JP2005520142A5 - - Google Patents

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Publication number
JP2005520142A5
JP2005520142A5 JP2003576887A JP2003576887A JP2005520142A5 JP 2005520142 A5 JP2005520142 A5 JP 2005520142A5 JP 2003576887 A JP2003576887 A JP 2003576887A JP 2003576887 A JP2003576887 A JP 2003576887A JP 2005520142 A5 JP2005520142 A5 JP 2005520142A5
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JP
Japan
Prior art keywords
grating
sensor
gratings
projection
distance
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003576887A
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English (en)
Japanese (ja)
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JP2005520142A (ja
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Publication date
Priority claimed from DE10212364A external-priority patent/DE10212364A1/de
Application filed filed Critical
Publication of JP2005520142A publication Critical patent/JP2005520142A/ja
Publication of JP2005520142A5 publication Critical patent/JP2005520142A5/ja
Pending legal-status Critical Current

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JP2003576887A 2002-03-20 2003-03-19 物体の絶対座標測定方法および装置 Pending JP2005520142A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10212364A DE10212364A1 (de) 2002-03-20 2002-03-20 Verfahren und Vorrichtung zur Bestimmung der Absolut-Koordinaten eines Objekts
PCT/EP2003/002877 WO2003078920A2 (de) 2002-03-20 2003-03-19 Verfahren und vorrichtung zur bestimmung der absolut-koordinaten eines objekts

Publications (2)

Publication Number Publication Date
JP2005520142A JP2005520142A (ja) 2005-07-07
JP2005520142A5 true JP2005520142A5 (enExample) 2005-08-18

Family

ID=27815803

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003576887A Pending JP2005520142A (ja) 2002-03-20 2003-03-19 物体の絶対座標測定方法および装置

Country Status (5)

Country Link
US (1) US6876458B2 (enExample)
EP (1) EP1485670A2 (enExample)
JP (1) JP2005520142A (enExample)
DE (1) DE10212364A1 (enExample)
WO (1) WO2003078920A2 (enExample)

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US20070023716A1 (en) * 2005-07-26 2007-02-01 Icos Vision Systems N.V. Apparatus for three dimensional measuring on an electronic component
CA2536411C (en) * 2006-02-14 2014-01-14 Lmi Technologies Inc. Multiple axis multipoint non-contact measurement system
US7525114B2 (en) 2006-02-14 2009-04-28 Lmi Technologies Ltd. Multiple axis multipoint non-contact measurement system
US8090194B2 (en) 2006-11-21 2012-01-03 Mantis Vision Ltd. 3D geometric modeling and motion capture using both single and dual imaging
CN101627280B (zh) 2006-11-21 2013-09-25 曼蒂斯影像有限公司 三维几何建模和三维视频内容创建
DE102007060263A1 (de) 2007-08-16 2009-02-26 Steinbichler Optotechnik Gmbh Vorrichtung zur Ermittlung der 3D-Koordinaten eines Objekts, insbesondere eines Zahns
EP2026034B1 (de) 2007-08-16 2020-04-29 Carl Zeiss Optotechnik GmbH Vorrichtung zur Ermittlung der 3D-Koordinaten eines Objekts, insbesondere eines Zahns
EP2051042B1 (de) * 2007-10-18 2010-11-03 Nectar Imaging S.r.l. Vorrichtung zur tomografischen Erfassung von Objekten
US8294082B2 (en) 2007-11-14 2012-10-23 Boulder Innovation Group, Inc. Probe with a virtual marker
DE102007054907A1 (de) * 2007-11-15 2009-05-28 Sirona Dental Systems Gmbh Verfahren zur optischen Vermessung von Objekten unter Verwendung eines Triangulationsverfahrens
DE102008047816B4 (de) 2008-09-18 2011-08-25 Steinbichler Optotechnik GmbH, 83115 Vorrichtung zur Ermittlung der 3D-Koordinaten eines Objekts, insbesondere eines Zahns
JP5545932B2 (ja) * 2009-06-08 2014-07-09 株式会社マクシス・シントー 三次元形状計測装置
US8649025B2 (en) 2010-03-27 2014-02-11 Micrometric Vision Technologies Methods and apparatus for real-time digitization of three-dimensional scenes
US8638450B2 (en) 2010-08-04 2014-01-28 Boulder Innovation Group Inc. Methods and systems for realizing reduced complexity in three-dimensional digitizer systems
US8687172B2 (en) * 2011-04-13 2014-04-01 Ivan Faul Optical digitizer with improved distance measurement capability
US10447040B2 (en) 2014-10-15 2019-10-15 Cummins Power Generation Ip, Inc. Programmable inverter for controllable grid response
DE102016208049A1 (de) 2015-07-09 2017-01-12 Inb Vision Ag Vorrichtung und Verfahren zur Bilderfassung einer vorzugsweise strukturierten Oberfläche eines Objekts
CN109323691B (zh) * 2017-07-31 2022-08-09 华为技术有限公司 一种定位系统以及定位方法
US11096765B2 (en) 2018-06-22 2021-08-24 Align Technology, Inc. Light field intraoral 3D scanner with structured light illumination
US20250342608A1 (en) * 2024-05-02 2025-11-06 Solera Holdings, Llc Image processing to measure absolute size and location of area of interest associated with object

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