JP2005520142A - 物体の絶対座標測定方法および装置 - Google Patents

物体の絶対座標測定方法および装置 Download PDF

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JP2005520142A
JP2005520142A JP2003576887A JP2003576887A JP2005520142A JP 2005520142 A JP2005520142 A JP 2005520142A JP 2003576887 A JP2003576887 A JP 2003576887A JP 2003576887 A JP2003576887 A JP 2003576887A JP 2005520142 A JP2005520142 A JP 2005520142A
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grating
sensor
projection
vector
lattice
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JP2005520142A5 (enExample
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クラウス アントン
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シュタインビフラー オプトテヒニク ゲーエムベーハー
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Publication of JP2005520142A publication Critical patent/JP2005520142A/ja
Publication of JP2005520142A5 publication Critical patent/JP2005520142A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2536—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings with variable grating pitch, projected on the object with the same angle of incidence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns

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  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2003576887A 2002-03-20 2003-03-19 物体の絶対座標測定方法および装置 Pending JP2005520142A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10212364A DE10212364A1 (de) 2002-03-20 2002-03-20 Verfahren und Vorrichtung zur Bestimmung der Absolut-Koordinaten eines Objekts
PCT/EP2003/002877 WO2003078920A2 (de) 2002-03-20 2003-03-19 Verfahren und vorrichtung zur bestimmung der absolut-koordinaten eines objekts

Publications (2)

Publication Number Publication Date
JP2005520142A true JP2005520142A (ja) 2005-07-07
JP2005520142A5 JP2005520142A5 (enExample) 2005-08-18

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ID=27815803

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003576887A Pending JP2005520142A (ja) 2002-03-20 2003-03-19 物体の絶対座標測定方法および装置

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US (1) US6876458B2 (enExample)
EP (1) EP1485670A2 (enExample)
JP (1) JP2005520142A (enExample)
DE (1) DE10212364A1 (enExample)
WO (1) WO2003078920A2 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009098146A (ja) * 2007-10-18 2009-05-07 Mht Optic Research Ag 物体をトモグラフィスキャンするための装置
JP2010281778A (ja) * 2009-06-08 2010-12-16 Myuu Skynet:Kk 三次元形状計測装置
JP2011504230A (ja) * 2007-11-15 2011-02-03 シロナ・デンタル・システムズ・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング 三角法を用いた物体の光学的測定方法

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US7187437B2 (en) 2003-09-10 2007-03-06 Shearographics, Llc Plurality of light sources for inspection apparatus and method
US20070023716A1 (en) * 2005-07-26 2007-02-01 Icos Vision Systems N.V. Apparatus for three dimensional measuring on an electronic component
CA2536411C (en) * 2006-02-14 2014-01-14 Lmi Technologies Inc. Multiple axis multipoint non-contact measurement system
US7525114B2 (en) 2006-02-14 2009-04-28 Lmi Technologies Ltd. Multiple axis multipoint non-contact measurement system
US8090194B2 (en) 2006-11-21 2012-01-03 Mantis Vision Ltd. 3D geometric modeling and motion capture using both single and dual imaging
CN101627280B (zh) 2006-11-21 2013-09-25 曼蒂斯影像有限公司 三维几何建模和三维视频内容创建
DE102007060263A1 (de) 2007-08-16 2009-02-26 Steinbichler Optotechnik Gmbh Vorrichtung zur Ermittlung der 3D-Koordinaten eines Objekts, insbesondere eines Zahns
EP2026034B1 (de) 2007-08-16 2020-04-29 Carl Zeiss Optotechnik GmbH Vorrichtung zur Ermittlung der 3D-Koordinaten eines Objekts, insbesondere eines Zahns
US8294082B2 (en) 2007-11-14 2012-10-23 Boulder Innovation Group, Inc. Probe with a virtual marker
DE102008047816B4 (de) 2008-09-18 2011-08-25 Steinbichler Optotechnik GmbH, 83115 Vorrichtung zur Ermittlung der 3D-Koordinaten eines Objekts, insbesondere eines Zahns
US8649025B2 (en) 2010-03-27 2014-02-11 Micrometric Vision Technologies Methods and apparatus for real-time digitization of three-dimensional scenes
US8638450B2 (en) 2010-08-04 2014-01-28 Boulder Innovation Group Inc. Methods and systems for realizing reduced complexity in three-dimensional digitizer systems
US8687172B2 (en) * 2011-04-13 2014-04-01 Ivan Faul Optical digitizer with improved distance measurement capability
US10447040B2 (en) 2014-10-15 2019-10-15 Cummins Power Generation Ip, Inc. Programmable inverter for controllable grid response
DE102016208049A1 (de) 2015-07-09 2017-01-12 Inb Vision Ag Vorrichtung und Verfahren zur Bilderfassung einer vorzugsweise strukturierten Oberfläche eines Objekts
CN109323691B (zh) * 2017-07-31 2022-08-09 华为技术有限公司 一种定位系统以及定位方法
US11096765B2 (en) 2018-06-22 2021-08-24 Align Technology, Inc. Light field intraoral 3D scanner with structured light illumination
US20250342608A1 (en) * 2024-05-02 2025-11-06 Solera Holdings, Llc Image processing to measure absolute size and location of area of interest associated with object

