KR101021375B1 - 멀티태스킹 알고리즘 패턴 발생기를 갖춘 반도체 테스트시스템 - Google Patents

멀티태스킹 알고리즘 패턴 발생기를 갖춘 반도체 테스트시스템 Download PDF

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KR101021375B1
KR101021375B1 KR1020047017833A KR20047017833A KR101021375B1 KR 101021375 B1 KR101021375 B1 KR 101021375B1 KR 1020047017833 A KR1020047017833 A KR 1020047017833A KR 20047017833 A KR20047017833 A KR 20047017833A KR 101021375 B1 KR101021375 B1 KR 101021375B1
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South Korea
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semiconductor devices
apg
multitasking
dut
time domain
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KR1020047017833A
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English (en)
Korean (ko)
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KR20050003411A (ko
Inventor
존 엠. 홀메스
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넥스테스트 시스템즈 코포레이션
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56004—Pattern generation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/26—Accessing multiple arrays
    • G11C2029/2602—Concurrent test
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5602—Interface to device under test

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020047017833A 2002-05-06 2003-05-06 멀티태스킹 알고리즘 패턴 발생기를 갖춘 반도체 테스트시스템 Expired - Lifetime KR101021375B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US37848802P 2002-05-06 2002-05-06
US60/378,488 2002-05-06
PCT/US2003/014328 WO2003093845A2 (en) 2002-05-06 2003-05-06 Semiconductor test system having multitasking algorithmic pattern generator

Publications (2)

Publication Number Publication Date
KR20050003411A KR20050003411A (ko) 2005-01-10
KR101021375B1 true KR101021375B1 (ko) 2011-03-14

Family

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Family Applications (1)

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KR1020047017833A Expired - Lifetime KR101021375B1 (ko) 2002-05-06 2003-05-06 멀티태스킹 알고리즘 패턴 발생기를 갖춘 반도체 테스트시스템

Country Status (5)

Country Link
US (1) US7472326B2 (enExample)
JP (1) JP2005528596A (enExample)
KR (1) KR101021375B1 (enExample)
TW (1) TWI278778B (enExample)
WO (1) WO2003093845A2 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7913002B2 (en) * 2004-08-20 2011-03-22 Advantest Corporation Test apparatus, configuration method, and device interface
JP2006179144A (ja) * 2004-12-24 2006-07-06 Fujitsu Ltd Ｉｃの高速試験方法及び装置
JP5480498B2 (ja) * 2005-05-19 2014-04-23 ネクステスト システムズ コーポレイション スマートカードを試験するためのシステム及びその方法
JP4915779B2 (ja) * 2006-06-02 2012-04-11 株式会社メガチップス 装置間の接続方式および接続装置
WO2008020555A1 (en) * 2006-08-14 2008-02-21 Advantest Corporation Test device and test method
TWI436077B (zh) * 2010-11-24 2014-05-01 Etron Technology Inc 增加晶片預燒掃描效率的方法
US9514016B2 (en) * 2011-02-01 2016-12-06 Echostar Technologies L.L.C. Apparatus systems and methods for facilitating testing of a plurality of electronic devices
CN104425269B (zh) * 2013-08-27 2017-07-14 中芯国际集成电路制造(上海)有限公司 鳍式场效应晶体管及其形成方法
US10242750B2 (en) * 2017-05-31 2019-03-26 Sandisk Technologies Llc High-speed data path testing techniques for non-volatile memory

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0368294U (enExample) * 1989-11-07 1991-07-04
US5572666A (en) * 1995-03-28 1996-11-05 Sun Microsystems, Inc. System and method for generating pseudo-random instructions for design verification
JP2000276367A (ja) 1999-03-23 2000-10-06 Advantest Corp データ書込装置、データ書込方法、及び試験装置
US6243665B1 (en) * 1995-12-27 2001-06-05 Duaxes Corporation Monitoring and control apparatus incorporating run-time fault detection by boundary scan logic testing

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4759021A (en) * 1985-01-31 1988-07-19 Hitachi, Ltd. Test pattern generator
JPH0750159B2 (ja) * 1985-10-11 1995-05-31 株式会社日立製作所 テストパタ−ン発生装置
JPH0754345B2 (ja) * 1986-07-30 1995-06-07 株式会社日立製作所 Ｉｃ試験装置
DE3752280T2 (de) * 1986-07-30 2000-02-03 Hitachi, Ltd. Mustergenerator
US5349587A (en) * 1992-03-26 1994-09-20 Northern Telecom Limited Multiple clock rate test apparatus for testing digital systems
JPH07198798A (ja) * 1993-12-28 1995-08-01 Hitachi Ltd アルゴリズミックパターン発生器
US5883905A (en) * 1997-02-18 1999-03-16 Schlumberger Technologies, Inc. Pattern generator with extended register programming
JPH10319095A (ja) * 1997-05-22 1998-12-04 Mitsubishi Electric Corp 半導体テスト装置
US6118304A (en) * 1997-11-20 2000-09-12 Intrinsity, Inc. Method and apparatus for logic synchronization
US6246250B1 (en) * 1998-05-11 2001-06-12 Micron Technology, Inc. Probe card having on-board multiplex circuitry for expanding tester resources
US6363510B1 (en) * 1999-08-31 2002-03-26 Unisys Corporation Electronic system for testing chips having a selectable number of pattern generators that concurrently broadcast different bit streams to selectable sets of chip driver circuits
US6571365B1 (en) * 1999-11-03 2003-05-27 Unisys Corporation Initial stage of a multi-stage algorithmic pattern generator for testing IC chips
US6314034B1 (en) * 2000-04-14 2001-11-06 Advantest Corp. Application specific event based semiconductor memory test system
US6754868B2 (en) * 2001-06-29 2004-06-22 Nextest Systems Corporation Semiconductor test system having double data rate pin scrambling
US6631340B2 (en) * 2001-10-15 2003-10-07 Advantest Corp. Application specific event based semiconductor memory test system

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0368294U (enExample) * 1989-11-07 1991-07-04
US5572666A (en) * 1995-03-28 1996-11-05 Sun Microsystems, Inc. System and method for generating pseudo-random instructions for design verification
US6243665B1 (en) * 1995-12-27 2001-06-05 Duaxes Corporation Monitoring and control apparatus incorporating run-time fault detection by boundary scan logic testing
JP2000276367A (ja) 1999-03-23 2000-10-06 Advantest Corp データ書込装置、データ書込方法、及び試験装置

Also Published As

Publication number Publication date
WO2003093845A2 (en) 2003-11-13
JP2005528596A (ja) 2005-09-22
TWI278778B (en) 2007-04-11
KR20050003411A (ko) 2005-01-10
WO2003093845A3 (en) 2005-05-26
US7472326B2 (en) 2008-12-30
US20040153920A1 (en) 2004-08-05
TW200401227A (en) 2004-01-16

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