JP2005528596A - マルチタスク・アルゴリズミック・パターン・ジェネレータを有する半導体試験システム - Google Patents

マルチタスク・アルゴリズミック・パターン・ジェネレータを有する半導体試験システム Download PDF

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Publication number
JP2005528596A
JP2005528596A JP2004502010A JP2004502010A JP2005528596A JP 2005528596 A JP2005528596 A JP 2005528596A JP 2004502010 A JP2004502010 A JP 2004502010A JP 2004502010 A JP2004502010 A JP 2004502010A JP 2005528596 A JP2005528596 A JP 2005528596A
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Japan
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semiconductor devices
apg
test
under test
coupled
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JP2004502010A
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English (en)
Japanese (ja)
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JP2005528596A5 (enExample
Inventor
ジョン エム ホームズ
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ネクステスト システムズ コーポレイション
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Application filed by ネクステスト システムズ コーポレイション filed Critical ネクステスト システムズ コーポレイション
Publication of JP2005528596A publication Critical patent/JP2005528596A/ja
Publication of JP2005528596A5 publication Critical patent/JP2005528596A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56004—Pattern generation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/26—Accessing multiple arrays
    • G11C2029/2602—Concurrent test
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5602—Interface to device under test

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2004502010A 2002-05-06 2003-05-06 マルチタスク・アルゴリズミック・パターン・ジェネレータを有する半導体試験システム Pending JP2005528596A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US37848802P 2002-05-06 2002-05-06
PCT/US2003/014328 WO2003093845A2 (en) 2002-05-06 2003-05-06 Semiconductor test system having multitasking algorithmic pattern generator

Publications (2)

Publication Number Publication Date
JP2005528596A true JP2005528596A (ja) 2005-09-22
JP2005528596A5 JP2005528596A5 (enExample) 2006-05-18

Family

ID=29401608

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004502010A Pending JP2005528596A (ja) 2002-05-06 2003-05-06 マルチタスク・アルゴリズミック・パターン・ジェネレータを有する半導体試験システム

Country Status (5)

Country Link
US (1) US7472326B2 (enExample)
JP (1) JP2005528596A (enExample)
KR (1) KR101021375B1 (enExample)
TW (1) TWI278778B (enExample)
WO (1) WO2003093845A2 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006179144A (ja) * 2004-12-24 2006-07-06 Fujitsu Ltd Ｉｃの高速試験方法及び装置
JP2008546063A (ja) * 2005-05-19 2008-12-18 ネクステスト システムズ コーポレイション スマートカードを試験するためのシステム及びその方法

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7913002B2 (en) * 2004-08-20 2011-03-22 Advantest Corporation Test apparatus, configuration method, and device interface
JP4915779B2 (ja) * 2006-06-02 2012-04-11 株式会社メガチップス 装置間の接続方式および接続装置
WO2008020555A1 (en) * 2006-08-14 2008-02-21 Advantest Corporation Test device and test method
TWI436077B (zh) * 2010-11-24 2014-05-01 Etron Technology Inc 增加晶片預燒掃描效率的方法
US9514016B2 (en) * 2011-02-01 2016-12-06 Echostar Technologies L.L.C. Apparatus systems and methods for facilitating testing of a plurality of electronic devices
CN104425269B (zh) * 2013-08-27 2017-07-14 中芯国际集成电路制造(上海)有限公司 鳍式场效应晶体管及其形成方法
US10242750B2 (en) * 2017-05-31 2019-03-26 Sandisk Technologies Llc High-speed data path testing techniques for non-volatile memory

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4759021A (en) * 1985-01-31 1988-07-19 Hitachi, Ltd. Test pattern generator
JPH0750159B2 (ja) * 1985-10-11 1995-05-31 株式会社日立製作所 テストパタ−ン発生装置
JPH0754345B2 (ja) * 1986-07-30 1995-06-07 株式会社日立製作所 Ｉｃ試験装置
DE3752280T2 (de) * 1986-07-30 2000-02-03 Hitachi, Ltd. Mustergenerator
JP2514223Y2 (ja) * 1989-11-07 1996-10-16 ミサワホーム株式会社 引違い障子を納めたサッシ
US5349587A (en) * 1992-03-26 1994-09-20 Northern Telecom Limited Multiple clock rate test apparatus for testing digital systems
JPH07198798A (ja) * 1993-12-28 1995-08-01 Hitachi Ltd アルゴリズミックパターン発生器
US5572666A (en) * 1995-03-28 1996-11-05 Sun Microsystems, Inc. System and method for generating pseudo-random instructions for design verification
EP1632780A2 (en) * 1995-12-27 2006-03-08 Koken Co., Ltd. Monitoring control apparatus
US5883905A (en) * 1997-02-18 1999-03-16 Schlumberger Technologies, Inc. Pattern generator with extended register programming
JPH10319095A (ja) * 1997-05-22 1998-12-04 Mitsubishi Electric Corp 半導体テスト装置
US6118304A (en) * 1997-11-20 2000-09-12 Intrinsity, Inc. Method and apparatus for logic synchronization
US6246250B1 (en) * 1998-05-11 2001-06-12 Micron Technology, Inc. Probe card having on-board multiplex circuitry for expanding tester resources
JP2000276367A (ja) 1999-03-23 2000-10-06 Advantest Corp データ書込装置、データ書込方法、及び試験装置
US6363510B1 (en) * 1999-08-31 2002-03-26 Unisys Corporation Electronic system for testing chips having a selectable number of pattern generators that concurrently broadcast different bit streams to selectable sets of chip driver circuits
US6571365B1 (en) * 1999-11-03 2003-05-27 Unisys Corporation Initial stage of a multi-stage algorithmic pattern generator for testing IC chips
US6314034B1 (en) * 2000-04-14 2001-11-06 Advantest Corp. Application specific event based semiconductor memory test system
US6754868B2 (en) * 2001-06-29 2004-06-22 Nextest Systems Corporation Semiconductor test system having double data rate pin scrambling
US6631340B2 (en) * 2001-10-15 2003-10-07 Advantest Corp. Application specific event based semiconductor memory test system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006179144A (ja) * 2004-12-24 2006-07-06 Fujitsu Ltd Ｉｃの高速試験方法及び装置
JP2008546063A (ja) * 2005-05-19 2008-12-18 ネクステスト システムズ コーポレイション スマートカードを試験するためのシステム及びその方法

Also Published As

Publication number Publication date
WO2003093845A2 (en) 2003-11-13
TWI278778B (en) 2007-04-11
KR20050003411A (ko) 2005-01-10
WO2003093845A3 (en) 2005-05-26
US7472326B2 (en) 2008-12-30
KR101021375B1 (ko) 2011-03-14
US20040153920A1 (en) 2004-08-05
TW200401227A (en) 2004-01-16

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