JPS57110908A - Measuring method for shape of object - Google Patents
Measuring method for shape of objectInfo
- Publication number
- JPS57110908A JPS57110908A JP18766080A JP18766080A JPS57110908A JP S57110908 A JPS57110908 A JP S57110908A JP 18766080 A JP18766080 A JP 18766080A JP 18766080 A JP18766080 A JP 18766080A JP S57110908 A JPS57110908 A JP S57110908A
- Authority
- JP
- Japan
- Prior art keywords
- point
- axis line
- projection light
- distance
- shape
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
Abstract
PURPOSE:To measure a shape of an object, by utilizing the fact that, when incident light to a certain point on a surface of an object having a curved shape and to another point and the reflection lights of said incident lights satisfy a geometrical condition, said two points are judged as being located in a contour position. CONSTITUTION:A point P1 and a point P2 in a projection light device on an axis line L in common to a projection light device 10 and a collector 12 are produced, a projection light, which is caused to pass a point P positioned at a distance l1 from the axis line L, is reflected by a point A1 and a point A2, and a reflection light, passing through a point Q located at a distance l1 from the axis line L, is collected at a point Q1 and a point Q2 on a photoelectric conversion surface on the axis line L. In the case of P1P2=Q1Q2, the points A1 and A2 on the object pass PQ, and are positioned at an equal distance from a plane perpendicular to a paper surface. Through the rotation of a projector, P1 and P2 are projected in order at a pitch DELTAx to analyze an image-formation on a photoelectric conversion surface 13, and this obtains a contour line.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18766080A JPS57110908A (en) | 1980-12-27 | 1980-12-27 | Measuring method for shape of object |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18766080A JPS57110908A (en) | 1980-12-27 | 1980-12-27 | Measuring method for shape of object |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57110908A true JPS57110908A (en) | 1982-07-10 |
JPS6248162B2 JPS6248162B2 (en) | 1987-10-13 |
Family
ID=16209950
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18766080A Granted JPS57110908A (en) | 1980-12-27 | 1980-12-27 | Measuring method for shape of object |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57110908A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60152909A (en) * | 1984-01-21 | 1985-08-12 | Sanwa Seiki Kk | Non-contact type three-dimensional measuring instrument |
US6876458B2 (en) * | 2002-03-20 | 2005-04-05 | Steinbichler Optotechnik Gmbh | Method and device for determining the absolute coordinates of an object |
-
1980
- 1980-12-27 JP JP18766080A patent/JPS57110908A/en active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60152909A (en) * | 1984-01-21 | 1985-08-12 | Sanwa Seiki Kk | Non-contact type three-dimensional measuring instrument |
US6876458B2 (en) * | 2002-03-20 | 2005-04-05 | Steinbichler Optotechnik Gmbh | Method and device for determining the absolute coordinates of an object |
Also Published As
Publication number | Publication date |
---|---|
JPS6248162B2 (en) | 1987-10-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CA2330793A1 (en) | Container sealing surface area inspection | |
JPS54128682A (en) | Automatic detector for foreign matters | |
JPS57110908A (en) | Measuring method for shape of object | |
US4147433A (en) | Contour inspection | |
US3603800A (en) | Telemeter having image flux separator with opaque area at an acute angle with the optical axis | |
JPS57108605A (en) | Displacement meter | |
JPS6413695A (en) | Damaged paper money discriminator | |
JPS57165704A (en) | Detecting system for light spot position | |
JPS57207808A (en) | Printing area measuring method | |
JPS57118105A (en) | Detector | |
JPS5618711A (en) | Device for measuring distance | |
ES2005965A6 (en) | Surface inspection device | |
JPS57186106A (en) | Inspection device for surface | |
JPS5388782A (en) | Method of inspecting abnormality of surface of long material | |
JPS557631A (en) | Surface inspection unit | |
JPS57163851A (en) | Optical fiber | |
JPS556239A (en) | Rotation detector for tachometer | |
JPS56126745A (en) | Automatic inspecting device for surface of plate material | |
JPS57182112A (en) | Range detector | |
JPS57135065A (en) | Applying machine | |
JPS5648544A (en) | Crack detector | |
ATE136364T1 (en) | DEVICE FOR MEASURING THE ROUGHNESS OF A MOVING METAL PRODUCT | |
JPS56129983A (en) | Photoelectric converter | |
JPS57113310A (en) | Measuring device for surface coarseness of rotary object | |
JPS5585209A (en) | Inspection device for mask |