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US4335962A (en) * 1979-07-20 1982-06-22 Robotic Vision Systems, Inc. Method and apparatus for determining spatial information
US4259589A (en) * 1979-07-20 1981-03-31 Solid Photography, Inc. Generation of contiguous data files of three-dimensional information
US4349277A (en) * 1980-06-11 1982-09-14 General Electric Company Non-contact measurement of surface profile
US4402608A (en) * 1980-10-02 1983-09-06 Solid Photography Inc. Room scanning system using multiple camera and projector sensors
JPS57110908A (en) * 1980-12-27 1982-07-10 Agency Of Ind Science & Technol Measuring method for shape of object
US4564295A (en) * 1983-03-07 1986-01-14 New York Institute Of Technology Apparatus and method for projection moire topography
US4641972A (en) * 1984-09-14 1987-02-10 New York Institute Of Technology Method and apparatus for surface profilometry
US4593967A (en) 1984-11-01 1986-06-10 Honeywell Inc. 3-D active vision sensor
JPH0615968B2 (ja) * 1986-08-11 1994-03-02 伍良 松本 立体形状測定装置
DE3817559C1 (enExample) 1988-05-24 1989-12-07 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung Ev, 8000 Muenchen, De
DE3907430C1 (enExample) 1988-12-23 1991-03-21 Klaus 8206 Bruckmuehl De Pfister
DE3843396C1 (en) 1988-12-23 1990-07-26 Klaus 8206 Bruckmuehl De Pfister Method and device for observing moiré patterns of surfaces under investigation in conjunction with the application of the projection moiré method with phase shifts
DE4011406A1 (de) 1990-04-09 1992-03-05 Steinbichler Hans Vorrichtung zur quantitativen absolutvermessung der dreidimensionalen koordinaten eines pruefobjekts mittels moire-technik
US5289246A (en) * 1991-02-26 1994-02-22 Canon Kabushiki Kaisha Color mixing and fixing device preventing gloss unevenness
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KR20000016663A (ko) * 1996-06-13 2000-03-25 에이치. 클라에스; 레이몽 드 봉 3차원 형상 묘사 획득용 시스템 및 방법
DE19637682B4 (de) * 1996-09-05 2004-04-29 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur Bestimmung der räumlichen Koordinaten von Gegenständen und/oder deren zeitlicher Änderung und Vorrichtung zur Anwendung dieses Verfahrens
EP1108197A1 (de) * 1998-09-04 2001-06-20 Siemens Aktiengesellschaft Anordnung und verfahren zur ermittlung einer tiefen- und farbinformation eines aufzunehmenden objekts
JP4197788B2 (ja) * 1999-02-25 2008-12-17 オリンパス株式会社 色再現システム

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009098146A (ja) * 2007-10-18 2009-05-07 Mht Optic Research Ag 物体をトモグラフィスキャンするための装置
JP2011504230A (ja) * 2007-11-15 2011-02-03 シロナ・デンタル・システムズ・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング 三角法を用いた物体の光学的測定方法
JP2010281778A (ja) * 2009-06-08 2010-12-16 Myuu Skynet:Kk 三次元形状計測装置

Also Published As

Publication number Publication date
US6876458B2 (en) 2005-04-05
WO2003078920A3 (de) 2004-02-05
US20040150836A1 (en) 2004-08-05
EP1485670A2 (de) 2004-12-15
WO2003078920A2 (de) 2003-09-25
DE10212364A1 (de) 2003-10-16

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