07-04 雅赫测试系统公司 电子测试器
WO2023278632A1 (en) 2021-06-30 2023-01-05 Delta Design, Inc. Temperature control system including contactor assembly

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5148103A (en) * 1990-10-31 1992-09-15 Hughes Aircraft Company Apparatus for testing integrated circuits
JPH0763788A (ja) * 1993-08-21 1995-03-10 Hewlett Packard Co <Hp> プローブおよび電気部品／回路検査装置ならびに電気部品／回路検査方法
US6483328B1 (en) * 1995-11-09 2002-11-19 Formfactor, Inc. Probe card for probing wafers with raised contact elements
US6028437A (en) * 1997-05-19 2000-02-22 Si Diamond Technology, Inc. Probe head assembly
US6137297A (en) * 1999-01-06 2000-10-24 Vertest Systemsn Corp. Electronic test probe interface assembly and method of manufacture
JP2001013208A (ja) * 1999-06-30 2001-01-19 Mitsubishi Electric Corp 半導体テスト治工具

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