JP2005530128A - 解像度と深さ領域を改善するための軸方向線焦点を用いたｏｃｔ撮像用装置 - Google Patents

解像度と深さ領域を改善するための軸方向線焦点を用いたｏｃｔ撮像用装置 Download PDF

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Publication number
JP2005530128A
JP2005530128A JP2003560471A JP2003560471A JP2005530128A JP 2005530128 A JP2005530128 A JP 2005530128A JP 2003560471 A JP2003560471 A JP 2003560471A JP 2003560471 A JP2003560471 A JP 2003560471A JP 2005530128 A JP2005530128 A JP 2005530128A
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optical element
sample
light
device characterized
detector
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JP2005530128A5 (enExample
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ギレルモ・ジェイ・ティアニー
ブレット・ユージン・ブーマ
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General Hospital Corp
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General Hospital Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02034—Interferometers characterised by particularly shaped beams or wavefronts
    • G01B9/02035—Shaping the focal point, e.g. elongated focus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02027—Two or more interferometric channels or interferometers
    • G01B9/02028—Two or more reference or object arms in one interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02034—Interferometers characterised by particularly shaped beams or wavefronts
    • G01B9/02035—Shaping the focal point, e.g. elongated focus
    • G01B9/02036—Shaping the focal point, e.g. elongated focus by using chromatic effects, e.g. a wavelength dependent focal point
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Optics & Photonics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Radiology & Medical Imaging (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
  • Endoscopes (AREA)
  • Microscoopes, Condenser (AREA)
  • Instruments For Viewing The Inside Of Hollow Bodies (AREA)
JP2003560471A 2002-01-11 2003-01-10 解像度と深さ領域を改善するための軸方向線焦点を用いたｏｃｔ撮像用装置 Pending JP2005530128A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US34752802P 2002-01-11 2002-01-11
PCT/US2003/000699 WO2003060423A2 (en) 2002-01-11 2003-01-10 Apparatus for low coherence ranging

Publications (2)

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JP2005530128A true JP2005530128A (ja) 2005-10-06
JP2005530128A5 JP2005530128A5 (enExample) 2006-02-23

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JP2003560471A Pending JP2005530128A (ja) 2002-01-11 2003-01-10 解像度と深さ領域を改善するための軸方向線焦点を用いたｏｃｔ撮像用装置

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US (1) US7310150B2 (enExample)
EP (4) EP1468245B1 (enExample)
JP (1) JP2005530128A (enExample)
CN (2) CN1639539A (enExample)
AT (1) ATE503982T1 (enExample)
AU (2) AU2003207507A1 (enExample)
CA (1) CA2473465C (enExample)
DE (1) DE60336534D1 (enExample)
WO (1) WO2003060423A2 (enExample)

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JP2010512912A (ja) * 2006-12-22 2010-04-30 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ ２つのイメージング・モダリティを有するイメージング・システム
JP2012103026A (ja) * 2010-11-08 2012-05-31 Mitsubishi Electric Corp 樹脂識別装置
WO2012127880A1 (ja) * 2011-03-24 2012-09-27 株式会社ニコン 観察装置および観察方法
JP2012228544A (ja) * 2012-07-23 2012-11-22 Canon Inc 光断層画像撮像装置
JP2013521071A (ja) * 2010-03-05 2013-06-10 ザ ジェネラル ホスピタル コーポレイション 特定の分解能にて少なくとも１つの解剖構造の微細画像を提供するシステム、方法およびコンピュータがアクセス可能な媒体
JP2017522066A (ja) * 2014-06-10 2017-08-10 カール ツァイス メディテック インコーポレイテッドＣａｒｌ Ｚｅｉｓｓ Ｍｅｄｉｔｅｃ Ｉｎｃ． 改善された周波数領域干渉法による撮像システムおよび方法
JP2023513316A (ja) * 2020-02-12 2023-03-30 ンタルミック ホールディング ピーティーワイ エルティーディ 補助的光学素子を有する眼鏡レンズ

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